Ryszard Jab�o´ski, Mateusz Turkowski, Roman Szewczyk (Eds.) l n Recent Advances in Mechatronics Ryszard Jab�onski, Mateusz Turkowski, Roman Szewczyk l ´ (Eds.) Recent Advances in Mechatronics With 487 Figures and 40 Tables 123 Ryszard Jab�o´ski l n Mateusz Turkowski Roman Szewczyk Warsaw University of Technology Faculty of Mechatronics ´w Andrzeja Boboli street S room 343 02-525 Warsaw Poland Email: yabu@mchtr.pw.edu.pl m.turkowski@mchtr.pw.edu.pl szewczyk@mchtr.pw.edu.pl Library of Congress Control Number: 2007932802 ISBN 978-3-540-73955-5 Springer Berlin Heidelberg New York This work is subject to copyright All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer Violations are liable for prosecution under the German Copyright Law Springer is a part of Springer Science+Business Media springer.com © Springer-Verlag Berlin Heidelberg 2007 The use of general descriptive names, registered names, trademarks, etc in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use Typesetting: Digital data supplied by the Editors Production: LE-TEX Jelonek, Schmidt & Vöckler GbR, Leipzig Cover: Erich Kirchner, Heidelberg/WMXDesign, Heidelberg SPIN 12034321 89/3180/YL - Printed on acid-free paper Preface The International Conference MECHATRONICS has progressed considerably over the 15 years of its existence The seventh in the series is hosted this year at the Faculty of Mechatronics, Warsaw University of Technology, Poland The subjects covered in the conference are wideranging and detailed Mechatronics is in fact the combination of enabling technologies brought together to reduce complexity through the adaptation of interdisciplinary techniques in production The chosen topics for conference include: Nanotechnology, Automatic Control & Robotics, Biomedical Engineering, Design Manufacturing and Testing of MEMS, Metrology, Photonics, Mechatronic Products The goal of the conference is to bring together experts from different areas to give an overview of the state of the art and to present new research results and prospects of the future development in this interdisciplinary field of mechatronic systems The selection of papers for inclusion in this book was based on the recommendations from the preliminary review of abstracts and from the final review of full lengths papers, with both reviews concentrating on originality and quality Finally, out of 182 papers contributed from over 15 countries, 136 papers are included in this book We believe that the book will present the newest applicable information for active researches and engineers and form a basis for further research in the field of mechatronics We would like to thank all authors for their contribution for this book Ryszard Jablonski Conference Chairman Warsaw University of Technology Contents Automatic Control and Robotics Dynamical behaviors of the C axis multibody mass system with the worm gear J Křepela, V Singule Control unit architecture for biped robot D Vlachý, P Zezula, R Grepl Quantifying the amount of spatial and temporal information in video test sequences A Ostaszewska, R Kłoda 11 Genetic identification of parameters the piezoelectric ceramic transducers for cleaning system P Fabijański, R Łagoda 16 Simulation modeling and control of a mobile robot with omnidirectional wheels T Kubela, A Pochylý 22 Environment detection and recognition system of a mobile robot for inspecting ventilation ducts A Timofiejczuk, M Adamczyk, A Bzymek, P Przystałka 27 Calculation of robot model using feed‐forward neural nets C Wildner, J E Kurek 32 EmAmigo framework for developing behaviorbased control systems of inspection robots P Przystałka, M Adamczyk 37 Simulation of Stirling engine working cycle M Sikora, R Vlach 42 Mobile robot for inspecting ventilation ducts W Moczulski, M Adamczyk, P Przystałka, A Timofiejczuk 47 VIII