Hot carrier mechanisms in advanced NMOS transistors 4

Hot carrier mechanisms in advanced NMOS transistors 4

Hot carrier mechanisms in advanced NMOS transistors 4

... trap assisted tunneling in thin oxides by means of substrate hot electron injection experiments,” in Proc Int Electron Devices Meeting Tech Digest, pp 159-162, 2002 Chapter Hot- carrier Mechanism ... “Mechanism for hot- carrier- induced interface trap generation in MOS transistors, ” in Proc Int Electron Devices Meeting Tech Digest, pp 85-88, 1999 [27] Z Chen, P Ong, A K Myli...

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Hot carrier mechanisms in advanced NMOS transistors 1

Hot carrier mechanisms in advanced NMOS transistors 1

... Chapter 1. 1 INTRODUCTION Impact of CMOS Technology Scaling on the Hot- Carrier Effects 1. 1 .1 Bulk Si CMOS Technology Trend 1. 1.2 The Change in CMOS Scaling Approach 1. 1.3 Hot- Carrier Degradation in ... 19 1. 2.2 Current Enhancement in Strained-Si NMOSFET 21 1.2.3 The Self-Heating Effect 27 1. 2.4 Process Induced Strain Relaxation 29 1. 3 Hot- Carrier Degradation...

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Hot carrier mechanisms in advanced NMOS transistors 2

Hot carrier mechanisms in advanced NMOS transistors 2

... enhancement in strained-Si (b) improvement of Ion-Ioff characteristics in the strained-Si [71] Chapter Introduction 25 NMOS µ eff enhancement 2. 4 2. 2 2. 0 1.8 1.6 1.4 1 .2 Calculated 1.0 0.0 0.1 0 .2 0.3 ... wave function in the inversion layer than that in the bulk Si In other words, a thinner inversion layer is formed in the former [69][70] Reduction in intervalley...

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Hot carrier mechanisms in advanced NMOS transistors 3

Hot carrier mechanisms in advanced NMOS transistors 3

... in the channel Thus, the incremental increase in charge-pumping current is interpreted as the interface traps present in that portion of the channel This technique was well received for hot- carrier ... probe the hot- carrier damage in regions under the spacer and that in the gate overlap The principle of this method is based on the change in resistance in the channel and...

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Hot carrier mechanisms in advanced NMOS transistors 5

Hot carrier mechanisms in advanced NMOS transistors 5

... [22][23] This finding indicates that the SCE plays a major role in suppressing the injection of HETE in strained-Si NMOSFET Chapter Importance of Dopant Profile in Strained-Si/SiGe NMOSFET Threshold ... Profile in Strained-Si/SiGe NMOSFET 112 4.3 Injection Efficiency of High-Energy Tail Electrons As mentioned in section 3.3, the hot- carrier induced damage in bulk Si arising f...

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Hot carrier mechanisms in advanced NMOS transistors 6

Hot carrier mechanisms in advanced NMOS transistors 6

... 1 36 The parameter h can be obtained by plotting Id(Vd0,Ta) as a function of Ta, and taking the slope of the linear regression line Now, assuming in the same Ta range, the drain current is a linear ... = 1.8 V) In the case for strained-Si, R increases non-linearly as Wp reduces The ratio R in strained-Si is also much larger than unity for all Wp values indicating self-heating is causin...

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Hot carrier mechanisms in advanced NMOS transistors 7

Hot carrier mechanisms in advanced NMOS transistors 7

... vol 48, pp 671 - 678 , Apr 2001 Chapter Spatial Interface Damage Due to Self-heating [14] 179 D S Ang and C H Ling, A new assessment of the self-limiting hot- carrier degradation in LDD NMOSFET's ... Devices Meeting Tech Digest, pp 177 -180, 2003 [4] M F Lu, S Chiang, A Liu, S H Lu, M S Yeh, J R Hwang, T H Tang, and W T Shiau, Hot carrier degradation in novel strained-Si nMOSFETs,”...

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Hot carrier mechanisms in advanced NMOS transistors 8

Hot carrier mechanisms in advanced NMOS transistors 8

... (SOI) In chapter five, the extracted value of Tch arising from this self-heating effect is ~760 °C during hot- carrier stress In the following experiment, the Ge concentration near the strained-Si ... of severe channel heating on the strained-Si/SiGe interface Thus, it is essential to examine this interface when the transistor is subjected to hot- carrier stress condition In this...

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Hot carrier mechanisms in advanced NMOS transistors 9

Hot carrier mechanisms in advanced NMOS transistors 9

... Conclusion 198 the gate current is mainly responsible for the shift in the worst-case hot- carrier degradation The reduction in the oxide potential barrier as indicated by the slope n, again lending support ... applied to the substrate In order to establish the main hot- carrier degradation mechanism in strained-Si, the effects related to the underlying SiGe is studied in deta...

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Fundamental and Advanced Topics in Wind Power Part 4 pptx

Fundamental and Advanced Topics in Wind Power Part 4 pptx

... 13 .4 14. 3 21 0 .45 56 0. 544 3 2.1 94 0 .49 7 1983 13 14. 3 22 0 .47 78 0.5221 2.092 0 .43 1 19 84 14. 3 14 23 0.5 0.5 0.366 1985 13 .4 14 24 0.5221 0 .47 78 1.915 0.303 1986 14. 3 14 25 0. 544 3 0 .45 56 1.837 0. 240 ... IEC 6 140 0- 24 Ed 1.0 Wind turbines – Part 24: Lightning Protection, 2010 IEC TR 6 140 0- 24 Wind turbine generator systems – Part 24: Lightning protect...

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Advanced Topics in Mass Transfer Part 4 ppt

Advanced Topics in Mass Transfer Part 4 ppt

... ⎣ ⎦ ⎝D⎠ strongly increase in mass- transfer process when the RMF is applied It was found that the 140 Advanced Topics in Mass Transfer Sherwood number increase with increase in the local magnetic ... reciprocating plate column, Chemical Engineering and Processing, Vol 44 , 1285-1295 ISSN 0255-2701 142 Advanced Topics in Mass Transfer Gomaa, H.G., Landau, J & Al Taw...

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Advanced Trends in Wireless Communications Part 4 pdf

Advanced Trends in Wireless Communications Part 4 pdf

... element spacing 4 ds A42 A43 A 44 End-fire Antenna 4 d s A41 A31 A21 A11 A12 A32 A22 A13 A33 A23 A 34 A 24 A 14 Antenna array element Layer Layer Layer Layer Fig Configuration of a 4x4 element square ... radiation pattern for two principle planes at 72 GHz is shown in Fig 9b The realized gain of the single element is 5 .4 dBi from 71 – 76 GHz 1 04 Advanced Trends in Wireless...

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advanced sql Functions in Oracle 10G phần 4 ppt

advanced sql Functions in Oracle 10G phần 4 ppt

... 39000 W 2 142 857 14 2 142 857 14 Stephanie 44 000 241 758 242 241 758 242 Chloe 44 000 241 758 242 241 758 242 Christina 55000 302197802 302197802 ****** -sum 119 Aggregate Functions Used as Analytical Functions ... 49 000 E 3500 3500 Lindsey 52000 E 37 14 37 14 John 39000 W 2 143 2 143 Stephanie 44 000 W 241 8 241 8 Chloe 44 000 W 241 8 241 8 Christina 55000 W 3022 3022 117 Agg...

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