Cabling Standard - TIA 568 B.2 - Addendum 10 - Draft 2.0

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ANY AND ALL WARRANTIES CONCERNING THE ACCURACY OF THE CONTENTS, ITS FITNESS OR APPROPRIATENESS FOR A PARTICULAR PURPOSE OR USE, ITS MERCHANTABILITY AND ITS NON-INFRINGEMENT OF ANY THIRD PARTY’S INTELLECTUAL PROPERTY RIGHTS TIA EXPRESSLY DISCLAIMS ANY AND ALL RESPONSIBILITIES FOR THE ACCURACY OF THE CONTENTS AND MAKES NO REPRESENTATIONS OR WARRANTIES REGARDING THE CONTENT’S COMPLIANCE WITH ANY APPLICABLE STATUTE, RULE OR REGULATION, OR THE SAFETY OR HEALTH EFFECTS OF THE CONTENTS OR ANY PRODUCT OR SERVICE REFERRED TO IN THE DOCUMENT OR PRODUCED OR RENDERED TO COMPLY WITH THE CONTENTS NOTICE OF DISCLAIMER AND LIMITATION OF LIABILITY 02/04/05 10 11 12 13 SP-3-4426-AD10 to be published as TIA-568-B.2-1 Draft 2.0 TIA SHALL NOT BE LIABLE FOR ANY AND ALL DAMAGES, DIRECT OR INDIRECT, ARISING FROM OR RELATING TO ANY USE OF THE CONTENTS CONTAINED HEREIN, INCLUDING WITHOUT LIMITATION ANY AND ALL INDIRECT, SPECIAL, INCIDENTAL OR CONSEQUENTIAL DAMAGES (INCLUDING DAMAGES FOR LOSS OF BUSINESS, LOSS OF PROFITS, LITIGATION, OR THE LIKE), WHETHER BASED UPON BREACH OF CONTRACT, BREACH OF WARRANTY, TORT (INCLUDING NEGLIGENCE), PRODUCT LIABILITY OR OTHERWISE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGES THE FOREGOING NEGATION OF DAMAGES IS A FUNDAMENTAL ELEMENT OF THE USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS NOTICE {TIA staff to insert applicable text here.} PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 10 11 TRANSMISSION PERFORMANCE SPECIFICATIONS FOR 4-PAIR 100 Ω AUGMENTED CATEGORY CABLING TABLE OF CONTENTS INTRODUCTION PURPOSE AND SCOPE .1 NORMATIVE REFERENCES DEFINITIONS, ACRONYMS & ABBREVIATIONS 4.1 Definitions 12 13 14 Acronyms and abbreviations 4.2 TEST CONFIGURATIONS 5.1 Component test configurations 15 16 17 18 19 20 21 22 5.2 Cabling test configurations COMPONENTS .4 6.1 Recognized cable 6.1.1 Horizontal cable 6.1.2 Cable for cords 6.1.3 Backbone cable 6.1.4 Bundled and hybrid cable 6.2 Recognized connecting hardware 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 6.3 Cords TRANSMISSION REQUIREMENTS .6 7.1 Insertion loss 7.1.1 Cable insertion loss 7.1.2 Connecting hardware insertion loss 7.1.3 Cabling insertion loss 7.1.3.1 Channel insertion loss 7.1.3.2 Permanent link insertion loss 7.2 NEXT loss 10 Pair-to-pair NEXT loss 10 7.2.1 7.2.1.1 Cable pair-to-pair NEXT loss 10 Connecting hardware pair-to-pair NEXT loss 11 7.2.1.2 7.2.1.3 Work area, equipment, and patch cord pair-to-pair NEXT loss 12 7.2.1.4 Channel pair-to-pair NEXT loss 14 Permanent link pair-to-pair NEXT loss 15 7.2.1.5 7.2.2 Power sum NEXT loss 16 7.2.2.1 Cable power sum NEXT loss 16 7.2.2.2 Channel power sum NEXT loss 17 Permanent link power sum NEXT loss 18 7.2.2.3 7.3 ELFEXT and FEXT loss 19 7.3.1 Pair-to-pair ELFEXT 19 7.3.1.1 Cable pair-to-pair ELFEXT 19 Connecting hardware pair-to-pair FEXT loss 20 7.3.1.2 7.3.1.3 Channel pair-to-pair ELFEXT 21 7.3.1.4 Permanent link pair-to-pair ELFEXT 22 Power sum ELFEXT 23 7.3.2 i PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 7.3.2.1 Cable power sum ELFEXT 23 Channel power sum ELFEXT 24 7.3.2.2 7.3.2.3 Permanent link power sum ELFEXT 25 7.4 Return loss 26 7.4.1 Horizontal cable return loss 26 7.4.2 Stranded conductor cable return loss 27 7.4.3 Connecting hardware return loss 28 Work area, equipment, and patch cord return loss 29 7.4.4 7.4.5 Cabling return loss 30 7.4.5.1 Channel return loss 30 7.4.5.2 Permanent link return loss 31 7.5 Propagation delay/delay skew 32 7.5.1 Cable propagation delay 32 7.5.2 Cabling propagation delay 32 7.5.3 Cable propagation delay skew 32 7.5.4 Cabling propagation delay skew 33 7.6 Balance 33 7.6.1 Transverse conversion loss (TCL) 33 7.6.1.1 Cable TCL 33 7.6.1.2 Connecting hardware TCL 34 7.6.2 Equal Level transverse conversion transfer loss (ELTCTL) 34 7.6.2.1 Cable ELTCTL 35 7.6.2.2 Connecting hardware TCTL 36 7.7 ANEXT loss and PSANEXT loss 36 7.7.1 Cable PSANEXT loss 36 7.7.2 Connecting hardware PSANEXT loss 36 7.7.3 Channel PSANEXT loss 37 7.7.4 Permanent link PSANEXT loss 37 7.8 Average ANEXT loss and PSANEXT loss 38 7.8.1 Average channel PSANEXT loss 38 7.9 AFEXT loss, AELFEXT, and PSAELFEXT 39 7.9.1 Cable PSAELFEXT 39 7.9.2 Connecting hardware PSAFEXT loss 39 7.9.3 Channel PSAELFEXT 39 Permanent Link PSAELFEXT 40 7.9.4 7.10 Average AELFEXT and PSAELEXT loss 40 7.10.1 Channel PSAELFEXT 40 Annex A Cabling measurement requirements (normative) 41 A.1 General 41 40 41 42 A.2 Test setup and apparatus required 41 Annex B Cable ANEXT loss and AFEXT loss reference test procedure (normative) 43 B.1 Purpose 43 43 B.2 Equipment 43 44 B.3 Procedure 43 45 46 47 48 B.4 Results 43 Annex C Connecting hardware ANEXT loss and AFEXT loss reference test procedure (normative) 44 C.1 Purpose 44 ii PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) C.2 Measurement procedure 44 C.3 Network analyzer and test fixture settings 44 C.4 Measurement floor 44 C.5 DUT setup for ANEXT loss and AFEXT loss measurement 44 C.6 Region of influence 46 C.7 Power sum ANEXT loss and AFEXT loss calculation 46 Annex D Channel ANEXT loss and AFEXT loss laboratory measurement procedures (normative) 47 D.1 General 47 10 D.2 Termination of pairs 47 11 D.3 Channel construction 47 12 D.4 Determining number of disturbing components 48 13 D.5 Determining significance 48 14 D.6 Victim and disturbing channel configuration 48 15 16 17 D.7 Channel ANEXT loss and AFEXT loss measurements and computations 49 Annex E Field measurement method for alien crosstalk (normative) 50 E.1 General 50 18 E.2 Frequency range 50 19 E.3 Test parameters 50 20 E.4 Test configurations 50 21 22 23 24 25 26 27 28 29 30 E.5 Test equipment for measuring alien crosstalk in installed