Digital logic testing and simulation phần 6 pdf

Digital logic testing and simulation phần 6 pdf

Digital logic testing and simulation phần 6 pdf

... input to S. The 16 faults now appear as SA0 and SA1 faults on the outputs of P and R and on each of the three inputs to S and T. The SA0 faults at the inputs of AND gates S and T are equivalent ... or hundreds of thousands of logic gates and numerous complex state machines engaged in extremely detailed and sometimes lengthy “hand-shaking” sequences tend to be quite random-r...

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Digital logic testing and simulation phần 1 pdf

Digital logic testing and simulation phần 1 pdf

... : Miczo, Alexander. Digital logic testing and simulation / Alexander Miczo—2nd ed. p. cm. Rev. ed. of: Digital logic testing and simulation. c19 86. Includes bibliographical references and index. ... index. ISBN 0-471-43995-9 (cloth) 1. Digital electronics Testing. I. Miczo, Alexander. Digital logic testing and simulation II. Title. TK7 868 .D5M49 2003 62...

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Digital logic testing and simulation phần 3 ppsx

Digital logic testing and simulation phần 3 ppsx

... automated. F Z X 1 Y 1 Y 2 X 2 119 Digital Logic Testing and Simulation , Second Edition , by Alexander Miczo ISBN 0-471-43995-9 Copyright © 2003 John Wiley & Sons, Inc. CHAPTER 3 Fault Simulation 3.1 ... , and Y 2 . 1 46 FAULT SIMULATION There are two FOs, H 2 and H 3 , in the ELIST of H 0 that differ from H 0 and are not in the RLIST, so it is...

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Digital logic testing and simulation phần 4 doc

Digital logic testing and simulation phần 4 doc

... gate Q if ((OR/NAND and C_O == 1) or (AND/ NOR and C_O == 0)) choose new objective net n; //input to Q // n = X, and EASIEST to control else // ((OR/NAND and C_O == 0) or (AND/ NOR and C_O == 1)) choose ... 1s on the outputs of 5, 6, and 7. A critical path now exists from input 2, through gates 5 and 8, to the output F. Critical paths also exist from the outputs of gates 6 a...

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Digital logic testing and simulation phần 5 potx

Digital logic testing and simulation phần 5 potx

... February 1 965 , pp. 76 79. 2. Putzolu, G., and J. P. Roth, A Heuristic Algorithm for the Testing of Asynchronous Circuits, IEEE Trans. Comput., Vol. C20, No. 6, June 1971, pp. 63 9 64 7. 3. Bouricius, ... 6, June 19 76, pp. 63 0 63 6. 5. Marlett, Ralph, EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits, Proc. 15th Des. Autom. Conf., June 1978, pp. 332–339....

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Digital logic testing and simulation phần 7 pps

Digital logic testing and simulation phần 7 pps

... problem for scan. Memory and analog circuits must be iso- lated from the digital logic, circuit partitioning becomes critical, and testing strategies for memories and random logic must now coexist. Sometimes ... the IEEE 1149.1 boundary scan standard. In this section we first look, briefly, at the NAND tree and then look in detail at boundary scan. 8 .6. 1 The NAND Tree The NAND...

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Digital logic testing and simulation phần 8 pps

Digital logic testing and simulation phần 8 pps

... If it passes, the maintenance routines assume the error 513 Digital Logic Testing and Simulation , Second Edition , by Alexander Miczo ISBN 0-471-43995-9 Copyright © 2003 John Wiley & ... megabytes and included test commands, signatures, and a logic model of the part. Fault coverage for the TCMs ranged from 94.5% up to 96. 5%. The test application time ranged from 1...

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Digital logic testing and simulation phần 9 docx

Digital logic testing and simulation phần 9 docx

... 1987, pp. 66 3 66 8. 16. Sridhar, T., A New Parallel Test Approach for Large Memories, IEEE Des. Test, Vol. 3, No. 4, August 19 86, pp. 15–22. 17. Altnether, J. P., and R. W. Stensland, Testing Redundant ... gate and source f GD gate and drain f SD source and drain f BS bulk and source f BD bulk and drain f BD bulk and gate I DDQ VERSUS BURN-I...

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Digital logic testing and simulation phần 10 pps

Digital logic testing and simulation phần 10 pps

... DSP Applications, IEEE Des. Test, September 1993, pp. 16 28. 6. Syzgenda, S. A., and A. A. Lekkos, Integrated Techniques for Functional and Gate-Level Digital Logic Simulation, Proc. 10th Design Automation ... 168 –177. 30. Blackett, R. K., As Good as Gold, IEEE Spectrum, Vol. 33, No. 6, June 19 96, pp. 68 –71. 31. Clarke, E. M., and R. P. Kurshan, Computer-aided Verification, IE...

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TRUYỀN HÌNH SỐ VÀ MULTIMEDIA (Digital Compressed Television and Multimedia) - Phần 5 pdf

TRUYỀN HÌNH SỐ VÀ MULTIMEDIA (Digital Compressed Television and Multimedia) - Phần 5 pdf

... 5.1 1 2 3 4 5 6 Thông số Số dòng frame Số dòng tích cực frame Quét Tỉ lệ khuôn hình Tần số mành (Hz) tần số dóng 1125 /60 (Mỹ) 1125 1035 2:1 16: 9 60 33.750 1250/50 (Châu Aâu) 1250 1152 1:1(2:1) 16: 9 50 62 .500 Ảnh ... dóng 1125 /60 (Mỹ) 1125 1035 2:1 16: 9 60 33.750 1250/50 (Châu Aâu) 1250 1152 1:1(2:1) 16: 9 50 62 .500 Ảnh tích cực 64 0x480 720x483 Quét 1:1 2:1 VGA480 CCIR...

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