00295971 PDF BRITISH STANDARD BS EN 61143 2 1994 IEC 1143 2 1992 Incorporating Amendment No 1 Specification for Electrical measuring instruments — X t recorders — Part 2 Recommended additional test me[.]
BRITISH STANDARD BS EN 61143-2:1994 IEC 1143-2: 1992 Incorporating Amendment No Specification for Electrical measuring instruments — X-t recorders — Part 2: Recommended additional test methods The European Standard EN 61143-2:1994 has the status of a British Standard BS EN 61143-2:1994 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Power Electrical Engineering Standards Policy Committee (PEL/-) to Technical Committee PEL/13, upon which the following bodies were represented: Association of Consulting Engineers Department of Energy (Electricity Division) Department of Trade and Industry (National Physical Laboratory) Electricity Association The Association for the Instrumentation, Control and Automation Industry GAMBICA (BEAMA Ltd.) Institution of Electrical Engineers Institution of Incorporated Executive Engineers This British Standard, having been prepared under the direction of the Power Electrical Engineering Standards Policy Committee, was published under the authority of the Standards Board and comes into effect on 15 March 1993 © BSI 04-2000 The following BSI references relate to the work on this standard: Committee reference PEL/13 Draft for comment 92/25058 DC ISBN 580 21993 Amendments issued since publication Amd No Date Comments 8389 January 1995 Indicated by a sideline in the margin BS EN 61143-2:1994 Contents Page Committees responsible Inside front cover National foreword ii Foreword Introduction 1.1 Scope 2.11 Intrinsic error test 2.12 Additional error due to zero displacement 2.13 Mutual influence of different measuring circuits of multiple and multiple channel recorders 4.20 Determination of the value of the dead band Influence of parasitic quantities 6.1 Common mode interference 6.2 Series (parallel) mode interference Test of dynamic performance 7.1 Response time 7.2 Frequency response range 7.3 Overshoot List of references Inside back cover © BSI 04-2000 i BS EN 61143-2:1994 National foreword This British Standard has been prepared under the direction of the Power Electrical Engineering Standards Policy Committee It is identical with IEC 1143-2:1992 Electrical measuring instruments — X-t recorders — Part 2: Recommended additional test methods published by the International Electrotechnical Commission (IEC) In 1994 the European Committee for Electrotechnical Standardization (CENELEC) accepted IEC 1143-2:1992 as European Standard EN 61143-2:1994 As a consequence of implementing the European Standard this British Standard is renumbered as BS EN 61143-2 and any reference to BS 7610-2 should be read as a reference to BS EN 61143-2 Cross-reference International Standard Corresponding British Standard IEC 51-9 BS 89 Direct acting indicating analogue electrical measuring instruments and their accessories Part 9:1990 Recommended test methods (Identical) A British Standard does not purport to include all the necessary provisions of a contract Users of British Standards are responsible for their correct application Compliance with a British Standard does not of itself confer immunity from legal obligations Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages to 6, an inside back cover and a back cover This standard has been updated (see copyright date) and may have had amendments incorporated This will be indicated in the amendment table on the inside front cover ii © BSI 04-2000 EUROPEAN STANDARD EN 61143-2 NORME EUROPÉENNE June 1994 EUROPÄISCHE NORM Supersedes HD 301 S1:1977 ICS 19.080 Descriptors: Measuring instrument, electrical measurement, recorder, X-t recorder, specific tests to X-t recorders English version Electrical measuring instruments — X-t recorders Part 2: Recommended additional test methods (IEC 1143-2:1992) Appareils électriques de mesure Enregistreurs X-t Partie 2: Méthodes d’essais complémentaires recommandées (CEI 1143-2:1992) Elekrische Meßgeräte X-t-Schreiber Teil 2: Empfohlene zusätzliche Prüfverfahren (IEC 1143-2:1992) This European Standard was approved by CENELEC on 1994-03-08 CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member This European Standard exists in three official versions (English, French, German) A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels © 1994 Copyright reserved to CENELEC members Ref No EN 61143-2:1994 E EN 61143-2:1994 Foreword The CENELEC questionnaire procedure, performed for finding out whether or not the International Standard IEC 1143-2:1992 could be accepted without textual changes, has shown that no common modifications were necessary for the acceptance as European Standard The reference document was submitted to the CENELEC members for formal vote and was approved by CENELEC as EN 61143-2 on March 1994 This European Standard replaces HD 301 S1:1977 The following dates were fixed: — latest date of publication of