Models in Hardware Testing- P1 pptx

Models in Hardware Testing- P1 pptx

Models in Hardware Testing- P1 pptx

... the floating line is driving an inverter. 1 Open Defects in Nanometer Technologies 5 c. The third factor in uencing the floating line voltage is the trapped charge accumulated in the floating structure ... spent together discussing, eating, tasting wine, talking of culture, sharing everyday problems of our private lives, telling us your experiences in fishing and hunting, have been invalua...

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Models in Hardware Testing- P9 pptx

Models in Hardware Testing- P9 pptx

... errors induced in the main registers was found to be less than 1% in the experiments reported in Johansson (1994). 8.3.2.2 Pin-Level Fault Injection The experiments with the pin-level fault injection ... models include temporary stuck-at faults affect- ing single or multiple pins. Indeed, temporary faults injected on the pins of the ICs can simulate the consequences of internal faults...

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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault docx

Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault docx

... Patterns generating a floating line voltage interpreted as logic 1 on the tester are plotted in dotted lines, whereas patterns generating a logic 0 in the floating line are plotted in plain lines. To ... of the gate leakage currents in uencing the downstream gate, the steady state voltage of the floating line can be predicted. Assuming a float- ing line driving an inverter for a 90 nm tech...

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Models in Hardware Testing- P2 pot

Models in Hardware Testing- P2 pot

... Patterns generating a floating line voltage interpreted as logic 1 on the tester are plotted in dotted lines, whereas patterns generating a logic 0 in the floating line are plotted in plain lines. To ... Assuming an interconnect full open defect, if an intermediate voltage is induced on the floating line, the two transistors driven by the floating line may be in a conduction state, genera...

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Models in Hardware Testing- P4 pot

Models in Hardware Testing- P4 pot

... between line b and line f of the circuit and any path fault containing the two lines is untestable. The lines b and f are logical lines which are physical lines with which a rising or falling transition ... inputs and circuit outputs. 90 S.M. Reddy Inputs Outputs f-line f-line b-line l b-line Decision point FFR backward expansion line forward expansion line initial PP I Fig. 3.19 Step-wise pa...

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Models in Hardware Testing- P5 pps

Models in Hardware Testing- P5 pps

... 1]1/0). Propagation through the inverting NAND gate F with non-controlling value 1 at its first input results in one more inversion of the interval, yielding the original ADI [0, R 0 E ] at line w. The XOR gate ... created at all lines involved in at least one sim- ulated RBF. The FSICs of the gates driving the bridged lines are determined by good-simulation. The masks are filled by looking...

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Models in Hardware Testing- P6 potx

Models in Hardware Testing- P6 potx

... Torino, Italy e-mail: stefano.dicarlo@polito.it H J. Wunderlich (ed.), Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault, Frontiers in Electronic Testing ... Nabdominates a & a AND-dominates b 1abdominates a & a OR-dominates b N b Na wired-AND N babAND-dominates a & a OR-dominates b bawired-OR All common bridge fault models are pres...

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Models in Hardware Testing- P7 ppt

Models in Hardware Testing- P7 ppt

... physical design constraints can be included in the reordering algorithm (Bonhomme et al. 2003). 7.5.1.3 Logic Insertion in Scan Chain This technique consists in inserting logic elements (XOR ... combined into a resulting march test, is becoming a bottleneck. Due to the increased number of FPs to consider, the complexity of the resulting test algorithms is drastically increasing. Increas...

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Models in Hardware Testing- P8 ppt

Models in Hardware Testing- P8 ppt

... considerations in this technique will consist in modify- ing the initial selective encoding procedure by using one of the following X-filling heuristics to fill don’t-care bits:  0-filling: all Xs in the ... testing: off-line testing with respect to manufacturing defects and on-line testing mechanisms to cope with faults occurring during normal operation (Section 8.2), and a recursive for...

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Tài liệu Advances in Database Technology- P1 pptx

Tài liệu Advances in Database Technology- P1 pptx

... computa- tional origins and information systems engineering aspects have received scant attention. The development within the GRID community of the W3C-inspired OGSA indicates a willingness to move in a direction ... data information about individuals that one can obtain within seconds. The data could be structured data or could be mul- timedia data. Information could be obtained through mi...

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