ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 5 pptx

... SPECTROSCOPIES Chapter 5 Bulk SiOp Thln Film Si02 on Si SiOp under Thln Film of Si 450 50 0 55 0 KE (eV) - Figure 5 Oxygen spectra from bulk SO2, a thin film of Si02 on Si, and ... Ritchie. J Polym. Sri. Polym. Chem. 13, 857 , 19 75. One of many papers from Clark's group of this era which deal with all aspects of XPS of polymers. 8 See t...

Ngày tải lên: 08/08/2014, 17:20

... quantitative analysis of major, minor, and trace constituents of materials Instrument cost $300,000-$800,000 Size 3 mx 1 .5 mx 2 m high 15 ENCYCLOPEDIA OF MATERIALS CHARACTERIZATION ... Coupled Plasma-Optical Emission Spectroscopy, ICP-OES 633 53 2 55 9 58 6 57 1 624 NEUTRONANDNUCLEARTECHNIQUES 1'1.0 Introduction 6 45 1 1 .I Neutron Diffraction 6...

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... composite materials. Profilometry of softer materials, such as polymers, is also possible with SFM, and with STM if the sample is conducting. Low forces on the SFM tip allow imaging of materials ... profiles of all features with sides steeper than 55 " will be dominated by the profile of the tip. Because many kinds of features have steep sides, tip imaging is a co...

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... distribution of generation of Cu KOr X rays for an incident beam energy of 20 keV, and the effect of absorption. tion volume of a beam incident perpendicularly on a flat specimen of copper, ... for the analysis of their distribution, with spatial resolution on the order of 1 pm and less. l1 3.3 CL 157 0 50 100 150 200 Energy Loss (eV) Figure2 Example...

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... 0.2 75. z 0. 250 . 0.2 25. 0.200 ’ 0.1 15. t 3300 3400 350 0 3600 Photon energy lev) Figure 2 Surface EXAFS spectra above the Pd b-edge for a 1 .5 monolayer evaporated film of Pd ... A) is related to their energy E(given in eV) by 4 .5 LEED 255 physical placement of an aperture or an array of cylinders in front of the electron- analyzing optics....

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... VISIBLE/UV EMISSION, REFLECTION, Chapter 7 " 1 .50 1 .55 1.60 1. 65 1.70 1. 75 1.80 1. 85 1.90 Energy (4 Figure 3 Composite plot of 2 K excitonic spectra from 11 GaAs/AI,~,Gap.,As ... details of polarization in optics. 2 D. E. Aspnes. In: Handbook of Optical Constana of Solid. (E. Palik, ed.) Academic Press, Orlando, 19 85. Descriptio...

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... foil will completely stop He ions of energy 5 2.3 MeV, while transmitting recoiling ‘H ions with an energy loss of 250 keV. An energy spread of I 50 keV in the transmitted ions ... consisting of 240 nm of Si on 170 nm of Si02 on a Si sub-ate. The spectrum in (a) was acquired using a scattering angle of leOo while the spectrum in (b) used a detecto...

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... time) of a silicon sample containing a boron ion implant. elements as a function of time, a profile of the in-depth distribution of the elements is obtained. The depth scale of the profile ... 0.02 0.0 35 V 0.6 0.27 Cr 26 19 .5 Mn 0.6 0.73 Fe 9 8.2 co 2 1.6 Ni 37 55 cu 0.07 0.19 Mo 25 11.2 w 0.9 1.46 Table 1 Semiquantitative bulk analysis by...

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... Sb TI Pb 0.00 056 0.000 25 0.072 0.0069 0.0019 0.0021 0.044 0.066 33. 25. 3.7 9.6 23. 14. 5. 4 3.4 Table 2 Precision of trace elemental analysis of 3N5 199. 95% ) and 6N 199.9999%) ... co.001 ~0.000 05 <0.00002 <0.00 05 ~0.0003 (~0.9) (c20.) (4 (~0.04) 0. 05 0.002 0.0 05 0.03 ~0.0006 ~0.0008 (cO.9) c0.0 05 0.02 ~0.00 05 0.001 <...

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... interfaces, can 6 95 Mechanical urofiler Depth resolution 0 .5 nm Minimum step 2 .5- 5 nm Maximum step - 150 pm Lateral resolution Maximum sample size Instrument cost $30,000-$70,000 0.1- 25 pm, depending ... grating equation. The intensity of the light in the different orders is a very sensitive function of the shape of the lines of the pattern. If the shape of the...

Ngày tải lên: 08/08/2014, 17:20