I E C 63 0 ® Ed i ti on I N TE RN ATI ON AL 201 5-1 I E E E S td 50 ™ S TAN D ARD colour i nsid e S tan d ard for th e com m on tes t i n te rface pi n m ap fi g u rati on for h i g h -d en s i ty, I EC 6300 3: 01 5-1 2(en ) I E EE S td 505 -2008 s i n g l e -ti e r e l ectron i cs tes t re q u i re m e n ts u ti l i zi n g I E E E S td 50 5™ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y TH I S P U B LI C ATI O N I S CO P YRI G H T P ROTE CTED C opyri g h t © 0 I E E E All rights reserved IEEE is a registered trademark in the U.S Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Inc Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central Office Any questions about IEEE copyright should be addressed to the IEEE Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee IEC Central Office 3, rue de Varembé CH-1 21 Geneva 20 Switzerland Tel.: +41 22 91 02 1 Fax: +41 22 91 03 00 info@iec.ch www.iec.ch Institute of Electrical and Electronics Engineers, Inc Park Avenue New York, NY 001 6-5997 United States of America stds.info@ieee.org www.ieee.org Abou t th e I EC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies Ab o u t I E C pu bl i cati on s The technical content of IEC publications is kept under constant review by the IEC Please make sure that you have the latest edition, a corrigenda or an amendment might have been published I EC Catalog u e - webstore i ec ch/catal og u e El ectropedi a - www el ectropedia org The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents Available for PC, Mac OS, Android Tablets and iPad The world's leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages Also known as the International Electrotechnical Vocabulary (IEV) online I EC pu bl i cati on s search - www iec ch /search pu b I EC Gl ossary - std i ec ch/g lossary The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,…) It also gives information on projects, replaced and withdrawn publications I EC J u st Pu bli sh ed - webstore iec ch /j u stpu bl i sh ed Stay up to date on all new IEC publications Just Published details all new publications released Available online and also once a month by email More than 60 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002 Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR I EC Cu stom er Servi ce Centre - webstore i ec ch /csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csc@iec.ch Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I E C 630 ® Ed i ti on 201 5-1 I N TE RN ATI ON AL I E E E S td 50 ™ S TAN D ARD colour insid e S tan d ard for th e com m on tes t i n terface pi n m ap fi g u rati on for h i g h -d en s i ty, s i n g l e-ti er el ectron i cs tes t req u i rem en ts u ti l i zi n g I E EE S td 505™ I N TERN ATI ON AL ELECTROTECH N I CAL COM MI SSI ON I CS 25 040 I EC I SBN : 978-2-8322-2941 -5 I EEE I SBN : 978-1 -5044-0580-5 STD20742 Warn i n g ! M ake s u re th at you obtai n ed th i s pu bl i cati on from an au th ori zed d i s tri bu tor ® Reg i stered trad emark of th e I n ternati on al El ectrotech ni cal Commi ssi on Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 Contents Overview 1 Scope 1 Purpose Statement of the problem 2 Normative references 3 Definitions, acronyms, and abbreviations Definitions Specification terms Acronyms and abbreviations 4 Common test interface requirements Introduction CTI open system requirements CTI cost requirements 4 Vertical integration test support requirements CTI configuration/interoperability requirements Maintainability/end-user support requirements Scaleable architecture requirements Physical framework requirements Reliability requirements CTI connector footprint/parametric requirements 1 CTI pin map requirements 22 CTI pin map input/output configuration 3 Annex A (normative) Common test interface signal definitions for pin map A Analog instruments (AI) A Bus A Digital A Instrument control A Power loads A Power supplies A Sense and control, DCPS, and loads A S witch A S ystem 40 Annex B (informative) Bibliography $QQH[& LQIRUPDWLYH ,(((/LVWRI3DUWLFLSDQWV vii Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 S T AN D ARD F O R T H E C O M M O N C O N F I G U R AT I O N T E S T I N T E RF AC E P I N F O R H I G H -D E N S I T Y, M AP S I N G L E -T I E R E L E C T RO N I C S T E S T RE Q U I RE M E N T S U T I L I Z I N G I E E E S td 50 5™ F O RE W O RD 1) T h e I n te rn a ti o n a l E l e c tro te c h n i c a l C o m m i s s i o n ( I E C ) i s a wo rl d wi d e o rg a n i z a ti o n fo r s ta n d a rd i z a ti o n c o m p ri s i n g all n a ti o n a l e l e c tro te c h n i c a l c o m m i tte e s (I E C N a ti o n a l C o m m i tte e s ) Th e o b j e ct of I EC is to p ro m o t e i n te rn a ti o n a l c