The Materials Science of Thin Films 2011 Part 11 pot

... perpendicular and parallel, to the plane of incidence. Through the use of the Maxwell equations with appropriate interfacial boundary conditions, the amplitudes of the components of the transmitted (&,l, ... 11. 2.6. Optical Properties of Thin Dielectric and Semiconductor Films The optical properties of dielectric and semiconductor films are colle...

Ngày tải lên: 11/08/2014, 20:21

... Testing of Films Bulge testing is widely used to determine the mechanical properties of thin films and membranes. In this test the film-substrate assembly is sealed to the end of a hollow ... applied to the surface of a body, they act directly on the surface atoms. The forces are also indirectly transmitted to the internal atoms via the network of bonds that...

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... Fig. 1-8b. The generalized behavior shown is common for all classes of solid materials, regardless of the type of bonding or crystal structure. Although the mathematical forms of the attractive ... discipline of materials science and engineer- ing. A dramatic increase in our understanding of the fundamental nature of materials throughout much of the twent...

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... in the presence of an applied field. logarithm of the rate is plotted on the ordinate and the reciprocal of the absolute temperature is plotted along the abscissa. The slope of the resulting ... continuous state of random motion, which is intimately dependent on the temperature of the gas. During their motion the gas particles collide with each other a...

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... view of the MOS field effect transistor structure in Fig. 4-1 indicates the extent to which the technology is employed. Above the plane of the base P-Si wafer, all of the films with the ... (4-34b) Note the use of the perfect gas law and the neglect of the temperature dependence of D. Maintenance of stoichiometry requires that JCd = JTez 9...

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... estimated in the capillarity theory. The uncertainties are now in i* and E;,. One of the important applications of this theory has been to the subject of epitaxy, where the crystallographic ... of the condensate. Shadowing is a phenomenon arising from the geometric constraint imposed by the roughness of the growing film and the line -of- sight impinge-...

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... series of post-specimen lenses. The objective lens produces the first image of the object and is, therefore, required to be the most perfect of the lenses. Depending on how the beams reaching the ... discussion of the analysis of diffraction effects is well beyond the scope of this book. Some notion of the correlation between structure and diffraction pat...

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... array of Fig. 7-26a reflects the sixfold symmetry of the (111 ) plane, and the six fainter spots in between are the result of the (7 x 7) surface reconstruction. In RHEED, on the other ... Blakely, Thin Solid Films 25, 363, 1975). 364 Interdiffusion and Reactions in Thin Films the mathematical theories of GB diffusion including discussions of tr...

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... Properties of Thin Films 10.1. INTRODUCTION TO ELECTRICAL PROPERTIES OF THIN FILMS 10.1 .l. General Considerations Electrical properties of thin films have long been of practical ... by the rupture of the ultrathin tunnel barrier due to the mismatch in thermal expansion between Pb alloys and the Si substrate on which the device is built. During tem...

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... substrates. The value of K, depends on a number of factors. Most important is the nature of the materials in contact, but the extent and type of lubrication, surface temperature, and nature of the ... wavelengths, depending on whether the refractive index of the film is greater or less than that of the substrate. In the former case the reflectivit...

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