I E C 61 6-3 -1 2 ® Edition 201 7-05 I N TE RN ATI ON AL S TAN D ARD colour i n sid e C on n e ctors for el ectri cal an d e l ectron i c e q u i pm e n t – P rod u ct req u i re m e n ts – P art -1 2 : D e tai l s peci fi cati on for -way, s h i el d ed , fre e an d fi xed n e ctors for IEC 61 076-3-1 22:201 7-05(en) I /O an d G i g abi t E th ern et appl i cati on s i n h ars h en vi ron m en ts T H I S P U B L I C AT I O N I S C O P YRI G H T P RO T E C T E D C o p yri g h t © I E C , G e n e v a , S wi tz e rl a n d All rights reserved Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IEC's member National Committee in the country of the requester If you have any questions about I EC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local I EC member National Committee for further information IEC Central Office 3, rue de Varembé CH-1 21 Geneva 20 Switzerland Tel.: +41 22 91 02 1 Fax: +41 22 91 03 00 info@iec.ch www.iec.ch Ab ou t th e I E C The I nternational Electrotechnical Commission (I EC) is the leading global organization that prepares and publishes I nternational Standards for all electrical, electronic and related technologies Ab o u t I E C p u b l i ca ti o n s The technical content of IEC publications is kept under constant review by the IEC Please make sure that you have the latest edition, a corrigenda or an amendment might have been published I E C Catal og u e - webstore i ec ch /catal og u e The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents Available for PC, Mac OS, Android Tablets and iPad I E C pu bl i cati on s s earch - www i ec ch /search pu b The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,…) It also gives information on projects, replaced and withdrawn publications E l ectroped i a - www el ectroped i a org The world's leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in additional languages Also known as the International Electrotechnical Vocabulary (IEV) online I E C G l os sary - s td i ec ch /g l oss ary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002 Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR I E C J u st Pu bl i s h ed - webstore i ec ch /j u stpu bl i sh ed Stay up to date on all new IEC publications Just Published details all new publications released Available online and also once a month by email I E C C u stom er S ervi ce C en tre - webstore i ec ch /csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csc@iec.ch I E C 61 6-3 -1 2 ® Edition 201 7-05 I N TE RN ATI ON AL S TAN D ARD colour i n sid e C on n ectors for el ectri cal an d e l ectron i c eq u i pm en t – P rod u ct req u i rem en ts – P art -1 2 : D etai l s peci fi cati on for -way, s h i el d ed , free an d fi xed n ectors for I /O an d G i g abi t E th e rn e t appl i cati on s i n h ars h e n vi ron m en ts INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31 220.1 ISBN 978-2-8322-4276-6 Warn i n g ! M ake s u re th a t you ob tai n ed th i s p u b l i cati on from an au th ori zed d i stri b u tor ® Registered trademark of the International Electrotechnical Commission –2– I EC 61 076-3-1 22: 201 © I EC 201 CONTENTS FOREWORD Scope Norm ative references Terms and definitions Mating inform ation General Contacts – m ating conditions Fixed connector Type I 4 Free connector Type I Fixed connector Type I I 4 Free connector Type I I Characteristics General Pin and pair grouping assignm ent Classification into climatic category Electrical characteristics Voltage proof Voltage rating Current-tem perature derating 4 I nitial insulation resistance 20 5 Mechanical characteristics 20 5 Mechanical operation 20 5 I nsertion and withdrawal forces 20 Transmission perform ance 20 General 20 I nsertion loss 21 Return loss 21 Near end cross talk 21 Far end cross talk 21 6 Transverse conversion loss 21 Transfer conversion transfer loss 21 Transfer im pedance 21 Tests and test schedule 22 General 22 Arrangem ent for contact resistance test (Figure 8) 22 Arrangem ent for vibration test (test phase DP3) (Figure 9) 23 Test procedures and measuring methods 23 Preconditioning 24 6 Test schedules 24 6 General 24 6 Basic (m inimum) test schedule 24 6 Full test schedule 24 Mounting of specimens 31 Figure – Contact interface dimensions with a free (male) connector (righ t side) mated with a fixed (female) connector (left side) I EC 61 076-3-1 22: 201 © I EC 201 –3– Figure – Fixed fem ale connector Type I Figure – Free male connector Type I Figure – Fixed (female) connector Type I I Figure – Free (m ale) connector Type I I Figure – Fixed connector pin and pair grouping assignm ent for Type I (left, with coding edges on one short side) and Type I I (right, with coding edges on one long side), front view of connector Figure – Connector de-rating curve 20 Figure – Arrangem ent for contact resistance test 22 Figure – Arrangem ent for vibration test 23 Table Table Table Table Table Table Table Table Table Table Table Table Table Table Table – Dimensions for Figure – Dimensions for Figure 1 – Dimensions for Figure – Dimensions for Figure 5 – Dimensions for Figure – Pin assignment for 0/1 00 Mb Ethernet – Pin assignment for Gb Ethernet 8 – Clim atic category 9 – Test group P 25 – Test group AP 25 1 – Test group BP 27 – Test group CP 28 – Test group DP 29 – Test group EP 30 – Test group FP 31 –4– I EC 61 076-3-1 22: 201 © I EC 201 I NTERNATI ON AL ELECTROTECH N I CAL COMMI SSI ON CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT – PRODUCT REQUIREMENTS – Part 3-1 22: Detail specification for 8-way, shielded, free and fixed connectors for I/O and Gigabit Ethernet applications in harsh environments FOREWORD ) Th e I n ternati on al El ectrotechn i cal Com m i ssi on (I EC) i s a worl d wi d e organi zati on for stan dard i zati on com pri si n g al l n ati on al el ectrotech ni cal com m i ttees (I EC N ati onal Com m i ttees) The obj ect of I EC i s to prom ote i n ternati on al co-operati on on al l q uesti on s concern i n g stand ard i zati on i n the el ectri cal an d el ectron i c fi el d s To thi s en d an d i n add i ti on to other acti vi ti es, I EC pu bl i sh es I nternati on al Stan d ards, Techn i cal Speci fi cati ons, Tech ni cal Reports, Pu bl i cl y Avai l abl e Speci fi cati ons (PAS) an d Gu i d es (h ereafter referred to as “I EC Publ i cati on (s)”) Th ei r preparati on i s entru sted to tech ni cal com m i ttees; any I EC N ati onal Com m i ttee i n terested i n th e subj ect d eal t wi th m ay parti ci pate i n thi s preparatory work I nternati onal , govern m en tal an d n on governm en tal organ i zati ons l i si ng wi th th e I EC al so parti ci pate i n th i s preparati on I E C col l aborates cl osel y wi th th e I n tern ati onal Organ i zati on for Stan d ard i zati on (I S O) i n accordan ce wi th d i ti on s determ i n ed by agreem ent between th e two organ i zati on s 2) The form al deci si on s or ag reem en ts of I EC on tech ni cal m atters express, as n earl y as possi bl e, an i nternati on al sen su s of opi n i on on th e rel evant su bj ects si n ce each tech ni cal com m i ttee has representati on from al l i nterested I EC N ati on al Com m ittees 3) I EC Pu bl i cati ons h ave th e form of recom m en dati ons for i n tern ati on al use an d are accepted by I EC N ati on al Com m i ttees i n that sen se Whi l e al l reasonabl e efforts are m ade to en sure that th e tech ni cal content of I EC Publ i cati on s i s accu rate, I EC can n ot be h el d responsi bl e for th e way i n wh ich th ey are used or for an y m i si nterpretati on by an y en d u ser 4) I n ord er to prom ote i n tern ati onal u ni form i ty, I EC N ati onal Com m i ttees u nd ertake to appl y I EC Pu bli cati on s tran sparentl y to th e m axi m u m exten t possi bl e i n thei r n ati onal an d regi on al publ i cati on s Any d i vergen ce between an y I EC Pu bl i cati on and th e correspon di ng nati on al or regi on al publ i cati on sh al l be cl earl y i n d i cated i n the l atter 5) I EC i tsel f d oes n ot provi de an y attestati on of conform i ty I n depend ent certi fi cati on bod i es provi de form i ty assessm ent servi ces and , i n som e areas, access to I EC m arks of conform i ty I EC i s n ot responsi bl e for an y servi ces carri ed ou t by i nd epen den t certi fi cati on bod i es 6) Al l u sers sh ou l d ensu re that th ey h ave th e l atest ed i ti on of th i s pu bl i cati on 7) N o l i abi l i ty shal l attach to I EC or i ts d i rectors, em pl oyees, servants or ag ents i n cl u di n g in d i vi d u al experts an d m em bers of i ts tech ni cal com m i ttees and I EC N ati on al Com m i ttees for any person al i n j u ry, property d am age or oth er dam age of an y n atu re wh atsoever, wh eth er d i rect or i n di rect, or for costs (i n cl ud i ng l eg al fees) and expen ses ari si n g out of the publ i cati on, u se of, or rel i an ce upon , thi s I EC Publ i cati on or any oth er I EC Publ i cati on s 8) Attenti