Optoelectronics Materials and Techniques Part 6 ppt

Optoelectronics Materials and Techniques Part 6 ppt

Optoelectronics Materials and Techniques Part 6 ppt

... present work, the substrates are silicon (100) and Optoelectronics - Materials and Techniques 168 200 400 60 0 800 1000 1200 1400 160 0 1800 0 200 400 60 0 800 1000 1200 1400 I Se Zn Si Counts/msr/keV Energy ... lattice parameter a = 5 .66 8 Å or wurtzite structure with lattice parameters a = 3.820 Å and c = 6. 6 26 Å. The lattice constant value of cubic silicon is...

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Optoelectronics Materials and Techniques Part 1 pptx

Optoelectronics Materials and Techniques Part 1 pptx

... light- induced degradation.” Optoelectronics - Materials and Techniques 16 By applying Yelon’s treatment to e-h pairs generated by beta particles originating from tritium decay, ... broken is not a weak one. The authors Optoelectronics - Materials and Techniques 6 (a) (b) Fig. 2. A 3-d computer model representation of c-Si (a), and a...

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Optoelectronics Materials and Techniques Part 2 pptx

Optoelectronics Materials and Techniques Part 2 pptx

... differences in density of the black area and the contrast between the black area and the white one from the PS layers (Figures 6a and 6c) and SRSO layers (Figures 6b and 6d). Those differences suggest ... interference filters. Optoelectronics - Materials and Techniques 38 Intensity (a.u.) Wavelength (nm) 1400 1500 160 0 1700 2 4 8 12 16 20 λ...

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Optoelectronics Materials and Techniques Part 7 pptx

Optoelectronics Materials and Techniques Part 7 pptx

... cells based on nanoparticle-decorated ZnO/TiO 2 core/shell nanorod arrays. J. Phys. D: Appl. Phys. Vol. 42, (2009), pp. 155104, ISSN 1 361 -64 63 Optoelectronics - Materials and Techniques 182 ... along the c-axis and slow etching along the radial directions. The X-ray diffraction peaks at 2θ of 31.9°, 34. 76 , 36. 3°, 47 .6 and 56. 68°arise from the (100), (002), (101),...

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Optoelectronics Materials and Techniques Part 10 pptx

Optoelectronics Materials and Techniques Part 10 pptx

... 0 0 2 4 6 8 10 0 2 4 6 8 10 0 2 4 6 8 Z X Y (b) t / τ R = 100 0 2 4 6 8 10 0 2 4 6 8 10 0 2 4 6 8 Z X Y (c) t / τ R = 500 0 2 4 6 8 10 0 2 4 6 8 10 0 2 4 6 8 Z X Y (d) t / τ R = 1000 0 2 4 6 8 10 0 2 4 6 8 10 0 2 4 6 8 Z X Y (e) ... 0 2 4 6 8 10 0 2 4 6 8 10 0 2 4 6 8 Z X Y (a) t / τ R = 0 0 2 4 6 8 10 0 2 4 6 8 10 0 2 4 6 8 Z X Y (b) t / τ R = 100...

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Optoelectronics Materials and Techniques Part 12 ppt

Optoelectronics Materials and Techniques Part 12 ppt

... wavelength and intensity of the LD was 1550 nm and 5.8 dBm, respectively. The 325 Optoelectronic Circuits for Control of Lightwaves and Microwaves Optoelectronics - Materials and Techniques 3 46 coefficients ... waveform generation, code/label generation for optical 334 Optoelectronics - Materials and Techniques Optoelectronics - Materials and Techniques...

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Optoelectronics Devices and Applications Part 6 pptx

Optoelectronics Devices and Applications Part 6 pptx

... heating of small particles, Proceedings of the 24th International Symposium on Combustion (code 1 962 6), Pittsburgh, PA, USA, pp. 1 761 –1 767 . ISSN:0082-0784. 204 Optoelectronics – Devices and Applications Applications ... narrow-band interference filter, centred at the same wavelength as a strong absorption band of CH 4 (Q-branch centred at 1 .66 6 μm), whilst the other filter covered a...

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Optoelectronics Materials and Techniques Part 3 docx

Optoelectronics Materials and Techniques Part 3 docx

... steps: i) first the PS samples were kept at 60 0 C for 60 min in air ambient to stabilize the PS (a) (b) Optoelectronics - Materials and Techniques 64 The IR vibrations of a Si–O–Si entity ... length and bond angle) is represented in the density of states distribution by localized states in the bands’ tails. Figure 11 shows the Optoelectronics - Materials and T...

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Optoelectronics Materials and Techniques Part 4 docx

Optoelectronics Materials and Techniques Part 4 docx

... coupled with wide bandgap has made GaN an attractive material for device operation in high temperature and caustic environments. Optoelectronics - Materials and Techniques 96 Augusts 2007, ... lattice and thermal mismatches between nitrides and substrate. These stacking irregularities are also known as double positioning boundaries. Optoelectronics - Materials...

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Optoelectronics Materials and Techniques Part 5 pot

Optoelectronics Materials and Techniques Part 5 pot

... Sub- ångstrom Resolution. Advanced Materials, Vol. 20, No. 11, pp. 2 162 -2 165 . Optoelectronics - Materials and Techniques 110 4. Defects in GaN films and formation mechanisms 4.1 Threading ... ( 4 Γ − 8  2 Γ + 7 ), and “indigo” ( 4 Γ − 8  4 Γ + 8 ). Our primary concern is dipole-forbidden yellow exciton ( 2 Γ + 6  2 Γ + 7 ), which is the bound state of an 138 Opt...

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