... APPLICATION OF BIASED SCANNING PROBE MICROSCOPY TECHNIQUES FOR MULTIFUNCTIONAL CHARACTERIZATION OF BiFeO3 AND ZnO THIN FILMS AMIT KUMAR (M.Tech, Indian Institute of Technology Roorkee, ... multiferroic and the other material is ZnO, one of the potential future materials for advanced electronic applications Scanning probe microscopy techniques, Piezoresponse Force Microscopy (PFM) and Kelvin ... the surface of ZnO: Cu:Co sample The red arrow represents the location and direction of data collection for the comparison Figure 8.3 The UPS results for Pt, ZnO, ZnO: Cu, ZnO: Co and ZnO: Cu:Co film...