Contents Applications of augmented reality in machinery design, maintenance and diagnostics W Moczulski, W Panfil, M Januszka, G Mikulski 52 Approach to early boiler tube leak detection with artificial neural networks A Jankowska 57 Behavior‐based control system of a mobile robot for the visual inspection of ventilation ducts W Panfil, P Przystałka, M Adamczyk 62 Simulation and realization of combined snake robot V Racek, J Sitar, D Maga 67 Design of combined snake robot V Racek, J Sitar, D Maga 72 Design of small‐outline robot – simulator of gait of an amphibian M Bodnicki, M Sęklewski 77 The necessary condition for information usefulness in signal parameter estimation G Smołalski 82 Grammar based automatic speech recognition system for the polish language D Koržinek, Ł Brocki 87 State controller of active magnetic bearing M Turek, T Březina 92 Fuzzy set approach to signal detection M Šeda 97 The robot for practical verifying of artificial intelligence methods: Micro‐mouse task T Marada 102 The enhancement of PCSM method by motion history analysis S Vĕchet, J Krejsa, P Houška 107 Contents IX Mathematical model for the multi‐attribute control of the air‐conditioning in green houses W Tarnowski, B B Lam 111 Kohonen self‐organizing map for the traveling salesperson problem Ł Brocki, D Koržinek 116 Simulation modeling, optimalization and stabilisation of biped robot P Zezula, D Vlachý, R Grepl 120 Extended kinematics for control of quadruped robot R Grepl 126 Application of the image processing methods for analysis of two‐phase flow in turbomachinery M Śleziak 131 Optoelectronic sensor with quadrant diode patterns used in the mobile robots navigation D Bacescu, H Panaitopol, D M Bacescu, L Bogatu, S Petrache 136 Mathematical analysis of stability for inverter fed synchronous motor with fuzzy logic control P Fabijański, R Łagoda 141 The influence of active control strategy on working machines seat suspension behavior I Maciejewski 146 Verification of the walking gait generation algorithms using branch and bound methods V Ondroušek, S Vĕchet, J Krejsa, P Houška 151 Control of a Stewart platform with fuzzy logic and artificial neural network compensation F Serrano, A Caballero, K Yen, T Brezina 156 Mechanical carrier of a mobile robot for inspecting ventilation ducts M Adamczyk 161 Contents The issue of symptoms based diagnostic reasoning J M Kocielny, M Syfert 167 The idea and the realization of the virtual laboratory based on the AMandD system P Stępień, M Syfert 172 The discrete methods for solutions of continuous‐time systems I Svarc 180 Control unit for small electric drives with universal software interface P Houška, V Ondroušek, S Vĕchet, T Březina 185 Predictor for control of stator winding water cooling of synchronous machine R Vlach, R Grepl, P Krejci 190 Biomedical Engineering The design of the device for cord implants tuning T Březina, M Z Florian, A A Caballero 195 Time series analysis of nonstationary data in encephalography and related noise modelling L Kipiński 200 Ambient dose equivalent meter for neutron dosimetry around medical accelerators N Golnik 206 External fixation and osteogenesis progress tracking out in use to control condition and mechanical environment of the broken bone adhesion zone D Kołodziej, D Jasińska‐Choromańska 211 Evaluation of PSG sleep parameters applied to alcohol addiction detection R Ślubowski, K Lewenstein, E Ślubowska 216 Drive and control system for TAH application P Huták, J Lapčík, T Láníček 222 Contents XI Acoustic schwannoma detection algorithm supporting stereoscopic visualization of MRI and CT head data in pre‐operational stage T Kucharski, M Kujawinska, K Niemczyk 227 Computer gait diagnostics for people with hips implants D Korzeniowski, D Jasińska‐Choromańska 233 Time series analysis of nonstationary data in