IEC 61 671 6 Edition 1 0 201 6 04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test station description IE C 6 1 6 7 1 6 2 0 1 6 0 4 (e n ) IE E E S td 1 6 7 1 6 2 0 1 5 I[.]
I E C 61 67 -6 ® Edition 201 6-04 I N TE RN ATI ON AL I E E E S td 67 ™ S TAN D ARD IEC 61 671 -6:201 6-04(en) IEEE Std 671 6-201 S tan d ard for au tom ati c tes t m arku p l an g u ag e (ATM L) tes t s tati on d es cri pti on TH I S P U B L I C AT I O N I S C O P YRI G H T P RO TE C T E D C o p yri g h t © I E E E All rights reserved IEEE is a registered trademark in the U.S Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Inc Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central Office Any questions about IEEE copyright should be addressed to the IEEE Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee IEC Central Office 3, rue de Varembé CH-1 21 Geneva 20 Switzerland Tel.: +41 22 91 02 1 Fax: +41 22 91 03 00 info@iec.ch www.iec.ch Institute of Electrical and Electronics Engineers, Inc Park Avenue New York, NY 001 6-5997 United States of America stds.info@ieee.org www.ieee.org Abo u t th e I E C The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies Ab o u t I E C p u b l i c a ti o n s The technical content of IEC publications is kept under constant review by the IEC Please make sure that you have the latest edition, a corrigenda or an amendment might have been published I E C C atal og u e - webs tore i ec ch /catal o g u e E l ectroped i a - www el ectroped i a org The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents Available for PC, Mac OS, Android Tablets and iPad The world's leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in additional languages Also known as the International Electrotechnical Vocabulary (IEV) online I E C pu bl i cati on s search - www i ec ch /s earch pu b I E C G l os s ary - s td i ec ch /g l os sary The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,…) It also gives information on projects, replaced and withdrawn publications 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002 Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR I E C J u s t P u bl i s h ed - webs tore i ec ch /j u s tpu bl i s h ed Stay up to date on all new IEC publications Just Published details all new publications released Available online and also once a month by email I E C C u s to m er S ervi ce C en tre - webs tore i ec ch /cs c If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csc@iec.ch I E C 61 67 -6 ® Edition 201 6-04 I N TE RN ATI ON AL I E E E S td 67 6™ S TAN D ARD S tan d ard for au tom ati c tes t m arku p l an g u ag e (ATM L) tes t s tati on d es cri pti on INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 I EC ISBN 978-2-8322-3268-2 I E E E I S B N -1 -5 4 -0 8 -4 S TD Warn i n g ! M ake s u re th at you obtai n ed th i s pu bl i cati on from an au th ori zed d i s tri bu tor ® Registered trademark of the International Electrotechnical Commission ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ? ? ? Contents Overview 1 General 1 Application of this document’ s annexes Scope Application Conventions used within this document 2 Normative references 3 Definitions, acronyms, and abbreviations Definitions Acronyms and abbreviations Schema—TestStationDescription xsd 4.1 General 4.2 Elements 4.3 Child elements 4.4 Complex types Schema—TestStationInstance xsd .1 5.1 General 5.2 Elements .1 5.3 Child elements 5.4 Complex types ATML TestStationDescription XML schema names and locations ATML XML schema extensibility Conformance .1 8.1 Conformance of a TestStationDescription instance document 8.2 Conformance of a TestStationInstance instance document Annex A (informative) IEEE download website material associated with this document .1 Annex B (informative) User’ s information and examples B.1 Partial automatic test station Annex C (informative) Glossary .21 Annex D (informative) Bibliography .22 ????? ? ? ?????? ? ? ? ?? ??? ???? ??? ? ? ? ? ????? ?? ???? ? ? ? ? ???????????????????????????????????????????????????????????????????????????????????????????? ?? ? ?? ? ? ? IEC I EEE 61 671 -6: 201 S td 671 6-201 Standard for Automatic