The Materials Science of Thin Films 2011 Part 11 pot
The Materials Science of Thin Films 2011 Part 11 pot
... perpendicular and parallel, to the
plane of incidence. Through the use of the Maxwell equations with appropriate
interfacial boundary conditions, the amplitudes of the components of the
transmitted
(&,l, ...
11. 2.6.
Optical Properties
of
Thin
Dielectric and Semiconductor Films
The
optical properties of dielectric
and
semiconductor films are colle...
The Materials Science of Thin Films 2011 Part 9 pot
... Testing
of
Films
Bulge testing is widely used to determine the mechanical properties of thin
films and membranes. In this test the film-substrate assembly is sealed to the
end
of a hollow ... applied to the surface of a body, they
act directly on the surface atoms. The forces are also indirectly transmitted to
the internal atoms via the network of bonds that...
The Materials Science of Thin Films 2011 Part 1 ppt
...
Fig. 1-8b. The generalized behavior shown is common for all classes of solid
materials, regardless
of
the type of bonding or crystal structure. Although the
mathematical forms of the attractive ... discipline of materials science and engineer-
ing. A dramatic increase in our understanding of the fundamental nature of
materials throughout much of the twent...
The Materials Science of Thin Films 2011 Part 2 ppsx
...
in
the
presence
of
an
applied field.
logarithm of the rate is plotted on the ordinate and the reciprocal of the
absolute temperature is plotted along the abscissa. The slope of the resulting ... continuous
state of random motion, which is intimately dependent on the temperature
of
the gas. During their motion the gas particles collide with each other a...
The Materials Science of Thin Films 2011 Part 4 ppt
... view
of
the
MOS
field effect transistor structure
in
Fig.
4-1
indicates the extent to which the technology is employed. Above the plane of
the base P-Si wafer, all
of
the films with the ...
(4-34b)
Note the use of the perfect gas law and the neglect of the temperature
dependence
of
D.
Maintenance of stoichiometry requires that
JCd
=
JTez
9...
The Materials Science of Thin Films 2011 Part 5 docx
...
estimated
in
the capillarity theory. The uncertainties are now in
i*
and
E;,.
One of the important applications
of
this theory has been to the subject
of
epitaxy, where the crystallographic ...
of the
condensate. Shadowing is a phenomenon arising from the geometric constraint
imposed by the roughness
of
the growing film and
the
line -of- sight impinge-...
The Materials Science of Thin Films 2011 Part 6 doc
... series of post-specimen lenses. The objective lens produces the first
image of the object and is, therefore, required to be the most perfect
of
the
lenses. Depending on how the beams reaching the ... discussion of the analysis of diffraction
effects is well beyond the scope of this book. Some notion of the correlation
between structure and diffraction pat...
The Materials Science of Thin Films 2011 Part 8 pps
... array of Fig.
7-26a
reflects the sixfold symmetry of
the (111 ) plane, and the six fainter spots in between are the result of the
(7
x
7)
surface reconstruction.
In RHEED, on the other ...
Blakely,
Thin
Solid
Films
25,
363,
1975).
364
Interdiffusion and Reactions in Thin
Films
the mathematical theories of
GB
diffusion including discussions of tr...
The Materials Science of Thin Films 2011 Part 10 pps
...
Properties
of
Thin Films
10.1.
INTRODUCTION TO
ELECTRICAL
PROPERTIES
OF
THIN
FILMS
10.1
.l.
General Considerations
Electrical properties of thin films have long been
of
practical ... by the
rupture of the ultrathin tunnel barrier due to the mismatch in thermal expansion
between Pb alloys and the Si substrate on which the device is built. During
tem...
The Materials Science of Thin Films 2011 Part 12 pptx
...
substrates. The value
of
K,
depends
on
a number of factors. Most
important is the nature of the materials in contact, but the extent and type
of
lubrication, surface temperature, and nature of the ... wavelengths, depending on whether the refractive index
of the film is greater
or
less than that of the substrate. In the former case the
reflectivit...