encephalography and related noise modelling L Kipiński 238 Mechatronic Products – Design and Manufacturing Precision electrodischarge machining of high silicon P/M aluminium alloys for electronic application D Biało, J Perończyk, J Tomasik, R Konarski 243 Modeling of drive system with vector controlled induction machine coupled with elastic mechanical system A Mężyk, T Trawiński 248 Method of increasing performance of stepper actuators K Szykiedans 253 Methods of image processing in vision system for assessing welded joints quality A Bzymek, M Fidali, A Timofiejczuk 258 Application of analysis of thermographic images to machine state assessment M Fidali 263 The use of nonlinear optimisation algorithms in multiple view geometry M Jaźwiński, B Putz 268 Modeling and simulation method of precision grinding processes B Bałasz, T Królikowski 273 Determination of DC micro‐motor characteristics by electrical measurements P Horváth, A Nagy 278 678 R. Jabłoński, P. Orzechowski of hole and measuring device The results of Fourier analysis can be used either to set the correct position of hole during the measurement, or to determine corrections used for further calculation of measurement results 0,776 0,771 0,766 0,761 first to zeroth 0,756 harmonic ratio [-] 0,751 0,746 20 0,741 -20 0,736 -40 -20 20 axes shift in x-direction [um] -40 axes shift in ydirectio n [um] Fig The first to zeroth harmonic ratio for various distances between nominal hole axis and nominal measurement stand axis The above mentioned systematic error is not explained yet, and it will be the subject of further investigations References: [1] B Odom, Manufacturing Engineering 126/2 (2001) 88-102 [2] P Waurzyniak, Manufacturing Engineering 133/1 (2004) 107-114 [3] M Yamamoto, I Kanno, S Aoki, Proceedings of 30-th Conference on MEMS (2000) 217-222 [4] R Jabłoński, P Orzechowski, Precision Engineering 30 (2006) 180184 Silicon quantum detectors with large photosensitive surface A Baranouski (a), A Zenevich (b) , E Novikov (b) (a) Institute of Applied Physical Problems, Kurchatov str., 7, Minsk, 220064, Republic of Belarus (b) Higher state college of communication, Skorina str 8/2, Minsk, 220114, Republic of Belarus Abstract Semiconductor light detectors are the part of vision and image processing systems Pulse amplitude distribution of silicon avalanche photodiodes with photosensitive surface mm2 is investigated using measurement computer system Amplitude characteristics in the photon-counting mode are studied depending on the supplied overvoltage, laser intensity and photosensitive surface area It is shown that changing the supplied overvoltage and photosensitive surface area causes increase / decrease of the peaks number on pulse-amplitude distribution curve due to several microplasmas in the region of space charge Introduction Computer vision and pattern recognition systems require application of various combinations of optical sensors, laser rangers, microwave sensors In this case very simple and inexpensive solution is utilization of chargecoupled devices, manufactured as multiple-unit matrices, and photodetectors with large area of the photosensitive surface Progress of microelectronics in the area of such image registration devices development ensures combination of the high resolution and high rate of imaging with the possibility for registration of separate photons A single-quantum registration or the photon counting method is the most frequently used for registration of the optical radiation with the extremely week intensity by application of the solid-state photodetectors with the internal amplification [1] 680 A. Baranouski, A. Zenevich, E. Novikov An ordinary silicon photodetectors with large photosensitive surface areas possess sufficiently high thermoelectric noise, thereby preventing application