Test Markup Language (ATML) Test Station Description F O RE W O RD ) Th e al l I n t e rn a t i o n a l n a ti o n a l i n t e rn a t i o n a l th i s en d c o - o p e t i o n and Te ch n i ca l in R e p o rt s , th e I EEE d e vel o pm en t th e deal t fi n a l d oes n ot p ro c e s s , s u b j e ct th e U se to a re of I EEE i m p o rt a n t wi t h and ru l e s te s t, or to l eg al is th e in d i s c l a i m e rs (se e a c c o rd a n c e wi th i ts v a ri e d is p ro m o t e fi e l d s To S p e c i fi c a t i o n s , r e fe r re d N a ti on a l c o m p ri s i n g to e l e c t ro n i c Te c h n i ca l to as C o m m i tte e “I EC i n te re s te d g o v e rn m e n t a l C o o rd i n a t i n g s t a n d a rd s v i e wp o i n t s s e rve th e of v o l u n t a ry an d ( h e re a ft e r I EC S t a n d a rd s and fa i r n e s s e l e c t ri c a l I EC an d non- p re p a ti o n d e ve l o p s of I EE E of I n t e rn a t i o n a l , th i s an d I EEE s t a n d a rd i z a t i o n S t a n d a rd s , any w o rk in a c c u c y wh o l l y th e fo r ob j e ct Gu i des r e p re s e n t i n g p ro m o t e v e ri fy d ocu m e n ts an d S o ci e ti e s B o a rd m e m b e rs in co m m i tte e s ; p a rt i c i p a t e I EEE Th e I n t e rn a t i o n a l (P AS ) v o l u n t e e rs n e c e s s a ri l y e va l u a te , n o ti ce s wi t h i n S t a n d a rd s e s ta b l i s h e s S t a n d a rd s s t a n d a rd i z a t i o n p r e p a t o r y al so o rg a n i z a ti o n C om m i tte e s ) te ch n i c a l th i s I EC tog e th e r n ot wo rl d wi d e pu bl i sh es to in th e d e ve l o p e d b ri n g s a S p e c i fi c a t i o n s p a rt i c i p a t e a re an d I EC e n t ru s t e d ( I E E E - S A) wh i c h p ro c e s s is l i sin g V o l u n t e e rs i n d e p e n d e n tl y s t a n d a rd s m ay As s o ci a ti o n p ro d u c t a d m i n i s t e rs wi t h d o cu m e n ts S t a n d a rd s Ava i l a b l e is N a ti on a l c o n c e rn i n g a cti vi ti e s , p re p a t i o n (I E C) (I E C q u e s ti on s oth er o rg a n i z a t i o n s S t a n d a rd s I EEE all P u b l i cl y Th ei r s u b j e ct g o v e rn m e n t a l to Com m i ssi on co m m i tte e s on a d d i ti o n P u b l i ca ti o n (s )” ) in E l e c t ro t e c h n i c a l e l e c t ro t e c h n i c a l wi t h o u t co n s e n s u s an y I EEE of th e C o m m i tte e s t h ro u g h and i n te re s ts i n fo rm a t i o n a re of th e co n s e n s u s com p e n s a ti on d e ve l o p m e n t d o cu m e n ts a to a ch i e ve While I EEE p ro c e s s , I EEE co n ta i n e d m ade a va i l a b l e h t t p : / / s t a n d a r d s i e e e o rg / I P R / d i s c l a i m e rs h t m l in i ts fo r fo r use m o re i n fo rm a t i o n ) IEC co l l a b o te s cl os e l y wi t h I EEE in co n d i ti o n s d e t e rm i n e d by a g re e m e n t b e t we e n th e t wo o rg a n i z a t i o n s 2) Th e fo rm a l opi n i on N a ti o n a l and d e ci s i o n s on th e C om m i tte e s S t a n d a rd s i n t e re s t e d 3) p a rt i e s P u b l i ca ti o n s In co n te n t th e y o rd e r a re to sh al l I EEE assessm en t i n d i ca te g i ve n i n te rn a ti o n a l d i v e rg e n c e p ro v i d e and, in fo r a n y s e rv i c e s c a rri e d out e n s u re th a t 7) No e xp e rt s and fo r or an d th e any fo r m e m b e rs p e rs o n a l c o s ts I E C /I E E E 8) Atte n ti o n is Atte n ti o n m a t e ri a l (i n cl u d i n g d wn is e xi s t e n c e va l i d i ty or n e cti o n va l i d i ty E s s e n ti a l s cop e wi t h an d th e I EC of l eg al ri s k h ave or th e an y fe e s ) and ri g h t s P aten t U s e rs Cl m s of a of th i s by I EC I EC e xt e n t h el d co n s e n s u s i n t e re s t e d wi t h i n I EEE bal l ot a p p ro v a l of I EC S o ci e ti e s of m a t e ri a l l y of th e I EEE B o a rd an d a re a re m ade a cce p te d to by e n s u re re s p o n s i b l e and u n d e rt a k e possi bl e th e I n d epen d en t m a rk s fo r I EC th a t th e th e wa y in to in appl y th e i r I EC P u b l i ca ti o n s n a ti o n a l c o rre s p o n d i n g and n a ti o n a l re g i o n a l or re g i o n a l and of of th i s I EC th e IEC