structure determined by x ray diffraction

Structure of hibiscus latent singapore virus determined by x ray fiber diffraction

Structure of hibiscus latent singapore virus determined by x ray fiber diffraction

Ngày tải lên : 10/09/2015, 15:53
... List of figures x List of tables xii Summary xiii CHAPTER X- RAY FIBER DIFFRACTION TECHNIQUES 1-19 1.1 INTRODUCTION 1.2 THEORY OF FIBER DIFFRACTION 1.2.1 Diffraction by a helical structure 1.2.2 ... solved by X- ray FD Surprisingly, the TMV CP structure was solved at 2.4 Å resolution by X- ray crystallography method (Bhyravbhatla et al., 1998) But for other Tobamovirus structures X- ray crsyatllography ... reciprocal space The z axis is the helix axis where the structure repeats exactly in a distance c (repeat distance) along this axis The repeat contains u subunits in t turns of the helix Diffraction from...
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Báo cáo khoa học: The effect of replacing the axial methionine ligand with a lysine residue in cytochrome c-550 from Paracoccus versutus assessed by X-ray crystallography and unfolding ppt

Báo cáo khoa học: The effect of replacing the axial methionine ligand with a lysine residue in cytochrome c-550 from Paracoccus versutus assessed by X-ray crystallography and unfolding ppt

Ngày tải lên : 07/03/2014, 17:20
... established by way of peroxidase activity assays and NMR spectroscopy Results Structure determination and overall structure of the various ferricyt c-550 models For the M100K variant two X- ray datasets ... As part of the present work the structure of cyt c-550 from P versutus has been determined by X- ray crystallography, allowing for a comparison in terms of overall structure and heme environment ... networks a single dark red crystal suitable for X- ray diffraction was obtained grown from 0.1 m bicine pH 9.0 and 3.2 m ammonium sulfate X- ray diffraction data of the wt and M100K crystals were...
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Báo cáo Y học: Determinants of the inhibition of a Taiwan habu venom metalloproteinase by its endogenous inhibitors revealed by X-ray crystallography and synthetic inhibitor analogues pdf

Báo cáo Y học: Determinants of the inhibition of a Taiwan habu venom metalloproteinase by its endogenous inhibitors revealed by X-ray crystallography and synthetic inhibitor analogues pdf

Ngày tải lên : 08/03/2014, 23:20
... are grouped in a superfamily of metzincin which exhibits some typical structural features, such as the Met-turn and active-site consensus HExxHxxGxxH sequence [15–17] Some organisms and mammalian ... Giordano, C., Gomis-Ruth, ă F .X. , Gorini, B., Kress, L.F., Mazza, F., Paradisi, M.P., ˚ Pochetti, G & Politi, V (1997) A X- ray structure of adamalysin II complexed with a peptide phosphonate ... T., Pieper, M., Tschesche, H., Huber, R & Bode, W (1995) X- ray structures of human neutrophil collagenase complexed with peptide hydroxamate and peptide thiol inhibitors Implications for substrate...
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Báo cáo khoa học: An X-ray diffraction study of model membrane raft structures doc

Báo cáo khoa học: An X-ray diffraction study of model membrane raft structures doc

Ngày tải lên : 15/03/2014, 23:20
... http://www.lipidat.tcd.ie/) A list of the samples examined in this study are tabulated in the Supporting information Synchrotron X- ray diffraction measurements X- Ray diffraction measurements were performed ... and annealed by 50 thermal cycles between 20 and 65°C, ensuring a complete mixing of phospholipids Samples were stored under argon at a temperature not below °C X- Ray diffraction examination was ... phospholipid was performed by ESI-tandem MS [29] and the data are presented in Table S1 4694 Sample preparation Samples for X- ray diffraction examination (Table S2) were prepared by dissolving lipids...
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Báo cáo khoa học: Structural flexibility in Trypanosoma brucei enolase revealed by X-ray crystallography and molecular dynamics pdf

Báo cáo khoa học: Structural flexibility in Trypanosoma brucei enolase revealed by X-ray crystallography and molecular dynamics pdf