of the photon counting mode at room temperatures Hence, the purpose of this work is to show the possibility of realizing the photon counting mode using photodetectors with photosensitive surface area up to several square millimeters with a view to register very low intensity light Experiment and discussion The avalanche photodetectors with a mm2 photosensitive area were used They featured a metal–resistive layer–semiconductor structure [2] based on single-crystal silicon substrate with a Ω⋅cm resistivity Thin undoped zinc–oxide film of n-type conductivity (d=30 nm, and ρ = 107Ω cm) was locally formed, ensuring the formation of an iZnO–Si heterojunction and acting as a resistive layer, and ZnO : Al film (d� 0.5 µm, and ρ = 10-3 Ω cm) as a transparent conducting electrode The photon–counting mode was realized with a passive avalanche quenching circuit [2] The photodetector acts similarly to a Geiger-Muller quantum counter Avalanche breakdown voltage Uav of photodetectors equals 76.8 V So called overvoltage ∆U = Us − Uav (Us – supply voltage) was used to analyze amplitude characteristics under variation of experiment conditions Semiconductor laser with λ = 0.68 µm and focusing system were utilized to light the photosensitive area completely and in part Hardware and software package comprising 100 MHz analog-digital converter was used for registration of pulse amplitude characteristics in the real-time mode Pulses with duration 1.0-1.1 µs and rise time less than 100 ns were observed Their amplitude A depended on supplied overvoltage The pulse is called dark when avalanche breakdown initiated by electron as a result of thermal excitation And the pulse is called signal when electron generated via photon absorption Amplitude distribution of dark pulses was measured as a function of supply overvoltage (Fig 1) The number of peaks on amplitude distribution increased as supply voltage rose The similar picture was observed for the total process of dark and signal pulses The number of peaks depends on homogeneity of photosensitive area and charge carriers multiplication region Heterogeneities have different gain and account for avalanche pulses with different amplitude Such heterogeneities in space charge region are called microplasmas Silicon quantum detectors with large photosensitive surface 681 Mean M and variance D were calculated versus supplied overvoltage for dark and signal pulses to characterize statistics of pulse amplitude (Fig 2) 250 p(A), V-1 200 150 100 50 0.005 0.010 0.015 0.020 0.025 A, V Fig Amplitude distribution of dark pulses for three supply overvoltages (1 - ∆U = –0.3 V; – ∆U = –0.1 V; – ∆U = 0.1 V) Fig Mean and variance of avalanche pulse amplitude versus supply overvoltage (1, – dark pulses, 2, – signal and dark pulses) 682 A. Baranouski, A. Zenevich, E. Novikov The behavior of statistical parameters is similar in presence and absence of laser irradiation The variations of mean and variance not exceed more then 2-3 times In this case operating mode is chosen according to the number of peaks and their magnitude Demonstrate this fact Amplitude distributions of avalanche pulses demonstrated shape changing as we varied laser stimulation area on photosensitive surface (Fig 3) 250 200 p(A), V-1 150 100 50 0.005 0.010 0.015 0.020 0.025 A, V Fig Amplitude distribution of avalanche pulses for ∆U = V (1 – dark pulses, 2, – laser stimulation in different regions of photosensitive surface area) Each peak magnitude of the amplitude distribution depended on the laser beam position on the photosensitive area By measuring number, position and magnitude of peaks it is possible to evaluate light intensity on the photosensitive surface Conclusion Amplitude characteristics of avalanche pulses in silicon quantum detector with large photosensitive surface have been