... volume of the Au nanometricgrains forming the film can be obtained. The XEI softwarefor the analyses of the AFM images allow to obtain the distribution of the grains radii, R, and of the grains ... room-temperature growth of sputtered Au filmson SiO2using the atomic force microscopy technique. By the analyses of the dependence of the roughness, r, of the surface roughness power, P(f), and of the correlationlength, ... procedure consisting in the definition of each grain area by the surface image sectioning of a plane that was positioned at the half grain height. As a consequence, the distribution of the grains radii...