cabling 50 E.5.1 Channel testing 50 E.5.2 Permanent link testing 51 E.5.3 Measurement floor of the test device and patch/test cord PSANEXT loss 51 E.5.4 Measurement floor of the test device for the channel test configuration 51 E.5.5 Measurement floor of the test device with permanent link adapter test cords 52 E.6 Alien Crosstalk measurements 52 Measuring PSANEXT loss in the channel configuration 52 E.6.1 E.6.2 Measuring PSAFEXT loss in the channel configuration 53 E.7 Processing measurement data 55 31 32 33 34 35 36 E.8 Power sum alien crosstalk test strategy 56 E.8.1 General guidelines for power sum alien crosstalk testing 56 Annex F Modeling configurations (informative) 57 F.1 General 57 Annex G Modular plug cord test procedure (normative) 58 G.1 General 58 37 G.2 Network analyzer test configuration 58 38 G.3 Augmented category modular plug cord test procedure 59 39 40 41 G.4 Augmented category modular plug cord test head requirements 59 G.4.1 Augmented category modular cord test head NEXT loss 59 Augmented category modular cord test head FEXT loss 60 G.4.2 iii PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) G.4.3 Augmented cCategory modular cord test head return loss 60 Annex H Connecting hardware NEXT loss, FEXT loss, return loss, and insertion loss measurement procedures (normative) 61 H.1 General 61 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 H.2 Test setup and apparatus 61 H.2.1 Test balun characteristics 61 H.2.2 Impedance matching terminations 61 Test fixture common mode impedance match 61 H.2.2.1 H.2.2.2 Balun terminations 61 H.2.2.3 Resistor terminations 61 H.3 Modular outlet test considerations 62 H.3.1 Test plug construction 62 H.3.2 Test plug qualification 62 NEXT loss, FEXT loss and return loss test plug qualification procedure 62 H.3.2.1 H.3.3 Plug direct measurement fixture 63 H.3.4 Connecting hardware NEXT loss testing 63 H.3.5 Procedure for terminating a test plug to direct measurement test head 64 H.3.6 Augmented category modular test plug NEXT loss requirements 65 H.3.7 Augmented category NEXT loss measurement reproducibility between labs 67 H.4 Augmented category Test plug FEXT loss 68 H.4.1 Augmented category FEXT loss measurement reproducibility between labs 68 H.5 Test plug return loss testing 69 H.5.1 Return loss test lead considerations 69 H.5.2 Test Plug Return loss requirements 69 H.5.3 Test plug return Loss measurement procedure 69 H.5.4 Return loss lab-to-lab measurement accuracy 69 Annex I Impedance controlled measurement fixture (normative) 70 I.1 General 70 29 I.2 30 31 32 33 34 35 I.3 Test fixture calibration procedure 72 I.3.1 Open short and load calibration 72 I.3.2 Through calibration 73 Test lead return loss measurement using pyramid impedance management fixture 73 I.4 I.5 Termination of inactive pairs for FEXT loss measurement 74 Direct measurement fixture detailed construction 74 I.6 36 I.7 Test plug delay and port extension 75 37 I.8 Calibration and reference plane location 75 38 I.9 Network analyzer settings 75 39 I.10 Measurements 76 40 I.11 Alternative port extension procedure 77 Additional components for connection to a network analyzer 72 41 iv PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 LIST OF FIGURES Figure - Supplemental schematic representation of a channel test configuration Figure - Supplemental schematic representation of a permanent link test configuration Figure A.1 - Measurement configurations for test balun qualification 42 Figure B.1 - Six-around-one cable test configuration 43 Figure C.1 - Connecting hardware ANEXT loss measurement setup 45 Figure D.1 - Example of a “6 around 1” cable arrangement in a channel 48 Figure D.2 - Connector arrangement from an 8-port panel, in which of the connectors are significant disturbers 48 Figure E.1 - Schematic diagram of the measurement floor of the test device 51 Figure E.2 - Testing the measurement floor with permanent link adapters 52 Figure E.3 - Schematic diagram to measure channel PSANEXT loss 52 Figure E.4 - Schematic diagram for channel PSAFEXT measurement 53 Figure E.5 - Measurement of the insertion loss of the victim cable and return path 53 Figure E.6 - Alien FEXT loss measurement when separate measurement signaling path is available 54 Figure E.7 - Example of extrapolating alien ELFEXT data when combined insertion loss of victim link and signal feedback link causes alien FEXT measurements to reach the measurement floor 54 Figure F.1 - Channel and permanent link test configurations 57 Figure G.1 - Network analyzer configuration 58 Figure H.1 - Plug direct measurement fixture 63 Figure H.2 - Test plug/direct measurement fixture with impedance controlled test fixture 64 Figure I.1 - Test head assembly THI3KIT with baluns attached 70 Figure I.2 - Test head assembly showing foil tape applied to baluns and shielding (optional) between baluns 72 Figure I.3 - Load calibration adapter arrangement 72 Figure I.4 - Through calibration 73 Figure I.5 - Test setup for measurement of test lead return loss 73 Figure I.6 - Exploded assembly of the coaxial termination reference test head 74 Figure I.7 - Detailed view of the coaxial termination reference test head interface 75 Figure I.8 - Example of coaxial test head shorting plug 77 LIST OF TABLES Table 1- Matrix of backward compatible mated component performance Table - Augmented category cable insertion loss @ 20 °C ± 3°C (68° F ± 5.5 °F) Table – Augmented category connecting hardware insertion loss Table – Augmented category channel insertion loss Table – Augmented category permanent link insertion loss Table - Augmented category cable NEXT loss @ 20 °C ± °C (68 °F ± 5.5° F), worst pair-topair 10 Table – Augmented category connecting hardware NEXT loss, worst pair-to-pair 11 Table – Augmented category connecting hardware NEXT