o - o p e ti o n o n a l l q u e s ti o n s c o n c e rn i n g s ta n d a rd i za ti o n i n t h e e l e c tri c a l a n d e l e c tro n i c fi e l d s T o th i s en d and Te ch n i ca l in a d d i ti o n Re p o rts , t o o t h e r a c ti v i ti e s , P u b l i cl y Ava i l a b l e I EC pu bl i sh es S p e c i fi c a ti o n s I n te rn a ti o n a l (P AS ) an d S ta n d a rd s , Gu i des Te c h n i ca l ( h e re a fte r S p e c i fi c a ti o n s , re fe rre d to as “I EC P u b l i c a ti o n ( s ) ” ) T h e i r p re p a t i o n i s e n t ru s te d to te c h n i c a l c o m m i tte e s ; a n y I E C N a ti o n a l C o m m i tte e i n te re s te d in th e s u b j e ct d ealt wi t h m ay p a rti c i p a te in th i s p re p a t o ry wo rk I n te rn a ti o n a l , g o ve rn m e n ta l and non- g o v e rn m e n ta l o rg a n i za ti o n s l i a i s i n g wi th t h e I E C a l s o p a rti c i p a te i n th i s p re p a ti o n I E E E S ta n d a rd s d o c u m e n ts a re d e ve l o p e d wi t h i n I E E E S o c i e ti e s a n d S ta n d a rd s C o o rd i n a ti n g C o m m i tte e s o f th e I EEE S ta n d a rd s As s o c i a ti o n ( I E E E - S A) S ta n d a rd s B o a rd I EEE d e ve l o p s i ts s ta n d a rd s th ro u g h a co n s e n s u s d e v e l o p m e n t p ro c e s s , wh i c h b ri n g s to g e th e r vo l u n t e e rs re p re s e n ti n g v a ri e d v i e wp o i n ts a n d i n te re s ts to a c h i e ve th e fi n a l p ro d u c t Vo l u n te e rs a re n o t n e c e s s a ri l y m e m b e rs o f I E E E a n d s e rve wi t h o u t c o m p e n s a ti o n W h i l e I E E E a d m i n i s te rs th e p ro c e s s a n d e s ta b l i s h e s ru l e s to p ro m o te fa i rn e s s i n th e c o n s e n s u s d e ve l o p m e n t p ro c e s s , I E E E d oes n ot i n d e p e n d e n tl y e va l u a te , te s t, or ve ri fy th e a c c u c y of an y of th e i n fo rm a ti o n c o n ta i n e d in i ts s ta n d a rd s U s e o f I E E E S ta n d a rd s d o c u m e n ts i s wh o l l y v o l u n ta ry I E E E d o c u m e n ts a re m a d e a va i l a b l e fo r u s e s u b j e c t to i m p o rta n t n o ti c e s a n d l e g a l d i s c l a i m e rs ( s e e h ttp : //s ta n d a rd s i e e e o rg /I P R/d i s c l a i m e rs h tm l fo r m o re i n fo rm a ti o n ) I E C c o l l a b o te s c l o s e l y wi th I E E E i n a c c o rd a n c e wi th c o n d i ti o n s d e te rm i n e d b y a g re e m e n t b e t we e n th e t wo o rg a n i za ti o n s 2) T h e fo rm a l d e c i s i o n s o f I E C o n te c h n i c a l m a tte rs e xp re s s , a s n e a rl y a s p o s s i b l e , a n i n te rn a ti o n a l c o n s e n s u s o f opi n i on on th e re l e v a n t s u b j e c ts s i n ce e a ch te c h n i c a l c o m m i tte e h a s re p re s e n ta ti o n fro m al l i n te re s te d I EC N a ti o n a l C o m m i tte e s T h e fo rm a l d e c i s i o n s o f I E E E o n t e ch n i c a l m a tte rs , o n c e c o n s e n s u s wi th i n I E E E S o c i e ti e s a n d S t a n d a rd s C o o rd i n a ti n g C o m m i tte e s h a s b e e n re a c h e d , i n te re s te d p a rti e s wh o i n d i c a te i n te re s t in re vi e wi n g th e i s d e te rm i n e d p ro p o s e d b y a b a l a n c e d b a l l o t o f m a te ri a l l y s ta n d a rd Fi n al a p p ro va l of th e I EEE s ta n d a rd s d o c u m e n t i s g i ve n b y th e I E E E S ta n d a rd s As s o c i a ti o n ( I E E E - S A) S ta n d a rd s B o a rd 3) I E C /I E E E N a ti o n a l P u b l i c a ti o n s h a ve th e fo rm of re c o m m e n d a ti o n s C o m m i tte e s /I E E E S o c i e ti e s i n th a t s e n s e fo r Wh i l e al l i n te rn a ti o n a l use an d a re a c c e p te d by I EC re a s o n a b l e e ffo rts a re m a d e to e n s u re th a t th e te c h n i c a l c o n te n t o f I E C /I E E E P u b l i c a ti o n s i s a c c u te , I E C o r I E E E c a n n o t b e h e l d re s p o n s i b l e fo r th e wa y i n wh i c h th e y a re u s e d o r fo r a n y m i s i n te rp re t a ti o n b y a n y e n d u s e r 4) In o rd e r to p ro m o te i n te rn a ti o n a l u n i fo rm i ty, I EC N a ti o n a l C o m m i tte e s u n d e rta ke to appl y I EC P u b l i c a ti o n s ( i n c l u d i n g I E C /I E E E P u b l i c a ti o n s ) tra n s p a re n tl y to t h e m a xi m u m e xt e n t p o s s i b l e i n th e i r n a ti o n a l a n d re g i o n a l p u b l i c a ti o n s An y d i ve rg e n c e b e t we e n a n y I E C /I E E E P u b l i c a ti o n and th e c o rre s p o n d i n g n a ti o n a l o r re g i o n a l p u b l i c a ti o n s h a l l b e c l e a rl y i n d i c a te d i n th e l a tte r 5) I E C a n d I E E E d o n o t p ro vi d e a n y a tte s ta ti o n o f c o n fo rm i ty I n d e