investigated for the purpose of using the devices in automatic vision systems operating in the photoncounting mode It was shown that imperfections in light detection and amplification regions resulted in variation of avalanche pulse amplitude Therefore, such photodetectors containing several multiplication regions Silicon quantum detectors with large photosensitive surface 683 may be used in the pattern recognition system under very low light intensity References [1] J Fraden “Handbook of modern sensors: physics, designs, and applications” Springer-Verlag, New York, 2004 [2] I R Gulakov, V B Zalesskii, A O Zenevich, T R Leonova, Instruments and experimental techniques 50, (2007) 249 Fizeau interferometry with automated fringe pattern analysis using temporal and spatial phase shifting Adam Styk, Krzysztof Patorski Institute of Micromechanics and Photonics, Sw A Boboli St Warsaw 02-525, Poland Abstract The paper presents a novel approach to measure the parameters of quasiparallel plates in a Fizeau interferometer The beams reflected from the front and rear surfaces lead to a complicated interferogram intensity distribution The phase shifting techniques (temporal and spatial) are proposed to process the interferograms and obtain a two-beam-like fringe pattern encoding the plate thickness variations Further pattern processing is conducted using the Vortex transform Introduction The surface flatness of transparent plates is frequently tested in a conventional Fizeau interferometer In case of quasi-parallel plates, however, a common problem is the interference of more than two beams They are reflected from the plate front and rear surfaces and the reference flat Parasitic intensity distribution modulates the two-beam interferogram of the plate front surface [1,2] and makes the application of phase methods for automatic fringe pattern analysis [3-6] inefficient On the other hand parasitic fringes contain the information on the light double passage through the plate Several methods to suppress unwanted fringe modulations are available, for example: index matching treatment on the rear surface of the plate, short-coherence interferometry, grating interferometry, grazing incidence interferometry and wavelength-scanning interferometry [1, 2] In this paper we present preliminary investigations of a novel proposal of processing the interferograms of quasi-parallel optical plates It is based on Fizeau interferometry with automated fringe pattern analysis using temporal 685 the observation that the two-beam interference pattern formed by the beams reflected from the front and rear plate surfaces only can be readily derived from the three-beam interference using temporal phase stepping (TPS) or spatial carrier phase stepping (SCPS) methods The resulting single frame pattern can be processed using the Vortex transform approach [7,8] The phase distribution obtained maps the plate thickness variations Principle and theory of the method The intensity distribution formed by the three interfering beams in the Fizeau cavity can be rewritten as: I = Ar + Af + Ab + Af Ab cos(θ f − θb ) + 2 2 Af Ar cos(θ f − θ r ) + Ar Ab cos(θ r − θb ) (1) Ar, Af, Ab, θr, θf and θb are the amplitudes and phases of the three beams, respectively For notation brevity the (x,y) dependence of all terms has been omitted The goal is to determine the parameters of a quasi-parallel plate such us the front surface phase θf and back surface phase θr using typical fringe pattern analysis methods Using the phase shifting method with a mechanical (PZT) phase shift one obtains the interferograms in the form: I = D + A f Ar cos(θ f − θ r − nδ ) + Ar Ab cos(θ r − θ b − nδ ) , (2) where n = 0,1,2,3, and δ is the phase shift between frames When the amplitudes of the beams reflected from the front and back surfaces are