loss, worst pair-to-pair 11 Table - Mated NEXT loss assigned to local and remote patch cord test adapter 12 Table 10 - Example Augmented Category modular plug cord NEXT loss limits, dB 13 Table 11 – Augmented category channel NEXT loss requirements, worst pair-to-pair 14 Table 12 – Augmented category channel NEXT loss, worst pair-to-pair 14 Table 13 – Augmented category channel NEXT loss, worst pair-to-pair (field measurements) 15 Table 14 – Augmented category permanent link NEXT loss requirements, worst pair-to pair 15 Table 15 – Augmented category permanent link NEXT loss, worst pair-to pair 15 Table 16 - Augmented category cable power sum NEXT loss @ 20 °C ± °C (68 °F ± 5.5° F)16 v PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 Table 17 – Augmented category channel PSNEXT loss 17 Table 18 – Augmented category channel PSNEXT loss 17 Table 19 – Augmented category channel PSNEXT loss (field measurements) 18 Table 20 – Augmented category permanent link power sum NEXT loss requirements 18 Table 21 – Augmented category permanent link power sum NEXT loss values 18 Table 22 – Augmented category cable ELFEXT @ 20 °C ± °C (68 °F ± 5.5 °F), worst pair-to-pair 19 Table 23 – Augmented category connecting hardware FEXT loss, worst pair-to-pair 20 Table 24 – Augmented category channel ELFEXT, worst pair-to-pair 21 Table 25 – Augmented category permanent link ELFEXT, worst pair-to-pair 22 Table 26 – Augmented category permanent link ELFEXT, worst pair-to-pair values 22 Table 27 - Augmented category cable PSELFEXT @ 20 °C ± °C (68 °F ± 5.5 °F) 23 Table 28 – Augmented category channel PSELFEXT 24 Table 29 – Augmented category permanent link PSELFEXT requirements 25 Table 30 – Augmented category permanent link power sum ELFEXT values 25 Table 31 - Augmented category horizontal cable return loss @ 20°C ± 3°C (68° F ± 5.5° F), for a length of 100 m (328 ft) 26 Table 32 - Augmented category solid conductor cable return loss at 20 °C ± °C (68 °F ± 5.5 °F), for a length of 100 m (328 ft) 26 Table 33 - Augmented category stranded conductor cable return loss requirements at 20 °C ± °C (68 °F ± 5.5 °F), for a length of 100 m (328 ft) 27 Table 34 - Augmented category stranded conductor cable return loss at 20 °C ± °C (68 °F ± 5.5 °F),f or a length of 100 m (328 ft) 27 Table 35 – Augmented category connecting hardware return loss 28 Table 36 - Augmented category connecting hardware return loss 28 Table 37 - Augmented category modular patch cord return loss 29 Table 38 - Augmented category work area, equipment, and patch cord return loss 29 Table 39 – Augmented Category channel return loss 30 Table 40 – Augmented category channel return loss 30 Table 41 – Augmented category permanent link return loss 31 Table 42 – Augmented category permanent link return loss 31 Table 43 - Propagation delay and delay skew for augmented category cable at 20 °C ± °C (68 °F ± 5.5 °F) 32 Table 44 – Augmented category cable TCL 33 Table 45 – Augmented category connecting hardware TCL 34 Table 46 – Augmented category cable ELTCTL 35 Table 47 – Augmented category cable ELTCTL 35 Table 48 – Augmented category connecting hardware TCTL 36 Table 49 – Augmented category channel PSANEXT loss requirements at 20 °C ± °C (68 °F ± 5.5 °F) 37 Table 50 – Augmented category channel PSANEXT loss at 20 °C ± °C (68 °F ± 5.5 °F) 37 Table 51 – Augmented category channel average PSANEXT loss requirements at 20 °C ± °C (68 °F ± 5.5 °F) 38 Table 52 – Augmented category channel average PSANEXT loss at 20 °C ± °C (68 °F ± 5.5 °F) 38 Table 53 – Augmented category channel PSAELFEXT at 20 °C ± °C (68 °F ± 5.5 °F) 39 Table 54 – Augmented category channel average PSAELFEXT loss requirements at 20 °C ± °C (68 °F ± 5.5 °F) 40 Table 55 – Augmented category channel average PSAELFEXT loss at 20 °C ± °C (68 °F ± 5.5 °F) 40 Table A.1 - Test balun performance characteristics 41 Table G.1 - Augmented Category modular cord test head return loss 60 Table H.1 - Direct measurement fixture residual NEXT loss and return loss 63 vi PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 10 11 Table H.2 – Augmented category de-embedded test plug NEXT loss limits 65 Table H.3 – Augmented Category de-embedded test plug NEXT loss range 66 Table H.4 – Augmented category FEXT loss ranges for category NEXT loss test plugs 67 Table H.5 – Test plug NEXT loss measurement reproducibility between laboratories 67 Table H.6 – Augmented Category test plug FEXT loss ranges 68 Table H.7 – Test plug FEXT loss measurement reproducibility between laboratories 68 Table I.1 - Test fixture kit 71 Table I.2 - Test head assembly, NEXT-FEXT kit 71 Table I.3 - Impedance controlled test fixture, detailed part list 71 Table I.4 – Coaxial termination reference head component list 74 vii PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 FOREWORD (This foreword is not part of the Standard) In 2003, the Telecommunications Industry Association (TIA) developed objectives for augmented category cabling intended to support 10 Gigabit applications over a distance of 100 meters At the request of the Institute of Electrical and Electronics Engineers (IEEE) 802.3 Committee, TIA agreed to specify augmented category cabling systems and components to 500 MHz in order to support 10GBASE-T The project was assigned to TR-42.7 under Engineering Committee TR-42 The TR-42.7 Sub-Committee cooperated with several groups related to this activity TIA standards documents are developed within the Technical Committees of the TIA and the standards coordinating committees of the TIA standards board Members of the committees serve voluntarily and without commission The companies that they represent are not necessarily members of the TIA The standards developed within the TIA represent a consensus of the broad expertise on the subject This