p e n d e n t c e rti fi c a ti o n b o d i e s p ro vi d e c o n fo rm i ty a s s e s s m e n t s e rvi c e s a n d , i n s o m e a re a s , a c c e s s to I E C m a rks o f c o n fo rm i ty I E C a n d I E E E a re n o t re s p o n s i b l e fo r a n y s e rvi c e s c a rri e d o u t b y i n d e p e n d e n t c e rti fi c a ti o n b o d i e s 6) 7) Al l u s e rs s h o u l d e n s u re th a t th e y h a v e th e l a te s t e d i ti o n o f th i s p u b l i c a ti o n N o l i a bi l i ty sh al l a tta c h to I E C o r I E E E o r th e i r d i re c to rs , e m p l o ye e s , s e rva n ts o r a g e n ts i n c l u d i n g i n d i vi d u a l e xp e rts a n d m e m b e rs o f te c h n i c a l c o m m i tte e s a n d I E C N a ti o n a l C o m m i tte e s , o r vo l u n te e rs o f I E E E S o c i e ti e s a n d th e S ta n d a rd s C o o rd i n a ti n g C o m m i tte e s o f th e I E E E S ta n d a rd s As s o c i a ti o n ( I E E E - S A) S ta n d a rd s B o a rd , fo r a n y p e rs o n a l i n j u ry, p ro p e rt y d a m a g e o r o t h e r d a m a g e o f a n y n a t u re wh a ts o e v e r, wh e t h e r d i re c t o r i n d i re c t, o r fo r c o s ts ( i n c l u d i n g l e g a l fe e s ) a n d e xp e n s e s a ri s i n g o u t o f th e p u b l i c a ti o n , u s e o f, o r re l i a n c e u p o n , th i s I E C /I E E E P u b l i c a ti o n o r a n y o t h e r I E C o r I E E E P u b l i c a ti o n s 8) Atte n ti o n i s d wn to th e n o rm a ti ve re fe re n c e s c i te d i n th i s p u b l i c a ti o n U s e o f th e re fe re n c e d p u b l i c a ti o n s i s i n d i s p e n s a b l e fo r th e c o rre c t a p p l i c a ti o n o f th i s p u b l i c a ti o n 9) Atte n ti o n m a te ri a l is d wn c o ve re d to by th e p o s s i b i l i ty p a te n t ri g h ts th a t i m p l e m e n ta ti o n B y p u b l i c a ti o n of th i s of th i s I E C /I E E E s ta n d a rd , no P u b l i c a ti o n p o s i ti o n is ta ke n m ay wi th re q u i re re s p e c t u se to of th e e xi s te n c e o r va l i d i ty o f a n y p a t e n t ri g h ts i n c o n n e c ti o n th e re wi th I E C o r I E E E s h a l l n o t b e h e l d re s p o n s i b l e fo r i d e n ti fyi n g E s s e n ti a l P a te n t C l a i m s fo r wh i c h a l i c e n s e m a y b e re q u i re d , fo r c o n d u c ti n g i n q u i ri e s i n to th e l e g a l va l i d i ty or s cop e of Paten t Cl m s or d e t e rm i n i n g wh e th e r any l i ce n s i n g te rm s or c o n d i ti o n s p ro v i d e d in c o n n e c ti o n wi th s u b m i s s i o n o f a L e tte r o f As s u n c e , i f a n y, o r i n a n y l i c e n s i n g a g re e m e n ts a re re a s o n a b l e o r n o n - d i s c ri m i n a to ry U s e rs o f th i s s ta n d a rd a re e xp re s s l y a d vi s e d th a t d e te rm i n a ti o n o f th e v a l i d i t y o f a n y p a t e n t ri g h ts , a n d th e ri s k o f i n fri n g e m e n t o f s u c h ri g h ts , i s e n ti re l y th e i r o wn re s p o n s i b i l i ty P u b l i s h e d b y I E C u n d e r l i ce n s e fro m I E E E © 0 I E E E Al l ri g h ts re s e rve d Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 I n te rn a ti o n a l S ta n d a rd I E C 0 / I E E E S td 5 - 0 h a s b e e n p ro ce s s e d th ro u g h I E C te c h n i c a l co m m i tte e 91 : E l e ctro n i cs assem bl y te ch n o l o g y , u n d er th e I E C /I E E E Dual Logo Ag re e m e n t T h e te x t o f th i s s ta n d a rd i s b a s e d o n th e fo l l o wi n g d o cu m e n ts : I E E E S td FDI S Re p o rt o n vo ti n g I E E E S td 5 - 0 /1 /F D I S /1 / RVD F u l l i n fo rm a ti o n o n th e vo ti n g fo r th e a p p ro va l o f th i s s ta n d a rd ca n b e fo u n d i n th e re p o rt o n vo ti n g i n d i c a te d i n th e a b o ve ta b l e T h e I E C T e ch n i c a l C o m m i tte e a n d I E E E T e ch n i c a l C o m m i tte e h a ve d e c i d e d th a t th e co n te n ts o f th i s p u b l i ca ti o n wi l l re m a i n u n ch a n g e d u n ti l th e s ta b i l i t y d a te i n d i ca te d o n th e I E C we b s i te u n d e r " h ttp : //we b s to re i e c ch " i n th e d a ta re l a te d to th e s p e ci fi c p u b l i ca ti o n At th i s d a te , th e p u b l i ca ti o n wi l l b e re co n fi rm e d , wi th d wn , re p l a c e d b y a re vi s e d e d i ti o n , o r am en d ed P u b l i s h e d b y I E C u n d e r l i ce n s e fro m I E E E © 0 I E E E Al l ri g h ts re s e rve d Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 I E E E S tan d ard for th e C om m on Tes t I n terface P i n M ap C on fi g u rati on for H i g h -D en s i ty, S i n g l e-Ti er E l ectron i cs Tes t Req u i rem en ts U ti l i zi n g I E E E S td 50 ™ Spon sor I E E E I n s tru m en tati on