on i s drawn to th e N orm ati ve references ci ted i n th i s pu bl i cati on U se of th e referenced publ i cati on s i s i nd i spensabl e for the correct appl i cati on of th i s pu bl i cati on 9) Attenti on i s drawn to the possi bi l i ty that som e of the el em ents of th i s I EC Pu bl i cati on m ay be the su bj ect of paten t ri g hts I EC shal l not be hel d respon si bl e for i den ti fyi n g any or all su ch patent ri ghts I n tern ati on al Stan dard I EC 61 076-3-1 22 h as been prepared by su bcom m ittee 48B: El ectrical n ectors, of I EC tech n ical com m ittee 48: El ectrical conn ectors an d m echan ical structures for el ectrical and el ectron ic equ i pm en t This first ed iti on cancels and repl aces I EC PAS 61 076-3-1 22 pu bl ish ed i n 201 Th is ed i tion constitutes a techn ical revision The text of th is I nternational Stan d ard is based on the fol lowin g d ocum ents: FDI S Report on voti n g 48B/2554/FDI S 48B/2563/RVD I EC 61 076-3-1 22: 201 © I EC 201 –5– Fu l l i nform ati on on th e voting for th e approval of th is I n tern ati onal Stan dard can be fou n d in th e report on votin g ind icated i n th e above table This d ocum en t h as been drafted i n accord ance wi th th e I SO/I EC Directi ves, Part A l ist of al l parts i n th e I EC 61 076 series, pu bl ished u nd er th e gen eral ti tl e Connectors electronic equipment – Product requirements , can be fou n d on th e I EC website for The com m ittee h as d ecid ed that th e ten ts of th is docum en t wi l l rem n u nch ang ed un til the stabi li ty d ate i nd icated on th e I EC websi te un d er "http: //webstore iec ch " in th e d ata rel ated to th e specific d ocum ent At th is date, the docum en t wi l l be • reconfirm ed, • wi thdrawn , • repl aced by a revised ed i ti on, or • am end ed A bi l in gual versi on of th is pu bl icati on m ay be issu ed at a l ater d ate IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents Users should therefore print this document using a colour printer –6– I EC 61 076-3-1 22: 201 © I EC 201 I EC 61 076-3-1 22: 201 Subcomm ittee 48B: Electrical conn ectors Detail specification for 8-way, shield ed, free and fi xed conn ectors for I /O and Gi gabit Ethernet appl ications i n harsh environm ents IEC NOTE The above view shows a Type I conn ector pair, with codin g ed ges on a short side; for Type I I nectors the codi ng edg es are l ocated on a l on g side Fi xed conn ectors are m ounted on pri nted circuit board by m eans of solderin g or press-in, the free connector is attached to wires by m eans of solderin g, crim ping, I DC or other term inati on technol ogy I EC 61 076-3-1 22: 201 © I EC 201 –7– C O N N E C T O RS F O R E L E C T RI C AL AN D E L E C T RO N I C E Q U I P M E N T – P RO D U C T RE Q U I R E M E N T S – P a rt -1 2 : D e ta i l s p e c i fi c a ti o n fo r -w a y, s h i e l d e d , fre e a n d fi xe d c o n n e c to rs fo r I /O a n d G i g a b i t E th e rn e t a p p l i c a ti o n s i n h a rs h e n vi ro n m e n ts S cop e This part of I EC 61 076 covers 8-way, shielded, free and fixed rectangular connectors for I /O and Gigabit Ethernet applications, suitable for use in harsh environm ents, and is intended to specify the comm on dim ensions, mechanical, electrical and environm ental characteristics and tests for this fam il y of connectors N o rm a t i ve re fe re n c e s The following docum ents are referred to in the text in such a way that som e or all of their content constitutes requirements of this docum ent For dated references, onl y the edition cited applies For undated references, the latest editi on of the referenced document (including an y am endm ents) applies I EC 60050-581 , In te rn a tion a l Electrotech n ica l Voca b ula ry (IEV) – Ch a pter 581 : Electrom ech a n ica l comp on e n ts for e lectro n ic equipm e n t I EC 60068-1 , En viron m e n ta l testin g – Pa rt : G e n era l a n d guida n ce IEC 60068-2-38, En viron m e n ta l testin g – Pa rt 2-38: Te sts – Test Z/A D: Co m p osite te m pera ture/h umidity cyclic test IEC 6051 2-1 , Con n e ctors for e lectron ic e quip m en t – Te sts and me a sure m e n ts – Pa rt : Ge n era l IEC 6051 2-1 -1 , Co n n ectors for e lectron ic equip me n t – Tests a n d me a sure m e n ts – Pa rt -1 : Ge n era l exa m in a tion – Te st a : Visua l exa a tio n IEC 6051 2-1 -2, Con n ectors for e lectron ic equip me n t – Tests a n d me a sure m e n ts – Pa rt -2: Ge n e l e xa m