expertise comes from within the TIA as well as those outside of the TIA that have an expressed interest The viewpoint expressed at the time that this standard was approved was from the contributors’ experience and the state of the art at that time Users are encouraged to verify that they have the latest revision of the standard This standard has been prepared by the TR-42.7 Subcommittee and approved by the Engineering Committee TR-42 There are annexes in this Standard Annexes A, B, C, D, E, , G, H, and I are normative and considered a mandatory part of this Standard AnnexesF is informative and not considered a part of this Standard viii PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 H.3.3 Plug direct measurement fixture The direct measurement fixture has shielded coaxial spring loaded pins that make contact with the modular plug contacts as shown in figure H.1 The fixture shall have levels of crosstalk and return loss compliant with table H.1 NEXT loss, FEXT loss, and insertion loss measurements can be made using this fixture Figure H.1 - Plug direct measurement fixture Table H.1 - Direct measurement fixture residual NEXT loss and return loss Direct fixture performance parameter Pair-to-pair residual NEXT loss Return loss Value (dB) > 80 (TBD) – 20log(f/100) > 35 (TBD) – 20log(f /100) 10 11 12 13 The measurement example in figure H.1 shows the simplified setup for measuring NEXT loss and FEXT loss on a plug constructed with coaxial conductors arranged in 100 Ohm differential configuration See annex (TBD) for detailed test fixture specifications 14 H.3.4 15 16 17 18 19 20 21 22 Modular connector performance on all pair combinations shall be qualified with the full set of 12 test plugs specified in table H.2 With the exception of the upper and lower test plugs specified for the pair combination terminated on pins 3,6-4,5, mated modular connector NEXT loss shall satisfy the requirements as specified in table When mated to test plugs compliant with upper and lower test plug requirements specified for the pins terminated on pairs 3,6-4,5, mated modular connector NEXT loss shall meet the values determined using equation (H-1) 23 24 25 Connecting hardware NEXT loss testing NEXTconn ≥ 52.5 − 20 log( f / 100) dB (TBD) (H-1) Editors note: add break frequency and slope for above 250 MHz, is this still the correct requirement when using direct measurement method 63 6/30/2005 PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) H.3.5 Procedure for terminating a test plug to direct measurement test head The mated test plug/coaxial termination reference test head is inserted in a test fixture consisting of four baluns that are mounted on a ground plane An example of a test setup with a network analyzer is illustrated in figure H.2 A description of a suitable impedance controlled test fixture is described in annex I 10 Figure H.2 - Test plug/direct measurement fixture with impedance controlled test fixture Editors note: Need new picture 64 PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 H.3.6 Table H.2 shows the 12 required worst case plugs for NEXT loss testing For the 3,6-4,5 pair combination, there is a low, central and high plug For the 1,2-7,8 pair combination, there is a low plug For all other pair combinations, there is a low and high plug for each pair combination All test plugs shall perform inside the specified limit from 10 to 500 MHz With the exception of the 1,2-7,8 pair combination over the frequency range of 10 to 500 MHz, no test plug shall be within the low limit at one frequency point and within the high limit at another frequency point 10 11 12 13 Augmented category modular test plug NEXT loss requirements NOTES, It is desirable to minimize slope deviation from 20 dB/decade It is desirable to minimize the amount by which the test plug is within the test limit Table H.2 – Augmented category de-embedded test plug NEXT loss limits Case # Pair combination 3,6-4,5 Limit NEXT loss magnitude limit 1),4),5) NEXT loss phase limit 2),3) ≤ 38-20log(f/100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 3,6-4,5 Central (38.8 ± 0.2)-20log(f /100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 3,6-4,5 High ≥ 39.5-20log(f /100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 1,2-3,6 Low ≤ 46.5-20log(f /100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 1,2-3,6 High ≥ 49.5-20log(f /100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 3,6-7,8 Low ≤ 46.5-20log(f /100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 3,6-7,8 High ≥ 49.5-20log(f /100) TBD (-90 + 1.5 f /100) ± f /100 TBD Case 1,2-4,5 Low ≤ 57-20log(f /100) TBD 90 ± (30 f /100) TBD Case 1,2-4,5 High any phase ≥ 70-20log(f /100) TBD Case 10 4,5-7,8 Low ≤ 57-20log(f /100) TBD 90 ± (30 f /100) TBD Case 11 4,5-7,8 High any phase ≥ 70-20log(f /100) TBD any phase Case 12 1,2-7,8 Low ≤ 66-20log(f /100) TBD 1) Magnitude limits apply over the frequency range from 10 to 500 MHz 2) Phase limits apply over the frequency range from 50 to 500 MHz 3) When the measured plug NEXT loss is greater than 70 dB, the phase limit does not apply 4) When a low limit NEXT loss calculation results in values greater than 70 dB, there shall be no low limit for NEXT loss 5) When a high limit NEXT loss calculation results in values greater than 70 dB, the high limit NEXT loss shall revert to a limit of 70 dB Case 14 15 16 17 18 Low Editor’s note: This is as far as we have gotten in our detailed review of the document in addition, some of the details of the above table have not been thoroughly discussed Comments and contributions are enthusiastically invited 65 6/30/2005 PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) When testing a particular pair combination, the de-embedded test plug NEXT loss performance for the other pair combinations