bodi es an d I EEE p ro v i d e a re n ot c o n fo rm i t y re s p o n s i b l e p u b l i ca ti on e m p l o ye e s , N a ti o n a l I EEE a ri s i n g of an y ou t of s e rva n ts C o m m i tte e s , S ta n d a rd s d am age a g e n ts i n cl u d i n g i n d i vi d u a l v o l u n t e e rs of As s o ci a ti o n ( I E E E - S A) S t a n d a rd s n a t u re th e or or w h a t s o e v e r, p u b l i ca ti o n , use wh e t h e r o f, or I EEE d i re ct re l i a n c e S o ci e ti e s or B o a rd , i n d i re c t , u pon , th i s P u b l i ca ti on s ci te d in th i s p u b l i ca ti on Use of th e re fe r e n c e d p u b l i ca ti on s is p u b l i ca ti on of th i s co n n e cti o n a A s s u n c e , m ay u n d e r l i ce n s e is if a n y, I EEE I E C /I E E E I EC no or any or in I EEE fo r l i ce n s i n g any th a t th e i r o wn © 201 P u b l i ca ti o n p os i ti o n r e q u i re d , a d vi s e d e n ti re l y fro m th i s be wh e t h e r e xp re s s l y ri g h t s , of s t a n d a rd , t h e re wi t h l i cen s e d e t e rm i n i n g a re c e rt i fi c a t i o n o f c o n fo rm i t y b od i e s i m p l e m e n ta ti o n in of s u ch C o m m i tt e e s P u b l i ca ti on d i re c t o rs , oth er wh i c h s t a n d a rd Fi n al use be al l b a l a n ce d e ffo rt s ca n n o t fro m u s e r m a xi m u m e d i ti o n th e i r o f th i s of a S t a n d a rd s i n t e rn a t i o n a l I EEE i n t e rn a t i o n a l co n s e n s u s by s t a n d a rd re a s o n a b l e or N a ti o n a l th e to p u b l i ca ti on or L e tte r o f i n fri n g e m e n t Publ i shed or th a t fo r en d c e rt i fi c a t i o n l a te s t re fe re n c e s By IEC on ce ( I E E E - S A) fo r al l c o n fo rm i t y e xp e n s e s ri g h ts Cl m s to of or I E E E a p p l i ca ti o n an y I E C /I E E E C o m m i tte e s p aten t by I EC co m m i tte e s p o s s i b i l i ty P a te n t a c c u t e , a cce s s or d am ag e p ro p o s e d an r e p re s e n t a t i o n l a t t e r th e I EEE n o rm a t i v e p a te n t of th e a re a s , te c h n i ca l su bm i ssi on n o n - d i s c ri m i n a t o r y ri g h t s , th e y c o rr e c t to by an y by i n depen dent p ro p e rt y th e is While possi bl e, d e t e rm i n e d As s o c i a t i o n sen se a tte s ta ti o n o r an y oth er I E C to fo r t h e d wn or i d e n t i fy i n g of i n j u ry, c o ve re d to any som e th e as h as m a t t e rs , is re c o m m e n d a t i o n s u n i fo rm i t y , in n e a rl y t e ch n i c a l r e v i e wi n g th a t b e t we e n C o o rd i n a t i n g P u b l i ca ti o n in d ispensabl e 9) a tta ch S t a n d a rd s of in as co m m i tte e re a c h e d , S t a n d a rd s t n s p a re n t l y c l e a rl y i n d i c a t e d n ot sh al l fo rm on been m i s i n t e rp re t a t i o n Al l l i a bi l i ty th e in I EEE S oci e ti e s of I E E E has i n t e re s t th e e xp re s s , te ch n i ca l o r fo r a n y s e rv i c e s shou l d by h a ve 6) u s e rs d e ci s i on s C om m i tte e s P u b l i ca ti o n s ) be e a ch P u b l i ca ti o n s u sed An y m a t t e rs s i n ce I E C /I E E E p ro m o t e p u b l i ca ti on an d of I E C /I E E E p u b l i ca ti o n s I EC is te ch n i ca l fo rm a l C o m m i tte e s /I E E E (i n cl u d i n g 5) wh o I E C /I E E E te ch n i ca l on s u b j e cts Th e d ocu m en t wh i ch I EC C o o rd i n a t i n g s t a n d a rd s N a ti o n a l 4) of re l e v a n t is shal l n ot co n d u cti n g t e rm s l i ce n s i n g m ay ta ke n or be h el d o f th e Al l ri g h t s a re va l i d i ty re s e r v e d u se to of th e re s p o n s i b l e i n to d i ti o n s re s p o n s i b i l i t y I EEE re s p e c t i n q u i ri e s a g re e m e n t s d e t e rm i n a t i o n re q u i re wi th th e p ro v i d e d re a s o n a b l e of an y fo r l eg al in or paten t ? IEC ? ??? ? ? 