an d M eas u rem en t S oci ety an d I E E E S tan d ard s C oord i n ati n g C om m i ttee on Tes t an d D i ag n os i s for E l ectron i c S ys tem s Approved 26 Septem ber 2008 I E E E -S A S tan d ard s B oard Approved as a Fu l l -U se Stan d ard on J u n e 201 I E E E -S A S tan d ard s B oard Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 Abstract: stan d ard Th i s stan d ard represen ts an exten si on to th e I EEE 505 recei ver fi xtu re i n terface (RFI ) speci fi cati on Parti cu l ar emph asi s is pl aced on d efi n i n g wi th i n th e I EEE 505 RFI stan d ard a more speci fi c set of performan ce req u i remen ts th at em pl oy a common scal abl e: (a) pi n m ap fi g u rati on ; (b) speci fi c n ector m od u l es; (c) respecti ve tacts; (d ) recomm en d ed swi tch i n g i mpl em en tati on ; an d (e) l eg acy au tom ati c test eq u i pmen t (ATE) tran si ti on al d evi ces Th i s is i n ten ti on al l y d on e to stan d ard i ze th e footpri n t an d assu re mech an i cal an d el ectri cal i n teroperabi l i ty between past an d fu tu re au tom ati c test system s (ATS) Keyword s: ATE, ATS, fi xtu re, I CD, I EEE 505 TM , i n terface, I TA, m ass termi n ati on , recei ver, scal abl e, TPS, U U T • Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 47 I EEE Std 505 -2008 Tab l e A 47 —1 x2 s wi tch CTI name Legacy systems IFTE, CAS S , LM-S TAR, x2 S S W Common x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W 20 Common x2 S S W 20 Port1 x2 S S W 20 Port2 x2 S S W 21 Common x2 S S W 21 Port1 x2 S S W 21 Port2 x2 S S W 22 Common x2 S S W 22 Port1 x2 S S W 22 Port2 x2 S S W 23 Common x2 S S W 23 Port1 x2 S S W 23 Port2 x2 S S W 24 Common x2 S S W 24 Port1 x2 S S W 24 Port2 x2 S S W 25 Common x2 S S W 25 Port1 IAIS , C1 B 14 B 15 B 16 B 17 B 18 B 19 B 20 B 21 B 22 B 23 B 24 B 25 B 26 B 27 B 28 B 29 “ “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B 13 “ IAIS , C1 IF TE, C AS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B 12 “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C1 IFTE, CAS S , LM-S TAR, B 11 “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B 10 “ IAIS , C1 IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C1 IFTE, CAS S , LM-S TAR, B “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B “ IAIS , C1 IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C1 IFTE, CAS S , LM-S TAR, B “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, B “ IAIS , C1 IFTE, CAS S , LM-S TAR, “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, Pin “ IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, Slot “ IAIS , C1 IFTE, CAS S , LM-S TAR, x2 S S W Port2 Recommended attributes IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, x2 S S W Port1 (continued) “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 48 Tab l e A 47 —1 x2 s wi tch CTI name Legacy systems IFTE, CAS S , LM-S TAR, x2 S S W 25 Port2 x2 S S W 26 Port2 x2 S S W 27 Common x2 S S W 27 Port1 x2 S S W 27 Port2 x2 S S W 28 Common x2 S S W 28 Port1 x2 S S W 28 Port2 x2 S S W 29 Common x2 S S W 29 Port1 x2 S S W 29 Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W 3 Common x2 S S W Common C AS S , LM-S TAR, C , “ CAS S , LM-S TAR, TETS , “ C1 C1 B 40 B 41 B 42 B 43 B 44 B 45 C C C 3 C C C C C C C 10 “ C1 CAS S , LM-S TAR, TETS , B 39 “ x2 S S W 3 Port1 x2 S S W 3 Port2 “ C1 , TETS CAS S , LM-S TAR, TETS , B 38 “ C1 IFTE, CAS S , LM-S TAR, “ C1 , TETS IFTE, CAS S , LM-S TAR, B 37 “ C1 , TETS IFTE, CAS S , LM-S TAR, “ C1 IFTE, CAS S , LM-S TAR, B 36 “ C1 , TETS IFTE, CAS S , LM-S TAR, “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, B 35 “ IAIS , C1 IFTE, CAS S , LM-S TAR, “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, B 34 “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, “ IAIS , C1 IFTE, CAS S , LM-S TAR, B 33 “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, B 32 “ IAIS , C1 IFTE, CAS S , LM-S TAR, “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, B 31 “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, “ IAIS , C1 IFTE, CAS S , LM-S TAR, B 30 “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, Pin “ IAIS , C1 IFTE, CAS S , LM-S TAR, Slot “ IAIS , C1 , TETS IFTE, CAS S , LM-S TAR, x2 S S W 26 Port1 Recommended attributes IAIS , C , TETS , RAF IFTE, CAS S , LM-S TAR, x2 S S W 26 Common (continued) “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 49 I EEE Std 505 -2008 Tab l e A 47 —1 x2 s wi tch CTI name x2 S S W Port1 x2 S S W Port2 Legacy systems (continued) Recommended attributes C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 x2 S S W Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 x2 S S W Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 x2 S S W Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 x2 S S W Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 , RAF x2 S S W Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 , RAF CAS S , LM-S TAR, TETS , C1 , RAF x2 S S W 40 Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 , RAF CAS S , LM-S TAR, TETS , C1 , RAF x2 S S W 41 Port1 C AS S , LM- S TAR, C1 “ CAS S , LM-S TAR, TETS , “ C1 , RAF CAS S , LM-S TAR, TETS , C1 x2 S S W 42 Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 x2 S S W 43 Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 CAS S , LM-S TAR, TETS , C1 x2 S S W 44 Port1 C AS S , LM-S TAR, C “ CAS S , LM-S TAR, TETS , “ C1 C 16 C 17 C 18 C 19 C 20 C 21 C 22 C 23 C 24 C 25 C 26 C 27 C 28 C 29 C 30 C 31 C 32 C 33 C 34 C 35 C 36 C 37 C 38 C 39 “ x2 S S W 44 Common x2 S S W 44 Port2 3 “ x2 S S W 43 Common x2 S S W 43 Port2 C 15 “ x2 S S W 42 Common x2 S S W 42 Port2 “ x2 S S W 41 Common x2 S S W 41 Port2 C 14 “ x2 S S W 40 Common x2 S S W 40 Port2 C 13 “ x2 S S W Common x2 S S W Port2 3 “ x2 S S W Common x2 S S W Port2 C 12 “ x2 S S W Common x2 S S W Port2 “ x2 S S W Common x2 S S W Port2 Pin C 11 “ x2 S S W Common x2 S S W Port2 Slot 3 C 40 C 41 C 42 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 50 Tab l e A 47 —1 x2 s wi tch CTI name (continued) Legacy systems Recommended attributes CASS, LM-STAR, TETS, “ x2 SSW 45 Common C1 x2 SSW 45 Port1 CASS, LM-STAR, C1 “ CASS, LM-STAR, TETS, “ x2 SSW 45 Port2 C1 CASS, LM-STAR, TETS, C1 x2 SSW 46 Port1 CASS, LM-STAR, C1 “ CASS, LM-STAR, TETS, “ C1 CASS, LM-STAR, TETS, C1 x2 SSW 47 Port1 CASS, LM-STAR, C1 “ CASS, LM-STAR, TETS, “ C1 CASS, LM-STAR, TETS, C1 x2 SSW 48 Port1 CASS, LM-STAR, C1 “ CASS, LM-STAR, TETS, “ C1 CASS, LM-STAR, TETS, C1 x2 SSW 49 Port1 CASS, LM-STAR, C1 “ CASS, LM-STAR, TETS, “ C1 CASS, LM-STAR, TETS, D 3 D D D D D D D 10 D 11 D 12 D 13 D 14 D 15 D 16 D 17 D 18 D 19 D 20 D 21 D 22 D 23 D 24 D 25 D 26 D 27 “ x2 SSW 50 Common C1 x2 SSW 50 Port1 CASS, LM-STAR, C1 “ CASS, LM-STAR, TETS, “ x2 SSW 50 Port2 D “ x2 SSW 49 Common x2 SSW 49 Port2 D “ x2 SSW 48 Common x2 SSW 48 Port2 “ x2 SSW 47 Common x2 SSW 47 Port2 Pin “ x2 SSW 46 Common x2 SSW 46 Port2 Slot C1 CASS, LM-STAR, ESTS, Max current: A C1 7, TETS, Min switch speed: ms Min breakdown voltage: 000 Vdc Freq range: dc to MHz P$ ȍ 0ȍ Max switch path resistance (@ Min open switch isolation: x2 SSW 51 Common 10 CASS, LM-STAR, ESTS, x2 SSW 51 Port1 C1 CASS, LM-STAR, ESTS, x2 SSW 51 Port2 “ C1 CASS, LM-STAR, ESTS, x2 SSW 53 Port2 “ C1 7, TETS, CASS, LM-STAR, ESTS, x2 SSW 53 Port1 “ C1 7, TETS, CASS, LM-STAR, ESTS, x2 SSW 53 Common “ C1 CASS, LM-STAR, ESTS, x2 SSW 52 Port2 “ C1 7, TETS, CASS, LM-STAR, ESTS, x2 SSW 52 Port1 “ C1 7, TETS, CASS, LM-STAR, ESTS, x2 SSW 52 Common “ C1 7, TETS, “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 51 I EEE Std 505 -2008 Tab l e A 47 —1 x2 s wi tch CTI name x2 S S W Common Legacy systems Recommended attributes C AS S , LM-S TAR, ES TS , “ C1 , TETS , C AS S , LM-S TAR, ES TS , x2 S S W Port1 x2 S S W 5 Common x2 S S W 5 Port1 x2 S S W 5 Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W Common x2 S S W Port1 x2 S S W Port2 x2 S S W 60 Common x2 S S W 60 Port1 x2 S S W 60 Port2 x2 S S W 61 Common x2 S S W 61 Port1 x2 S S W 61 Port2 x2 S S W 62 Common x2 S S W 62 Port1 C1 D 38 D 39 D 40 D 41 D 42 19 A 17 19 A 18 19 A 19 19 A 20 19 A 21 19 A 22 19 A 23 19 A 24 19 A 25 19 A 26 19 A 27 “ TETS , C1 C AS S , LM-S TAR, ES TS , “ TETS , C1 C AS S , LM-S TAR, ES TS , D 37 “ C1 C AS S , LM-S TAR, ES TS , “ TETS , C1 C AS S , LM-S TAR, ES TS , D 36 “ TETS , C1 C AS S , LM-S TAR, ES TS , “ C1 C AS S , LM-S TAR, ES TS , D 35 “ TETS , C1 C AS S , LM-S TAR, ES TS , “ TETS , C1 C AS S , LM-S TAR, ES TS , D 34 “ C1 C AS S , LM-S TAR, ES TS , “ TETS , C1 C AS S , LM-S TAR, ES TS , D 33 “ C1 , TETS C AS S , LM-S TAR, ES TS , “ C1 C AS S , LM-S TAR, ES TS , D 32 “ C1 , TETS , C AS S , LM-S TAR, ES TS , “ C1 , TETS , C AS S , LM-S TAR, ES TS , D 31 “ C1 C AS S , LM-S TAR, ES TS , “ C1 , TETS , C AS S , LM-S TAR, ES TS , D 30 “ C1 , TETS , C AS S , LM-S TAR, ES TS , “ C1 C AS S , LM-S TAR, ES TS , D 29 “ C1 , TETS , C AS S , LM-S TAR, ES TS , “ C1 , TETS , C AS S , LM-S TAR, ES TS , D 28 “ C1 C AS S , LM-S TAR, ES TS , “ C1 , TETS , C AS S , LM-S TAR, ES TS , Pin “ C1 , TETS , C AS S , LM-S TAR, ES TS , Slot “ C1 C AS S , LM-S TAR, ES TS , x2 S S W Port2 (continued) “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 52 Tab l e A 47 —1 x2 s wi tch CTI name x2 S S W 62 Port2 Legacy systems Recommended attributes C AS S , LM-S TAR, ES TS , “ TETS , C1 C AS S , LM-S TAR, ES TS , x2 S S W 63 Common x2 S S W 63 Port2 x2 S S W 64 Common x2 S S W 64 Port1 x2 S S W 64 Port2 x2 S