Tài liệu tham khảo |
Loại |
Chi tiết |
1. Maxwell, P. C., R. C. Aitken, V. Johansen, and I. Chiang, The Effectiveness of I DDQ , Functional and Scan Tests: How Many Fault Coverages Do We Need?, Proc. Int. Test Conf., October 1992, pp. 168–177 |
Sách, tạp chí |
Tiêu đề: |
I"DDQ,Functional and Scan Tests: How Many Fault Coverages Do We Need?, "Proc. Int. Test"Conf |
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2. Goel, P., J. Grason, and D. Siewiorek, Structural Factors in Fault Dominance for Combinational Logic Circuits, Proc. Fault Tolerant Comput. Symp., 1971 |
Sách, tạp chí |
Tiêu đề: |
Proc. Fault Tolerant Comput. Symp |
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3. Armstrong, D. B., On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets, IEEE Trans. Electron. Comput., Vol. EC-15, No. 1, February 1966, pp. 66–73 |
Sách, tạp chí |
Tiêu đề: |
IEEE Trans. Electron. Comput |
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4. Mei, K. C. Y, Bridging and Stuck-at Faults, IEEE Trans. Comput., Vol. C-23, No. 7, July 1974, pp. 720–727 |
Sách, tạp chí |
Tiêu đề: |
IEEE Trans. Comput |
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5. Son, K., and D. K Pradhan, Design of Programmable Logic Arrays for Testability, Proc.IEEE Test Conf., 1980, pp. 163–166 |
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Tiêu đề: |
Proc."IEEE Test Conf |
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6. Szygenda, S. A., and A. A. Lekkos, Integrated Techniques for Functional and Gate-Level Digital Logic Simulation, Proc. 10th Des. Autom. Conf., pp. 159–172 |
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Tiêu đề: |
Proc. 10th Des. Autom. Conf |
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7. Thomas, J. J., Common Misconceptions in Digital Test Generation, Comput. Des., January 1977, pp. 89–94 |
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8. Wadsack, R. L., Fault Modelling and Logic Simulation of CMOS and MOS Integrated Circuits, Bell Syst. Tech. J., Vol. 57, No. 5, May–June 1978, pp. 1449–1474 |
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Tiêu đề: |
Bell Syst. Tech. J |
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9. El Ziq, Y. M., Automatic Test Generation for Stuck-Open Faults in CMOS VLSI, Proc.18th D.A. Conf., 1981, pp. 347–354 |
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Tiêu đề: |
Proc."18th D.A. Conf |
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10. Beh, C. C. et al., Do Stuck Fault Models Reflect Manufacturing Defects?, Proc. IEEE Test Conf., 1982, pp. 35–42 |
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Tiêu đề: |
Proc. IEEE Test"Conf |
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11. Wadsack, R. L., Fault Coverage in Digital Integrated Circuits, Bell Syst. Tech. J., May–June 1978, pp. 1475–1488 |
Sách, tạp chí |
Tiêu đề: |
Bell Syst. Tech. J |
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12. Miczo, A., Fault Modelling for Functional Primitives, Proc. IEEE Test Conf., 1982, pp. 43–49 |
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Tiêu đề: |
Proc. IEEE Test Conf |
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13. Wadsack, R. L., Design Verification and Testing of the WE 32,100 CPUs, IEEE Des. Test, August 1984, pp. 66–75 |
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14. Maxwell, Peter C., Reductions in Quality Caused by Uneven Fault Coverage of Different Areas of an Integrated Circuit, IEEE Trans. Comput.-Aided Des. Int. Circuits Syst., Vol. 14, No. 5, May 1995, pp. 603–607 |
Sách, tạp chí |
Tiêu đề: |
IEEE Trans. Comput.-Aided Des. Int. Circuits"Syst |
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15. Chang, H. Y., E. Manning, and G. Metze, Fault Dictionaries, Fault Diagnosis of Digital Systems, Chapter 5, John Wiley & Sons, New York, 1970 |
Sách, tạp chí |
Tiêu đề: |
Fault Diagnosis of Digital"Systems |
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16. Megill, N., Techniques for Reducing Pattern Count for Functional Testing, Proc. 1979 Int.Test Conf., pp. 90–94 |
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Tiêu đề: |
Proc. 1979 Int."Test Conf |
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17. Miczo, A., Enhanced Test Through Improved RTL Code Coverage, Proc. High Level Des.Validation & Test Workshop, November 1997, pp. 99–104 |
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Tiêu đề: |
Proc. High Level Des."Validation & Test Workshop |
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18. Snethen, T. J., Simulator-Oriented Fault Test Generator, Proc. 14th D.A. Conf., 1977, pp. 88–93 |
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Tiêu đề: |
Proc. 14th D.A. Conf |
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19. Roth, J. P., Diagnosis of Automata Failures: A Calculus and a Method, IBM J. Res. Dev., Vol. 10, No. 4, July 1966, pp. 278–291 |
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20. Roth, J. P. et al., Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits, IEEE Trans. Electron. Comput., Vol. EC-16, No. 5, October 1967, pp. 567–580 |
Sách, tạp chí |
Tiêu đề: |
IEEE Trans. Electron. Comput |
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