61 671 -6: 201 IEEE S td 671 6-201 I n t e rn a t i o n a l te c h n i c a l S t a n d a rd c o m m i tte e I EC 91 : 6 - /I E E E E l e c t ro n i c s S td 671 6-201 assem bl y h as t e c h n o l o g y, been u n d er p ro c e s s e d th e t h ro u g h I E C /I E E E Du al I EC Log o A g re e m e n t Th e te x t o f th i s s t a n d a rd I EEE I EEE Fu l l i n fo rm a t i o n vo ti n g Th e i n d i ca te d I EC o f th i s u n d er based on in Te ch n i ca l th e th e fo l l o w i n g d o c u m e n ts : voti n g a b o ve R e p o rt /1 /F D I S fo r th e a p p ro v a l on vo ti n g /1 /RVD of th i s s t a n d a rd ca n be fo u n d in re m a i n an d I EEE T e ch n i c a l u n ch a n g e d in th e u n ti l d a ta th e re l a t e d C o m m i tte e s ta b i l i ty to th e h a ve d a te d eci d ed i n d i ca te d s p e c i fi c on p u b l i ca ti o n th a t th e th e I EC At be re c o n fi rm e d , ? wi th d wn , ? re p l a c e d ? am en d ed by a re v i s e d Publ i shed th e re p o rt on ta b l e C o m m i tte e wi l l th e FDI S " h t t p : / / w e b s t o re i e c c h " wi l l on S td 671 6-20 p u b l i ca ti o n p u b l i ca ti o n ? S td is e d i ti o n , by I EC or u n d e r l i ce n s e fro m I EEE © 201 I EEE Al l ri g h t s re s e r v e d th i s c o n te n ts we b s i te d a te , th e ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ?? ? ? ? ? ? ? ? IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 26 March 201 IEEE-SA Standards Board ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ?? ? Abstract: An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document This test station may be used with a test program set to test and diagnose a unit under test Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), IEEE 671 6™ , test station, XML schema ? W3C is a registered trademark of the W3C®, (registered in numerous countries) World Wide Web Consortium Marks of W3C are registered and held by its host institutions: Massachusetts Institute of Technology (MIT), European Research Consortium for Information and Mathematics (ERCIM), and Keio University, Japan ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? I ??? ntroduction ? ? This introduction is not part of IEEE Std 671 6™-201 5, IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description This child, or dot, standard, also known as an ATML component standard, provides for the definition of the Test Station XML schemas, and contains references to examples; both of which accompany this standard These XML schemas provide for the identification and definition of a test station ATML’ s XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities ATML component standards within the ATML framework define the particular requirements within the test environment ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ? ?? ? ? 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Name ? ?? ? ? Type Description Instruments See Use Optional 5.3 Child elements 5.3.1 TestStationInstance/Instruments Properties: isRef 0, content complex When present, the TestStationInstance/Instruments child element shall identify all of the instruments within the test station 5.3.1 Attributes TestStationInstance/Instruments contains no attributes 5.3.1 Child elements TestStationInstance/Instruments contains the following child element: Name Instrument Type c:ItemInstanceReference Description See Use Optional 5.3.2 TestStationInstance/Instruments/Instrument Base type: c:ItemInstanceReference Properties: isRef 0, content complex When present, the TestStationInstance/Instruments/Instrument child element shall identify a specific instrument 5.3.2.1 Attributes TestStationInstance/Instruments/Instrument contains no attributes 5.3.2.2 Child elements TestStationInstance/Instruments/Instrument inherits contained in Annex B of IEEE Std 671 5.4 Complex types 5.4.1 InstrumentInstanceReference Base type: Extension of c:ItemInstanceReference Properties: isRef 0, content complex the child elements of c:ItemInstanceReference ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? The InstrumentInstanceReference complex type shall identify details of a specific instrument instance The mandatory InstrumentDocumentReference/ID attribute shall match the Instrument/ID from the TestStationDescription description 5.4.1 Attributes InstrumentInstanceReference Instrument contains no attributes 5.4.1 Child elements InstrumentInstanceReference contains the following child elements