S W 65 Common x2 S S W 65 Port1 x2 S S W 65 Port2 x2 S S W 66 Common x2 S S W 66 Port1 x2 S S W 66 Port2 x2 S S W 67 Common x2 S S W 67 Port1 x2 S S W 67 Port2 x2 S S W 68 Common x2 S S W 68 Port1 x2 S S W 68 Port2 x2 S S W 69 Common x2 S S W 69 Port1 x2 S S W 69 Port2 x2 S S W 70 Common x2 S S W 70 Port1 x2 S S W 70 Port2 x2 S S W 71 Common C1 x2 S S W 71 Port1 LM-S TAR, ES TS , C1 A 38 19 A 39 19 A 40 19 A 41 19 A 42 19 A 43 19 A 44 19 A 45 19 A 46 19 A 47 19 A 48 19 A 49 19 B 17 19 B 18 19 B 19 19 B 20 19 B 21 “ C1 , TETS LM-S TAR, TETS , ES TS , 19 “ C1 C AS S , LM-S TAR, ES TS , A 37 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , A 36 “ C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , A 35 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ C1 C AS S , LM-S TAR, ES TS , A 34 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , A 33 “ C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , A 32 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ C1 C AS S , LM-S TAR, ES TS , A 31 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , A 30 “ C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , A 29 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ C1 C AS S , LM-S TAR, ES TS , A 28 “ TETS , C1 C AS S , LM-S TAR, ES TS , 19 “ TETS , C1 C AS S , LM-S TAR, ES TS , Pin “ C1 C AS S , LM-S TAR, ES TS , Slot “ TETS , C1 C AS S , LM-S TAR, ES TS , x2 S S W 63 Port1 (continued) “ “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 53 I EEE Std 505 -2008 Tab l e A 47 —1 x2 s wi tch CTI name Legacy systems LM- S TAR, ES TS , C , x2 S S W 71 Port2 (continued) Recommended attributes TETS LM- S TAR, ES TS , C , TETS x2 S S W 72 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W 73 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W 74 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W 75 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W 76 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W 77 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM-S TAR, ES TS , C , TETS x2 S S W 78 Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W 79 Port1 LM-S TAR, ES TS , C1 “ LM-S TAR, ES TS , C1 , “ TETS LM- S TAR, ES TS , C , TETS x2 S S W Port1 LM-S TAR, ES TS , C1 “ LM- S TAR, ES TS , C , “ TETS IF TE, LM-S TAR, ES TS , TETS , C1 x2 S S W Port1 LM-S TAR, ES TS , C1 “ IF TE, LM-S TAR, ES TS , “ TETS , C1 IF TE, LM-S TAR, ES TS , x2 S S W Common TETS , C1 B 26 19 B 27 19 B 28 19 B 29 19 B 30 19 B 31 19 B 32 19 B 33 19 B 34 19 B 35 19 B 36 19 B 37 19 B 38 19 B 39 19 B 40 19 B 41 19 B 42 19 B 43 19 B 44 19 B 45 19 B 46 19 B 47 19 B 48 19 B 49 19 C 17 19 C 18 19 C 19 19 C 20 “ x2 S S W Common x2 S S W Port2 19 “ x2 S S W Common x2 S S W Port2 B 25 “ x2 S S W 79 Common x2 S S W 79 Port2 19 “ x2 S S W 78 Common x2 S S W 78 Port2 B 24 “ x2 S S W 77 Common x2 S S W 77 Port2 B 23 19 “ x2 S S W 76 Common x2 S S W 76 Port2 19 “ x2 S S W 75 Common x2 S S W 75 Port2 B 22 “ x2 S S W 74 Common x2 S S W 74 Port2 19 “ x2 S S W 73 Common x2 S S W 73 Port2 Pin “ x2 S S W 72 Common x2 S S W 72 Port2 Slot “ “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 54 Tab l e A 47 —1 x2 s wi tch CTI name x2 S S W Port1 x2 S S W Port2 Legacy systems (continued) Recommended attributes LM-S TAR, ES TS , C1 “ IF TE, LM-S TAR, ES TS , “ TETS , C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W 8 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W 90 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W 91 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W 92 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , x2 S S W 93 Common C1 C 26 19 C 27 19 C 28 19 C 29 19 C 30 19 C 31 19 C 32 19 C 33 19 C 34 19 C 35 19 C 36 19 C 37 19 C 38 19 C 39 19 C 40 19 C 41 19 C 42 19 C 43 19 C 44 19 C 45 19 C 46 19 D 17 19 D 18 19 D 19 19 D 20 19 D 21 19 D 22 19 D 23 “ x2 S S W 92 Common x2 S S W 92 Port2 19 “ x2 S S W 91 Common x2 S S W 91 Port2 C 25 “ x2 S S W 90 Common x2 S S W 90 Port2 19 “ x2 S S W Common x2 S S W Port2 C 24 “ x2 S S W 8 Common x2 S S W 8 Port2 C 23 19 “ x2 S S W Common x2 S S W Port2 19 “ x2 S S W Common x2 S S W Port2 C 22 “ x2 S S W Common x2 S S W Port2 19 “ x2 S S W Common x2 S S W Port2 Pin C 21 “ x2 S S W Common x2 S S W Port2 Slot 19 “ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 55 I EEE Std 505 -2008 Tab l e A 47 —1 x2 s wi tch CTI name x2 S S W 93 Port1 x2 S S W 93 Port2 Legacy systems (continued) Recommended attributes LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , C1 x2 S S W 94 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ C1 IF TE, LM-S TAR, TE TS , 19 D 25 19 D 26 19 D 27 19 D 28 19 D 29 19 D 30 19 D 31 19 D 32 19 D 33 “ x2 S S W 95 Common C1 x2 S S W 95 