Digital logic testing and simulation phần 8 pps

Digital logic testing and simulation phần 8 pps

Digital logic testing and simulation phần 8 pps

... If it passes, the maintenance routines assume the error 513 Digital Logic Testing and Simulation , Second Edition , by Alexander Miczo ISBN 0-471-43995-9 Copyright © 2003 John Wiley & ... 9.4 Signature Table IC Pin Signature IC Pin Signature U21 2 8UP3 U41 3 37A3 3 713A 5 84 U4 4 01F6 6 F0P1 7 69CH 8 1147 9 8P7U 9 77H1 11 684 C 11 10UP 15 H1C3 14 1359 15 U11A 504 BUILT...

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Digital logic testing and simulation phần 3 ppsx

Digital logic testing and simulation phần 3 ppsx

... positive logic convention will be used. Any voltage between ground (Gnd) and +0 .8 V represents a logic 0. A voltage between +2.4 V and +5.0 V (Vcc) represents a logic 1. A voltage between +0 .8 V and ... automated. F Z X 1 Y 1 Y 2 X 2 119 Digital Logic Testing and Simulation , Second Edition , by Alexander Miczo ISBN 0-471-43995-9 Copyright © 2003 John Wiley &a...

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Digital logic testing and simulation phần 7 pps

Digital logic testing and simulation phần 7 pps

... problem for scan. Memory and analog circuits must be iso- lated from the digital logic, circuit partitioning becomes critical, and testing strategies for memories and random logic must now coexist. Sometimes ... 1149.1 boundary scan standard. In this section we first look, briefly, at the NAND tree and then look in detail at boundary scan. 8. 6.1 The NAND Tree The NAND tree, sho...

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Digital logic testing and simulation phần 10 pps

Digital logic testing and simulation phần 10 pps

... DSP Applications, IEEE Des. Test, September 1993, pp. 16– 28. 6. Syzgenda, S. A., and A. A. Lekkos, Integrated Techniques for Functional and Gate-Level Digital Logic Simulation, Proc. 10th Design Automation Conf., ... for logic simulation are easily adapted to perform symbolic simulation. This stands in contrast to theorem proving and model checking where a major learning cur...

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Digital logic testing and simulation phần 1 pdf

Digital logic testing and simulation phần 1 pdf

... : Miczo, Alexander. Digital logic testing and simulation / Alexander Miczo—2nd ed. p. cm. Rev. ed. of: Digital logic testing and simulation. c1 986 . Includes bibliographical references and index. ... ISBN 0-471-43995-9 (cloth) 1. Digital electronics Testing. I. Miczo, Alexander. Digital logic testing and simulation II. Title. TK 786 8.D5M49 2003 621. 381 5...

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Digital logic testing and simulation phần 4 doc

Digital logic testing and simulation phần 4 doc

... gate Q if ((OR/NAND and C_O == 1) or (AND/ NOR and C_O == 0)) choose new objective net n; //input to Q // n = X, and EASIEST to control else // ((OR/NAND and C_O == 0) or (AND/ NOR and C_O == 1)) choose ... (0 on an AND or NAND gate, 1 on an OR or NOR gate), then the backtrace is made through the input that is easiest to control. Assume a logic gate with inputs X 1 , X n , and...

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Digital logic testing and simulation phần 5 potx

Digital logic testing and simulation phần 5 potx

... of the 8- bit register are grouped and assigned the name INBUS. In similar fashion the outputs of the 8- bit register are grouped and given the name OUTBUS. Then, the entire set of input and output ... primary inputs and other elements. Before continuing, we point out that the sensitized path extends through both logic and time, since the cubes impose switch- ing conditions as w...

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Digital logic testing and simulation phần 6 pdf

Digital logic testing and simulation phần 6 pdf

... The 16 faults now appear as SA0 and SA1 faults on the outputs of P and R and on each of the three inputs to S and T. The SA0 faults at the inputs of AND gates S and T are equivalent to a single ... or hundreds of thousands of logic gates and numerous complex state machines engaged in extremely detailed and sometimes lengthy “hand-shaking” sequences tend to be quite random-re...

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Digital logic testing and simulation phần 9 docx

Digital logic testing and simulation phần 9 docx

... Realistic Self-Test Machine for Static Random Access Memories, Proc. Int. Test Conf., 1 988 , pp. 353–361. 14. Franklin, M., and K. K. Saluja, Built-in Self -Testing of Random-Access Memories, IEEE Computer, ... October 1 987 , pp. 663–6 68. 16. Sridhar, T., A New Parallel Test Approach for Large Memories, IEEE Des. Test, Vol. 3, No. 4, August 1 986 , pp. 15–22. 17. Altnether, J. P., and...

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TRUYỀN HÌNH SỐ VÀ MULTIMEDIA (Digital Compressed Television and Multimedia) - Phần 1 ppsx

TRUYỀN HÌNH SỐ VÀ MULTIMEDIA (Digital Compressed Television and Multimedia) - Phần 1 ppsx

... U Khoá burst Tải màu 3, 58 MHz Đồng bộ S VBS Hình 1 .8 1,2MHz 1,2MHz 180 0 7 ,8 KHz + - + + T T í í n hi n hi ệ ệ u 8 s u 8 s ọ ọ c m c m à à u u B 100% 0% 88 ,6 70,1 68, 9 41,3 29,9 11,4 100% 0% B RR RR B B B G G G G Y B R G C Hình ...   f=1,6MHz) f=1,6MHz) + Chrominance: bi + Chrominance: bi ế ế n đ n đ ổ ổ i xu i xu ố ố ng 3, 58 ng 3, 58   688 688 KHz; KHz; đi...

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