in a tion – Test b : Exa m in a tion of dime n sion a n d m a ss I EC 6051 2-2-1 , Co n n ectors for e le ctron ic e quip me n t – Tests a n d me a sure m e n ts – Pa rt 2-1 : Ele ctrica l co n tin uity a n d ta ct re sista n ce te sts – Test 2a : Con ta ct resista n ce – Millivo lt leve l me thod IEC 6051 2-3-1 , Con n ectors for e lectron ic equip me n t – Tests a n d me a sure m e n ts – Pa rt 3-1 : In sula tion tests – Test 3a : In sula tio n resista n ce I EC 6051 2-4-1 , Con n e ctors for e lectro n ic equip me n t – Tests a n d me a sure m e n ts – Pa rt 4-1 : Volta ge stress te sts – Te st 4a : Vo lta ge p roof IEC 6051 2-5-2, Con n ectors for e lectron ic e quip m e n t – Te sts a n d m e a sure m e n ts – Pa rt 5-2: Curre n t-ca rryin g ca p a city tests – Test 5b : Curre n t-te m pera ture dera tin g –8– IEC 6051 2-6-3, I EC 61 076-3-1 22: 201 © I EC 201 Co n n ectors for e lectro n ic equip me n t – Tests a n d me a sure m e n ts – Pa rt 6-3: Dyn a mic stress tests – Test 6c: Sh ock IEC 6051 2-6-4, Con n ectors for e lectron ic equip me n t – Te sts a n d me a sure m e n ts – Pa rt 6-4 : Dyn a mic stre ss tests – Test 6d: Vib tio n (sin usoida l) I EC 6051 2-9-1 , Con n ectors for e lectron ic equip me n t – Tests a n d me a sure m e n ts – Pa rt 9-1 : En dura n ce tests – Test 9a : Mecha n ica l op era tion IEC 6051 2-1 -3, Con n ectors for e le ctron ic e quip me n t – Tests a n d m ea sure me n ts – Pa rt 1 -3: Clim a tic tests – Te st 1 c: Da m p h e a t, ste a dy sta te I EC 6051 2-1 -4, Co n n ectors for e lectron ic e quip me n t – Tests a n d m ea sure me n ts – Pa rt 1 -4: Clim a tic tests – Test 1 d: Ra p id ch a n ge of te m pera ture IEC 6051 2-1 -7, Con n ectors for e lectron ic e quip me n t – Tests a n d m ea sure me n ts – Pa rt 1 -7: Clim a tic te sts – Test 1 g: Flo win g m ixed ga s corrosion test I EC 6051 2-1 -9, Co n n ectors for e lectron ic e quip me n t – Tests a n d m ea sure me n ts – Pa rt 1 -9: Clim a tic tests – Test 1 i: Dry h e a t IEC 6051 2-1 -1 0, Con n e ctors for e lectro n ic e quip me n t – Tests a n d m e a sure me n ts – Pa rt 1 - 0: Clim a tic tests – Test 1 j: Co ld I EC 6051 2-1 3-2, Co n n ectors for e lectro n ic e quip m en t – Tests a n d m e a sure me n ts – Pa rt 3-2: Mech a n ica l opera tion tests – Test 3b : In sertion a n d with dra wa l forces IEC 6051 2-1 5-6, Con n ectors for e lectron ic e quip me n t – Tests a n d m ea sure me n ts – Pa rt 5-6: Con n ecto r tests (m ech a n ica l) – Te st 5f: Effective n ess of co n n e ctor coup lin g devices I EC 6051 2-26-1 00, Co n n ectors for Pa rt 26-1 00: Me a surem e n t se tup , e le ctron ic equipm e n t te st a n d referen ce – Tests and m e a sure m en ts – a rra n ge me n ts a n d m ea sure me n ts for n ectors a ccordin g to IEC 60603-7 – Te sts 26a to 26g IEC 61 076-1 : 2006, Con n ectors for e le ctron ic equip m en t – Product re quirem e n ts – Pa rt : Ge n eric sp ecifica tio n IEC 61 076-3, Con n ectors for e lectron ic equip me n t – Product re quirem e n ts – Pa rt 3: Recta n gula r n ectors –Section a l specifica tio n Terms an d defi ni ti ons For the purposes of this docum ent, the term s and definitions given in I EC 60050-581 , I EC 61 076-1 , I EC 61 076-3 and I EC 6051 2-1 appl y I SO and I EC maintain term inological databases for use in standardization at the following addresses: • • I EC Electropedia: available at http://www electropedia.org/ I SO Online browsing platform : available at http: //www iso org/obp Current (A) – 20 – I EC 61 076-3-1 22: 201 © I EC 201 Current de-rating diagram ,8 ,6 ,4 ,2 0, 0, 0, 0, 0 10 20 30 40 50 60 70 80 90 00 Am bient tem perature (°C) IEC NOTE The m axim um perm issible current for a gi ven am bi ent tem perature (t) is: I (t) = ,76 ⋅ − t 0,5 90 NOTE For am bient tem peratures lower than °C, th e m axi m um perm issible current per cond uctor is , 76 A F i g u re – C o n n e c t o r d e - t i n g 4 I n i ti a l Conditions: i n su l ati on c u rv e re s i s t a n c e I EC 6051 2-3-1 , Test 3a Method A Mated connectors Test voltage: 500 V d.c All types: 500 M Ω minimum 5 5 M ech an i ca l c h a c t e ri s t i c s M e c h a n i c a l o p e t i o n Conditions: I EC 6051 2-9-1 , Test 9a Speed: mm/s maximum Rest: s m inimum (mated and unmated) 250 operations 5 I n s e rt i o n a n d w i t h d w a l fo rc e s Conditions: I EC 6051 2-1 3-2, Test 3b Speed: maximum rate of 2, mm per m inute All types, insertion and withdrawal: 20 