Solution manual for CMOS digital integrated circuits analysis and design 4th edition by kang

Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at 1.1 An ADD/SUBTRACT logic circuit is shown in Fig P1.1 It performs the ADD operation for P = and SUBTRACT for P = Figure P1.1 (a) Draw an equivalent CMOS logic diagram by noting that most CMOS gates, except for the transmission gate and XOR, are inverting For example, the AND gate is implemented with NAND followed by an inverter (b) By using the gate array platform given in Fig 1.30, implement the CMOS circuit as compactly as possible with the aspect ratio, which is the ratio of vertical dimension to horizontal dimension, as close to as possible 1-1 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at CMOS Gate Array Platform SOLUTION: (a) The AND and OR gates can be translated into CMOS circuit in the following steps: ↓ 1-2 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at ↓ OAI21 OAI21 ( Or – And – Inverter ) (b) The CMOS circuit implementation using the gate array platform: 1-3 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at OAI21 NAND A Out XOR B A B A_b Out Out B_b A A Out CAS B C 1.2 For the CMOS circuit in Problem 1.1, 1-4 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at (a) First develop a small library of CMOS cells (b) Place the cells into a single row and interconnect them with proper ordering such that the total interconnection wire length is minimized SOLUTION: (a) Inverter Cell OAI21 Cell Nand Cell 1-5 Full file at Xor Cell Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at (b) 1.3 A measure of design productivity predicts the required engineer-months in terms of design implementation styles, such as repeated transistors (RPT), non-repeatable unique transistors (UNQ), PLA, RAM, and ROM transistors; the experience level of engineers (yr); the productivity improvement per year (D); and the design complexity (H) The formula proposed by Fey is Engineer  Months( EM )  (1  D) yr [ A  Bk H ] where the number k of equivalent transistors in the design is expressed by 1-6 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at k  UNQ  C  RPT  E  PLA  F RAM  G ROM In this formula, the transistor count is in units of thousands and the coefficients A, B, C, D, E, F, G, and H are model parameters that depend on the designers’ experience and CAD tool support The parameter (yr) represents the number of years since the extraction time of the model parameters A set of sample values for these parameters are A = 0, B = 12, C = 0.13, D = 0.02, E = 0.37, F = 0.65, G = 0.08, and H = 1.13 (a) Discuss how one would extract the model parameters within a design organization (b) A 24-bit floating-point processor has been designed using 20,500 repeated transistors, 10,500 unique transistors, 105,500 RAM transistors, and 150,200 ROM transistors Calculate the expected engineer-months (EM) by assuming the experience year value of yr = Note that the transistor counts in the formula are in units of thousands, for instance, UNQ = 10.5, not 10,500 SOLUTION: (b) RPT  20.5 UNQ  10.5 RAM  105.5 ROM  150.2 1-7 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at k  UNQ  C  RPT  E  PLA  F  RAM  G  ROM  10.5  0.13  20.5  0.65  105.5  0.08  150.2  20.82 EM  (1  D)Yp   A  Bk H   (1  0.02)3 12  20.081.13   349.35 1.4 A large-scale, fast prototyping system has been produced by using a very large array of field programmable logic arrays (FPGAs) (a) Discuss the pros (features) and cons (weaknesses) of such prototyping systems for proof of design concepts and verification in view of effort and speed performance of the design (b) How would you compare the hardware prototyping method with the computer simulation method? SOLUTION: (a) Pros: Rapid implementation It is easy for hardware testing Functionality and timing problem can be resolved in short time Hardware debugging can be done by reprogramming the chip Cons: FPGA chips operate at slower frequencies 1-8 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at FPGA chips are not dense, hence more chip area is required Due to predetermined and restricted routing, some FPGA configurable block may not be utilized This results in wasted chip area (b) Simulation systems may have bugs Simulation algorithms are slow and they may miss some important application specific issues FPGA implementation is a direct realization of the system Hence it is a working chip FPGA chip can be used as final product if the time to market is short 1.5 As the design complexity increases with increasing number of on-chip transistors, the on-chip noises have become more pronounced Discuss the impact of packaging in suppressing on-chip noises in view of the numbers and strategic placement of ground and power pads, and the numbers of ground and power planes SOLUTION: The rule of thumb practiced in industry is to use one VDD or VSS pad for every two or three adjacent signal pads The number of ground and power planes depends on the number of signal planes It is good to put one VDD at the top and one VSS at the bottom of two signal planes 1.6 The testing of VLSI chips at speed has become increasingly more difficult due to undesirable parasitic effects in a testing environment Also the cost of high-speed testing machines has become very high and, hence, in reality it is difficult for 1-9 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at smaller manufacturers to procure such equipment Discuss what problem the chip testing only at lower speed would cause for systems houses that take such chips to develop systems at speed What alternative ways can be used to ease the problem in the absence of at-speed testers? SOLUTION: Testing a chip at lower speed would determine the functional yield of a chip design, identifying shorts, opens, and leakage current as well as circuit and logic faults Parametric testing, however, cannot be performed Without this testing, there may be delay problems, unacceptable clock skew, etc A company that cannot afford high-speed testing machines could consider sending some of these chips to be tested elsewhere, developing delay models based on available data and relying more heavily on simulation for design validation in terms of speed, or intentionally designing chips more familiar the designers are with the manufacturing limits, the safer the chips they can design without being overly conservative 1.7 Draft plans for developing a chip as a function of design turnaround time and development cost In particular, what design style would be chosen when the customer requires that the chip be delivered in one month, six months, and one year, respectively? SOLUTION: Development time and cost would obviously depend on the complexity and the size of the design, but the cheapest and fastest chip design would generally be done using FPGA’s This would be an appropriate design style for producing a chip in a month If six months 1-10 Full file at Solution Manual for CMOS Digital Integrated Circuits Analysis and Design 4th Edition by Kang Full file at were available, a gate array or sea-of-gates style could be chosen Patterning of the metal layers could be done in a few days on a few weeks This is more expensive than FPGA, but will generally result in a smaller, faster chip For a chip that must be more expensive and time-consuming since a full custom mask set would be required, but the final product would be smaller and faster Standard cell design is also appropriate for large-volume applications 1-11 Full file at