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Tiêu đề: |
Emerging memories: resistive switching mechanisms and current status,” "Reports Prog. Phys |
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[2] F. Pan, C. Chen, Z. Wang, Y. Yang, J. Yang, and F. Zeng, “Nonvolatile resistive switching memories-characteristics, mechanisms and challenges,” Prog. Nat. Sci.Mater. Int., vol. 20, pp. 1–15, 2010 |
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Tiêu đề: |
Nonvolatile resistive switching memories-characteristics, mechanisms and challenges,” "Prog. Nat. Sci. "Mater. Int |
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[3] S.-C. Chen, T.-C. Chang, S.-Y. Chen, C.-W. Chen, S.-C. Chen, S. M. Sze, M.-J. Tsai, M.-J. Kao, and F.-S. Yeh, “Bipolar resistive switching of chromium oxide for resistive random access memory,” Solid. State. Electron., vol. 62, no. 1, pp. 40–43, 2011 |
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Tiêu đề: |
Bipolar resistive switching of chromium oxide for resistive random access memory,” "Solid. State. Electron |
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[4] S.-C. Chen, T.-C. Chang, S.-Y. Chen, H.-W. Li, Y.-T. Tsai, C.-W. Chen, S. M. Sze, F.-S. Yeh(Huang), and Y.-H. Tai, “Carrier Transport and Multilevel Switching Mechanism for Chromium Oxide Resistive Random-Access Memory,” Electrochem.Solid-State Lett., vol. 14, no. 2, p. H103, 2011 |
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Tiêu đề: |
Carrier Transport and Multilevel Switching Mechanism for Chromium Oxide Resistive Random-Access Memory,” "Electrochem. "Solid-State Lett |
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[5] D. B. Strukov and H. Kohlstedt, “Resistive switching phenomena in thin films: Materials, devices, and applications,” MRS Bull., vol. 37, no. 02, pp. 108–114, 2012 |
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Tiêu đề: |
Resistive switching phenomena in thin films: Materials, devices, and applications,” "MRS Bull |
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[6] U. Celano, L. Goux, R. Degraeve, A. Fantini, O. Richard, H. Bender, M. Jurczak, and W. Vandervorst, “Imaging the three-dimensional conductive channel in filamentary- based oxide resistive switching memory,” Nano Lett., vol. 15, no. 12, pp. 7970–7975, 2015 |
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Tiêu đề: |
Imaging the three-dimensional conductive channel in filamentary-based oxide resistive switching memory,” "Nano Lett |
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[7] K. M. Kim, D. S. Jeong, and C. S. Hwang, “Nanofilamentary resistive switching in binary oxide system; a review on the present status and outlook,” Nanotechnology, vol. 22, no. 25, p. 254002, 2011 |
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Tiêu đề: |
Nanofilamentary resistive switching in binary oxide system; a review on the present status and outlook,” "Nanotechnology |
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[8] X. Jiang, Z. Ma, H. Yang, J. Yu, W. Wang, W. Zhang, W. Li, J. Xu, L. Xu, K. Chen, X. Huang, and D. Feng, “Nanocrystalline Si pathway induced unipolar resistive switching behavior from annealed Si-rich SiN x /SiN y multilayers,” J. Appl. Phys., vol.116, no. 12, pp. 123705, 2014 |
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Tiêu đề: |
Nanocrystalline Si pathway induced unipolar resistive switching behavior from annealed Si-rich SiNx/SiNy multilayers,” "J. Appl. Phys |
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[9] L. Goux, P. Czarnecki, Y. Y. Chen, L. Pantisano, X. P. Wang, R. Degraeve, B. Govoreanu, M. Jurczak,D. J. Wouters, and L. Altimime, “Evidences of oxygen- mediated resistive-switching mechanism in TiN/HfO 2 /Pt cells,” Appl. Phys. Lett., vol.97, no. 24, p. 243509, 2010 |
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Tiêu đề: |
Evidences of oxygen-mediated resistive-switching mechanism in TiN/HfO2/Pt cells,” "Appl. Phys. Lett |
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[10] Q. Zhou, Q. Lu, X. Zhang, Y. Song, Y. Y. Lin, and X. Wu, “A study of copper oxide based resistive switching memory by conductive atom force microscope,” Appl. Surf.Sci., vol. 271, pp. 407–411, 2013 |
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Tiêu đề: |
A study of copper oxide based resistive switching memory by conductive atom force microscope,” "Appl. Surf. "Sci |
