00140532 PDF BRITISH STANDARD BS CECC 16100 1980 Harmonized system of quality assessment for electronic components — Sectional specification Electromechanical all or nothing relays UDC 621 318 56 BS C[.]
BRITISH STANDARD Harmonized system of quality assessment for electronic components — Sectional specification: Electromechanical all-or-nothing relays UDC 621.318.56 BS CECC 16100:1980 BS CECC 16100:1980 Cooperating organizations The Electronic Components Standards Committee, under whose direction this British Standard was prepared, consists of representatives from the following Government department and scientific and industrial organizations: British Electrical and Allied Manufacturers’ Association (BEAMA) Electricity Supply Industry in England and Wales Electronic Components Industry Federation* Electronic Engineering Association* Institution of Electronic and Radio Engineers Ministry of Defence* National Supervising Inspectorate* Post Office* Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association (TEMA)* The organizations marked with an asterisk in the above list, together with the following, were directly represented on the Committee entrusted with the preparation of this British Standard: Association of Control Manufacturers Tacma (BEAMA) Cinematograph Exhibitors’ Association of Great Britain and Ireland Transmission and Distribution Association (BEAMA) This British Standard, having been prepared under the direction of the Electronic Components Standards Committee, was published under the authority of the Executive Board and comes into effect on 29 August 1980 © BSI 11-1999 The following BSI references relate to the work on this standard: Committee reference ECL/1 Draft for comment 77/29527 DC ISBN 580 11518 Amendments issued since publication Amd No Date of issue Comments BS CECC 16100:1980 Contents Cooperating organizations National foreword Foreword Text of CECC 16100 Publications referred to © BSI 11-1999 Page Inside front cover ii iii Inside back cover i BS CECC 16100:1980 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee It is identical with the CENELEC Electronic Components Committee (CECC) 16100 “Harmonized system of quality assessment for electronic components Sectional specification: Electromechanical all-or-nothing relays” This standard is a harmonized specification within the CECC system The existing non-harmonized BS 9151 “Rules for the preparation of detail specifications for all-or-nothing relays of assessed quality” will remain in force for the time being because of current approvals within the BS 9000 scheme Terminology and conventions The text of the CECC specification has been approved as suitable for publication, without deviation, as a British Standard Some terminology and certain conventions are not identical with those used in British Standards; attention is especially drawn to the following The comma has been used throughout as a decimal marker In British Standards it is current practice to use a full point on the baseline as the decimal marker Cross-reference The British Standard harmonized with CECC 00100 is BS E9000 “General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System” Part “Basic rules” The British Standard harmonized with CECC 00107 is BS E9000-2 “Rules of procedure” International Standard Corresponding British Standard IEC 410:1973 BS 6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) BS CECC 16000:1980 Harmonized system of quality assessment for electronic components Generic specification: Electromechanical all-or-nothing relays (Identical) CECC 16000:1979 IEC 255 (to which reference is made in 4.2), is a multipart standard and relevant parts of it are to be published as identical British Standards A British Standard does not purport to include all the necessary provisions of a contract Users of British Standards are responsible for their correct application Compliance with a British Standard does not of itself confer immunity from legal obligations Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages to 12, an inside back cover and a back cover This standard has been updated (see copyright date) and may have had amendments incorporated This will be indicated in the amendment table on the inside front cover ii © BSI 11-1999 BS CECC 16100:1980 Contents Foreword Section Scope Section General 2.1 Related documents Section Quality assessment procedures 3.1 Primary stage of manufacture 3.2 Structurally similar relays 3.3 Qualification approval tests 3.4 Formation of inspection lots 3.5 Test schedules 3.6 Order of tests Section Writing of blank detail and detail specifications Section Marking 5.1 Relay 5.2 Package Appendix A Explanations and examples regarding IL- and AQL-values Table — Basic test schedules for electromechanical all-or-nothing relays ii Page iii 1 1 1 1 2 9 10 © BSI 11-1999 BS CECC 16100:1980 