nearly equal (Af ≅ Ab) the terms before cosine terms in Eq are equal as well Using trigonometric identities the intensity distribution becomes: θ f − θb θ f + θb I = D + A f Ar cos cos − θ r − nδ (3) A new fringe pattern based on two fringe families multiplied by each other is obtained It can be treated as a two beam interferogram with the bias described by the term D (constant) and the modulation distribution described by the first cosine term The modulation distribution carries the information on the plate optical thickness variations and the main cosine term gives the information on the sum of two surfaces Using conventional techniques for fringe pattern analysis (TPS, SCPS), it is possible to evaluate the information on the optical thickness variations separately 686 A. Styk, K. Patorski Five mutually phase shifted interferograms, Eq 3, acquired with the phase shift δ = π/2 and put into the standard TPS five frame algorithm [9,10] for modulation calculation give the modulation distribution Md in the form: θ Md = A f A r cos f − θb (4) The calculated distribution may be treated as a fringe pattern without bias However, in the form presented by Eq it cannot be analyzed due to its highly nonsinusoidal profile as it is a modulus function To overcome this difficulty one can square the Md distribution and obtain: Md = (2 A Ar ) f [1 + cos (θ f ] − θb ) (5) The optical thickness variations of the quasi - parallel plate can be evaluated from Eq As the presented fringe pattern cannot be intentionally modified, only the single frame analysis methods can be applied [7,11] Fringe pattern analysis method In this Section the processing path of the three – beam interference pattern described by Eq is introduced, see Fig Set of phase shifted interferograms Md2 - modulation determination Vortex Transform (VT) Fringe pattern bias removal Information on optical thickness variations of tested plate Fig Three beam interferogram processing path In the first step the set of five to seven mutually phase shifted interferograms (with δ = π/2) is recorded If the TPS technique cannot be implemented, the SCPS technique might be used In this case only one interferogram, with intentionally introduced spatial carrier fringes, is sufficient to evaluate the desired parameters Unfortunately the interferogram processing using the SCPS method provides lower accuracy than the TPS method The next step in the three beam interferogram processing path is to calculate the squared interferogram modulation distribution Md2 This can be performed with a specially derived TPS algorithm with high resistance to Fizeau interferometry with automated fringe pattern analysis using temporal 687 the phase step error [12] Detailed studies of systematic errors of the most common TPS algorithms applied to modulation calculations can be found in [13] The modulation fringe pattern needs to be processed using single frame analysis methods The method presented by Larkin et al [7,8] was chosen for calculations This method, called the Vortex Transform (VT), is based on the two-dimensional Hilbert transform Experimental results Experimental work has been conducted using the Fizeau interferometer with the reference element axially displaced by three PZTs placed along the optical element circumference (diameter of 50 mm) Figure presents a three beam interferogram (one from the set of five phase shifted interferograms) of a microscope cover glass and the calculated squared modulation distribution Md2 Figure shows the quadrature signal of the fringe pattern (Fig 2b) calculated using VT and the wrapped phase distribution with information about plate optical thickness variations a) b) Fig Experimental three - beam interferogram (a) and the calculated squared modulation distribution Md2 (b) a) b) Fig Quadrature signal of the