N maxim um 6 T n s m i s s i o n p e rfo rm a n c e G e n e l Com pliance to this docum ent, in respect to transmission characteristics, shall be determ ined according to specific test m ethods described in test group FP All transm ission perform ance requirements shall appl y between the reference planes specified in I EC 6051 2-26-1 00 All I EC 61 076-3-1 22: 201 © I EC 201 – 21 – transmission results shall be reported as worst case result for the corresponding pair or pair combination after testing all sam ples NOTE I n the foll owi ng su bclauses f is the frequency, expressed in MH z I n s e rt i o n loss Conditions according to I EC 6051 2-26-1 00, test 26a Mated connectors All pairs: ≤ 0, 04 x√ f dB from MH z to 00 MH z Whenever the equation results in a value less than 0,1 dB, the requirement shall revert to 0, dB Re t u rn l oss Conditions according to I EC 6051 2-26-1 00, test 26b Mated connectors Al l pairs: ≥ 60 -20log ( f) dB from MH z to 00 MH z Whenever the equation results in a value greater than 30 dB, the requirem ent shall revert to 30 dB N ear en d c ro s s t a l k Conditions according to I EC 6051 2-26-1 00, test 26c Mated connectors Al l pair com bi nations: ≥ 83 -20log ( f) dB from MH z to 00 MH z Whenever the equation results in a value greater than 75 dB, the requirem ent shall revert to 75 dB Far en d c ro s s t a l k Conditions according to I EC 6051 2-26-1 00, test 26d Mated connectors Al l pair com bi nations: ≥ 75, -20log ( f) dB from MH z to 00 MH z Whenever the equation results in a value greater than 75 dB, the requirem ent shall revert to 75 dB 6 T n s v e rs e c o n v e rs i o n l os s Conditions according to I EC 6051 2-26-1 00, test 26f Mated connectors Al l pairs: ≥ 66 -20log ( f) dB from MH z to 00 MH z Whenever the equation results in a value greater than 50 dB, the requirem ent shall revert to 50 dB T n s fe r c o n v e rs i o n t n s fe r l o s s Conditions according to I EC 6051 2-26-1 00, test 26g Mated connectors Al l pairs: ≥ 66 -20log ( f) dB from MH z to 00 MH z TCTL at frequencies that correspond to calculated values of greater than 50 dB shall revert to a m inim um requirement of 50 dB T n s fe r i m p e d a n c e Conditions according to I EC 6051 2-26-1 00, test 26e Mated connectors Al l pairs: ≤ 0, x f0, Ω from MH z to M H z an d ≤ 0, 02 x f Ω from MH z to 80 MH z – 22 – I EC 61 076-3-1 22: 201 © I EC 201 Tests and test schedul e G en eral This clause states the test sequence (in accordance with this docum ent) and the num ber of specimens for each test sequence I ndividual variants m ay be subm itted to type tests for approval of those particular variants Testers m ay limit the num ber of variants tested to a selection representative of the whole range for which approval is required (which may be less than the range covered by the detail specification), but each feature and characteristic shall be validated against the dimensional requirem ents and test sequences specified in this document The connectors shall have been processed in a careful and workmanlike m anner, in accordance with good current practice Unless otherwise specified, m ated sets of connectors shall be tested For contact resistance measurem ents, care shall be taken to keep a particular com bination of connectors together during the complete test sequence; that is, when un-mating is necessary for a certain test, the sam e connectors shall be mated for subsequent tests Arran g em en t for tact resi stan ce test (Fi gu re 8) IEC Ke y Fi xed conn ector Point P1 Point P2 Point A Measure the DC resistance across each of th e sign al pins As short as practical (except for vi bration test EP5) Free conn ector Point C As short as practical (except for vi bration test EP5) Contact resistance m easurem ent poi nts Fi gu re – Arran gemen t for tact resi stan ce test I EC 61 076-3-1 22: 201 © I EC 201 – 23 – The test procedure is as follows: a) Determine the bulk resistance of the fixed connector between points A and P1 of Figure by calculation or by measurem ent This resistance is noted and recorded as R AP1 b) Determ ine the bulk resistance of the free connector between points P2 and C of Figure by calculation or by m easurement This resistance is noted and recorded as R CP2 c) Measure the total m ated connector resistance between points A and C, following the requirements and procedures of I EC 6051 2, Test 2a This resistance is noted and recorded as R AC d) Calculate the contact