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity The components produced under the System are thereby accepted by all member countries without further testing This document has been formally approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for ELECTROMECHANICAL ALL-OR-NOTHING RELAYS It should be read in conjunction with document CECC 00100: Basic Rules (1974) Preface This sectional specification was prepared by CECC Working Group 16: “Relays” In accordance with the requirements of document CECC 00100 it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission The text of this sectional specification was circulated to the CECC for voting in the document CECC(Secretariat)644 in September 1977, and was ratified by the CECC for printing as a CECC specification The layout of this specification deviates from that given in CECC 00400, mainly by the insertion of an “Appendix A: Explanations and Examples Regarding IL- and AQL-Values”, which gives guidance to specification writers © BSI 11-1999 iii iv blank BS CECC 16100:1980 Section Scope This sectional specification applies to electromechanical all-or-nothing relays of assessed quality It selects from the generic specification CECC 16000 the appropriate methods of tests to be used in detail specifications derived from this specification, and contains basic test schedules to be used in the preparation of such specifications Detailed test schedules are contained in the blank detail specifications supplementary to this specification Section General 2.1 Related documents CECC 16000:1979, Generic Specification: Electromechanical all-or-nothing relays Section Quality assessment procedures 3.1 Primary stage of manufacture The primary stage of manufacture is the manufacturer’s incoming goods inspection stage where he checks that these goods fulfil his specified requirements 3.2 Structurally similar relays Relays are considered structurally similar if having no other differences in design than in: 1) coil wire diameter and number of windings 2) types, numbers and material of contacts 3) rated coil and/or contact voltage(s) 4) mounting and terminal variants altogether up to the limits prescribed in the detail specification NOTE If a detail specification covers variants 1) to 4), then the purchaser shall specify which variant(s) he requires 3.3 Qualification approval tests Qualification approval tests shall include all the tests prescribed in the detail specification, and shall be performed: — for short production runs: by a schedule specifically prescribed in the detail specification (method of CECC 00107) — for large production runs: by the schedule prescribed in the detail specification for quality conformance inspection on three consecutive lots (method of CECC 00107) As a general rule, a minimum of five specimens are required for each group of tests in a test schedule as in method of CECC 00107 Specimens which pass a non-destructive test may be used again for subsequent destructive tests 3.4 Formation of inspection lots Inspection lots shall be formed in accordance with § 10 of CECC 00107 and with the sampling plans and procedures given in IEC Publication 410, except for small production runs, isolated lots, and small lots 3.4.1 When sampling is carried out in accordance with IEC Publication 410, the percent defective concept only shall be used Stratified or representative sampling shall always be used to include all production lines and structurally similar relays in proportion to their respective quantities in the lot Where variants are liable to cause differing results in a particular test, exceptions from proportionality may become necessary and shall be stated in the detail specification or agreed between the manufacturer and the National Supervising Inspectorate (ONS) Specimens shall be as representative as possible of the production Samples for Group C inspection shall be taken from a lot (or lots) which has passed Group A and B inspection They may be taken either from the lot which leaves production at the end of the Group C period, or from different lots at intervals during the Group C period In either case the sample size shall not be less than that applicable to the average lot size in the current Group C period © BSI 11-1999 BS CECC 16100:1980 3.4.2 A short production run is defined as a production comprising not more than 30 inspection lots For each of these lots the procedures for isolated lots shall be adopted However, depending on lot size and acceptable quality level (AQL), the switching rules may have a greater chance if operating with large lots and low AQL, which may also be considered when determining the sampling plans to be used These shall be agreed between the manufacturer and the ONS 3.4.3 An isolated lot (as distinct from the lot of isolated nature in IEC 410, Clause 11.6) is defined as a unique