Sổ tay ma sát và Nano P10 pot
Sổ tay ma sát và Nano P10 pot
... G.M., 1992,
J. Mater. Res. 7, 1564–1583. With permission.)
FIGURE 10.21 Schematic of load–displacement curve.
hh W S
c
=−
max max max
ε
hh W S
p
=−
max max max
© 1999 by CRC Press LLC
remains unchanged. ... 90° may be desirable for a more durable tip. The tip radius should not be very
small as it will get blunt readily.
FIGURE 10.17 (a) Schematic of nanoindenter with an AE transducer, (b) sch...
Sổ tay ma sát và Nano P11 pot
... indentation to approximately the same
value of maximum force was repeated, plastic deformation was also observed. However, the atomic-scale
details, including the degree of damage, differed. The ... constants, the curvature and magnitude of potential
wells, and bulk phonon frequencies. The main drawback of these approaches is that simplifying assump-
tions must be made as part of these models...
Sổ tay ma sát và Nano P13 pot
... surface micromachining. In contrast to substrate micromachining in which mechan-
ical parts are sculpted from the wafer itself, surface micromachining makes mechanical elements out of
materials ... the motions of very small bodies in which micrograms
are proper units of mass. At this scale, as we know from observing the insect world, inertial effects play
far smaller (in many cases negligible...
Sổ tay ma sát và Nano P15 potx
... strengths of the corresponding bulk materials. Many theories to explain these stresses
have been suggested, and a summary is given in a review by Windischmann (1992). Intrinsic tensional
stresses ... instead prefer to form small, particle-like
precipitates, resulting in a maintained low yield limit, see Figure 15.5. Also, during plastic deformation
these precipitates may act as sources for .....
Sổ tay ma sát và Nano P1 docx
... properties of mating components dominate the tribological perfor-
mance. In micro/nanotribology, measurements are made on components, at least one of the mating
components, with relatively small mass ... 1989; Mamin et
al., 1990;
Utsugi, 1990; Hosoki et
al., 1992; Kobayashi et
al., 1993), and nanomachining (Parkinson, 1990). AFMs
have also been used for nanofabrication (Maju...
Sổ tay ma sát và Nano P2 pps
... the mass to 0.1 µg. This lumped mass m
eff
, however, is smaller than the real mass m, by a factor
that depends on the geometry of the cantilever.
A good rule of thumb says that the effective mass ... the real mass. Today, micro-machined
cantilevers are commercially available and are used almost exclusively.
2.2.4 Materials and Geometry
Cantilevers have been made from a whole range of materia...
Sổ tay ma sát và Nano P3 pptx
... elastic effects in any measuring apparatus and in the
materials involved that make measurement of the force distribution at the interface difficult. Materials
can change mechanical properties as a result ... as
hardness, ductility, defect formation, plasticity, strain hardening, and creep must be considered. Surface
properties may be altered just by contact with the counterface material (Carpi...
Sổ tay ma sát và Nano P4 docx
... be resolved. One may ask how is it that, under increasing load, smaller asperities under plastic
deformation may merge to form a larger spot which can be under elastic deformation. A qualitative
answer ... of
elastic contact area increases. This results from merging of small contact spots in plastic deformation to
form larger spots in elastic deformation.
The effects of fractal dimension on t...
Sổ tay ma sát và Nano P5 docx
... water (≈80).
5.3.4 Electromagnetic Forces
There are three classes of magnetism — diamagnetism, paramagnetism, and ferromagnetism. In paramag-
netic and diamagnetic materials, electron spins are ... was written. For example, many simulations neglect the fact that electrons have spin,
so that normally magnetic materials may not have magnetic moments in a simulation. Magnetic forces
can overpowe...
Sổ tay ma sát và Nano P6 pptx
... be deflected (normal force signal).
Images taken in the constant-height mode show no contrast in the topographic image, in this case all
information is in the normal force image. Images taken in ... constant-force mode, topographic image is obtained by adjusting the
position of the sample to maintain a constant force. Hence, minima and maxima of the normal force
and of the topography coincide...
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