Ngày tải lên : 23/03/2014, 07:20
... and PAH_1 structures is shown in Fig Unexpected variability in inhibitor complex structures Comparison of the substrate and inhibitor complexes shows that the His156-out and His156-in structures ... JE, Rayment I & Reed GH (1996) A carboxylate oxygen of the substrate bridges the magnesium ions at the active site of enolase: structure of the yeast enzyme complexed with the equilibrium mixture ... trajectory (obtained by removing PEP and the site II metal from the PEP complex structure) are intriguingly different After exploring the neighbourhood of the starting conformation for approximately ns,...
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ELEMENTS OF X-RAY DIFFRACTION ppt

ELEMENTS OF X-RAY DIFFRACTION ppt

Ngày tải lên : 29/03/2014, 11:20
... angstrom, the exact relation The region between netic X X X bemg lkX= 1.00202A worth while to review briefly some properties of electromagnetic Suppose a monochromatic beam of x- rays, i.e., x- rays of ... of rotating anode for high -power x- rav tubes FIG 1-17 Since an x- ray tube is less than percent efficient in producing x- rays since the diffraction of x- rays by crystals is far less efficient ... PROPERTIES OF X- RAYS 12 [CHAP termed hard, while long-wavelength x- rays are easily absorbed and are said to be soft Matter absorbs x- rays in two distinct ways, by scattering and by true absorption,...
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Báo cáo các phương pháp phân tích hiện đại - đề tài X ray diffraction

Báo cáo các phương pháp phân tích hiện đại - đề tài X ray diffraction

Ngày tải lên : 16/04/2014, 23:35
... Đề Tài: X- RAY DIFFRACTION Giới thiệu Cơ sở nhiễu x tia X Máy phân tích phổ XRD Đặc trưng phổ XRD số vật liệu X- RAY DIFFRACTION Giới thiệu tia X • Năm 1895 Rơntghen tình cờ phát tia X • Năm ... Tia X Sự phát sinh tia Röngent Tia X Nhiễu x tia X Huỳnh quang tia X Phân tích cấu trúc rắn, vật liệu… X c định hàm lượng ngun tố có mẫu Phân tích cấu trúc tinh thể nhiễu x tia X • Max von ... phổ XRD số vật liệu 4.3 Nhóm vật liệu kim loại oxit kim loại Phổ XRD kim loại Zn với x CuK α Đặc trưng phổ XRD số vật liệu Phổ XRD vật liệu TiO2 x CuK α Ứng dụng cụ thể Máy nhiễu x tia X dùng...
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Báo cáo hóa học: "Valence band offset of InN/BaTiO3 heterojunction measured by X-ray photoelectron spectroscopy" pot

Báo cáo hóa học: "Valence band offset of InN/BaTiO3 heterojunction measured by X-ray photoelectron spectroscopy" pot

Ngày tải lên : 21/06/2014, 04:20
... XPS: X- ray photoelectron spectroscopy Authors’ contributions CJ carried out the experimental analysis and drafted the manuscript YC carried out the experimental design YG participated in the experimental ... accumulation at InN films by ozone induced oxidation Appl Phys Lett 2007, 90: 152106 Jia CH, Chen YH, Zhou XL, Liu GH, Guo Y, Liu XL, Yang SY, Wang ZG: InN layers grown by MOCVD on SrTiO3 substrates ... G: Photoemission (XPS and XPD) study of epitaxial LaAlO3 film grown on SrTiO3(0 1) Mater Sci Semicond Process 2006, 9: 954 15 Jia CH, Chen YH, Zhou XL, Yang AL, Zheng GL, Liu XL, Yang SY, Wang...
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Báo cáo hóa học: " Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy" ppt

Báo cáo hóa học: " Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy" ppt

Ngày tải lên : 21/06/2014, 05:20
... Oxidation study of polycrystalline InN film using in situ X- ray scattering and X- ray photoemission spectroscopy Thin Solid Films 2007, 515:4691 Lee IJ, Kim JY, Shin HJ, Kim HK: Near-edge x- ray ... heterojunctions measured by x- ray photoemission spectroscopy Appl Phys Lett 1996, 68:2541 Jia CH, Chen YH, Zhou XL, Liu GH, Guo Y, Liu XL, Yang SY, Wang ZG: InN layers grown by MOCVD on SrTiO3 substrates ... offset: High-resolution x- ray photoemission spectroscopy measurements Phys Rev B 2008, 78:033308 Liu JM, Liu XL, Xu XQ, Wang J, Li CM, Wei HY, Yang SY, Zhu QS, Fan YM, Zhang XW, Wang ZG: Measurement...
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Báo cáo hóa học: " Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy" docx

