Tài liệu tham khảo |
Loại |
Chi tiết |
[5] 5. John Canny, “A computational approach to edge detection”, Pattern Analysis and Machine Intelligence, IEEE Transactions on, (6):679–698, 1986 |
Sách, tạp chí |
Tiêu đề: |
John Canny, “A computational approach to edge detection |
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[6] 6. Satoshi Suzuki and others, “Topological structural analysis of digitized binary images by border following”, Computer Vision, Graphics, and Image Processing, 30(1):32–46, 1985 |
Sách, tạp chí |
Tiêu đề: |
Satoshi Suzuki and others, “Topological structural analysis of digitized binary images by border following |
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[7] 7. M. A. Fischler and R. C. Bolles, “Random sample consensus: A paradigm for model fitting with applications to image analysis and automated cartography”, Communications of the ACM, vol. 24, no.6, 1981, pp. 381–395 |
Sách, tạp chí |
Tiêu đề: |
M. A. Fischler and R. C. Bolles, “Random sample consensus: A paradigm for model fitting with applications to image analysis and automated cartography”, Communications of the ACM, vol. 24, no |
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[8] 8. Joseph Redmon, Ali Farhadi, “YOLOv3: An Incremental Improvement”, ArXiv, 2018 |
Sách, tạp chí |
Tiêu đề: |
Joseph Redmon, Ali Farhadi, “YOLOv3: An Incremental Improvement |
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[9] 9. Shuang Mei, Yudan Wang and Guojun Wen, “Automatic Fabric Defect Detection with a Multi-Scale Convolutional Denoising Autoencoder Network Model”, Sensors 2018, 18, 1064 |
Sách, tạp chí |
Tiêu đề: |
Shuang Mei, Yudan Wang and Guojun Wen, “Automatic Fabric Defect Detection with a Multi-Scale Convolutional Denoising Autoencoder Network Model |
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[10] 10. Jiawei Yu, Ye Zheng, Xiang Wang, Wei Li, Yushuang Wu, Rui Zhao, Liwei Wu, “FastFlow: Unsupervised Anomaly Detection and Localization via 2D Normalizing Flows”, ArXiv, 2021 |
Sách, tạp chí |
Tiêu đề: |
Jiawei Yu, Ye Zheng, Xiang Wang, Wei Li, Yushuang Wu, Rui Zhao, Liwei Wu, “FastFlow: Unsupervised Anomaly Detection and Localization via 2D Normalizing Flows |
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[11] 11. Karsten Roth, Latha Pemula, Joaquin Zepeda, Bernhard Schửlkopf, Thomas Brox, Peter Gehler, “Towards Total Recall in Industrial Anomaly Detection”, ArXiv, 2022 |
Sách, tạp chí |
Tiêu đề: |
Karsten Roth, Latha Pemula, Joaquin Zepeda, Bernhard "Schửlkopf, Thomas Brox, Peter Gehler, “Towards Total Recall in Industrial Anomaly Detection |
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[12] 12. https://github.com/AlexeyAB/darknet [13] 13. https://github.com/AlexeyAB/Yolo_mark |
Sách, tạp chí |
Tiêu đề: |
12. "https://github.com/AlexeyAB/darknet "[13] "13 |
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[14] 14. https://github.com/plutoyuxie/AutoEncoder-SSIM-for-unsupervised-anomaly-detection- |
Sách, tạp chí |
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[2] 2. Beyerer, Jürgen; Puente León, Fernando & Frese, Christian (2016). Machine Vision - Automated Visual Inspection: Theory, Practice and Applications. Berlin: Springer. doi:10.1007/978-3- 662-47794-6. ISBN 978-3-662-47793-9. Retrieved 2016-10-11 |
Khác |
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[3] 3. Graves, Mark & Bruce G. Batchelor (2003). Machine Vision for the Inspection of Natural Products. Springer. p. 5. ISBN 978-1-85233- 525-0. Retrieved 2010-11-02 |
Khác |
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