resistance by subtracting the sum of the bulk resistance of the fixed and free connectors from the total mated connector resistance Contact resistance = R AC − ( R AP1 + R CP2 ) Arran g em en t for vi brati on test (test ph ase DP3) (Fi gu re 9) IEC Ke y Fi xed conn ector vibrati on featu re Not relevant for vibrati on testin g Not relevant for vibrati on testin g Point A: secure to th e vi bratin g m em ber, m easure the DC resi stance across each of the sig nal pi ns Mounti ng pl ate Free conn ector Point C: secure to the non-vibrating m em be Fi xed conn ector rigi dl y fi xed to the m ounting pl ate Contact resistance m easurem ent poi nt Cabl e length ≥ 200 mm Figu re – Arran g emen t for vi brati on test Test procedu res an d m easu rin g m eth od s The test methods specified and given in the relevant standards are the preferred methods, but not necessaril y the onl y ones that can be used I n case of dispute, however, the specified method shall be used as the reference m ethod Unless otherwise specified, all tests shall be carried out under standard atm ospheric conditions for testing as specified in I EC 60068-1 – 24 – I EC 61 076-3-1 22: 201 © I EC 201 NOTE Where approval procedures are i nvol ved and alternative m ethods are em ployed, it is the responsibility of the m anufacturer to satisfy th e auth ority g ranting approval that an y altern ati ve m ethods which h e m ay use gi ve results eq ui val ent to th ose obtained by the m ethods specified in this docum ent Precon di tion in g Before the tests are m ade, the connectors shall be preconditioned under standard atm ospheric conditions for testing as specified in I EC 60068-1 for a period of 24 h, unless otherwise specified by the detail specification 6 Test sch edu l es 6 G en eral The test parameters required shall not be less than those listed in Clause 6 Basi c (m in i mu m) test sch edu le Not applicable 6 6 3.1 Fu ll test sch ed u l e Gen eral The following tests specify the characteristics which shall be checked and the requirem ents which shall be fulfilled For a complete test sequence, 21 specimens shall be used (Test groups AP, BP, DP, EP and FP shall each consist of specim ens Test group CP consists of specimens) Contact resistance tests shall apply onl y to the interface 6 Test g rou p P – prel im in ary All specim ens shall be subj ected to the following tests All the test group specim ens shall be subj ected to the preliminary group P tests in the following sequence, see Table The specimens shall then be divided into the appropriate number of groups (Tables to 5) All connectors in each group shall undergo the following tests as described in the sequence given I EC 61 076-3-1 22: 201 © I EC 201 – 25 – T a b l e – T e s t g ro u p P Te s t Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e I EC 6051 Te s t n o P1 S e v e ri t y o r c o n d i ti o n Ti tl e o f te s t Re q u i re m e n t s Te s t n o Visual exam inati on 1a There shall be n o defects that would im pair norm al operati on Exam ination of dim ensions and m ass 1b The dim ensions shall com ply with those specified in the detail specification All contacts/ specim ens Low l evel contact resistance 2a Max 80 m Ω initi al, 00 m Ω final P3 500 V d c m in hold I nsulation resistance 3a 500 P4 Subject specim ens to 500 V d c between adj acent contacts and 250 V d c between bri dged sign al contacts and earth shield Voltage proof 4a No breakdown or flashover P2 6 3 General exam inati on I E C 6051 Contact resistance MΩ m inim um T e s t g ro u p AP – C l i m a t i c T a b l e – T e s t g ro u p A P Te s t Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e AP1 I nsertion an d withd rawal force AP2 Rapi d chang e of tem peratu re I EC 6051 S e v e ri t y o r c o n d i t i o n Te s t n o o f te s t Ti tl e Re q u i re m e n t s Te s t n o 3b Measure the force necessary to insert / withd raw the specim ens at a m ax rate of 2, m m per m inute (latchi ng m echanism inactivated ) 11d I E C 6051 Subject m ated specim ens to 20 N m ax for inserti on and for withd rawal Meet visu al req uirem ents, show no ph ysical dam age cycles between -55 ° C an d 85 ° C with 30 m in d wel l at tem p extrem es and m in transition between tem peratu res AP3 Subject specim ens to 500 V d c between adjacent contacts an d 250 V d c between bri dged sign al contacts and earth shield Voltage proof 4a No breakdown or flashover AP4 500 V d c , m in hold I nsulation resistance 3a 500 AP5 