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ x2 S S W 95 Port2 Pin D 24 “ x2 S S W 94 Common x2 S S W 94 Port2 Slot 19 C1 IF TE, LM-S TAR, TE TS , “ x2 S S W 96 Common C1 x2 S S W 96 Port1 LM-S TAR, C1 “ IF TE, LM-S TAR, TE TS , “ x2 S S W 96 Port2 C1 19 D 34 x2 S S W 97 Common IF TE, LM-S TAR, C1 “ 19 D 35 x2 S S W 97 Port1 LM-S TAR, C1 “ 19 D 36 x2 S S W 97 Port2 IF TE, LM-S TAR, C1 “ 19 D 37 x2 S S W 98 Common IFTE, LM-S TAR, C1 “ 19 D 38 x2 S S W 98 Port1 LM-S TAR, C1 “ 19 D 39 x2 S S W 98 Port2 IF TE, LM-S TAR, C1 “ 19 D 40 x2 S S W 99 Common LM-S TAR, C1 “ 19 D 41 x2 S S W 99 Port1 “ “ 19 D 42 x2 S S W 99 Port2 “ “ 19 D 43 x2 S S W 0 Commo n “ “ 19 D 44 x2 S S W 0 P ort1 “ “ 19 D 45 x2 S S W 0 P ort2 “ “ 19 D 46 Tabl e A 48 —E TE g rou n d CTI name ETE GND Legacy systems N/A Recommended attributes Slot Pin Maximum voltage: 0 Vdc D5 ETE GND “ Maxi mum current: A “ D5 ETE GND “ “ 14 D5 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 56 Tabl e A 49 —F req u en cy s tan d ard CTI name 00 MHz ref Legacy systems LM-STAR Recommended attributes Max freq: 00 MHz Slot Pin ,PSHGDQFH ȍ IFTE, CASS, LM-STAR, IAIS MHz Ref Max voltage: V Stability: ppm/year Max freq: MHz 21 ,22 A 12 21 ,22 B 12 ,PSHGDQFH ȍ Max voltage: V Stability: ppm/year Tab l e A 50 —S ys tem tri g g er CTI name System Trigger STA System Ext Input System Trigger Shield System Trigger STA Sys Trigger A+ System Trigger Shield STA Sys Trigger ASystem Trigger STA Sys Trig A Shield System Trigger STA Sys Trig B+ System Trigger STA Sys Trig B– System Trigger STA Sys Trig B Shield Legacy systems CASS, LMSTAR, IAIS “ CASS, LMSTAR, IAIS “ CASS, LMSTAR CASS, LMSTAR, IAIS “ CASS, LMSTAR Recommended attributes Max voltage: ±5 V Max current: 00 mA Min pulse width: ns “ Max voltage: Diff ECL Max current: 50 mA Min period: ns “ “ “ “ “ Slot Pin 9 D 38 C 38 C 37 C 36 C 35 9 D 36 D 37 D 35 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 57 I EEE Std 505 -2008 Tab l e A 51 —I n te rru pts , i n terl o cks , an d s h u td own CTI name Legacy systems S ystem ID N/A S ystem ID N/A S ystem ID N/A S ystem ID Recommended attributes Slot Pin 18 A 37 “ 18 A 38 “ 18 A 39 N/A “ 18 A 40 S ystem ID N/A “ 18 B 37 S ystem ID N/A “ 18 B 38 S ystem ID N/A “ 18 B 39 S ystem ID N/A “ 18 B 40 S ystem ID N/A “ 18 C 40 28 A 34 UUT Interrupt TTL/GND CAS S , LM- S TAR, Max voltage: V IAIS , RAF Current: mA CAS S , LM- S TAR, UUT Interrupt “ 28 A 35 UUT Interrupt IAIS “ “ 28 A 36 UUT Interrupt “ “ 28 A 37 UUT Interrupt “ “ 28 B 34 UUT Interrupt “ “ 28 B 35 UUT Interrupt “ “ 28 B 36 UUT Interrupt “ “ 28 B 37 UUT Interrupt “ “ 28 C 34 UUT Interrupt “ “ 28 C 35 28 C 36 28 C 37 28 D 34 CAS S , LM- S TAR, UUT Interrupt Rtn1 IAIS , RAF UUT Interrupt Rtn2 LM-S TAR, I AIS UUT Intlk “ “ CAS S , LM- S TAR, J2 -D3 and J2 -D3 shall b e IAIS s horted together by the connection LM-S TAR, IAIS o f a UUT to the ID, and the “ UUTINTLK” global variab le should b e set in the TP S software If the UUT or ID is removed during tes ting and if the UUTINTLK glob al variab le is set b y the TP S , UUT power and stimulus is removed in accordance with either the default or TPS defined sequential shutdown file, UUT Intlk Rtn and TPS execution is aborted 28 D 35 Interlock ID Intlk J7 -A5 and J7 -B shall b e A 50 s horted together in the ID , and the “ IDOP EN” glob al variab le should b e s et in the TPS software I f the ID is opened during testing and if the IDOP EN glob al variab le is set b y the TP S , all UUT power and s timulus is removed in accordance with either the default or TPS defined sequential shutdown file, and TPS execution is aborted Interlock ID Intlk Rtn B 50 GP I Interlock N O C AS S , TE TS D5 GP I Interlo ck N C CAS S , TE TS C5 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 58 Tab l e A 51 —I n te rru pts , i n terl ocks , an d s h u td o wn CTI name Legacy systems (continued) Recommended attributes Slot Pin J3 -C4 and J3 -D43 shall b e s horted together in the ID , and the “ IDOP EN” glob al variab le should b e s et in the TPS software If the ID is opened during testing and if the IDOP EN glob al variab le is set b y the TP S , all UUT power and stimulus is removed in accordance with either the default or TPS defined sequential shutdown file, Interlock ID Intlk and TPS execution is aborted Interlock ID Intlk Rtn C 43 D 43 J1 -D5 and J1 -C5 shall b e s horted together in the ID , and the “ IDOP EN” glob al variab le should b e s et in the TPS software I f the ID is opened during testing and if the IDOP EN glob al variab le is s et b y the TP S , all UUT power and stimulus is removed in accordance with either the default or TPS defined sequential shutdown file, Interlock ID Intlk and TPS execution is aborted Interlock ID