Digital logic testing and simulation phần 7 pps
Digital logic testing and simulation phần 7 pps
... problem for scan. Memory and analog circuits must be iso-
lated from the digital logic, circuit partitioning becomes critical, and testing
strategies for memories and random logic must now coexist.
Sometimes ... the IEEE 1149.1 boundary scan standard.
In this section we first look, briefly, at the NAND tree and then look in detail at
boundary scan.
8.6.1 The NAND Tree
The NAND tr...
Digital logic testing and simulation phần 3 ppsx
... G., and T. Baker, Concurrent Simulation of Nearly Identical Digital Networks,
Computer, Vol. 7, No. 4, April 1 974 , pp. 39–44.
7. Schuler, D. M., and R. K. Cleghorn, An Efficient Method of Fault Simulation ... automated.
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119
Digital Logic Testing and Simulation
,
Second Edition
, by Alexander Miczo
ISBN 0- 471 -43995-9 Copyright © 2003 John Wil...
Digital logic testing and simulation phần 8 pps
... Signature Table
IC Pin Signature IC Pin Signature
U21 2 8UP3 U41 3 37A3
3 71 3A 5 84U4
4 01F6 6 F0P1
7 69CH 8 11 47
9 8P7U
9 77 H1 11 684C
11 10UP 15 H1C3
14 1359
15 U11A
504
BUILT-IN SELF-TEST
The ... passes, the maintenance routines assume the error
513
Digital Logic Testing and Simulation
,
Second Edition
, by Alexander Miczo
ISBN 0- 471 -43995-9 Copyright © 2003 John...
Digital logic testing and simulation phần 10 pps
... 16–28.
6. Syzgenda, S. A., and A. A. Lekkos, Integrated Techniques for Functional and Gate-Level
Digital Logic Simulation, Proc. 10th Design Automation Conf., 1 973 , pp. 159– 172 .
7. Thomas, J. J., Common ... for
logic simulation are easily adapted to perform symbolic simulation. This stands in
contrast to theorem proving and model checking where a major learning curve is
r...
Digital logic testing and simulation phần 1 pdf
...
:
Miczo, Alexander.
Digital logic testing and simulation / Alexander Miczo—2nd ed.
p. cm.
Rev. ed. of: Digital logic testing and simulation. c1986.
Includes bibliographical references and index. ... 321
7 Developing a Test Strategy 323
7. 1 Introduction 323
7. 2 The Test Triad 323
7. 3 Overview of the Design and Test Process 325
7. 4 A Testbench 3 27
7.4.1 The...
Digital logic testing and simulation phần 4 doc
... gate Q
if ((OR/NAND and C_O == 1) or (AND/ NOR and C_O == 0))
choose new objective net n; //input to Q
// n = X, and EASIEST to control
else
// ((OR/NAND and C_O == 0) or (AND/ NOR and C_O == 1))
choose ... X, and HARDEST to control
}
if (Q == NAND/NOR) //complement the current
//objective level
objective level = -(C_O logic level);
else //Q is AND/ OR
objective level = C_O l...
Digital logic testing and simulation phần 5 potx
... February 1965, pp. 76 79 .
2. Putzolu, G., and J. P. Roth, A Heuristic Algorithm for the Testing of Asynchronous
Circuits, IEEE Trans. Comput., Vol. C20, No. 6, June 1 971 , pp. 639–6 47.
3. Bouricius, ... Sensitizing Algorithm for Diagnosis of Binary Sequential Logic, Proc.
9th Symposium on Switching and Automata Theory, 1 970 , pp. 250–259.
7. Kriz, T. A., Machine Identification Co...
Digital logic testing and simulation phần 6 pdf
... The 16 faults now appear as
SA0 and SA1 faults on the outputs of P and R and on each of the three inputs to S and
T. The SA0 faults at the inputs of AND gates S and T are equivalent to a single ... or hundreds of thousands of logic gates and numerous complex state
machines engaged in extremely detailed and sometimes lengthy “hand-shaking”
sequences tend to be quite random-re...
Digital logic testing and simulation phần 9 docx
... Note, Standard Patterns for Testing Memories, Electron. Test, Vol. 4, No. 4,
April 1981, pp. 22–24.
7. Nair, J., S. M. Thatte, and J. A. Abraham, Efficient Algorithms for Testing Semiconductor
Random-Access ... IEEE Trans. Comput., Vol. C- 27, No. 6, June 1 978 ,
pp. 572 – 576 .
8. van de Goor, A. J., Testing Memories: Advanced Concepts, Tutorial 12, International Test
Conference, 19...
TRUYỀN HÌNH SỐ VÀ MULTIMEDIA (Digital Compressed Television and Multimedia) - Phần 1 ppsx
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