Báo cáo hóa học: " Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy" docx

Ngày tải lên : 21/06/2014, 11:20
... effect measurement in the InN/sapphire film The XPS measurements were performed on a PHI Quantera SXM instrument with Al Ka (energy 1486.6 eV) as the X- ray radiation source, which had been carefully ... error of VBO induced by lattice mismatch is less than 60 meV Besides, practically all nitride epitaxial layers are characterized by dense networks of threading defects extending from the substrates ... using a Shirley background and Voigt (mixed Lorentzian-Gaussian) line shapes The position of the VBM with respect to the surface Fermi level was determined by the intersection of linear fitting...
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Báo cáo hóa học: " Measurement of w-InN/h-BN Heterojunction Band Offsets by X-Ray Photoemission Spectroscopy" docx

Báo cáo hóa học: " Measurement of w-InN/h-BN Heterojunction Band Offsets by X-Ray Photoemission Spectroscopy" docx

Ngày tải lên : 21/06/2014, 17:20
... matrix, leaving a positive charge of photohole and then the deexcitation of the photohole by quantized excitations the conduction-electron system However, the extrinsic plasmons are excited by ... (2010) 5:1340–1343 1341 XPS measurement was performed on PHI Quantera SXM instrument with Al Ka (hm = 1486.6 eV) as the X- ray radiation source and the angle between the X- ray source and the detector ... fitted using Voigt (mixed Lorentz–Gaussian) lineshape and Shirley background The positions of valence band maximum (VBM) in valence band (VB) spectra are determined by linear extrapolation of leading...
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Báo cáo hóa học: " Research Article Application of the HLSVD Technique to the Filtering of X-Ray Diffraction Dat" pot

Báo cáo hóa học: " Research Article Application of the HLSVD Technique to the Filtering of X-Ray Diffraction Dat" pot

Ngày tải lên : 22/06/2014, 20:20
... size n and structure type X are computed by using the diffractional model based on the Debye function method [14, 15]: NX (n) X= C 5.0 0.3 4.0 1.0 1.0 0.5 Parameter X sX n0 X X X wX 4000 3000 ... 5000 XRD intensity (AU) IX,n (q) = A NX (n) + X, n sin 2πqui, j aX (n) X= I 5.0 0.3 4.0 1.0 1.0 0.5 6000 given in terms of the four parameters [n0 , X , X , wX ] InX tensities scattered by nanoclusters ... function of the structure type and cluster size is aX (n) = X + XX × π + atan n0 − n /wX X , π + atan n0 − /wX X (5) Table 1: Values of parameters used in (6) to compute synthetic XRD intensity...
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Báo cáo lâm nghiệp: "Relationships between the intra-ring wood density assessed by X-ray densitometry and optical anatomical measurements in conifers. Consequences for the cell wall apparent density determination" pps

Báo cáo lâm nghiệp: "Relationships between the intra-ring wood density assessed by X-ray densitometry and optical anatomical measurements in conifers. Consequences for the cell wall apparent density determination" pps

Ngày tải lên : 08/08/2014, 01:22
... lumen models Let X = · x = width of the double cell wall: s = R · T – [(R – X) · (T – X) ], s = X · (T + R) – X2 , s / S = cell wall proportion If drx = the wood density measured by x ray: apparent ... apparent density of the cell wall = drx / cell wall proportion = drx · S/s = drx · R · T / [X · (T + R) – X2 ] = drx · R · T / [X · (T + R – X) ] 2.3.2 Hexagonal model ST = area of measurement ... again, if drx = the wood density measured by x ray: apparent density of the cell wall = drx / cell wall proportion = drx · S/s = drx · H2 / (H2 – H’2) The use of rectangular and hexagonal models...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 1