production or supply lot, not forming part of a current sequence of inspection lots in the quality assessment system The following options are available and shall be chosen by agreement between the manufacturer and the ONS 1) 100 % inspection if the lot is too small for sampling with adequate discrimination against the release of non-conforming items for the specified AQL and inspection level (IL) (non-destructive tests only) 2) Change to a sampling plan with an operating characteristic giving adequate protection (DR)* at the limiting quality (LQ) and for the known usage of the relays in the lot The plan to be used shall be agreed between the manufacturer and the ONS and should not unduly increase the producer’s risk of the original AQL The plan chosen may have both different AQL and IL from those specified in the detail specification NOTE *DR = Discrimination Ratio, defined as: Quality Level for which Pa = 10 % -AQL (see Table VI-A and Table X of IEC Publication 410) 3) Where good discrimination cannot be obtained e.g for a small lot and a destructive test, a greater sampling risk must be taken and agreement on the plan to be used shall be reached between the manufacturer, the ONS and when known, the ultimate customer (user) 3.4.4 For small lots, procedures as described in 1), 2) or 3) of 3.4.3 above may be used and agreed between the manufacturer, the ONS and when known, the ultimate customer (user) 3.5 Test schedules 3.5.1 A test sequence shall consist of all tests listed in the detail specification The reference numbers of the tests are those of CECC 16000 Generic Specification: Electromechanical All-or-nothing Relays, except those described in detail in the detail specification 3.5.2 The IL-notation applies for all tests in one Sub-Group A corresponding range of values of AQL is given, including a centre value which is underlined, and the and the authority preparing detail specifications shall choose the appropriate value which then applies to all tests in one Sub-Group 3.5.3 All tests in Sub-Group A0 shall normally be performed on every relay However, if for some reason there is a need to check by auditing the outcome of the 100 % test or in special cases of mass production, it is advisable to check the lot on a statistical basis For this purpose, an IL value and an AQL range are given in Table 3.5.4 Any IL- and AQL-notations shall be interpreted such that the number of defectives allowable for acceptance is applicable to each test within a Sub-Group separately, i.e., no accumulated AQLs are to be stated 3.6 Order of tests 3.6.1 Quality conformance inspection is divided into two parts: that carried out lot-by-lot, on which the release of the individual lots is based, and that carried out on a periodic basis which contains the time-consuming and more expensive tests Following § 8.2 of CECC 00107, Groups A and B contain lot-by-lot tests, while periodic and further tests required for the maintenance of qualification approval are contained in Group C 3.6.2 When several tests are subsequently to be carried out on any one specimen or number of specimens, the following order shall apply, unless otherwise prescribed in the detail specification — Tests of Sub-Group A0 shall always precede any other non-destructive (ND) or destructive (D) tests — The remaining ND tests may be conducted in any suitable order, provided that the effects of earlier tests are not liable to invalidate the results of the later tests © BSI 11-1999 BS CECC 16100:1980 — Destructive (D) tests may be preceded by one or more ND tests, provided that the effects of the ND tests are not liable to invalidate the results of the D test Section Writing of blank detail and detail specifications 4.1 Blank detail specifications shall conform with the test schedules given in Table of this specification and the related explanations Detail specifications shall follow the blank detail specifications as far as tests in the latter are marked by M (mandatory) Tests marked by R (recommended) may be included in the detail specifications Other tests contained in CECC 16000 and any other tests not listed there but considered necessary, may be included but care shall then be taken to check whether the IL- and AQL- notations are still reasonable, and that the final measurements for each test in a Group are correctly listed at the end of that Group NOTE Although some tests are marked by R in the blank detail specification if included in the detail specification, they are then mandatory 4.2 Blank detail specifications shall call for, and detail specifications shall include, the following information: 1) Identification of the detail specification 2) Identification of the relay and information on its applications Identification shall be provided by such properties as size, sealing, whether monostable or bistable, polarised or not, or as otherwise