in addition to those inherited from the c:ItemInstanceReference complex type contained in Annex B of IEEE Std 671 Name PhysicalLocation Address Type c:NonBlankString c:NonBlankString Description Use See 4.2 Optional See 4.3 Optional 5.4.2 InstrumentInstanceReference/PhysicalLocation Base type: c:NonBlankString Properties: isRef 0, content simple Facets: minLength , whiteSpace replace When present, the InstrumentInstanceReference/PhysicalLocation child element shall identify where the instrument is physically located 5.4.2.1 Attributes InstrumentInstanceReference/PhysicalLocation contains no attributes 5.4.2.2 Child elements InstrumentInstanceReference/PhysicalLocation contains no child elements 5.4.3 InstrumentInstanceReference/Address Base type: c:NonBlankString Properties: isRef 0, content simple Facets: minLength , whiteSpace replace When present, the InstrumentInstanceReference/Address child element shall identify the address used to communicate with the instrument 5.4.3.1 Attributes InstrumentInstanceReference/Address contains no attributes ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ?? ? ? 5.4.3.2 Child elements InstrumentInstanceReference/Address contains no child elements ATML TestStationDescription XML schema names and locations IEEE provides a download website for material published in association with published IEEE standards, presented in machine-friendly format This material is digital rights management restricted use material The ATML family of standards utilizes this download website to allow easy accessibility to all of the ATML family XML schemas (and in some cases, example XML instance documents) As depicted by Figure , the IEEE download website (http: //standards ieee.org/downloads/) contains several folders, each folder labeled by an associated IEEE standards number (e g , IEEE 671 series standards are in the 671 folder) Each folder under this base IEEE standard number contains the material (XML schemas, etc.) for that ATML family component standard ATML family component standards are identified by their IEEE 671 series dot standard number and the year in which that standard was published by IEEE NOTE —Standards that are revised will contain a folder for the year in which the standard is reissued Both folders (for each year the standard was published) will be present on the IEEE download website NOTE 2—Folders for a particular standard are not available until the standard is published by IEEE, provided the standard has associated material that is to be made available via the download website Figure depicts a portion of the entire IEEE download website as it pertains to the Test Station Description ATML family standard http: //standards ieee org/downloads / 671 / 671 -2006 671 -201 671 - 2008 671 - 20 Figure —ATML test station related IEEE download website structure The Test Station ATML family component standard, where the component is defined, their associated XML schemas’ names, and the IEEE download website folder name (where the XML schemas are located), are as defined in Table ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? Table —ATML family XML schema name and folder location IEEE download website Component Defined in clause XML schema name folder (see Figure 2) Test Station Description TestStationDescription xsd 671 6-201 Test Station Instance TestStationInstance xsd 671 6-201 The XML schema identified in Table includes ATML common elements The ATML common element (e g., component), where the component is defined, the associated XML schema’ s name, and the IEEE download website folder name (where the XML schema are located) Table —ATML common element XML schema name and location Defined in Component IEEE Std 671 -201 Common Hardware Common Test Equipment Annex B.1 Annex B.2 Annex B.3 IEEE download website XML schema name folder (see Figure 2) Common xsd 671 -201 Hardware Common xsd 671 -201 TestEquipment xsd 671 -201 ATML XML schema extensibility The provision of an extension mechanism is necessary to help ensure the viability of the specification and allow producers and consumers of Test Station instance documents to interoperate