Intlk Rtn CAS S , LM- S TAR, J2 -D3 and J2 -C3 shall b e IAIS s horted together in the ID , and the 12 D 50 12 C 50 28 D 38 28 C 38 28 D 36 28 D 37 “ IDOP EN” glob al variab le should b e s et in the TPS software I f the ID is opened during testing and if the IDOP EN glob al variab le is set b y the TP S , all UUT power and stimulus is removed in accordance with either the default or TPS defined sequential shutdown file, Interlock ID Intlk Interlock ID Intlk Rtn UUT S hut Dwn and TPS execution is aborted LM-S TAR, IS I A CAS S , LM- S TAR, J2 -D3 and J28 -D3 should b e in IAIS parallel to the “EMER O FF - CAS S , LM- S TAR, UUT” b utton When shorted, all IAIS power and stimulus is removed fro m the UUT in accordance with either the default or TPS defined sequential shutdown file Also, the UUT test program is aborted and removed fro m the test queue UUT S hutdwn Rtn Tab l e A 52 —S afety g ro u n d CTI name Legacy systems Vo ltage: 5 V IFTE, CAS S Voltage: 5 V S afety GND S afety GND Recommended attributes IF TE, CAS S , ES TS Current: A Current: A Slot Pin A 20 C 20 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 59 I EEE Std 505 -2008 Annex B (i n form ati ve) Bibliography [B1] Automatic Test System Critical Interfaces Report, Release 1, 9/30/96, http://grouper.ieee.org/groups/scc20/HIWG/CIWG%20Report.doc [B2] DoD Instruction 5000.2, “Operation of the Defense Acquisition System,” May 12, 2003 12 [B3] EIA/ECA-310-E (2005), Cabinets, Racks, Panels, and Associated Equipment 13 [B4] IEEE/ASTM SI 10™-2002, American National Standard for Use of the International System of Units (SI): The Modern Metric System 14, 15 [B5] IEEE 100™, Seventh Edition New York, Institute of Electrical Electronics Engineers, Inc [B6] IEEE Std 260.1™-2004, IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units) [B7] IEEE Std 260.3™-1993 (Reaff 2006), IEEE Standard for Mathematical Signs and Symbols for Use in Physical Sciences and Technology [B8] IEEE Std 280™-1982, IEEE Standard Letter Symbols for Quantities Used in Electrical Science and Electrical Engineering [B9] IEEE Std 315™-1975 (Reaff 1993), IEEE Standard Graphic Symbols for Electrical and Electronics Diagrams (Including Reference Designation Letters) [B10] IEEE Std 945™-1984 (Reaff 2002), IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology [B11] IEEE Std 991™-1986 (Reaff 1994), IEEE Standard for Logic Circuit Diagrams [B12] IEEE Std 1014™-1987 (Reaff 2008); IEEE Standard for Versatile Backplane Bus: VMEBUS [B13] IEEE Std 1149.1™-2001 (Reaff 2008), IEEE Standard Access Port and Boundary-Scan Architecture [B14] New York: Institute of Electrical and Electronics Engineers, Inc [B15] New York: Institute of Electrical and Electronics Engineers, Inc [B16] New York: Institute of Electrical and Electronics Engineers, Inc Th e IEEE- SA IEEE- SA IEEE- SA A uth o ritative Stan dards Stan dards Stan dards Dictio n ary o f IEEE Stan dards Term s, Bo ard Bylaws Bo ard Op eratio n s Man ual, Co m p an io n 12 DoD Instruction available from Defense Technical Information Center (DTIC) (http://www.dtic.mil/whs/directives/index.html) 13 EIA/ECA publications are available from Global Engineering Documents, 15 Inverness Way East, Englewood, Colorado 80112, USA (http://global.ihs.com/) IEEE publications are available from the Institute of Electrical and Electronics Engineers Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http://standards.ieee.org/) 15 The IEEE standards or products referred to in this annex are trademarks owned by the Institute of Electrical and Electronics Engineers, Incorporated 14 Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y I EC 63003: 201 I EEE Std 505 -2008 [B1 7] IEEE Stan dards 60 Style M an ual New York: Institute of Electrical and Electronics Engineers, Inc [B1 8] Joint Service Automatic Test Systems Research and Development Integrated Product Team (ARI), government/industry Critical Interfaces Working Group; US AF-CIWG Contract Report, Washington, DC, 6/1 /98 [B1 9] MIL-C-8 73 , Rectangular Rack and Panel Connectors 16 [B20] MIL-DTL-5 02/1 79-1 0, Connectors, Printed Circuit Subassembly and Accessories [B21 ] MIL-HDBK-21 7, Reliability Prediction of Electronic Equipment [B22] MIL-PRF-28 00, General Specification for Test Equipment for Use with Electrical and Electronic Equipment 16 MIL publications are available from Customer Service, Defense Printing Service, 700 Robbins Ave , B ldg 4D, Philadelphia, PA 91 1 -5 094 and SAI Global, 61 Winters Ave, Paramus, NJ 0765 2, http: //www saiglobal com/ Au th o ri z e d l i cen s e d u s e l i m i te d to : U n i ve rs i ty o f Wate rl o o D o wn l o ad e d o n Apri l , at 0 : 47: U TC fro m I E E E Xpl o re R e s tri cti o n s appl y