required for identification 3) Outline drawing of the relay and key dimensions Variants, such as for terminations, may be given in an Appendix to the detail specification 4) Reference data of the relay A limited number of values is required on the front page, so as to describe the overall performance of the relay Full information in conformance with IEC-Publication 255-1-00 shall be added on one of the subsequent pages, and accordance with IEC 255-1-00 implies that rated values should preferably be those listed therein Where tests are referred to rated values, they shall be indicated with each test Where tests are to be performed at other than rated values, the test values shall be indicated and clearly distinguished from the rated values 5) Related documents Reference shall be made to CECC 16000 and this sectional specification When reference to further documents is necessary, such documents shall be listed with their full titles, year of edition and, unless common knowledge, the source from which they can be obtained 6) Level of assessment Table of this specification contains three test schedules They shall be referenced as test schedule X (number 1, or 3) without additions, if containing only tests listed in that schedule, or as test schedule X with additions, if tests have been added which are not listed in the test schedule 7) Intervals between tests 8) Formation of inspection lots, if predictable in the sense of 3.4 9) Order of tests, if deviating from 3.6 10) General test conditions, if deviating from 5.5 of CECC 16000 11) Qualification approval test schedule 12) Quality conformance test schedule For 11) and 12): For each group of tests, the final measurements specified in each of them shall be summed up and be stated at the end of the Sub-Group 13) Specification of IL-numbers 14) Specification of AQL-numbers 15) Marking of package and/or relays beyond that listed in this specification, if necessary Each of the above items shall be taken into consideration during the testing of the relays covered by the detail specification 4.3 Additional information, such as diagrams and graphs, may be given in an Appendix of the detail specification Such information should not be used for test purposes © BSI 11-1999 BS CECC 16100:1980 4.4 When preparing detail specifications the following steps are to be taken in order to obtain an adequate test schedule: — Select from Table of this sectional specification the properties relevant to the intended use of the relay — Select the test schedule which most closely satisfies the requirements for the relay — Include in the detail specification all the mandatory tests prescribed in the chosen test schedule, together with those recommended tests considered appropriate for the intended use — If necessary, add any other tests required either from or beyond CECC 16000 Table — Basic test schedules for electromechanical all-or-nothing relays Explanations and abbreviations T1 Ranking of test schedules All mandatory and recommended tests listed in test schedule are also included in test schedule 2, plus some further tests Likewise the tests of test schedule are again included in test schedule 3, plus still further tests In a few cases, tests are shifted from one group to another, or recommended tests become mandatory when proceeding from test schedule to the higher ones Such shifting and changes are marked by an asterisk (for example: M+ ) T2 Order of tests The tests in each Sub-Group are listed in the order of the number of paragraphs in CECC 16000 For the order in which tests shall be cried out, see 3.6 of this specification T3 Abbreviations T3.1 Options M test mandatorily to be included in detail specification R test recommended for inclusion in detail specification Tests contained in CECC 16000 but not listed in the test schedule may be added to any detail, specification if required T3.2 Properties of relays RT relay with open contacts RT I relay with sealed contacts RT II sealed relay The effectiveness of sealing is defined by the test methods in 5.20 of CECC 16000 T3.3 Categories of contacts CA relay with category contacts (30 mV; 10 mA) CA I relay with category I contacts (60 V;100 mA) CA II relay with category II contacts (250 V; A) CA relay with category III contacts (600 V; 100 A) III The application categories of contacts are defined in full in 3.7 of CECC 16000 T4 Notes Table refers to the following notes: NOTE These tests are to be carried out in this test group when either, or both, of the following situations apply: 1) When the parameter concerned is vital to the successful operation of the relay in its intended use 2) When the manufacturing variability is comparable to the specified tolerance range for a stated parameter, and when any relay with characteristics outside these limits would have an adverse effect on its intended use NOTE