should satisfy the ranges shown in table H.3 However, it is not necessary to have 12 plugs if more than one worst case condition is covered by a particular test plug Table H.3 – Augmented Category de-embedded test plug NEXT loss range Pair combination NEXT loss magnitude range 1),4),5) NEXT loss phase range 2),3) 3,6-4,5 38.0-20log(f/100) TBD ≤ NEXT loss ≤ 39.520log(f/100) TBD 50 – 100 MHz: (-90 + 1.5f/100) ± 100 – 500 MHz: (-90 + 1.5f/100) ± f/100 TBD 1,2-3,6 46.5-20log(f/100) ≤ NEXT loss ≤ 49.5-20log(f/100) TBD (-90 +1.5f/100) ± 3f/100 TBD 3,6-7,8 46.5-20log(f/100) ≤ NEXT loss ≤ 49.5-20log(f/100) TBD (-90 +1.5f/100) ± 3f/100 TBD 1,2-4,5 7) NEXT loss ≥ 57-20log(f/100) TBD 90 ± (30f/100) 6) TBD 4,5-7,8 7) NEXT loss ≥ 57-20log(f/100) TBD 90 ± (30f/100) 6) TBD 1,2-7,8 NEXT loss ≥ 66-20log(f/100) TBD Any phase 1) 2) 3) 4) Magnitude limits apply over the frequency range from 10 MHz to 250 MHz Phase limits apply over the frequency range from 50 MHz to 250 MHz When the measured plug NEXT loss is greater than 70 dB, the phase limit does not apply When a high limit NEXT loss calculation results in values greater than 70 dB, there shall be no high limit for NEXT loss Refer to Table H.2 for an explanation of the high limit 5) When a low limit NEXT loss calculation results in values greater than 70 dB, the low limit shall revert to 70 dB Refer to table H.2 for an explanation of the low limit 6) When the NEXT loss magnitude exceeds 70 – 20 log (f/100), the phase requirement does not apply 7) The requirements for 1-2,4-5 and 4,5-7,8 not exclude plugs that meet cases and 11, respectively, shown in table H.2, because such plugs are acceptable for field tester adapters 10 11 NOTE – An alternative procedure for qualification of test plug NEXT loss may be used if equivalent results and equivalent or better accuracy can be demonstrated 66 PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 In addition, the de-embedded test plug FEXT loss performance for all pair combinations shall satisfy the ranges shown in table H.4 Table H.4 – Augmented category FEXT loss ranges for category NEXT loss test plugs Pair combination 2) 3) 4) 10 11 FEXT loss3), 4) magnitude range (dB) Phase 1), 2) (degrees) 46-20log(f/100) ≤ FEXT loss ≤ -90 ± (30 f /100) 56-20log(f /100) 1,2-3,6 10-250 46-20log(f /100) ≤ FEXT loss ≤ -90 ± (30 f /100) 56-20log(f /100) 3,6-7,8 10-250 46-20log(f /100) ≤ FEXT loss ≤ -90 ± (30⋅ f /100) 56-20log(f /100) 1,2-4,5 10-250 any phase ≥ 55-20log(f /100) 4,5-7,8 10-250 any phase ≥ 55-20log(f /100) 1,2-7,8 10-250 any phase ≥ 55-20log(f /100) When the measured plug FEXT loss is greater than 70 dB, the phase requirement does not apply Due to measurement accuracy considerations, phase measurement requirements below 50 MHz are specified for information only When upper limit FEXT loss calculations result in values greater than 70 dB, there shall be no upper limit for FEXT loss When lower limit FEXT loss calculations result in values greater than 70 dB, the lower limit FEXT shall revert to a limit of 70 dB 3,6-4,5 1) Frequency range (MHz) 10-250 H.3.7 Augmented category NEXT loss measurement reproducibility between labs The measurement reproducibility of connecting hardware NEXT loss is primarily limited by the measurement reproducibility of the test plugs Controlled experiments have demonstrated that the test plug measurement process is reproducible within the noise floor levels indicated in table H.5 Table H.5 – Test plug NEXT loss measurement reproducibility between laboratories Maximum error at the limit Pair combination Measurement noise floor (dB) 3,6-4,5 10 – 250 66 – 20log(f/100) 1,2-3,6 10 – 250 66 – 20log(f /100) 3,6-7,8 10 – 250 66 – 20log(f /100) 1,2-4,5 10 – 250 68 – 20log(f /100) 4,5-7,8 10 – 250 68 – 20log(f /100) 1,2-7,8 12 13 14 Frequency range (MHz) 10 – 250 72 – 20log(f /100) Test plug requirement at 100 MHz (37 dB) nominal (48 dB) nominal (48 dB) nominal (57 dB) minimum (57 dB) minimum (60 dB) minimum Test plug reproducibility (dB) Reproducibility for mated NEXT loss of 54 dB @ 100 MHz (dB) 0.1 TBD TBD TBD TBD TBD TBD TBD 1.5 TBD TBD 1.5 TBD TBD 1.5 TBD NOTE – An alternative procedure for qualification of test plug NEXT loss may be used if equivalent or better accuracy can be demonstrated 67 6/30/2005 PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) H.4 Augmented category Test plug FEXT loss Test plug FEXT loss shall be measured in accordance with annex F of ANSI/TIA/EIA-568-B.2-1 For each of the twelve (12) pair combinations, the measured test plug FEXT loss shall fall in the ranges shown in table H.6 Table H.6 – Augmented Category test plug FEXT loss ranges Pair combination 6) 7) 8) 10 11 12 13 14 FEXT loss3), 4) magnitude range (dB) Phase 1), 2) (degrees) 46-20log(f/100) ≤ FEXT loss ≤ -90 ± (30 f /100) 56-20log(f /100) 1,2-3,6 10-250 46-20log(f /100) ≤ FEXT loss ≤ -90 ± (30 f /100) 56-20log(f /100) 3,6-7,8 10-250 46-20log(f /100) ≤ FEXT loss ≤ -90 ± (30⋅ f /100) 56-20log(f /100) 1,2-4,5 10-250 any phase ≥ 55-20log(f /100) 4,5-7,8 10-250 any phase ≥ 55-20log(f /100) 1,2-7,8 10-250 any phase ≥ 55-20log(f /100) When the measured plug FEXT loss is greater than 70 dB, the phase requirement does not apply Due to measurement accuracy considerations, phase measurement requirements below 50 MHz are specified for information only When upper limit FEXT loss calculations result in values greater than 70 dB, there shall be no upper limit for FEXT loss When lower limit FEXT loss calculations result in values greater than 70 dB, the lower limit FEXT shall revert to a limit of 70 dB 3,6-4,5 5) Frequency range (MHz) 10-250 H.4.1 Augmented category FEXT loss measurement reproducibility between labs The measurement reproducibility of connecting hardware FEXT loss is primarily limited by the measurement