an identical national standard — latest date of withdrawal of conflicting national standards (dop) 1995-03-15 (dow) 1995-03-15 © BSI 04-2000 EN 61143-2:1994 Introduction This part of IEC 1143 shall be read in conjunction with part and IEC 51-9:1988, Direct acting indicating analogue electrical measuring instruments and their accessories — Part 9: Recommended test methods It gives details of tests which are specific to X-t recorders The testing conditions and the more conventional tests, which shall be followed, are those given in the following list of subclauses from IEC 51-9: 1.2 1.2.8 1.2.9 1.2.11 1.2.12 1.2.13 3.2 3.4 3.5 3.5.2 3.6 3.5.2 3.6 3.7 3.8 3.17 3.18 4.1 4.6 4.10 4.19 Other clauses from IEC 51-9 may also be applied, if relevant For easier reference clause numbering follows that of IEC 51-9 For X-t recorders, tapping is not allowed In case of doubt, the text of this part as well as that of part shall prevail 1.1 Scope See part 2.11 Intrinsic error test The recorder shall be under reference conditions with the auxiliary circuits energized 2.11.1 Measuring circuit Before determining the intrinsic error, the record shall be at the chart scale line corresponding to zero and the chart driving mechanism shall be on The errors shall be determined for both increasing and decreasing values of the measurand as follows: This test shall be performed at five approximately equal steps within the span, including the lower and upper limits of the measuring range For single channel dotted line recorders, the reading used shall be that of the dot next following the one indicating that the steady state has been reached During this test the chart shall be driven at a sufficiently high speed for the individual dots to be distinguishable Computation: The intrinsic error, expressed as a percentage, shall be computed for each selected step as follows: Bx – Ba - ´ 100 As where As is the span 2.11.1.2 For multiple recorders, the determination of the errors shall be carried out on every measuring circuit in sequence, the other measuring circuits being energized so that their record corresponds to the lower limit of the span 2.11.1.3 For multiple channel recorders, the procedure is analogous to that given in 2.11.1.2 2.11.2 Time-keeping Procedure: The recorded time, Tx, is determined from the values of the chart time lines corresponding to two abrupt changes in the value of the measurand The actual value, Ta, of the time between these changes shall be measured using a timing device of sufficient accuracy that any error caused is small (such as one tenth) compared with the intrinsic error in time-keeping being determined The chart shall have been driven for a sufficient time before the first abrupt change to have reached a steady speed and for a distinct change of the record, as a function of time, to be observed Computation: The intrinsic error in time-keeping, expressed as a percentage of the actual (true) value of the elapsed time is: Tx – Ta - ´ 100 Ta 2.11.1.1 Continuous line recorders and single channel dotted line recorders 2.12 Additional error due to zero displacement Procedure: An input quantity shall be applied and increased sufficiently slowly, in order to avoid overshoot, to a value corresponding to the input quantity, Ba The recorded value, Bx, shall be read as soon as the steady state value of the input has been reached and the chart has advanced by at least mm Before the determination of the additional error, the recorder should be on a chart scale line at approximately 10 % of the span and the chart driving mechanism on The zero displacement shall be off Note the recorded value, Ba, after the chart has been driven for s or approximately mm whichever is the greater © BSI 04-2000 EN 61143-2:1994 Procedure Switch on the zero displacement and apply an input quantity, Az, corresponding to the zero displacement value Note the value, Bx, of the record after the chart has been driven for s or approximately mm whichever is the greater The procedure shall be carried out with increasing and decreasing values of the input quantity Computation: The additional error due to zero displacement is expressed as a percentage: Bx – Ba - ´ 100 Az 2.13 Mutual influence of different measuring circuits of multiple and multiple channel recorders Procedure: The variation arising from a mutual effect between the measuring circuits is determined by energizing one circuit (or channel) so that a record equal to approximately 50 % of the span is obtained The value of the input quantity of each other circuit (channel) is then simultaneously changed between the upper and lower limits of their measuring ranges The test is to be repeated for each measuring circuit (channel) in turn Computation: The change in the record of the measuring circuit under test, expressed as a percentage of the span, represents the influence 4.20 Determination of the value of the dead band The following procedure is to be used to determine the value of the dead