in those cases where there is a requirement to exchange relevant data that is not included in the Test Station associated XML schema The use of the extensions shall be done in a way that a conformant consumer can utilize the extended file without error, discard, or otherwise sidestep the extended data and use the non-extended portions of the data as it is intended, without error or loss of functionality Extensions shall be additional information added to the content model of the element being extended Extensions shall not repackage existing information entities that are already supported by the Test Station XML schema An extended instance document shall be accompanied by the extension XML schema and documentation sufficient to explain the need for the extension as well as the underlying semantics and relationship(s) to the base Test Station XML schema The ATML family of standards associated XML schemas allow for three forms of extension: a) b) Wildcard-based extensions allow for the extension of the XML schemas with additional elements Type derivation allows for extending the set of data types by deriving a new type from an existing common element type c) Lists derived from c:NamedValues allowing user-defined properties with attached values ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ?? ? ? Conformance T his clause sp ecifies the re quire me nts that must be satisfied to claim co nfo rmanc e to this standard Co nfo rmance is defined fo r the fo llo wing ite ms: a) A T estS tatio nD escrip tio n instance cume nt b) A T estS tatio nInstance instanc e cument Extensio ns are only through oc c ur p ermitted to the b o th the fac ility W3 C XML sche ma standard, T estS tatio nD es crip tio n and T estS tatio nI nstance o f the e xte nsib ility mec hanis m desc rib ed any e xtended sche ma s hall conform to in C lause cume nts, As b ut s hall defined in the the W3 C XML sc he ma sp ec ificatio n and shall no t describ e any e ntities defined in the b ase sc he ma 8.1 Conformance of a TestStationDescription instance document A c ume nt s hall co nfo rm as a T estS tatio nD e scrip tio n ins tance cume nt if it satis fie s all o f the fo llo wing co nditio ns: a) T he c ume nt satis fies the require me nts fo r a we ll -fo rmed XML c ument b) T he root eleme nt o f the XM L doc ument is a T estS tatio nD es c rip tio n ele me nt c) T he c ontents o f the XML c ume nt are valid with resp ect to the T estS tatio nD escrip tio n XM L sc he ma, inc luding imp o rted XML sc he mas d) T he co ntents o f the XM L c ume nt satis fy the require me nts stated in C lause e) T he co ntents of the XML cume nt satis fy the require ments s tated in the anno tatio ns of the T estS tatio nD esc rip tion XM L sche ma, including require me nts s tated in the anno tations o f imp orted XML sc he mas f) Extensio ns, if any, satis fy the require ments stated in C laus e 8.2 Conformance of a TestStationInstance instance document A cument s hall co nfo rm as a T estS tatio nI nstanc e instanc e cument if it satis fie s all o f the fo llo wing co nditio ns: a) T he c ume nt satis fies the require me nts fo r a we ll-fo rmed XML c ument b) T he root eleme nt o f the XML document is a T estS tationI nstanc e ele me nt c) T he co ntents o f the XM L docume nt are valid with resp ect to the T estS tatio nI nstance XM L sc he ma, including imp o rted XM L sche mas d) T he co ntents o f the XML doc ume nt satis fy the require me nts stated in Clause e) T he co ntents of the T estS tatio nIns tance XM L XML cume nt sc he ma, satis fy including the require ments require me nts XML sc he mas f) stated stated Extensio ns, if any, satis fy the require ments s tated in C laus e in in the the anno tatio ns anno tatio ns of the o f imp o rted ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? Annex A (informative) IEEE download website material associated with this document This document includes supporting material required to maintain and/or develop the ATML framework as well as maintain the ATML family of standards This material is published by the IEEE in association with this document, presented