Only applicable when agreed upon between manufacturer and purchaser and when the test duration does not exceed one week NOTE Only applicable when agreed upon between manufacturer and purchaser NOTE Combination of electrical and mechanical endurance is allowed when the required number of operations for one of the electrical endurance tests is at least equal to the number of operations required for mechanical endurance NOTE In the tables on pages to 10 references such as A0, A1, B2 etc refer to Sub-Groups A0, A1, B2 etc © BSI 11-1999 BS CECC 16100:1980 Table — Basic test schedules for electromechanical all-or-nothing relays Test Test schedule Test schedule Test schedule References are to CECC 16000 Group A Sub-Group A0 For all tests in this Sub-Group Visual inspection, marking 5.6.4 General case 100 % test Special case IL: II AQL: 0,065 0,25 0,65 M M M Coil resistance 5.8.1 Dielectric test 5.9 M+ if notes and/or apply M reduced number of M terminals as stated in detail specification Contact-circuit resistance 5.12 terminals stated in detail spec to which note applies M terminals stated in detail spec to which note applies M only for CA M only for CA Functional tests 5.13 M operate and release value for RT I and RT II only M operate and release value for RT I and RT II only M operate and release value for RT I and RT II only Sealing 5.20.2 M only for RT II M only for RT II M only for RT II Sub-Group A1 For all tests in this Sub-Group IL: I AQL: 0,4 1,0 Mechanical test procedures 5.7.1 R R Coil resistance 5.8.1 M only for d.c relays M only for d.c relays M only if not tested in A Coil impedance 5.8.3 M only for a.c relays M only for a.c relays M only for a.c relays M only for CA I M only for CA I M operate and release value for RT only M operate and release value for RT only Contact-circuit resistance 5.12 Functional tests 5.13 M operate and release value for RT only Timing tests 5.14 Internal moisture 5.21 R+ if notes and apply R+ only for RT II and CA both combined M+ only for RT II and CA both combined Abbreviations and notes on page © BSI 11-1999 BS CECC 16100:1980 Table — Basic test schedules for electromechanical all-or-nothing relays Test Test schedule Test schedule Test schedule References are to CECC 16000 Sub-Group A2 For all tests in this Sub-Group Check of dimensions 5.6.1 IL: S-4 AQL: 0,4 1,0 R M+ M M M M+ further selected terminals not tested in A0 and if note applies M Sub-Group A3 For all tests in this Sub-Group Visual inspection, other than marking 5.6.4 IL: II AQL: 0,4 1,0 M Sub-Group A4 For all tests in this Sub-Group IL: S-4 AQL: 0,4 1,0 Dielectric test 5.9 Insulation resistance 5.11 further selected terminals not tested in A0 and if note applies M+ Group B Sub-Group B1 For all tests in this Sub-Group IL: S-3 AQL: 0,4 1,5 6,5 Electrical endurance 5.30 R+ only if notes and apply R R R only if notes and apply Sub-Group B2 For all tests in this Heating 5.18 IL: S-3 AQL: 0,4 1,0 R Rapid change of temperature, method 5.19.2 Internal moisture 5.21 M R only for RT II M only for RT II only for RT II and CA both combined Abbreviations and notes on page © BSI 11-1999 BS CECC 16100:1980 Table — Basic test schedules for electromechanical all-or-nothing relays Test Test schedule Test schedule Test schedule References are to CECC 16000 Sub-Group B2 Robustness of terminals 5.24 Solderability, Test 5.25.3 M for printed wiring board relays only Magnetic remanence 5.43 M+ only for RT II M M M R only for RT II for d.c relays only R for d.c relays only only for RT I and RT II R only for RT I and RT II R only if not tested in B1 and if note applies Sub-Group B3 For all tests in this Sub-Group IL: S-3 AQL: 0,1 0,65 2,5 Contact sticking 5.42 R Group C Sub-Group C1 For all tests in this Sub-Group IL: S-2 AQL: 0,4 1,5 6,5 Electrical endurance 5.30 R+ only if not tested in B1 and if note applies Sub-Group C2 For all tests in this Sub-Group IL: S-3 AQL: 0,4 1,0 Coil inductance 5.8.2 Dielectric test 5.9 R M terminals not tested M in A0 Insulation resistance 5.11 M Contact-circuit resistance 5.12 R Timing tests 5.14 R only if not in A0 and A4 M only if not in A0 and A4 only for CA II and CA III M+ only for CA II and CA III M+ only if not tested in A1 Abbreviations and notes on page © BSI 11-1999 BS CECC 16100:1980 Table — Basic test schedules for electromechanical all-or-nothing relays Test Test schedule Test schedule Test schedule References are to CECC 16000 Sub-Group C3 For all tests in this Sub-Group Check of dimensions 5.6.1 IL: S-2 AQL: 0,65 1,5 6,5 R no dimensions checked in A2 Mass 5.7.2 R R Contact noise 5.39 R only for CA and CA I M+ only if not tested in B1 or C1 M only if not tested in B1 or C1 M M see note Sub-Group C4 For all tests in this Sub-Group Electrical endurance 5.30 IL: S-2 AQL: 0,4 1,5 6,5 R Mechanical endurance 5.31 see note Sub-Group C5 For all tests in this Sub-Group