reproducibility of the test plugs Controlled experiments have demonstrated that the test plug measurement process is reproducible within the noise floor levels indicated in table H.7 Table H.7 – Test plug FEXT loss measurement reproducibility between laboratories Maximum error at the limit Pair combination Frequency range (MHz) Measurement noise floor (dB) 3,6-4,5 10 – 250 66 – 20 log(f /100) 1,2-3,6 10 – 250 66 – 20 log(f /100) 3,6-7,8 10 – 250 66 – 20 log(f /100) 1,2-4,5 10 – 250 4,5-7,8 1,2-7,8 Test plug reproducibility (dB) Reproducibility for mated FEXT loss of 43.1 dB @ 100 MHz (dB) (51 dB) nominal (51 dB) nominal (51 dB) nominal 1.0 TBD 0.4 TBD 1.0 TBD 0.4 TBD 1.0 TBD 0.4 TBD 68 – 20 log(f /100) n/a - TBD 0.4 TBD 10 – 250 68 – 20 log(f /100) n/a - TBD 0.5 TBD 10 – 250 72 – 20 log(f /100) n/a - TBD 0.3 TBD 68 Test plug requirement at 100 MHz PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 H.5 Test plug return loss testing H.5.1 A 76 mm (3.0 in) maximum length twisted-pair lead shall be used to connect the device under test to the network analyzer balun interface For connecting hardware return loss measurements, the twisted-pair lead shall have a return loss of greater than 35 (TBD) dB for all frequencies from to 500 MHz, relative to the calibration resistor specified in annex B of ANSI/TIA/EIA-568-B.2 as measured in place in the impedance controlling test fixture specified in annex I H.5.2 Return loss test lead considerations Test Plug Return loss requirements 10 11 12 13 14 The return loss of the pairs terminated on pins 1,2, 4,5, and 7,8 shall meet the values determined by equation (H-2) when measured in accordance with clause D.4.1 of ANSI/TIA/EIA-568-B.2 The return loss of the pair terminated on pins 3,6 shall meet the values determined by equation (H-3) when measured in accordance with clause D.4.1 of TIA/EIA-568-B.2 Calculations that result in return loss values greater than 35 dB shall revert to a maximum requirement of 35 dB An alternative reference jack may be used if equivalence is demonstrated 15 RLoss non _ 3,6 _ pairs ≥ 35 − 20 log( f / 100) dB (H-2) 16 RLoss 3,6 _ pair ≥ 28 − 20 log( f / 100) dB (H-3) 17 H.5.3 18 19 20 21 22 23 24 Test plugs shall be mounted on an appropriate impedance controlled fixture The test plug shall be terminated with the direct measurement fixture The far end of the test fixture as assembled (see figure I.6 shall be terminated with common mode plus differential mode precision chip resistor terminations Since the return loss is affected by the impedance of the test leads on the impedance controlled fixture, if the return loss requirements are not met initially, it may be possible to improve the test result by selective application of conductive foil tape to the test plug leads It is not recommended to move the leads outside of the impedance controlled fixture channel 25 H.5.4 26 27 28 29 30 Lab-to-lab measurement accuracy is highly affected by the accuracy of the reference load and return loss properties of interconnect leads Refer to annexes H and I of ANSI/TIA/EIA-568-B.2 for guidelines on estimating lab-to-lab measurement accuracy, establishing values for directivity, tracking, and source match and return loss of terminations Test plug return Loss measurement procedure Return loss lab-to-lab measurement accuracy 69 6/30/2005 PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) Annex I Impedance controlled measurement fixture (normative) I.1 10 11 12 13 14 15 16 General The impedance controlled measurement fixture consists of a metal plated pyramid with slots in each side designed to accept the twisted pair leads of a DUT (device under test) The slots are designed to maintain correct differential and common mode characteristic impedance of the pairs in the transmission line when they are separated for mating to the test fixture The pyramid also provides shielding for the pairs to reduce unwanted pair-to-pair coupling The pyramid is electrically connected to the balun ground plane through pin and socket connectors The pyramid, as shown in figure I.1, is mounted to an adapter plate that provides pin and socket connections for the test leads of the DUT A second adapter plate with longer pin and socket connectors is mounted between the balun mounting plate/ground plane and the pyramid adapter plate A common mode termination adapter (which provides common mode with differential mode resistor terminations for the inactive pairs) replaces the long pin through adapter when making FEXT loss (and optionally NEXT loss) measurements PYRASY LPTHRU THIFACE3 17 18 19 Figure I.1 - Test head assembly THI3KIT with baluns attached 20 21 22 Calibration standards are provided which use the same materials and positioning as the pyramid adapter The calibration reference plane (when performed correctly) is located at the top (open end) of the sockets of the pyramid adapter plate 70 PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 A test fixture kit is available consisting of the parts shown in tables I.1, I.2, and I.3 Table I.1 - Test fixture kit N447072 TEST HEAD ASSEMBLY, NEXT - FEXT KIT, WITH BALUNS THNFKIT-WB2 N447070 TEST HEAD ASSEMBLY, NEXT - FEXT KIT, THNFKIT-NB N447077 BALUN, 0400-0092 (1 MHz to 650 MHz) BH 0400-0092 (TBD) N447069 INSTRUCTION BOOKLET (shipped only with kit order) N/A Table I.2 - Test head assembly, NEXT-FEXT kit N447046 N447038 N447039 N447042 N447044 N447043 N447041 N447069 N447070 TEST HEAD ASSEMBLY, NEXT - FEXT KIT, THNFKIT-NB TEST HEAD INTERFACE KIT CALIBRATION KIT, OPEN SHORT LOAD CALIBRATION STANDARD, BACK-BACK THROUGH COMMON MODE TERMINATION, NEXT KIT COMMON MODE TERMINATION FEXT KIT DIFFERENTIAL MODE TERMINATION, NEXT KIT COMMON MODE TERMINATION, FOUR PAIR INSTRUCTION BOOKLET (shipped only with kit order) THI3KIT CALKITOSL CALTHRU