1. Trang chủ
  2. » Tất cả

Tiêu chuẩn iso 09344 2016

10 0 0

Đang tải... (xem toàn văn)

THÔNG TIN TÀI LIỆU

Thông tin cơ bản

Định dạng
Số trang 10
Dung lượng 322,33 KB

Nội dung

© ISO 2016 Microscopes — Graticules for eyepieces Microscopes — Réticules pour oculaires INTERNATIONAL STANDARD ISO 9344 Third edition 2016 11 15 Reference number ISO 9344 2016(E) ISO 9344 2016(E) ii[.]

ISO 9344 INTERNATIONAL STANDARD Third edition 2016-11-15 Microscopes — Graticules for eyepieces Microscopes — Réticules pour oculaires Reference number ISO 9344:2016(E) © ISO 2016 ISO 9344:2016(E) COPYRIGHT PROTECTED DOCUMENT © ISO 2016, Published in Switzerland All rights reserved Unless otherwise specified, no part o f this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission Permission can be requested from either ISO at the address below or ISO’s member body in the country o f the requester ISO copyright o ffice Ch de Blandonnet • CP 401 CH-1214 Vernier, Geneva, Switzerland Tel +41 22 749 01 11 Fax +41 22 749 09 47 copyright@iso.org www.iso.org ii © ISO 2016 – All rights reserved ISO 9344:2016(E) Contents Page Foreword iv Scope Normative references Terms and definitions Requirements 4.1 Dimensions 4.2 Permissible material defects and processing faults Marking © ISO 2016 – All rights reserved iii ISO 9344:2016(E) Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies) The work o f preparing International Standards is normally carried out through ISO technical committees Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters o f electrotechnical standardization The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part In particular the different approval criteria needed for the di fferent types o f ISO documents should be noted This document was dra fted in accordance with the editorial rules of the ISO/IEC Directives, Part (see www.iso.org/directives) Attention is drawn to the possibility that some o f the elements o f this document may be the subject o f patent rights ISO shall not be held responsible for identi fying any or all such patent rights Details o f any patent rights identified during the development o f the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents) Any trade name used in this document is in formation given for the convenience o f users and does not constitute an endorsement For an explanation on the meaning o f ISO specific terms and expressions related to formity assessment, as well as information about ISO’s adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www.iso.org/iso/foreword.html The committee responsible for this document is ISO/TC 172, Optics and photonics, Subcommittee SC Microscopes and endoscopes This third edition cancels and replaces the second edition (ISO 9344:2011), which has been technically revised to add ISO 10110-7 and ISO 10110-8 in the normative references; see also Table iv © ISO 2016 – All rights reserved INTERNATIONAL STANDARD ISO 9344:2016(E) Microscopes — Graticules for eyepieces Scope This c u ment s p e ci fie s d i men s ion s and p erm i s s ible materi a l de fe c ts and pro ce s s i ng fau lts for gratic u le s with d i ame ters o f 19 m m, m m and m m to b e u s e d i n m icro s cop e eyepie ce s purposes of measurement, assessment and comparison for the Normative references T he fol lowi ng c u ments are re ferre d to i n the tex t i n s uch a way th at s ome or a l l o f thei r content s titute s re qu i rements o f th i s c u ment For date d re ference s , on ly the e d ition cite d app l ie s For u ndate d re ference s , the late s t e d ition o f the re ference d c ument (i nclud i ng a ny amend ments) appl ie s ISO 10110-1, Optics and photonics — Preparation of drawings for optical elements and systems — Part 1: General ISO 10110-3, Optics and optical instruments — Preparation ofdrawings for optical elements and systems — Part 3: Material imperfections — Bubbles and inclusions ISO 10110-4, Optics and optical instruments — Preparation