IL: S-2 AQL: 0,4 1,0 Climatic sequence 5.15 R R R Damp heat, steady state 5.16 R R R Salt mist 5.22.1 R only for RT II R only for RT II only if not tested in B2 Robustness of terminals 5.24 R M+ only if not tested in B2 M Shock, Bump, Vibration and Acceleration 5.26 to 5.29 R R R Thermal endurance 5.32 R Thermo-electric e.m.f 5.40 R only for CA Abbreviations and notes on page © BSI 11-1999 BS CECC 16100:1980 Table — Basic test schedules for electromechanical all-or-nothing relays Test Test schedule Test schedule Test schedule References are to CECC 16000 Sub-Group C6 For all tests in this IL: S-2 AQL: 1,5 2,5 6,5 Thermal resistance 5.17 R Rapid change of temperature 5.19 R R only for RT and RT I Mould growth 5.23 Resistance to soldering heat, Test 5.25.3 R only for RT and RT I R R R Abbreviations and notes on page Section Marking Marking of relays and package Relays and their package supplied in accordance with detail specifications covered by this specification, shall be marked as follows unless otherwise prescribed in the detail specification 5.1 Relay (minimum information) — trade mark or manufacturer’s name — relay type and variant code — coded date of manufacture, to at least the nearest month 5.2 Package (minimum information) — detail specification reference — trade mark or manufacturer’s name — relay type and variant code — manufacturer’s batch identification code — quantity © BSI 11-1999 BS CECC 16100:1980 Appendix A Explanations and examples regarding IL- and AQL- values A.1 Introduction This sectional specification refers to, and detail specifications derived from it will generally use, the concept of IEC-Publication 410 which is based on notations called IL- and AQL-values This Appendix explains in a rather simple form the meaning; of inspection level (IL) and acceptable quality level (AQL) while showing by some examples the consequences from choosing IL- and AQL-values It is not intended to replace or supersede the far more detailed terminology and specifications contained in IEC-Publication 410 A.2 Inspection level — ILThe inspection level determines the relationship between the lot or batch size and the sample size This relationship is established by means of a table in IEC 410 which contains lines for various lot or batch sizes, from to more than 50 000, and contains columns for seven different inspection levels These levels are divided into two groups The general inspection levels are I, II and III from which IL II is normally be used, while IL I results in a smaller, and IL III in a larger number of test specimens The special inspection levels are S-1 to S-4 and result in far smaller sample sizes They are to be used for expensive tests, e.g destructive tests or tests of long duration IL S-1 results in the smallest, and IL S-4 results in the largest sample size among the special inspection levels A.3 Sample sizes, versus IL-values If single sampling and normal inspection (see IEC 410 for the explanations of these terms) are used, the following examples of relationship between lot or batch size and sample size apply Lot or batch size 91 to 150 501 to 200 10 001 to 35 000 Sample size for IL S-1 S-2 S-3 S-4 I II III 5 13 20 20 50 32 125 20 80 315 32 125 500 A.4 Acceptable quality level — AQL — The acceptable quality level is — simply explained — the percentage of defectives within a lot which a buyer is willing to admit, and which is ensured to him, by means of sampling inspection, at a given probability This probability is of the order of 90 % but varies with the chosen IL and AQL The AQL is the index of tables in IEC 410 which relate two figures to a given AQL and the sample size determined as above: The figure Ac (accepted) is the maximum number of defectives up to which the lot or batch is accepted The figure Re (rejected) is the number of defectives above which the lot or batch is rejected The figures Ac and Re are results from statistical equations (Poisson distributions) which connect IL and AQL notations such that the supplier, when complying with these figures, may suppose at the given probability, that the buyer will accept the delivery when the latter uses the same AQL A.5 Admitted defectives versus AQL If single sampling, normal inspection and IL II are used, the following examples of relationship between sample size and number of allowed defectives apply 10 © BSI 11-1999 BS CECC 16100:1980 It is to be noted that some AQL-values may require a larger or smaller sample size than determined in accordance with the IL-value This is indicated by arrows in the following table Lot size Sample size Number of allowed defectives (Ac) at IL II and AQL 0,25 0,40 0,65 1,0 1,5 2,5 91–150 20 use 50 use 32 specimens specimens G G E 501–1 200 80 E use 13 use 32 specimens specimens G use 50 use 125 specimens specimens 1 5 10 14 G 10 001–35 000 © BSI 11-1999 315 11 12 blank