... Series on characterization of particular materials classes include volumes on silicon processing, metals and alloys, catalytic materials, integrated circuit packaging, etc. Characterization ... Single crystal Single crystal Single crysml All All All, inorganic usually N1 Y2 N2 N2 Y3 Y2 Y2 Y1 Y3 Y3 N2 YIN - Y- Y- Y3 Y- Y- Y3 Y- Y3 1Y 1Y 3Y 2Y...
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Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 2 pps
... family of instruments commonly termed Scanning Probe Microscopes (SPMs). Other common members include the mag- netic force microscope, the scanning capacitance microscope, and the scanning acoustic ... a metallo- graph-a light microscope set up for the characterization of opaque samples. Figure 3 illustrates a research-grade microscope made specifically for materials sci- en...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 3 pps
... micro- structure of materials. It is used to study all varieties of solid materials: metals, ceramics, semiconductors, polymers, and composites. With the common availabil- ity of high-voltage ... Operational Considerations in Electron Microscopes Quantification Conclusions Introduction With modern detectors and electronics most Energy-Dispersive X-Ray Spectros- copy (EDS)...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 5 ppt
... and small mole- cules on surfaces; electrode-dectrolyte interfaces; electrochemically produced solu- tion species; metals, semiconductors, and insulators; high-temperature superconductors; ... studies of mate- rials, particulary catalysts59 and electrochemical systems. l3 Other techniques that have been successfully employed for in situ electrochemical studies include ellip-...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 6 ppsx
... eV Al3 + -2 .0 eV cu+ -0 .0 eV cu2+ -1 .5 eV Zn2+ -0 eV w4' 2 eV w6' 4 eV Typical chemical shift values for XPS core levels. with the simplest classical electrostatic ... processing of these materials, such as studying the effects of cleaning procedures on residual surface contami- nants, and studying reactive ion-etching mechanisms.’ The major...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 7 ppt
... defects. Such materials include alkali- halides, semiconductors, crystalline ceramics, and glasses. In opaque materials PL is particularly surface sensitive, being restricted by the optical ... 90 2 of Trace Element Figure3 Calculated detection limits for trace elements in 1 mg/cm2 specimens of carbon,aluminum, and calcium (100 pC of 3-MeV protons)? The dashed curv...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 8 pptx
... surfaces. Magneto-optic and magnetic disc materials: DyCo, TbFeCo, garnets, sputtered magnetic media (CoNiCr alloys and their carbon overcoats). Electrochemical and biological and medical ... Microfocus Raman Spectroscopic Analysis By successllly marrying a Raman spectrometer to an optical microscope it is possi- ble to obtain spectra having the resolution of optical microscopy-...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 9 pps
... silicon by a special technique of dipolar spectroscopy, mul- tiple-quantum NMR Am. Cbem. SOC. 11 1 ,20 52, 1989. In situ NMR studies of catalytic proper- ties. 4 T M. Duncan and C. ... their collaborators. 504 ION SCATTERING TECHNIQUES Chapter 9 9 .2 ERS Elastic Recoil Spectrometry J.E.E. BAGLIN Contents Introduction Principles of ERS Practical Consideration...
Ngày tải lên: 11/08/2014, 02:21