All contacts/ specim ens Contact resistance 2a 80 m Ω m ax MΩ m inim um – 26 – Te s t Te s t I EC 61 076-3-1 22: 201 © I EC 201 M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e AP6 Dry heat AP7 Hum idity/tem peratu re cycling AP8 Cold AP9 Contact resistance I EC 6051 S e v e ri t y o r c o n d i t i o n Te s t n o o f te s t 11i Ti tl e Subject m ated specim ens to a tem peratu re of 85 °C during 21 d ays Meet visual req uirem ents, show n o ph ysical dam age I EC 600682-38, test Z/AD cycles (1 d ays) between 25 °C an d 60 °C at 80 % to 00 % RH Subject m ated sam ples to a tem peratu re of -55 ° C for days All contacts/ specim ens Re q u i re m e n t s Te s t n o Subject m ated specim ens to 11j I E C 6051 Meet visu al req uirem ents, show n o ph ysical dam age Meet visu al req uirem ents, show n o ph ysical dam age Low l evel contact resistance 2a 00 m Ω m ax AP1 Subject specim ens to 500 V d c between adjacent contacts an d 250 V d c between bri dged sign al contacts and earth shield Voltage proof 4a No breakdown or flashover AP1 500 V d c , m in hold I nsulation resistance 3a 500 3b 20 N m ax for inserti on and for withd rawal AP1 I nsertion an d withd rawal force AP1 Effectiveness of connector coupli ng device AP1 General exam inati on Measure the force necessary to insert / withd raw the specim ens at a m ax rate of 2, m m per m inute (latchi ng m echanism inactivated ) 5f Rate of l oad appl ication 45 N/s m axim um MΩ m inim um 50 N for 60 s ± s Visu al exam i n ation 1a There shall be no defects that would im pair norm al operati on I EC 61 076-3-1 22: 201 © I EC 201 6 – 27 – T e s t g ro u p B P – M e c h a n i c a l e n d u n c e Tabl e 1 Te s t – T e s t g ro u p B P Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e I EC 6051 Te s t n o S e v e ri t y o r co n d i ti o n Ti tl e o f te s t I E C 6051 Re q u i re m e n t s Te s t n o BP1 I nsertion an d withd rawal force Measure the force necessary to insert / withd raw the specim ens at a m ax rate of 2, m m per m inute (latchi ng m echanism inactivated ) 3b 20 N m ax for inserti on and for withd rawal BP2 Mech anical operati on (half of the specified num ber of cycles) Mate an d un -m ate the specim ens for 50 cycles at a m ax rate of 200 cycl es/hour 9a Shall m eet visual req uirem ents, show no ph ysical dam age BP3 Contact resistance All contacts/ specim ens 2a 00 m Ω m ax BP4 Mi xed flowi ng gas corrosion Subject m ated specim ens to environm ent M ethod for days (unm ated for days, then m ated for d ays) 11g Shall m eet visual req uirem ents, show n o ph ysical dam age BP5 Mech anical operati on (rem aini ng num ber of operati ons) Mate an d un -m ate the specim ens for 50 cycles at a m ax rate of 200 cycl es/hou r 9a Meet visu al req uirem ents, show n o ph ysical dam age BP6 Hum idity/tem p erature cyclin g Subject m ated specim ens to cycles (1 days) between 25 °C an d 60 °C at 80% to 00 % RH I EC 600682-38, test Z/AD Meet visu al req uirem ents, show n o ph ysical dam age BP7 Contact resistance All contacts/ specim ens BP8 General exam inati on Low l evel contact resistance Low l evel contact resistance 2a 00 m Ω m ax Visual exam inati on 1a There shall be n o defects that would im pair norm al operati on – 28 – 6 I EC 61 076-3-1 22: 201 © I EC 201 T e s t g ro u p C P – M o i s t u re T a b l e – T e s t g ro u p C P Te s t Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e I EC 6051 Te s t n o S e v e ri t y o r co n d i ti o n Ti tl e o f te s t I E C 6051 Re q u i re m e n t s Te s t n o CP1 I nsertion an d withd rawal force Measure the force necessary to insert / withd raw the specim ens at a m ax rate of 2, m m per m inute (latchi ng m echanism inactivated ) 3b 20 N m ax for inserti on and for withd rawal CP2 Dam p heat, steady state Subject m ated specim ens to a rel ative hum idity of 95 % at a tem peratu re of 40 °C d uring 21 days 11c Shall m eet visual req uirem ents, show n o physical dam age CP3 Contact resistance All contacts/ specim ens Low l evel contact resistance 2a 00 m Ω m ax CP4 500 V d c , m in hold I nsulation resistance 3a 500 MΩ m inim um CP5 Subject specim ens to 500 V d c between adj acent contacts and 250 V d c between bri dged sign al contacts and earth shield Voltage proof 4a No breakdown or flash over 3b 20 N m ax for inserti on and for withd rawal 1a There shall be no d efects that woul d im pair norm al operati on CP6 I nsertion an d withd rawal force CP7 General exam inati