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 1

Ngày tải lên : 14/09/2015, 08:40
... neutron diffraction - Group theoretical analysis -Temperature dependent synchrotron x- ray (-253-177 °C) E-field dependent neutron diffraction -E-field dependent synchrotron x- ray -X- ray and PLM ... (2002) S: x = ([001]-, [011]-, and [111]-poled) S: x = 8.5 (unpoled) S: x = 4.5 (unpoled) S: x = 4.5 P (~38-44 µm): x = (unpoled) S: x = ([001]-poled) *(2 of the samples have been studied by Durbin ... et al.) S: x = ([001]-poled) S: x = ([001]- and [111]-poled) S: x = 5, (unpoled) S: x =4.5, ([001]-poled) S: x = 4.5, ([001]-poled) S: x =8, 10 ([100]-,[011]-, and [111]-poled) P: 10 x 15 prepared...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 2

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 2

Ngày tải lên : 14/09/2015, 08:40
... surface X- ray 44.65o ~43.0-44.0o 42 43 44 45 46 47 2θ [010]W [100] L PZN-4.5%PT b) b) Fractured surface Intensity (arb units) X- ray X- ray 44.62 42 43 44 45 o 46 47 2θ Figure 5.1 (002) XRD profiles ... nonlinear relation between the x- ray energy and the penetration depth despite similar test samples were used Whether the x- ray diffraction patterns pertain to bulk structure or a mere surface layer ... of µm [16] Synchrotron x- ray diffraction of higher energy, being 18 keV, revealed similar penetration depth in PZN-8%PT sample [32] Meanwhile, using synchrotron x- ray diffraction at 10.7 keV,...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 3

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 3

Ngày tải lên : 14/09/2015, 08:40
... the x- ray diffraction patterns (Figures 5.11a, c, and e) As a result, the polished surface can hardly reveal any useful structural information of the crystals hence unsuitable for x- ray diffraction ... fractured surfaces are relatively strain-free surface which are suitable for x- ray diffraction study of bulk structure in relaxor ferroelectric single crystals 77 ... occurrence of the extremely broad lower 2θ peak adjacent to the main (002)R peak in standard XRD profiles of (001)-orientated PZN-PT single crystals has been examined This diffraction arises...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 4

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 4

Ngày tải lên : 14/09/2015, 08:40
... in the x- ray profile following any direction of polishing, suggesting that the surface phase is always present regardless of the direction and/or mode of polishing This behavior can be explained ... crystallographic direction, e.g., [010]pc or [110]pc in our experiments Otherwise, the domains are not evident and the sample is covered with areas exhibiting slight but varying birefringence when observed ... 5.7a), was tilted by an angle of 45° and again polished back and forth in the new direction After the second polishing, the earlier set of domains disappeared and was replaced by a new set of elongated...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 5

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 5

Ngày tải lên : 14/09/2015, 08:40
... (002) diffraction profiles, we begin with diffractions arising from untilted T microdomains By microscale domains, we mean here coarse domains of which the diffractions can be predicted by means ... of the streaked nanotwin diffractions This new nanotwin peak lies along the line joining the two parent nanotwin diffractions, of which the exact position is determined by the lever rule according ... encircled by the dash lines in Figures 6.10a-b) reveals an extinction at P/A= 45°, while the remaining domains exhibited the optical extinction at P/A= 0° This suggests that the (R+T) two phases coexisted...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 6

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 6

Ngày tải lên : 14/09/2015, 08:40
... how the (002) diffraction pattern is affected by: (a) the four structural variants of the R structure, i.e., r1, r2, r3, and r4, and (b) its domain size, the diffraction produced by the eight ... result of the large diffraction width associated with the fine domain structure and the extreme compliant nature of the R phase The diffraction pattern indicating possible coexistence of {100}-type ... scattered areas started to exhibit extinction at most P/A angles, suggesting the occurrence of the C phase (Figure 7.9d) Above Tmax, the sample exhibited a total extinction indicating the presence...
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High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 7

High resolution x ray diffraction study of phase and domain structures and thermally induced phase transformations in PZN (4 5 9)%PT 7

Ngày tải lên : 14/09/2015, 08:40
... could not be detected by the x- ray This would explain the observation made in the present work One deduction from the above is that under the condition when T nanotwin domains exist in the crystal ... configurations of coexistence R* and T* domain structures The arrows represent the directions of the polar axis in T phase The two polar directions are joined by the {110}-type T* as indicated by the red ... temperature However, careful examination of the roomtemperature RSMs revealed that only (100)T diffractions were detected but not the (001)T diffractions In this section, we shall examine the nature of...
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