Direct growth of graphitic carbongraphene on si (111) by using electron beam evaporation

CHAPTER 1. INTRODUCTION

1.1. General introduction
1.2. Outline

CHAPTER 2. STRUCTURAL PROPERTIES, STUDIED METHOD AND EXPERIMENTAL TECHNIQUES

2.1. Introduction
2.2. Structure of C/Si (111) samples
2.3. Crystallographic structures of relevant materials
2.4. Sample preparation
2.5. Experimental techniques
2.6. Summary

CHAPTER 3. GROWING GRAPHENE ON SI: STATE OF THE ART

3.1. Introduction
3.2. Electron beam evaporators
3.3. MBE growth
3.4. CVD growth
3.5. Laser irradiation
3.6. Transfer processes
3.7. Summary

CHAPTER 4. EXPERIMENTAL RESULTS AND DISCUSSION

4.1. Introduction
4.2. Preparation of Si (111) 7x7 substrate
4.3. Growing graphene of Si (111) 7x7 substrate
4.4. Summary
- 2.1 Introduction
- 2.2 Structure of C/Si(111) samples
- 2.3 Crystallographic structures of relevant materials
  - 2.3.1 Real and reciprocal lattice vectors
  - 2.3.2 Reciprocal characterization
  - 2.3.3 Crystallographic structure in the real and reciprocal space
    - a Si(111) 77 surface reconsctruction
    - b Silicon carbide
    - c Amorphous carbon
    - d Graphite - graphene
  - 2.3.4 Summary
- 2.4 Sample preparation
  - 2.4.1 Principle of e-beam evaporation
    - a Evaporation and deposition rates
    - b Evaporation sources
    - c Evaporation materials
    - d E-beam power and deposition rate
    - e Advantages and disadvantages
  - 2.4.2 Experimental setup
    - a Main components needed to setup the experiment using graphite rod form of evaporation
    - b Principle of operation
    - c Experimental conditions for carbon evaporation
- 2.5 Experimental techniques
  - 2.5.1 Ultra-high vacuum
  - 2.5.2 Low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED)
    - a Principle of LEED and RHEED
    - b LEED geometry
    - c RHEED geometry
  - 2.5.3 Auger electron (AE) and X-ray photoelectron (XP) spectroscopies
    - a Principle of AES and XPS
    - b Depth profiling of AES and XPS
  - 2.5.4 Raman spectroscopy (RS)
    - a Principle of Raman
    - b Raman for graphene
  - 2.5.5 Scanning tunneling microscopy (STM) and atomic force microscopy (AFM)
    - a STM principle
    - b Mode of operation
    - c AFM principle
    - d Mode of operation
- 2.6 Summary

CHAPTER 5. CONCLUSION

5.1. Summary of the results
5.2. Perspectives