Modern Developments in X-Ray and Neutron Optics Episode 4 potx

... Phys. Lett. 85, 49 4 (20 04) 14. T. Oku, S. Morita, S. Moriyasu, et al., Nucl. Instrum. Methods A 46 2, 43 5 (2001) 15. T. Adachi, K. Ikeda, T. Shinohara, et al., Nucl. Instrum. Methods A 529, 112 (20 04) 16. ... employing only smaller grating periods or in the case of zone plates by smaller zones. According to the Rayleigh criterion the point-to-point 106 S. Lagomarsino et al. 6 .4....

Ngày tải lên: 13/08/2014, 05:22

... number requires specialised instruments for tests and a careful and time consuming production process. The interesting point in the large tolerance for the surface errors in X-ray transmission lenses ... soft X-ray contact microscopy, or micromachining of polymers by direct photoetching. Grazing incidence X-ray optics can be used to collect the radiation in a wide wavelength...

Ngày tải lên: 13/08/2014, 05:22

... OptimizationofInstrumentParameters 60 4. 3 SimulationofNeutronOpticsComponents 61 4. 3.1 NeutronSource 61 4. 3.2 DiffractiveOptics 62 4. 3.3 ReflectiveOptics 64 4 .4 SimulationsofEntireInstruments 66 4. 4.1 ResolutionFunctions ... RadiationSource 343 21 .4. 3BeamDiffraction in theClessidra Structure 343 21 .4. 4Refraction Efficiencyinthe ClessidraStructure 346 21.5 Conclusion 349 Refe...

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... initial analytical estimation of the sampling intervals. The phase- space coordinates and other random quantities (e.g., scattering angles or penetration depth in a crystal) determining the neutron ... (2. 24) 2.5.7 Intersection Point The intersection point (x M ,y M ,z M ) of the ray with the optical element is determined by solving the quadratic equation in t generated by inserting...

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... over the same 45 mm by 45 mm area and the output converted into PHASE field format. The aperture is included in PHASE by setting the radius of a pinhole in the input source plane, defined in the input ... field and also allows for its propagation across “thin” optics. This code is described in Sect. 5.2. Beamlines at UV and shorter wavelengths require highly grazing incidence o...

Ngày tải lên: 13/08/2014, 05:22

... aperture. 8.5 The In uence of Interdiffusion and Roughness Up to now X-ray microscopes mainly operate in the soft X-ray wavelength range between the K-absorption edges of oxygen and carbon (2. 34 4. 37nm wavelength). ... Guttmann, O. Christ, in X-Ray Microscopy,ed.by G. Schmahl, D. Rudolph, Springer Series in Optical Sciences, vol. 43 (Springer, Berlin Heidelberg New York, 19...

Ngày tải lên: 13/08/2014, 05:22

... described in (13.3). It is possible to make the measurement without changing anything in the LTP but instead by simply inclining the grating with respect to the optics table in order to obtain the ... 250 mirror coordinates (mm) slope error (urad) Fig. 14. 4. S2 (R ≈ 44 m) residual slopes after best sphere subtraction 14. 4 Conclusions The five mirrors involved in this Round-Robin...

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... by Tatchyn in 1990 [105], and the first zone plate with a blazed zone profile was manufactured at Wisconsin and tested at the APS using 8 keV X-rays showing 45 % efficiency for linear and 39% efficiency ... plasma chemical vaporization machining (PCVM) is employed for rough figuring, and elastic emission machining (EEM) is used for final figuring and surface super smoothing. These methods...

Ngày tải lên: 13/08/2014, 05:22

... [ 145 ], while for refractive optics this limit is slightly lower and 2 nm may be achievable [ 146 ]. Unlike reflective and refractive optics, zone plates can focus X-rays below 1 nm [ 147 , 148 ]. In ... applications, and new scientific and industrial instruments and methods have been developed based on capillary optics. X-ray microprobes are widely used in combination with...

Ngày tải lên: 13/08/2014, 05:22

... (nm) 30 860 44 . 541 0.701 12.25 0.2033 35 575 44 . 540 0.7 14 12.03 0.2033 40 621 44 .577 0.717 11.98 0.2032 51 48 6 44 .696 0.732 11. 74 0.2026 60 170 44 .736 0.838 10.25 0.2025 remanence, with values ... cooled down invacuumandmeasuredatRT.TheXRRandGIXDSsimulationparameters are also shown in Table 24. 2. An increase of the σ and σ eff −σ values indicates an advanced interface r...

Ngày tải lên: 13/08/2014, 05:22