on Measure the force necessary to insert / withd raw the specim ens at a m ax rate of 2, m m per m inute (latchi ng m echanism inactivated ) Visual exam inati on I EC 61 076-3-1 22: 201 © I EC 201 6 – 29 – T e s t g ro u p D P – H e a t a n d e l e c t ri c a l l o ad T a b l e – T e s t g ro u p D P Te s t Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e I E C 6051 Te s t n o DP1 Mech anical operati on (rem aini ng num ber of operati ons) DP2 Dry heat DP3 Contact resistance S e v e ri t y o r c o n d i ti o n Ti tl e o f te s t Re q u i re m e n t s Te s t n o Mate an d unm ate the specim ens for 50 cycles at a m ax rate of 200 cycles/hou r 11i I EC 6051 9a Subject m ated specim ens to a tem peratu re of 85 °C d uring 21 d ays Shall m eet visual requirem ents, show n o physical dam age Shall m eet visual req uirem ents, show n o physical dam age All contacts/ specim ens Low l evel contact resistance 2a 00 m Ω m ax DP4 500 V d c , m in hold I nsul ation resistance 3a 500 MΩ m inim um DP5 Subject specim ens to 500 V d c between adj acent contacts and 250 V d c between bri dged sign al contacts and earth shield Voltage proof 4a No breakdown or flash over, Visual exam inati on 1a There shall be no d efects that woul d im pair norm al operati on DP6 General exam inati on – 30 – 6 I EC 61 076-3-1 22: 201 © I EC 201 T e s t g ro u p E P – D y n a m i c s t re s s T a b l e – T e s t g ro u p E P Te s t Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e I EC 6051 Te s t n o S e v e ri t y o r co n d i ti o n EP1 Vibrati on, sinusoid al EP2 General exam ination EP3 Mech anical shock Subject m ated specim ens to 300 m /s half-sin e shock pulses of 1 m s durati on, shocks in both directions of m utually perpendicul ar directions (totall y shocks) EP4 Contact resistance All contacts/ specim ens EP5 General exam ination 6 T e s t g ro u p F P – S i g n a l Ti tl e o f te s t I E C 6051 Re q u i re m e n t s Te s t n o 0-55-1 H z, , 55 m m displ h in each of m utually perpendicul ar axes 6d There shall be no discontin uities with duration > µs 1a There shall be no d efects that woul d im pair norm al operati on 6c There shall be no discontin uities with duration > µs Low l evel contact resistance 2a 00 m Ω m ax Visual exam inati on 1a There shall be no d efects that woul d im pair norm al operati on Visual exam inati on i n t e g ri t y These tests are applicable for signal connectors for sym m etrical pair cabling Measurem ents shall be performed between pairs which are connected according the pin and pair grouping assignment as indicated in I EC 61 076-3-1 22: 201 © I EC 201 – 31 – T a b l e – T e s t g ro u p F P Te s t Te s t M e a s u re m e n t t o b e p e rfo rm e d ph ase Ti tl e FP1 I EC 6051 S e v e ri t y o r c o n d i t i o n Te s t n o o f te s t Ti tl e I E C 6051 R e q u i re m e n t s Te s t n o I nsertion loss 26a Test result shal l be ≤0, √ 푓 dB see FP2 FP3 Return l oss Near end crosstalk All pairs, both directions 26b All pairs, both directions (pai r to pair) 26c ≥60 – 20log( 푓 ) dB see Test result shal l be ≥83 – 20log ( 푓 ) dB see FP4 Far end crosstalk All pairs, both directions (pai r to pair) 26d Test result shal l be ≥75 , – 20log( 푓 ) dB see FP5 Transverse conversion loss All pairs, both directions 26f For al l pai rs, the test result shal l be ≥66 – 20log( 푓 ) dB see 6 FP6 Transverse conversion transfer loss All pairs, both directions 26g For al l pai rs, the test result shall be ≥66 – 20log( 푓 ) dB see FP7 Transfer im pedance 26e Measuri ng poi nts accordi ng to 2, all signal contacts and screen Test result shal l be ≤ 0, x 푓 0, Ω from MH z to MH z ≤0, 02 x 푓 0, Ω from MH z to 00 M Hz see FP8 FP9 I nput to output resistance Resistance unbalance Measuri ng poi nts accordi ng to 2, all signal contacts and screen Measuri ng poi nts accordi ng to 2, all signal contacts and screen 2a Signal contact resistance sh all be 00 m Ω m ax Screen resistance shall be 0 m Ω m ax Low l evel contact resistance 2a Unbalance resistance sh all be 50 m Ω m ax M o u n ti n g o f s p e ci m e n s When mounting is required in a test, the connectors shall be rigidl y m ounted on a metal plate, a printed board or to specified accessories, whichever is applicable, using the normal mounting method, fixing devices and panel cut-out _ INTERNATIONAL ELECTROTECHNICAL COMMISSI ON 3, rue de Varembé PO Box 31 CH-1 21 Geneva 20 Switzerland Tel: + 41 22 91 02 1 Fax: + 41 22 91 03 00 info@iec.ch www.iec.ch