in a machine-friendly format This is digital rights management restricted use material The ATML family of standards utilizes this download website to allow easy accessibility to these documents’ XML schemas, and associated material referenced within this document (e.g., examples or committee drafts) For an explanation of, and the location of, the IEEE download website and its structure (as it pertains to the ATML family of standards), see Clause The material available on the IEEE download website in association with this document is described in Table A Table A.1 —IEEE download website contents File TestStationDescription xsd Description The ATML Test Station Description schema defined in Clause TestStationInstance.xsd The ATML Test Station Instance schema defined in Clause 671 _6_TestStationExample xml Example 671 _6_TestStationExampleInstance.xml Example Readme txt This file contains user information pertaining to the files posted, related files, and their usage ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ?? ? ? Annex B (informative) User's information and examples B.1 Partial automatic test station B.1 General This fictitious example, while not a complete detailed specification of Rack of the Automatic Test Station hardware depicted by Figure B.1 , provides example test station elements that may be included in either an automatic test station or a specific instance of an automatic test station identified by its serial number B.1 Test Station Description XML instance document The Test Station Description XML instance document following: P1671_6_TestStationExample.xml a) Station identification definition (manufacturer, part number, contact information) b) Interface port definitions (connector and pin) c) Interface connector types d) Station documentation (assembly drawings, schematics, test procedures, contains the development specifications) e) Station environmental requirements (operational, storage) f) Station physical characteristics (weight, dimensions) g) Station internal connection (as depicted in Figure B ) h) Station controller hardware definitions (processor, physical memory, storage) i) Installed software on the station controller (operating system, runtime system, compiler, self-test programs) j) S-Parameter path definition for the ‘ HiFreqCh1 ’ connection between the instrument with ID=" 677 RF Signal Generator" and the port with name=" RF_OUT_UUT01 " k) Station level specifications of the 7778 Timer Counter l) Definition of the switching in the rack m) Identification of the instrumentation in the rack n) References to external Instrument Description Instance documents for each of the instruments in the rack The XML instance document 1671_6_TestStationExample.xml http: //standards ieee org/downloads/1 671 /1 671 6-201 5/ shall be available at: ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? Figure B.1 —Partial test station B.1 Test station instance XML instance document The Test Station Instance XML instance document P1 671 _6_TestStationInstanceExample xml, while not a complete detailed specification of an instance of Rack of the Automatic Test Station hardware depicted by Figure B , provides example test station elements which may be included in a specific serial number of an automatic test station not provided in the Test Station Description XML example: a) Reference to the description document for the test station family for which this instance applies b) Serial number of this instance c) The date of manufacture d) Time of the last calibration e) Self-test information f) Station configuration g) Instrument instance document references for each instrument in this station instance ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? The ? ? ? ? XML instance document ? ?? ? ? 