Digital logic testing and simulation phần 4 doc

... gate Q if ((OR/NAND and C_O == 1) or (AND/ NOR and C_O == 0)) choose new objective net n; //input to Q // n = X, and EASIEST to control else // ((OR/NAND and C_O == 0) or (AND/ NOR and C_O == 1)) choose ... Figure 4. 24( b) is the result of using Apply to compute the XOR of the ROBDD in Figure 2 .45 and the OBDD in Figure 4. 24( a). The closed form Boolean expression for this gr...

Ngày tải lên: 09/08/2014, 16:20

... 8– 14. 6. Application Note, Standard Patterns for Testing Memories, Electron. Test, Vol. 4, No. 4, April 1981, pp. 22– 24. 7. Nair, J., S. M. Thatte, and J. A. Abraham, Efficient Algorithms for Testing ... single MOS transistor: 4 f GS gate and source f GD gate and drain f SD source and drain f BS bulk and source f BD bulk and drain f BD...

Ngày tải lên: 09/08/2014, 16:20

... 0.01 548 0.008 34 0.00362 0.00 048 CAD 0.217 14 0.1 243 9 0. 045 56 0.01985 0.01090 0.0 043 2 0.000 64 Wadsack 0.23267 0. 145 42 0.05817 0.02617 0. 145 4 0.00582 0.00087 Williams 0. 240 38 0.15788 0.06 642 0.03 046 ... Alexander. Digital logic testing and simulation / Alexander Miczo—2nd ed. p. cm. Rev. ed. of: Digital logic testing and simulation. c1986. Includes bibli...

Ngày tải lên: 09/08/2014, 16:20

... G., and T. Baker, Concurrent Simulation of Nearly Identical Digital Networks, Computer, Vol. 7, No. 4, April 19 74, pp. 39 44 . 7. Schuler, D. M., and R. K. Cleghorn, An Efficient Method of Fault Simulation ... must be accountable. 4. It must be easily automated. F Z X 1 Y 1 Y 2 X 2 119 Digital Logic Testing and Simulation , Second Edition , by Alexander Miczo ISBN...

Ngày tải lên: 09/08/2014, 16:20

... 4. 00ns’; } tpzl { Min ‘5.25ns’; Typ ‘6.00ns’; Max ‘7.00ns’; } tpzh { Min 4. 50ns’; Typ ‘5.50ns’; Max ‘6.50ns’; } tplz { Min ‘3 .45 ns’; Typ 4. 20ns’; Max ‘5.75ns’; } tphz { Min ‘3 .45 ns’; Typ 4. 20ns’; ... X X X X X X X n + 2 D I 1 I 2 I 3 I 4 I 5 I 6 1 1 1 1/1 1/1 0 FF 5 FF 4 I 6 FF 2 FF 3 FF 7 FF 6 I 4 I 5 I 5 I 4 FF 6 I 3 I 2 I 1 Out n n + 1 n + 2 n + 3 n + 4 n + 5 FF 1 FF 7 SE...

Ngày tải lên: 09/08/2014, 16:20

... (x 1 + x 2 + x 3 + x 4 ) ⋅(x 1 + x 2 + x 3 + x 4 ) ⋅(x 1 + x 2 + x 3 + x 4 ) ⋅(x 1 + x 2 + x 3 + x 4 ) or F = x 1 ⋅ x 2 + x 1 ⋅ x 2 + x 3 ⋅ x 4 + x 3 ⋅ x 4 depending on which technology ... The 16 faults now appear as SA0 and SA1 faults on the outputs of P and R and on each of the three inputs to S and T. The SA0 faults at the inputs of AND gates S and T...

Ngày tải lên: 09/08/2014, 16:20

... developed the IEEE 1 149 .1 boundary scan standard. In this section we first look, briefly, at the NAND tree and then look in detail at boundary scan. 8.6.1 The NAND Tree The NAND tree, shown in Figure ... Section 8 .4. 5. Analog cir- cuitry represents another problem for scan. Memory and analog circuits must be iso- lated from the digital logic, circuit partitioning becomes critical, a...

Ngày tải lên: 09/08/2014, 16:20

... ≥ 4 and 4 ≥ 2. That can also be see from the ordering tree. This implies an indistinguish- ability between 2 and 4. Therefore, a new block b 1 = {2 ,4} is formed, and it replaces both 2 and 4. ... ≥ 0 2 ≥ 4 3 ≥ 4 ⋅ 5 4 ≥ 1 ⋅ 2 + 1 ⋅ 3 5 ≥ 3 ⋅ 4 Figure 9.23 Ordering tree. Controlled by Observed through 1 ρ 1 01 ρ 2 0 2 ρ 1 02 ρ 2 4 3 ρ 1 53 ρ 2 4 4 ρ 1...

Ngày tải lên: 09/08/2014, 16:20

... for logic simulation are easily adapted to perform symbolic simulation. This stands in contrast to theorem proving and model checking where a major learning curve is required. For data path logic, ... IEEE Des. Test, Vol. 7, No. 4, August 1990, pp. 13–25. 6 54 BEHAVIORAL TEST AND VERIFICATION 13. http://www.edif.org/lpmweb/intro/functions.html 14. Breuer, M. A., and A. D. Fried...

Ngày tải lên: 09/08/2014, 16:20

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Ngày tải lên: 19/01/2014, 20:20