Hot carrier mechanisms in advanced NMOS transistors 3
... in the channel Thus, the incremental increase in charge-pumping current is interpreted as the interface traps present in that portion of the channel This technique was well received for hot- carrier ... probe the hot- carrier damage in regions under the spacer and that in the gate overlap The principle of this method is based on the change in resistance in the channel and...
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... Chapter 1. 1 INTRODUCTION Impact of CMOS Technology Scaling on the Hot- Carrier Effects 1. 1 .1 Bulk Si CMOS Technology Trend 1. 1.2 The Change in CMOS Scaling Approach 1. 1.3 Hot- Carrier Degradation in ... 19 1. 2.2 Current Enhancement in Strained-Si NMOSFET 21 1.2.3 The Self-Heating Effect 27 1. 2.4 Process Induced Strain Relaxation 29 1. 3 Hot- Carrier Degradation...
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... enhancement in strained-Si (b) improvement of Ion-Ioff characteristics in the strained-Si [71] Chapter Introduction 25 NMOS µ eff enhancement 2. 4 2. 2 2. 0 1.8 1.6 1.4 1 .2 Calculated 1.0 0.0 0.1 0 .2 0.3 ... wave function in the inversion layer than that in the bulk Si In other words, a thinner inversion layer is formed in the former [69][70] Reduction in intervalley...
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Hot carrier mechanisms in advanced NMOS transistors 4
... trap assisted tunneling in thin oxides by means of substrate hot electron injection experiments,” in Proc Int Electron Devices Meeting Tech Digest, pp 159-162, 2002 Chapter Hot- carrier Mechanism ... “Mechanism for hot- carrier- induced interface trap generation in MOS transistors, ” in Proc Int Electron Devices Meeting Tech Digest, pp 85-88, 1999 [27] Z Chen, P Ong, A K Myli...
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Hot carrier mechanisms in advanced NMOS transistors 5
... [22][23] This finding indicates that the SCE plays a major role in suppressing the injection of HETE in strained-Si NMOSFET Chapter Importance of Dopant Profile in Strained-Si/SiGe NMOSFET Threshold ... Profile in Strained-Si/SiGe NMOSFET 112 4.3 Injection Efficiency of High-Energy Tail Electrons As mentioned in section 3.3, the hot- carrier induced damage in bulk Si arising f...
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Hot carrier mechanisms in advanced NMOS transistors 6
... 1 36 The parameter h can be obtained by plotting Id(Vd0,Ta) as a function of Ta, and taking the slope of the linear regression line Now, assuming in the same Ta range, the drain current is a linear ... = 1.8 V) In the case for strained-Si, R increases non-linearly as Wp reduces The ratio R in strained-Si is also much larger than unity for all Wp values indicating self-heating is causin...
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Hot carrier mechanisms in advanced NMOS transistors 7
... vol 48, pp 671 - 678 , Apr 2001 Chapter Spatial Interface Damage Due to Self-heating [14] 179 D S Ang and C H Ling, A new assessment of the self-limiting hot- carrier degradation in LDD NMOSFET's ... Devices Meeting Tech Digest, pp 177 -180, 2003 [4] M F Lu, S Chiang, A Liu, S H Lu, M S Yeh, J R Hwang, T H Tang, and W T Shiau, Hot carrier degradation in novel strained-Si nMOSFETs,”...
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Hot carrier mechanisms in advanced NMOS transistors 8
... (SOI) In chapter five, the extracted value of Tch arising from this self-heating effect is ~760 °C during hot- carrier stress In the following experiment, the Ge concentration near the strained-Si ... of severe channel heating on the strained-Si/SiGe interface Thus, it is essential to examine this interface when the transistor is subjected to hot- carrier stress condition In this...
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Hot carrier mechanisms in advanced NMOS transistors 9
... Conclusion 198 the gate current is mainly responsible for the shift in the worst-case hot- carrier degradation The reduction in the oxide potential barrier as indicated by the slope n, again lending support ... applied to the substrate In order to establish the main hot- carrier degradation mechanism in strained-Si, the effects related to the underlying SiGe is studied in deta...
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Advanced Topics in Mass Transfer Part 3 docx
... liquid-liquid interface in a ultrasoinc field International Chemical Engineering, Vo .30 , No .3, 526- 534 , ISSN 138 5-8947 Temkin, S.(1998).Sound propagation in dilute suspensions of rigid particles ... s-1 ωc, s-1 Γ3d/Γ2d Zmin 9.7 9.8 8.8 16 .3 92/102 72/80 54/60 80/89 5605 430 3 4478 6119 13. 2 10. 23 22.44 15.62 6 .3/ 7 4.1/4.6 6.2/6.9 1.6/1.8 8800 5912 5581 4195 13. 0 12.5 13. 5 2...
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Advanced Trends in Wireless Communications Part 3 pdf
... symbolic integration Finally, an alternative ABEP expression may 62 Advanced Trends in Wireless Communications Will-be-set-by -IN- TECH 16 be obtained by substituting (35 ) to (45) By integrating the ... model Advanced Trends in Wireless Communications Will-be-set-by -IN- TECH Assessment of Indoor Propagation and Antenna Performance for Bluetooth Wireless Communication L...
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advanced sql Functions in Oracle 10G phần 3 pot
... -John 35 000 2 Chloe 33 000 Christina 430 00 David 37 000 Katie 45000 Lindsey 40000 Stephanie 35 000 3 79 The Analytical Functions in Oracle (Analytical Functions I) RNUM in this case is the ordering ... Programmer 33 000 33 000 Accountant 35 000 35 000 Chemist 35 000 35 000 Director Personnel 40000 40000 Mediator 40000 35 000 The ORDER BY is applied last 73 The Analyt...
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Advanced therapy in thoracic surgery - part 3 docx
... MYC-MAX-directed HSVTK 28 Multiple HSVTK 29 HGPRT 30 IL2 31 IL1/IL3 32 CD4L 33 MDA7 34 TP 53 10 p16INK4a35 RB2/p 130 36 k-ras ribozyme37 p2 738 cyclin D antisense39 E1A40 c-erb2 antisense41 IGFB -3 4 2 ... colleagues in abstract form that examined TP 53 gene therapy in combination with radiotherapy.16 In this trial, subjects receiving radiotherapy concomitantly received intratu...
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Advanced Techniques in Dermatologic Surgery - part 3 pot
... such as boiling, steaming, autoclaving, or using radiation Before starting the surgery, the skin is disinfected; skin disinfection should be repeated at regular intervals during surgery The surgeon ... 100:1466–1474 38 Kim K-J, Lee H-W, Lee M-W, Choi J-H, Moon K-C, Koh J-K Artecoll granuloma: a rare adverse reaction induced by microimplant in the treatment of neck wrinkles Dermatol Surg...
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