CMTNKIT CMTFKIT DMTNKIT CMT4PR N/A 1 1 1 Table I.3 - Impedance controlled test fixture, detailed part list N447046 TEST HEAD INTERFACE KIT THI3KIT N447028 PYRAMID ASSEMBLY N447034 LONG PIN THROUGH ADAPTER N447031 BALUN INTERFACE PCB ASSEMBLY PYRASY LPTHRU THIFACE3 1 N447038 CALIBRATION KIT, OPEN SHORT LOAD CALKITOSL N447032 SHORT CALIBRATION REFERENCE SHORTCAL N447033 LOAD CALIBRATION REFERENCE LOADCAL N447027 PYRAMID ADAPTER PCB ASSEMBLY PYRADAPT 1 N447042 COMMON MODE TERMINATION, NEXT KIT CMTNKIT N447029 COMMON MODE TERMINATION OPPOSITE PAIRS CMTERM13 N447035 COMMON MODE TERMINATION ADJACENT PAIRS CMTERM23 1 N447044 COMMON MODE TERMINATION FEXT KIT CMTFKIT N447040 COMMON MODE TERMINATION, FEXT CMTFEXT N447043 DIFFERENTIAL MODE TERMINATION, NEXT KIT DMTNKIT N447036 DIFFERENTIAL MODE TERMINATION OPPOSITE PAIRS DMTERM13 N447037 DIFFERENTIAL MODE TERMINATION ADJACENT PAIRS DMTERM23 1 10 11 12 13 71 6/30/2005 10 I.2 PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) Additional components for connection to a network analyzer SMA cables, connectors, 50Ω SMA terminations, mounting fixtures, etc Foil tape with conductive adhesive (3M 5012C or equivalent) NOTES, The balun interfaces are designed to mate to the BH 0050-0092 baluns It is recommend to use some copper foil tape as a shield A shield between the long pin adapters as shown in figure I.2 can also be created 11 12 13 Figure I.2 - Test head assembly showing foil tape applied to baluns and shielding (optional) between baluns 14 I.3 Test fixture calibration procedure 15 I.3.1 16 17 18 19 The open, short, and load calibrations are performed using the calibration standards (CALKITOSL), which are each in turn attached to the long pin through adapter (LPTRU) that is attached to the balun mounting plate as shown in figure I.3 Open short and load calibration LOADCAL LPTHRU 20 21 Figure I.3 - Load calibration adapter arrangement 22 72 PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 I.3.2 Through calibration Through calibration is performed using the CALTHRU adapter First a long pin through adapter (LPTHRU) is attached to one balun mounting plate A second long pin through adapter is attached to the second balun mounting plate The CALTHRU adapter is inserted between the long pin adapters as shown in figure I.4 Remove the port balun from the first balun mounting plate if necessary Attach the port balun temporarily to the second balun mounting plate To maintain correct polarity of the port balun, rotate it 180° with respect to the first balun as shown in figure I.4 BALUN THIFACE3 CALTHRU LPTHRU 10 Figure I.4 - Through calibration 11 I.4 Test lead return loss measurement using pyramid impedance management fixture 12 13 14 15 16 17 18 19 Trim the test lead to fit into the pyramid slot as shown in figure I.5 Attach a differential mode termination adapter (DMTERM23) to the pyramid adapter so that the through connecting pins connect to the near-end of the wire pair and the resistor termination connects to the far-end Perform a 1-port (open-short-load) calibration of the near-end balun using the calibration standards and the LPTHRU adapter Remove the LPTHRU adapter from the balun mounting plate Attach the pyramid assembly including the test lead to the balun mounting plate and measure the test lead return loss CMTERM 23 20 21 Figure I.5 - Test setup for measurement of test lead return loss 22 73 6/30/2005 PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) I.5 Termination of inactive pairs for FEXT loss measurement Common mode with differential mode resistor terminations shall be used at both ends of the DUT for FEXT loss measurements I.6 The direct measurement fixture, as depicted in figure I.6, may be assembled from the parts listed in table I.4 Table I.4 – Coaxial termination reference head component list Direct measurement fixture detailed construction Qty 1 1 2 Description Coax termination, clamp block base Coax termination, clamp Coax termination, coax probe Coax termination, clamp block Coax termination, clamp Coax termination, plug clamp Guide pin, steel 3.2mm (.13 in) dia X 19.1 mm (.75 in) Screw, 8-32 X 3/4 SHC Screw, 8-32 X 1/2 SHC Spring pin insert SMP part no N447050 N447051 N447054 N447052 N447053 N447058 N447057 N447056 N447055 104094 Ref 10 10 11 12 NOTE – Components indicated in table I.4 may be obtained from: Superior Modular Products, Inc., Swannanoa, NC 28778 Alternative equivalent components may also be used 13 Figure I.6 - Exploded assembly of the coaxial termination reference test head 14 15 74 PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 A detailed view of the reference test head to plug mating interface is illustrated in figure I.7 O 0.12 250 DEEP O 0.09 CB , CBD 0.15 0.23 0.38 PLS R 0.02 PLS A 0.07 PLS 0.14 0.1 0.06 0.02 0.1 0.06 0.02 0.14 DETAIL A Figure I.7 - Detailed view of the coaxial termination reference test head interface I.7 Test plug delay and port extension The reference plane of measurement of the reference and test plugs shall be at the tip of the plug This is accomplished with a network analyzer calibration at the balun terminals and a port extension 10 I.8 Calibration and reference plane location 11 12 13 A full 1-port calibration shall be performed to establish a reference plane location at the balun port Use the test fixture specified in clause I to ensure consistent common mode impedance matching for the test leads between the device under test and the balun terminations 14 I.9 15 16 17 18 19 20 21 22 23 The settings of the network analyzer shall be sufficient to achieve a maximum of +/-5 ps of random variation Recommended settings are as follows: Network analyzer settings Measurement function is S11 delay Averaging 4x or higher Intermediate frequency bandwidth (IFBW) 300 Hz or less Smoothing to 10 % (25 MHz or greater) Output power level in the range of –5 dBm to dBm for phase critical measurements 75 6/30/2005 I.10 Measurements 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 With the test plug connected to the test baluns, measure the S11 time delay determined with an open circuit at the plug ends at 50 MHz (TDopen _ 50 MHz ) and 100 MHz (TDopen _ 100 MHz ) for each pair PN-3-4426-AD10, draft 2.0 (to be published asTIA/EIA-568-B.2-10) Place a short on the plug This short shall connect the pins of the pair under test at the tip of the plug and be no further than mm (0.12 in) from the point of contact Measure the S11 delay for each pair at 50 MHz (TD short _ 50 MHz ) and 100 MHz (TD short _ 100 MHz ) sequentially shorted in this manner A recommended procedure for establishing a suitable short delay correction is as follows: Select a plug that can be used for this procedure and is then discarded Three or more plugs are recommended Mount the plug rigidly onto a pyramid or other suitable impedance management fixture Measure the S11 round trip delay of the plug mated to the shorting jack on all pairs and record these value as Delayround trip plug jack Without removing the plug from the pyramid, trim the plastic ribs separating the blades, and solder a wire across all blades where they make contact with the jack Measure the S11 round trip delay of the plug on all pairs and record these value as Delayround trip plug To these values, subtract picoseconds for pairs 1,2; 4,5; and 7,8 and 14 picoseconds for pair 3,6 to account for the delay of the short spanning the plug blades Record these values as Delayadjusted round trip plug Determine the difference in round trip delay for each pair of the shorting jack as follows: Shorting Jack (round trip delay)= Delayround trip plug jack - Delayadjusted round trip plug When measuring the open and short delays for the test plug, the shorting jack values will need to be modified by the delay values calculated in step to determine the one way port extension (PE one way) as follows: PE one way = (Open(avg 50-100MHz)+(Short(avg 50-100MHz) – Shorting Jack(avg 50-100 MHz)))/4 The time delay for each wire pair is determined by the average of the open and short circuit time delay measurements at 50 MHz and 100 MHz (four numbers averaged) These time delay measurements represent round-trip time delays The one-way time delay is ½ of the round trip S11 delay For the purpose of NEXT loss measurements for each pair, the one-way time delays of the wire pairs involved in the measurement shall be used to set the port extension amount for each port as calculated in equation (I-1) PortExtension = TDopen _ 50 MHz + TDopen _ 100 MHz + TDshort _ 50 MHz + TDshort _ 100 MHz (I-1) NOTES, The time delay measurements are dependent on proximity to ground planes The positioning of the wire pairs should remain as constant as possible during all measurements The measurement accuracy of this method is approximately 20 ps in a round trip measurement, corresponding to a one-way distance of approximately mm (0.8 in) When the test plug NEXT loss is measured, the appropriate port extensions shall be applied after calibration to align the tp-rj data and the reference planes corresponding to the jack vector specified in table I.1 of ANSI/TIA/EIA-568-B.2-1 This may be done by turning port extensions of the network analyzer on and entering the calculated port extension constant for each port (1 and 2) of the network analyzer 76 PN-3-4426-AD10, draft 2.0 (to be published as TIA/EIA-568-B.2-10) 6/30/2005 I.11 Alternative port extension procedure The following procedure is recommended for measuring the delay of each pair of the DUT for port extensions Create a reference short by applying copper foil tape to the mating face of a modular plug as shown in figure I.8 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 Figure I.8 - Example of coaxial test head shorting plug Measure the S11 open and short delay (round trip delay) of each pair of the FEXT coaxial termination reference test head Calculate the average of these two measurements for each pair Divide the result by two (one way delay) (Measure the open delay with the fixture unterminated Measure the short delay with the shorting plug mated to the fixture.) Mate the test plug to the coaxial termination reference test head Use common mode impedance management of the plug leads Measure the through delay of each pair (S12), and record the result Calculate the delay of each pair of the test plug as the difference between the one way delay calculated in step and the through delay measured in step Subtract ps for pairs 12, 45, and 78, and 15 ps for pair 36 to obtain the port extension for each pair Average the time delay from steps through at 50 MHz and 100 MHz When the port extension values calculated according to equation (I-2) are applied to each port (for each pair) the reference planes of measurement will be aligned to the contact point at the nose of the plug PortExtension = TDthrough _ 50 MHz + TDthrough _ 100 MHz − TDopen _ 50 MHz + TDopen _ 100 MHz + TDshort _ 50 MHz + TDshort _ 100 MHz 28 29 77 (I-2) ... for 100 Ω ScTP cables are located in annex K of ANSI /TIA/ EIA -5 6 8- B.2 Cable for cords PN- 3-4 426-AD10, draft 2.0 (to be published as TIA/ EIA -5 6 8- B. 2-1 0) 6.1.3 6/30/2005 Backbone cable 10 11 Four-pair... requirements in clause of ANSI /TIA/ EIA -5 6 8- B.3, clause of ANSI /TIA/ EIA -5 6 8- B.2, annex K of ANSI /TIA/ EIA -5 6 8- B.2, annex M of ANSI /TIA/ EIA -5 6 8- B.2, and clause of this Standard after bundle formation... than dB revert to a requirement of dB maximum (see ANSI /TIA/ EIA -5 6 8- B. 2-3 ) PN- 3-4 426-AD10, draft 2.0 (to be published as TIA/ EIA -5 6 8- B. 2-1 0) 6/30/2005 7.1.3.2 For all frequencies from MHz to 500