Tài liệu tham khảo |
Loại |
Chi tiết |
1. Quinnel, R. A., Kill Bugs Early with Software-Test Tools, EDN Magazine, May 23, 1996 |
Sách, tạp chí |
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2. Debany, W. H. et al., Design Verification Using Logic Tests, Proc. IEEE Int. Workshop on Rapid System Prototyping, June 1991, pp. 17–24 |
Sách, tạp chí |
Tiêu đề: |
Proc. IEEE Int. Workshop on"Rapid System Prototyping |
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3. Baird, Mike, Designers May Find C++ to Their Liking, ISD Magazine, October 2001, pp. 48–53 |
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4. Thomas, D. E. et al., A Model and Methodology for Hardware-Software Codesign, IEEE Des. & Test, September 1993, pp. 6–15 |
Sách, tạp chí |
Tiêu đề: |
IEEE"Des. & Test |
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5. Kalavade, A., and E. A. Lee, A Hardware-Software Codesign Methodology for DSP Applications, IEEE Des. Test, September 1993, pp. 16–28 |
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6. Syzgenda, S. A., and A. A. Lekkos, Integrated Techniques for Functional and Gate-Level Digital Logic Simulation, Proc. 10th Design Automation Conf., 1973, pp. 159–172 |
Sách, tạp chí |
Tiêu đề: |
Proc. 10th Design Automation Conf |
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7. Thomas, J. J., Common Misconceptions in Digital Test Generation, Comput. Des., January 1977, pp. 89–94 |
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8. Bening, L., and H. Foster, Principles of Verifiable RTL Design, Kluwer, Boston, 2000 |
Sách, tạp chí |
Tiêu đề: |
Principles of Verifiable RTL Design |
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9. Beizer, Boris, Black-Box Testing, John Wiley & Sons, New York, 1995, p. 9 |
Sách, tạp chí |
Tiêu đề: |
Black-Box Testing |
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10. Bellon, C. et al., Automatic Generation of Microprocessor Test Programs, Proc. 19th Des.Autom. Conf., 1982, pp. 566–573 |
Sách, tạp chí |
Tiêu đề: |
Proc. 19th Des."Autom. Conf |
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11. Aharon, A. et al., Verification of the IBM RISC System/6000 by a Dynamic Biased Pseudo-Random Test Program Generator, IBM Syst. J., Vol. 30, No. 4, 1991, pp. 527–538 |
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12. Wood, David A. et al., Verifying a Multiprocessor Cache Controller Using Random Test Generation, IEEE Des. Test, Vol. 7, No. 4, August 1990, pp. 13–25 |
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14. Breuer, M. A., and A. D. Friedman, Functional Level Primitives in Test Generation, IEEE Trans. Comput., Vol. C-29, No. 3, March 1980, pp. 223–235 |
Sách, tạp chí |
Tiêu đề: |
IEEE"Trans. Comput |
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15. Levendel, Y. H., and P. R. Menon, Test Generation Algorithms for Computer Hardware Description Languages, IEEE Trans. Comput., Vol. C-31, No. 7, July 1982, pp. 577–587 |
Sách, tạp chí |
Tiêu đề: |
IEEE Trans. Comput |
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16. Belt, John E., An Heuristic Search Approach to Test Sequence Generation for AHPL Described Synchronous Sequential Circuits, Ph.D. dissertation, University of Arizona, 1973 |
Sách, tạp chí |
Tiêu đề: |
An Heuristic Search Approach to Test Sequence Generation for AHPL"Described Synchronous Sequential Circuits |
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17. Hill, F., and B. M. Huey, A Design Language Based Approach to Test Sequence Generation, IEEE Comput., Vol. 10, No. 6, June 1977, pp. 28–33 |
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18. Azema, P. et al., Petri Nets as a Common Tool for Design Verification and Hardware Simulation, Proc. 13th D.A. Conf., 1976, pp. 109–116 |
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Tiêu đề: |
Proc. 13th D.A. Conf |
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19. Dennis, J. B. et al., Computational Structures, Project MAC Progress Report VIII, July 1971, pp. 11–52 |
Sách, tạp chí |
Tiêu đề: |
Project MAC Progress Report VIII |
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20. Torku, E. K., and B. M. Huey, Petri Net Based Search Directing Heuristics for Test Generation, Proc. 20th Des. Autom. Conf., 1983, pp. 323–330 |
Sách, tạp chí |
Tiêu đề: |
Proc. 20th Des. Autom. Conf |
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21. Torku, Emmanuel K., Fault Test Generation for Sequential Circuits: A Search Directing Heuristic, Ph.D. dissertation, University of Oklahoma, Norman, OK, 1979 |
Sách, tạp chí |
Tiêu đề: |
Fault Test Generation for Sequential Circuits: A Search Directing"Heuristic |
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