Encycopedia of Materials Characterization (surfaces interfaces thin films) - C Brundle et al (BH 1992) WW Part 8 pptx
encycopedia of materials characterization surfaces interfaces thin films c brundle et al bh 1992 pdf
... end. Library of Congress Cataloging-in-Publication Data Brundle, C. R. Encyclopedia of materials characterization: surfaces, interfaces, thin films /C. Richard Brundle, Charles A. Evans, ... classes include volumes on silicon processing, metals and alloys, catalytic materials, integrated circuit packaging, etc. Characterization is approached from the mate- rials...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 14 ppt
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 2 pps
... Nikon Microphot-FXA research microscope for materials science. As an example of a more specific application, Figure 2 illustrates a metallo- graph-a light microscope set up for the characterization ... aperture achieved is 1.4. The significance of the numerical aperture lies in the dif- fraction theory of microscopical image formation; details on the theoretical and prac...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 3 pps
... micro- structure of materials. It is used to study all varieties of solid materials: metals, ceramics, semiconductors, polymers, and composites. With the common availabil- ity of high-voltage ... Operational Considerations in Electron Microscopes Quantification Conclusions Introduction With modern detectors and electronics most Energy-Dispersive X-Ray Spectros- copy (EDS)...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 5 ppt
... and small mole- cules on surfaces; electrode-dectrolyte interfaces; electrochemically produced solu- tion species; metals, semiconductors, and insulators; high-temperature superconductors; ... studies of mate- rials, particulary catalysts59 and electrochemical systems. l3 Other techniques that have been successfully employed for in situ electrochemical studies include ellip-...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 6 ppsx
... processing of these materials, such as studying the effects of cleaning procedures on residual surface contami- nants, and studying reactive ion-etching mechanisms.’ The major drawback of syn- chrotron ... strengths of XPS are its good quantification, its excellent chemical state determination capabilities, its applicability to a wide variety of materials from bio- lo...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 7 ppt
... defects. Such materials include alkali- halides, semiconductors, crystalline ceramics, and glasses. In opaque materials PL is particularly surface sensitive, being restricted by the optical ... other optical methods, such as photoluminescence, cathodoluminescence, photoluminescence excitation spec- troscopy, absorption, spectral ellipsometry, photocurrent spectroscopy, and reso- nan...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 8 pptx
... surfaces. Magneto-optic and magnetic disc materials: DyCo, TbFeCo, garnets, sputtered magnetic media (CoNiCr alloys and their carbon overcoats). Electrochemical and biological and medical ... Microfocus Raman Spectroscopic Analysis By successllly marrying a Raman spectrometer to an optical microscope it is possi- ble to obtain spectra having the resolution of optical microscopy-...
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Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 9 pps
... Analytical Cbem. 60, 3 W. K. Chu, J. W. Mayer, and M. A. Nicolet. Backscattering Spectrometry. J Polynter Sci. (Cbem.) 22,3367,1 984 . 1046,1 988 . Academic Press, New York, 19 78. ... silicon by a special technique of dipolar spectroscopy, mul- tiple-quantum NMR Am. Cbem. SOC. 11 1,2052, 1 989 . In situ NMR studies of catalytic proper- ties. 4 T M. Duncan a...
Ngày tải lên: 11/08/2014, 02:21