671 _6_TestStationInstanceExample xml http: //standards.ieee.org/downloads/1 671 /1 671 6-201 5/ shall be available at: ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? Annex C (informative) Glossary Fo r the p urpo ses o f this standard, IEEE standards are fo und in the adapter: under A tes t de vic e, (UUT ) or and series the the fo llo wing terms and definitio ns app ly IEEE Standards Dictionary Online o f device s, te s t designed equip me nt It may to pro vide inc lude a T hese and o ther terms c o mp atib le p ro p er within [B 2] stimuli c onnectio n or lo ads no t b etwee n included the with unit the auto matic test equip me nt ( ATE) attribute: A c ume nting characteristic o f an e ntity automatic test equipment (ATE): mo re units perip herals pro vide under T he stimuli, test (UUTs) A s yste m p ro viding a te st cap ab ility fo r the auto matic testing o f o ne o r T he controller direc ts the meas ure me nts, and AT E s yste m te sting co nsists p roc ess p hysical of a co ntro ller, and interp rets interc onnectio ns the test results T he reso urce T he test p erip herals, devic es, reso urce s uch as and devices disp lays, ke yb o ards, p rinters, mass s to rage, etc , s up p ly the nece ss ary cap ab ility fo r info rmatio n manage me nt automatic test system (ATS): Includes the auto matic test equip ment (AT E) as we ll as all s up po rt equip me nt, so ftware, test p ro gram (TP ) , and adap ters framework: A c ollection of c lasses created sp ecifically to s erve the needs of an ap plic atio n area test program (TP): A p ro gram sp ecifically intended fo r the tes ting o f a unit under test (UUT ) test program set (TPS): T he c o mp lete s et o f hardware, s o ftware, and c ume ntatio n nee ded to evaluate a unit under test (UUT ) o n a given test s ys te m unit under test (UUT): s yste m T he entity to be tested It may range fro m a s imp le co mp o ne nt to a c o mp lete ? ? ? ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? ? ? ? ?? ? ? Annex D (informative) Bibliography Bibliographical references are resources that provide additional or helpful material but not need to be understood or used to implement this standard Reference to these resources is made for informational use only [B1 ] Extensible Markup Language Recommendation 26 November 2008 (XML) [B2] IEEE Standards Dictionary Online [B3 ] IEEE Standards Style Manual [B4] XML Schema Tutorial (Fifth Edition) World Wide Web Consortium 10 11 Available from the World Wide Web Consortium: http://www w3 org/TR/2006/REC-xml-2006081 IEEE Standards Dictionary Online subscription is available at: http://www.ieee.org/portal/innovate/products/standard/standards/ /standards_dictionary html 10 Available from IEEE: http://standards ieee org/guides/style/201 4_Style_Manual.pdf 13 Available from the World Wide Web: http://www xfront com/xml-schema html ? ? ? ? ? ? ? ?? ? ? ? ? ??? ? ?? ? ? ? ? ? ?? ? ? ? ? ? ? ?? ? ? ? ? ? ? ? ? Annex ? (informative) ? ??? ? ? ? ? ? ? ??? ? ??? ?? ? ? ? ? ? ? At the time this IEEE standard was completed, the P1 671 Working Group had the following membership: Ronald Taylor, Chair Chris Gorringe Ion Neag Mike Seavey Teresa Lopes Hugh Pritchett Rob Spinner Scott Misha John Stabler The following members of the individual balloting committee voted on this standard Balloters may have voted for approval, disapproval, or abstention W Larry Adams, Jr Randall Groves Leslie Orlidge Bill Brown Raymond Harbert Bartien Sayogo Malcom Brown Werner Hoelzl Mike Seavey Susan Burgess Noriyuki Ikeuchi Joseph Stanco Darryl Busch Anand Jain Walter Struppler Keith Chow Adam Ley March Stutzman William Frank Teresa Lopes Ronald Taylor Chris Gorringe Mukund Modi Oren Yuen When the IEEE-SA Standards Board approved this standard on 26 March 201 5, it had the following membership: John D Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Joseph L Koepfinger* Stephen J Shellhammer Ted Burse David J Law Adrian P Stephens Stephen Dukes Hung Ling Yatin Trivedi Jean-Philippe Faure Andrew Myles Philip Winston J Travis Griffith T W Olsen Don Wright Gary Hoffman Glenn Parsons Yu Yuan Michael Janezic Ronald C Petersen Daidi Zhong Annette D Reilly *Member Emeritus Julie Alessi IEEE-SA Content Production and Management Christy Bahn IEEE-SA Operational Program Management ? I N TE RN ATI O N AL E LE CTRO TE CH N I CAL CO M M I S S I O N , ru e d e Va re m bé P O B ox CH -1 1 G e n e va S wi tze rl a n d Te l : + 41 F a x: + 22 91 02 1 22 91 0 i n fo @i e c ch www i e c ch