Tài liệu physical metallurgy 4e volume2 pptx

h 1 IC Robert W. Cahn and Peter Haasen (-I), editors FOURTH, REVISED AND ENHANCED EDITION [NORTH-HOLLAND [...]... enhancement The highly developed state of the mechanical and optical design of microscopes used in metallographic work makes it impossible to come near to an adequate description in the context of a book on physical metallurgy A large number of monographs (e.g., PAYNE [1957], 0ETl"EL [1959], MALES[1959], F R E W [1960, 19691, KINGLAKE [1965], BIGGS[1970], LOVELAND[1970], PHILIPS [1971], GALOPM HENRY [1972], MODIN... contrast, at least in the lower range of atomic numbers where the contrast is more pronounced (see fig 9) Figure 8b shows an example of strong BE material contrast The limitation for many problems in physical metallurgy is the lack in resolution due to the large depth of information (see fig 7) which, for highly dispersed phases, results in blurred edges and detection of features not intersected by the... electrons Material contrast is reduced at lower voltages and additional contrast-enhancementtechniques by surface treatment have been worked out for individual cases A large number of problems in physical metallurgy and materials science have been solved using the BE mode, particularly since the early semiconductor-based detectors were substituted by optimized scintillator-light guide-photomultiplier... the gray scale, improving the visibility of features in otherwise dark holes) In Y-modulation,the CRT (cathode-ray tube) beam is deflected proportionately to the detector RHerences: p , 1016 Table 2 Physical effects producing radiation, detector types and detected signals used for imaging and analyzing metal surfaces in the scanning electron microscope Detected signal Type of detector Information...CHAPTER 10 QUALITATIVE AND QUANTITATIVE SURFACE MICROSCOPY H.E EXNER Technical University Darmstadt Department of Materials Science 0-64287 Darmstadt, Germany R W Cahn and P: Haasen?, eds Physical Metallursy;fourth, revised and enhanced edition 0Elsevier Science BY 19% 944 H E Exner Ch 10, 0 1 1 Introduction In technical materials, the microstructure develops during processing Apart from... as, for example, fracture surfaces, deep-etched or corroded surfaces and surfaces of porous materials 3.1 Basic features of scanning electron microscopy Excellent monographs and handbook articles on the physical fundamentals, the various techniques, the instrumental details and the application of scanning electron [1971], HEARLE al [1972], et microscopy are available (e.g., SEILER E19681, HEYWOOD OATLEY . ENHANCED EDITION [NORTH-HOLLAND