band, at approximately 50 % of the span Procedure: The starting point corresponds to a value of the input quantity smaller than the chosen value by an amount equivalent to five times the class index The input quantity is then slowly increased until the chosen value is reached and the recorded value, Bb, is then noted after the chart has been driven for s or approximately mm whichever is the greater The same operation is then repeated, starting at a value of the input quantity greater than the chosen value by an amount equivalent to five times the class index and then decreasing the input until the chosen value is reached The recorded value, Ba, is noted Computation: The dead band is the absolute difference between the two recorded values, expressed as a percentage: Ba – Bb ´ 100 Az Influence of parasitic quantities The method for determination of the influence of parasitic quantities is described in Annex A of part Measurements are to be made in the centre of the span During the tests, any earthing (grounding), including connections to any internal screen, shall be as specified by the manufacturer 6.1 Common mode interference The test is performed with a d.c voltage and then with an a.c voltage having a frequency equal to the power supply frequency The phase relationship between the power supply voltage and the a.c parasitic voltage shall be adjusted so as to obtain the maximum influence If the manufacturer has stated values of parasitic voltages for any other value of frequency, or frequency range, the same test applies 6.2 Series (parallel) mode interference 6.2.1 Recorders for measuring d.c quantities The test is performed with an a.c voltage (current) having a frequency equal to the power supply frequency The phase relationship between the power supply voltage and the a.c parasitic voltage (current) shall be adjusted so as to obtain the maximum influence If the manufacturer has stated values of parasitic voltages (currents) for any other value of frequency, or frequency range, the same test applies 6.2.2 Recorders for measuring a.c quantities The test is performed with a d.c voltage (current) and the frequency of the measured quantity is varied between the specified limits of the frequency response range Test of dynamic performance The recorder shall be under reference conditions with the auxiliary circuits energized The impedance of the external measuring circuit shall have a steady value between the limits specified by the manufacturer The amplifier gain or attenuation, if any, shall be set as specified by the manufacturer © BSI 04-2000 EN 61143-2:1994 7.1 Response time 7.2 Frequency response range The response time shall be measured in both ascending and descending directions For single-channel dotted line recorders with a response time less than the dotting time, an abrupt change of the input quantity shall be applied and maintained for a period of time longer than the dotting time This time shall be gradually shortened until the next dot corresponds to the steady state value, within a percentage of the span equivalent to the class index The time between the application of the change and the next dot is the desired response time This procedure can be realised automatically by applying a periodic input quantity of a rectangular waveform and having a repetition time in the vicinity of the dotting time (sampling method) For multiple and multiple channel recorders the same tests shall be applied using first one measuring circuit (channel) and then the others The test is carried out by applying, successively, two sinusoidal input quantities corresponding to peak-to-peak deflections of 2/3 and 1/10 of the span respectively The frequency is then varied between the specified limits of the frequency response range The values of the frequency at which the deflection deviates by 10 % from the d.c (or low frequency) deflection value are the limits of the frequency response range for each peak-to-peak deflection For recorders which respond only to input quantities of one polarity, the sinusoidal input quantities mentioned above shall be superimposed on an appropriate constant quantity © BSI 04-2000 7.3 Overshoot The overshoot shall be determined by carrying out the tests corresponding to 7.1 The overshoot is the difference expressed as a percentage of the span, between the extreme record (exceeding the steady state record in the direction of the change) and the final steady state record blank BS EN 61143-2:1994 List of references See national foreword © BSI 04-2000 BS EN 61143-2:1994 IEC 1143-2: 1992 BSI — British Standards Institution BSI is the independent national body responsible for preparing British Standards It presents the UK view on standards in Europe and at the international level It is incorporated by Royal Charter Revisions British Standards are updated by amendment or revision Users of British Standards should make sure that they possess the 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