ofdrawings for optical elements and systems — Part 4: Material imperfections — Inhomogeneity and striae ISO 10110-5, Optics and photonics — Preparation of drawings for optical elements and systems — Part 5: Surface form tolerances ISO 10110-7, Optics and photonics — Preparation of drawings for optical elements and systems — Part 7: Surface imperfection tolerances ISO 10110-8, Optics and photonics — Preparation of drawings for optical elements and systems — Part 8: Surface texture; roughness and waviness Terms and definitions No term s and defi nition s a re l i s te d i n th i s c u ment ISO and IEC maintain terminological databases for use in standardization at the following addresses: — IEC Electropedia: available at http://www.electropedia.org/ — ISO Online browsing platform: available at http://www.iso.org/obp Requirements 4.1 Dimensions Table s p e ci fie s the d i men s ion s © ISO 2016 – All rights reserved for Typ e a nd Typ e gratic u le s ISO 9344:2016(E) Table — Dimensions of graticules Parameter Type 19 −0 , Diametera, d 21 −0 , 26 −0 , Thickness Protective chamfer in accordance with ISO 10110–1 a 1,0 1,5 0,1 to 0,3 Dimensions in millimetres Type 19 −0 , 033 , 033 , 033 21 −0 26 −0 1,0 1,5 0,1 to 0,3 O the r d i a me ters a re a l s o p e r m i tte d i f the y co mp l y wi th the s p e c i fie d th ickne s s a nd the re qu i re ments l i s te d i n Table 4.2 Permissible material defects and processing faults Table s p e c i fie s the p erm i s s ion s for Typ e a nd Typ e gratic u le s Marking To d i fferenti ate the com mon ly u s e d Typ e gratic u le form the s ma l ler tolerance Typ e gratic u le , the ma rki ng “Typ e form i ng to I S O 4” sh a l l b e place d on the gratic u le its el f or on the gratic u le packaging © ISO 2016 – All rights reserved ISO 9344:2016(E) Table — Permissible material defects and processing faults Reference for Test regiona specification Bubbles ISO 10110–3 Striae ISO 10110–4 — Surface form tolerances ISO 10110–5 — Surface imperfections for ISO 10110–7 each side Criterion ISO 10110–8 S u r face qu a l ity Minimum requirement 1/2 × 0,016 b 1/2 × 0,025 b 2/—; c 3/6 (3) d 5/2 × 0,016 b ; L2 × 0,002 e 5/2 × 0,025 b; L2 × 0,004 e f — Parallelism tolerance — — a For an illustration of the test regions, see Figure b C o de c T he d a s h fo r ≤ 10 ′ de fe c t/p er m i s s ib le nu mb er o f de fe c ts mu ltip l ie d b y the s qu a re ro o t o f the m a xi mu m a re a o f the largest defect, in mm EXAMPLE 1/2 × 0,1 indicates two bubble defects with a maximum area of 0,01 mm per bubble fo l lowi ng the de fe c t co de i nd ic ate s that the i n homo geneitie s a re u n s p e c i fie d; the d igit i nd ic ate s the cl a s s o f s tr i ae , wh ich m ay h ave the graticule plate: Diameter, mm Striae class Striae area, mm 19 fol lowi ng e ffe c tive 21 a re a s , i n re ference to the d ia me ter o f the 26 10 f f missible sagitta deviation, whereas the number in brackets gives the maximum permissible value of irregulari- d I n accord a nce with I S O 101 10 -5 , the fi rs t nu mb er a ter the de e c t co de repre s ents the m a xi mu m p er ty T he nu mb er o f e fr i nge s p ac i n gs i s on l y u s e d a s the u n it i n th i s c u ment Two s c ratche s o f u n s p e c i fie d leng th a nd the m a xi mu m width with the grade nu mb er , 0 m m (0 , 0 m m fo r o ne s c ratch) a re p er m i s s ib le T he s ymb ol L i nd ic ate s lon g s c ratch lon ger th a n m m i n I S O 10 10 -7 H owe ver, it me a n s merel y s c ratch with u n s p e c i fie d len g th i n th i s c u ment f Polished surface with less than 16 microdefects per 10 mm scan line © ISO 2016 – All rights reserved ISO 93 44: 01 6(E) Dimensions in millimetres Key test region test region Figure — Test regions © ISO 2016 – All rights reserved ISO 93 44: 01 6(E) ICS  37.020 Price based on pages © ISO 2016 – All rights reserved

Ngày đăng: 05/04/2023, 14:34

TÀI LIỆU CÙNG NGƯỜI DÙNG

TÀI LIỆU LIÊN QUAN

w