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[11] E. Souchier, F. D ‟acapito, P. Noé, P. Blaise, M. Bernard, and V. Jousseaume, “The role of the local chemical environment of Ag on the resistive switching mechanism of conductive bridging random access memories,” Phys. Chem. Chem. Phys. Phys.Chem. Chem. Phys, vol. 17, no. 17, pp. 23931–23937, 2015 |
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Tiêu đề: |
The role of the local chemical environment of Ag on the resistive switching mechanism of conductive bridging random access memories,” "Phys. Chem. Chem. Phys. Phys. "Chem. Chem. Phys |
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[12] K. C. Sekhar, K. Kamakshi, S. Bernstorff, and M. J. M. Gomes, “Effect of annealing temperature on photoluminescence and resistive switching characteristics of ZnO/Al 2 O 3 multilayer nanostructures,” J. Alloys Compd., vol. 619, pp. 248–252, 2015 |
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Tiêu đề: |
Effect of annealing temperature on photoluminescence and resistive switching characteristics of ZnO/Al2O3 multilayer nanostructures,” "J. Alloys Compd |
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[13] P. Bousoulas, J. Giannopoulos, K. Giannakopoulos, P. Dimitrakis, and D. Tsoukalas, “Memory programming of TiO 2-x films by Conductive Atomic Force Microscopy evidencing filamentary resistive switching,” Appl. Surf. Sci., vol. 332, pp. 55–61, 2015 |
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Tiêu đề: |
Memory programming of TiO2-x films by Conductive Atomic Force Microscopy evidencing filamentary resistive switching,” "Appl. Surf. Sci |
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[14] L. Zhu, J. Zhou, Z. Guo, and Z. Sun, “An overview of materials issues in resistive random access memory,” J. Mater., vol. 1, no. 4, pp. 1–11, 2015 |
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Tiêu đề: |
An overview of materials issues in resistive random access memory,” "J. Mater |
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[15] H. Yu, M. Kim, Y. Kim, J. Lee, K. K. Kim, S. J. Choi, and S. Cho, “Al-doped ZnO as a switching layer for transparent bipolar resistive switching memory,” Electron.Mater. Lett., vol. 10, no. 2, pp. 321–324, 2014 |
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Tiêu đề: |
Al-doped ZnO as a switching layer for transparent bipolar resistive switching memory,” "Electron. "Mater. Lett |
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[16] I. Chung, K. Cho, J. Yun, and S. Kim, “Flexible resistive switching memory devices composed of solution-processed GeO 2 :S films,” Microelectron. Eng., vol. 97, pp.122–125, 2012 |
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Tiêu đề: |
Flexible resistive switching memory devices composed of solution-processed GeO2:S films,” "Microelectron. Eng |
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[17] J.-M. Hu, Z. Li, L.-Q. Chen, and C.-W. Nan, “High-density magnetoresistive random access memory operating at ultralow voltage at room temperature,” Nat. Commun., vol. 2, p. 553, 2011 |
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Tiêu đề: |
High-density magnetoresistive random access memory operating at ultralow voltage at room temperature,” "Nat. Commun |
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[18] C. Ye, J. Wu, G. He, J. Zhang, T. Deng, P. He, and H. Wang, “Physical Mechanism and Performance Factors of Metal Oxide Based Resistive Switching Memory: A Review,” J. Mater. Sci. Technol., vol. 32, no. 1, pp. 1–11, 2016 |
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Tiêu đề: |
Physical Mechanism and Performance Factors of Metal Oxide Based Resistive Switching Memory: A Review,” "J. Mater. Sci. Technol |
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[19] H. Akinaga and H. Shima, “Resistive Random Access Memory (RRAM) Based on Metal Oxides,” Proc. IEEE, vol. 98, no. 12, pp. 2237–2251, 2010 |
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Tiêu đề: |
Resistive Random Access Memory (RRAM) Based on Metal Oxides,” "Proc. IEEE |
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[20] R. Waser, R. Dittmann, C. Staikov, and K. Szot, “Redox-based resistive switching memories nanoionic mechanisms, prospects, and challenges,” Adv. Mater., vol. 21, no. 25–26, pp. 2632–2663, 2009 |
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Tiêu đề: |
Redox-based resistive switching memories nanoionic mechanisms, prospects, and challenges,” "Adv. Mater |
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