Volume 10 - Materials Characterization Part 13 pptx

[...]... of Data Representation Rk (Eq 13) ci ci i k i n k c k i i k Rk k k Requirements for Quantitative Analysis N σ x nx (Eq 14) T T nx T γ γ Table 5 Analysis of high-purity 18Cr-12Ni austenitic stainless steel Element Bulk analysis, at % 18.8 ± 0.80 12.1 ± 0.7 0.6 ± 0.15 Iron bal bal Factors Limiting Spatial Resolution The Imaging Atom Probe (lAP) The High-Resolution Energy-Compensated Atom Probe (ECAP)... 0.06 Table 6 Four-stage heat treatment of alloy IN 939 Temperature °C Time, h °F Air cool Air cool Air cool 700 1290 16 Air cool γ γ γ γ γ γ σ Table 7 Analyses of γ and γ' phases in IN 939 Element γ, at.% γ 61.4 9.8 1.5 11.7 13. 8 1.7 0.03 Carbon 0.04 0.04 γ γ γ Table 8 Secondary γ' precipitate compositions in IN 939 Element Analysis 1 at.% Analysis 2 at.% Analysis 3 at.% 68.1 3.2 1.4 13. 8 11.4 0.9 Tantalum... compositions in IN 939 Element Analysis 1 at.% Analysis 2 at.% Analysis 3 at.% 68.1 3.2 1.4 13. 8 11.4 0.9 Tantalum γ γ 1.6 1.6 1.2 γγ γ γ x x x Table 9 Local composition variations in a metallo-organic chemical-vapor-deposited GaAIAs layer Ratios Nominal Region 1 Region 2 0.70 ± 0.05 (Gallium + aluminum):arsenide 1.00 1.08 ± 0.03 1.03 ± 0.04 1.14 ± 0.04 Metall Trans A, Electron Microscopy and Analysis... Bibliography of Field Ion Microscopy and Related Techniques, Field Ion Microscopy in Materials Science, General Uses • • Examples of Applications • • • • • • • Samples • Form: • Size: • Preparation: Limitations • • • μ • Estimated Analysis Time • • Capabilities of Related Techniques • Auger electron spectroscopy: • X-ray photoelectron spectroscopy: • Secondary ion mass spectroscopy: o o o . k (Eq 13) c i c i k i i k c n k i i k R k k k Requirements for Quantitative Analysis N x n x σ n x (Eq 14) T T T γ γ