The electrical engineering handbook SN08

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The electrical engineering handbook SN08

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The electrical engineering handbook

Sandige, R.S. “Section VIII – Digital Devices” The Electrical Engineering Handbook Ed. Richard C. Dorf Boca Raton: CRC Press LLC, 2000 © 2000 by CRC Press LLC LCD projection televisions, such as this “Television of the Future” could replace the CRT-based television if certain performance criteria are obtained. One criteria being addressed is the need for a very bright, optically efficient point source for projecting an image through a small LCD. If new lighting technologies are developed, such as an illumination source that can provide a brighter image with better colors than current CRT technology, then the consumer television market will certainly change. (Photo courtesy of Thomson Multimedia.) 8574/ch078/frame Page 1766 Wednesday, May 6, 1998 11:08 AM © 2000 by CRC Press LLC VIII Digital Devices 79Logic Elements G.L. Moss, P. Graham, R.S. Sandige, H.S. Hinton IC Logic Family Operation and Characteristics•Logic Gates (IC)•Bistable Devices•Optical Devices 80Memory Devices W.D. Pricer, R.H. Katz, P.A. Lee, M. Mansuripur Integrated Circuits (RAM, ROM)•Basic Disc System Architectures•Magnetic Tape• Magneto-Optical Disk Data Storage 81Logical Devices F.P. Preparata, R.S. Sandige, B.R. Bannister, D.G. Whitehead, M. Bolton, B.D. Carroll Combinational Networks and Switching Algebra•Logic Circuits•Registers and their Applications•Programmable Arrays•Arithmetic Logic Units 82Microprocessors J. Staudhammer, S.-L. Chen, P.J. Windley, J.F. Frenzel Practical Microprocessors•Applications 83Displays J.E. Morris, A. Martin, L.F. Weber Light-Emitting Diodes•Liquid-Crystal Displays•The Cathode Ray Tube•Color Plasma Displays 84Data Acquisition D. Kurumbalapitiya, S.R.H. Hoole The Analog and Digital Signal Interface•Analog Signal Conditioning•Sample-and-Hold and A/D Techniques in Data Acquisition•The Communication Interface of a Data Acquisition System•Data Recording•Software Aspects 85Testing M. Serra, B.I. Dervisoglu Digital IC Testing•Design for Test Richard S. Sandige University of Wyoming LECTRONIC DESIGNERS have placed increasing significance on digital devices since the late 1960s. This is due primarily to the greater reliability and improved accuracy gained when using electronic devices in a two-level mode (binary mode) as compared to using electronic devices in a continuous mode (analog mode). As silicon integrated circuits (ICs) became denser and more consistently reproducible over the past few decades, so did digital electronic devices. Today digital circuits and digital systems produced from digital devices can be found in every walk of life ranging from children’s toys, kitchen appliances, laboratory instruments, personal and workstation computers to space shuttle and satellite applications. The intent of this section is to present topics related to the utilization and application of digital devices. Chapter 79 establishes the foundation for digital logic elements beginning with IC, logic gates, logical families, bistable devices, and optical devices. Discussed in the next chapter are memory devices, which include integrated circuits (RAM, ROM), disk systems, magnetic tape, and optical disks. Chapter 81 on logical devices discusses switching algebra, logic circuits, registers, programmable arrays (PAL, FPGA), and arithmetic logic units. The next chapter explains the microprocessor, perhaps the best-known digital device. The topics covered include practical microprocessors and microprocessor applications. Chapter 83 on displays consists of the light- emitting diode, the liquid-crystal display, the cathode ray tube, and the plasma display. The gathering of digital E © 2000 by CRC Press LLC information, referred to as data acquisition, is discussed next. No digital system is released to production without extensive testing. Chapter 85 presents methods of testing and design for testing. The variety of topics presented in this section should provide readers with a contemporary overview of digital devices and their applications. To obtain additional information, the reader may refer to the References and Further Information in each chapter. Nomenclature Symbol Quantity Unit A area m 2 a average absorption coefficient B luminance off the projection screen C brightness contrast CMRR common-mode rejection ratio C R contrast ratio d diameter m E g band gap energy eV e screen efficiency lumen/W f focal length m F maximum flux lumen h Planck’s constant 6.626 ´ 10 –34 J·s h quantum efficiency I beam current amp L luminance cd/m 2 L raster luminance Symbol Quantity Unit l radiation wavelength nm m magnification factor m n electron mobility n aperture n photon frequency Hz p photon momentum kg · m/s R recombination rate ns R i reflectivity S emitting screen surface m 2 SNR signal-to-noise ratio t add add time ns t h hold time ns t pd propagation delay time ns T transmission ratio T transmission of faceplate t lifetime ns q c critical angle degree V B accelerating voltage V V s screen voltage V 8574/sn08/frame Page 1768 Saturday, May 23, 1998 4:15 PM . on displays consists of the light- emitting diode, the liquid-crystal display, the cathode ray tube, and the plasma display. The gathering of digital E . FPGA), and arithmetic logic units. The next chapter explains the microprocessor, perhaps the best-known digital device. The topics covered include practical

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