fringe pattern presented in Fig 2b (a) and the calculated wrapped phase distribution (b) 688 A. Styk, K. Patorski Conclusions Preliminary investigations of a novel processing path of interferograms of quasi-parallel optical plates tested in a Fizeau interferometer were presented The processing path is based on the observation that the two-beam interference pattern formed by the beams reflected from the front and rear plate surfaces only can be derived from the three-beam interference using either temporal (TPS) or spatial carrier phase stepping (SCPS) methods The evaluated single frame pattern can be subsequently processed using the vortex transform (VT) approach The phase distribution obtained corresponds to plate optical thickness variations Experimental investigations corroborate the theoretical and numerical findings Acknowledgments The authors want to thank Dr Piotr Szwaykowski for performing the part of measurements and fruitful discussions This work was supported by the grant of the Dean of Faculty of Mechatronics and the statutory founds References [1] P de Groot, “Measurement of transparent plates with wavelengthtuned phase-shifting interferometry”, Appl Opt 39(16), 2658-2663 (2000) [2] K Hibino, B.F Oreb, P.S Fairman, and J Burke, “Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer”, Appl Opt 43(6), 1241-1249 (2004) [3] J Schwider, “Advanced evaluation techniques in interferometry,” Chap in Progress in Optics, E Wolf ed., 28, 271-359, North Holland, Amsterdam, Oxford, New York, Tokyo, 1990 [4] J.E Greivenkamp, and J.H Brunning, “Phase shifting interferometry,” Chap 14 in Optical Shop Testing, D Malacara ed., 501-598, John Wiley & Sons, Inc., New York, Chichester, Brisbane, Toronto, Singapore, 1992 [5] K Creath, “Temporal phase measurement methods,” Chap in Interferogram Analysis: Digital Fringe Pattern Measurement, D.W Robinson and G Reid, eds., 94-140, Institute of Physics Publishing, Bristol, Philadelphia, 1993 Fizeau interferometry with automated fringe pattern analysis using temporal 689 [6] D Malacara, M Servin, and Z Malacara, Interferogram Analysis for Optical Shop Testing, Marcel Dekker, Inc., New York, Basel, Hong Kong, 1998 [7] K.G Larkin, D.J Bone, and M.A Oldfield, “Natural demodulation of two-dimensional fringe patterns I General background of the spiral quadrature transform”, J Opt Soc Am A, 18(8), 1862-1870 (2001) [8] K.G Larkin, “Natural demodulation of two-dimensional fringe patterns II Stationary phase analysis of the spiral phase quadrature transform”, J Opt Soc Am A, 18(8), 1871-1881 (2001) [9] J Schwider, R Burrow, K.E Elssner, J Grzanna, R Spolaczyk, K Merkel, “Digital wave-front measuring interferometry: some systematic error sources”, Appl Opt 22(21), 3421-3432 (1983) [10] P Hariharan, B Oreb, T Eiju, “Digital phase-shifting interferometry: a simple error compensating phase calculation algorithm”, Appl Opt 26(13), 2504-2505 (1987) [11] M Servin, J.A Quiroga, J.L Marroquin, ”General n-dimensional quadrature transform and its application to interferogram demodulation”, J Opt Soc Am A, 20(5), 925-934, 2003 [12] K.G Larkin, “Efficient nonlinear algorithm for envelope detection in white light interferometry”, J Opt Soc Am A 13(4), 832-843 (1996) [13] K Patorski, A Styk, “Interferogram intensity modulation calculations using temporal phase shifting: error analysis”, Opt Eng 45(8), 085602, (2006) Index Abetkovskaia, 551 Adamczyk, 27, 37, 47, 62, 161 Alexandrescu, 516 Andrei, 531 Anwar, 556 Bacescu, D., 136, 516 Bacescu, D.M., 136 Balemi, 355 Bałasz, 273 Baranouski, 679 Barczyk, 406 Baszak, 591 Bauma, 438 Bernat, 431 Besnea, 516 Biało, 243, 370, 470 Bieńkowski, 616 Bodnicki, 77 Bogatu, 136, 288, 391, 516 Bohm, 458 Bojko, 381 Bratek, 561 Brezina, 156 Březina, 185, 195 Brocki, 87, 116 Buczyński, 401, 406 Bukat, 313, 340 Burhanudin, 500 Bzymek, 27, 258 Caballero, 156, 195 Cernica, 288, 391 Chikunov, 541 Chizhik, 541, 551 Delobelle, 531 Demianiuk, 308 Denkiewicz, 546 Dobosz, 627 Dovica, 335 Drozd, 293, 298, 313, 340 Duminica, 288 Dwórska, 648 Dymny, 616, 637 Ekwińska, 505, 536 Ekwiński, 505 Fabijański, 16, 141 Fidali, 258, 263 Florian, 195 Gambin, 526 Gheorghiu, 571 Girulska, 313 Golnik, 206 Gorecki, 531 Gorzás, 335 Greger, 421 Grepl, 6, 120, 126, 190, 318 Hadaš, 350 Hartmann, 658 Hirsinger, 531 Hoffmann, 345 Horváth, 278 Houfek, 411 Houška, 107, 151, 185 Huták, 222 Ichiraku, 556 Ikeda, 500 Ionascu, 288, 391, 516 Jabloński, 556, 591, 596, 663, 673 Jakubowska, 360 Janeček, 453 Janiszowski, 323, 475 Jankowska, 57 Januszka, 52 Jarzabek, 541 Jasińska-Choromańska, 211, 233, 401, 406 Jaźwiński, 268 Jezior, 360 Józwik, 531 Just, 396 Kabziński, 401 Kacalak, 375, 431 Keränen, 643v Kipiński, 200, 238 Kisiel, 293, 313 Klapka, 448 Klug, 345 Kluge, 350 Kłoda, 11, 611 Koch, 345 Kocich, 421 Kołodziej, 211 692 Konarski, 243 Korzeniowski, 233 Koržinek, 87, 116 Kościelny, 167 Kowalczyk, 386 Kozacki, 653, 668 Kozánek, 438 Krajewski, 653, 658 Krejci, 190, 576 Krejsa, 107, 151, 416 Křepela, Kretkowski, 663 Krezel, 658 Krężel, 643, 658 Królikowski, 273 Krupa, 531 Kubela, 22 Kucharski, 227 Kuczyński, 475, 616 Kudła, 303 Kujawińska, 227, 637, 643, 653, 658 Kupka, 453 Kurek, 32 Kuznetsova, 541 Lam, 111 Láníček, 222 Lapčík, 222 Lewenstein, 216 Ligowski, 556 Łagoda, 16, 141 Łuczak, 511 Maciejewski, 146 Maga, 67, 72 Majewski, 465, 490 Makuch, 375 Malášek, 426 Malinowski, 365, 480 Manea, 288, 391 Marada, 102 Mayer, 621 Mazůrek, 448, 601 Mąkowski, 596 Meuret, 653 Mężyk, 248 Michałkiewicz, 637 Miecielica, 308 Mikulski, 52 Moczulski, 47, 52 Index Mohr, 658 Moraru, 500 Nagy, 278 Necas, 458 Neugebauer, 345 Neusser, 438 Niemczyk, 227 Nieradko, 531 Novikov, 679 Novotny, 486 Nuryadi, 500, 556 Oiwa, 330 Ondroušek, 151, 185 Ondrůšek, 350 Orzechowski, 673 Ostaszewska, 11, 611 Pakuła, 668 Panaitopol, 136, 516 Panfil, 52, 62 Parriaux, 658 Paszkowski, 370, 443, 470 Patorski, 684 Perończyk, 243 Petrache, 136 Piskur, 283 Pistek, 485 Pochylý, 22 Posdarascu, 571 Pozdnyakov, 571 Pražák, 448, 601 Przystałka, 27, 37, 47, 62 Pustan, 521 Putz, 268 Racek, 67, 72 Rasch, 416 Rizescu, 391 Roncevic, 355 Rymuza, 505, 521, 536, 541, 546 Salach, 606 Sałbut, 616, 637, 643 Sandu, 391 Šeda, 97 Serrano, 156 Sęklewski, 77 Shimodaira, 663 Šika, 438, 458 Sikora, 42 Singule, 1, 350 Index Siroezkin, 551 Sitar, 67, 72 Sitek, 340 Skalski, 370 Šklíba, 453 Sloma, 360 Słowikowski, 561 Smołalski, 82 Sokołowska, 464 Sokołowski, 366, 464, 484 Sorohan, 385 Steinbauer, 432 Stępień, 166 Styk, 684 Suzuki, 657 Svarc, 180 Sveda, 458 Svída, 566 Syfert, 167, 172 Syryczyk, 313 Szewczyk, 586 Szwech, 293, 313 Szykiedans, 253 Śleziak, 131 Ślubowska, 216 Ślubowski, 216 Tabe, 500, 556 693 Tarnowski, 111, 283, 396 Timofiejczuk, 27, 47, 258 Tomasik, 243 Tonchev, 658 Trawiński, 248 Turkowski, 561, 632 Uhl, 381 Urzędniczok, 581 Valasek, 458 Vĕchet, 107, 151, 190, 411 Vlach, 42, 190 Vlachý, 6, 120 Wawrzyniuk, 648 Wielgo, 536 Wierciak, 495 Wildner, 32 Wissmann, 658 Wiśniewski, 443, 470 Wnuk, 323 Wozniak, 621 Wrona, 298 Yen, 156 Yokoi, 500 Zarzycki, 526 Zelenika, 355 Zenevich, 679 Zezula, 6, 120 .. .Ryszard Jab�o´ski, Mateusz Turkowski, Roman Szewczyk (Eds.) l n Recent Advances in Mechatronics Ryszard Jab�onski, Mateusz Turkowski, Roman Szewczyk l ´ (Eds.) Recent Advances in Mechatronics. .. φM The switching-on of the C axis causes the preload and the slewing into a defined angular position The preload remains constant during machining with the moving C axis and the increase of moments... numbers of neurons in a single network required that 54000 examples had to be used during network training In order to increase the number of testing images a few different noises were introduced to