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SYNTHESIS AND STUDY OF ZINC OXIDE
NANOSTRUCTURES AND FILMS.
WEE RUI QI
(B. Eng. (Hons.), NUS)
A THESIS SUBMITTED
FOR THE DEGREE OF MASTER OF
ENGINEERING
DEPARTMENT OF MATERIALS SCIENCE
NATIONAL UNIVERSITY OF SINGAPORE
2012
Acknowledgements
I would like take this opportunity to express my heartfelt gratitude to my
supervisor Prof. Gong Hao for his continuous encouragement and guidance. I
sincerely appreciate the time and effort he provided regardless of his busy schedule.
He taught me how to express my ideas clearly and how to construct frameworks to
solve challenging problems. I genuinely thank Dr. Yang Weifeng for his patience in
guiding me in my approach towards research work.
I would also like to thank my fellow group members which include Dr. Wang
Yu, Miss Sun Jian, Miss Tang Chunhua, and Mr Yin Xuesong for the fruitful
discussions, suggestions, and support over the past two years. I would like to thank
Dr. Chen Rui from Division of Physics and Applied Physics, School of Physical and
Mathematical Sciences, Nanyang Technological University (NTU) for his help in
photoluminescence measurements. I thank the technical staff of the Department of
Material Science and Engineering, National University of Singapore (NUS) for their
continuous technical support.
I would like to thank DuPont Apollo and Singapore EDB for their financial
support, and National University of Singapore (NUS) for giving me an opportunity to
pursue my interest in research as a graduate student. Lastly, I would like to give
special thanks to my loved ones for their unconditional understanding and support
during this period of time.
i
Tables of Contents
Acknowledgements …………………………………………………………............. i
Table of Contents ……………………………………………………………………ii
Summary …………………………………………………………………………....vi
List of Tables ……………………………….………………………………….......viii
List of Figures ……………………………………………………………………....ix
List of Publications ………………………………………………………………..xiv
Chapter 1: Introduction…………………………………………………..…………1
1.1 Background information ……………………………………………………….…1
1.1.1
Introduction
to
Nanostructured
ZnO
Properties
and
Applications ……………………………………………………..……1
1.1.2
Synthesis Methods for Nanostructured Materials and ZnO……..….…4
1.1.2.1 Solvothermal/Hydrothermal methods……………………....…5
1.1.2.2 Sol-Gel………………………………………………..…….….7
1.1.2.3 Microwave-Assisted Synthesis………………………….….…8
1.1.2.4 Nano-Lithography……………………………………..…..…10
1.1.2.5 Vapor-Phase Synthesis…………………………………….…12
1.1.2.6 Direct Oxidation by Air ………………………………….…..13
1.1.3
Challenges Identified ………………………………………………..14
1.2
Outline of Thesis……………………………………………………...……...16
1.3
References……………………………………………………………………17
Chapter 2: Synthesis and Characterization…………………………………...….25
ii
2.1 Fabrication of Samples…………………………………………………………..25
2.1.1 Sputtering of Zn and ZnO Thin Films…………………………...…….25
2.1.2 Heating in Furnace……………………………………………………..27
2.1.3 Hydrothermal Synthesis………………………………………………..28
2.1.3.1 Background of Hydrothermal Synthesis………………….….28
2.1.3.2 Experimental Setup….……………………………………….30
2.1.3.3 Chemistry Behind Hydrothermal Synthesis………………....30
2.2 Characterization Techniques………………………………………………..……34
2.2.1 Surface Profiler……………………………………………………...…34
2.2.2 X-ray Diffraction (XRD)…… ………………………………………...35
2.2.3 Scanning Electron Microscopy (SEM)… ……………………….…….37
2.2.4 Transmission Electron Microscopy (TEM) …………………………...38
2.2.5 Photoluminescence (PL)… ……………………………………………41
2.2.6 Vibrating Sample Magnetometer (VSM).. ……………………………42
2.3 References………………………………………………………………………..43
Chapter 3: Investigation on Origins of Black Zinc Oxide……………………….46
3.1 Introduction….……..……..……..……..……..……..……..……..……..……….46
3.2 Results and Discussion….……..……..……..……..……..……..……..….…..…47
3.2.1 Structural Features and Surface Morphology…………..…….....…..…48
3.2.2 Photoluminescence Properties ………..……..……..……..………...…55
3.2.3 Magnetic Properties……..……..……..……..……..……..……...…….59
3.3 Conclusions………..……..……..……..……..……..……..……..……..………..61
3.4 References……..……..……..……..……..……..……..……..……..……..……..62
iii
Chapter 4: Growth of ZnO Nanostructured Films by Zn films in NaCl
Solution……………………………………………………………………………...65
4.1 Introduction……………………………………………….……………………...65
4.2 Results and Discussion …….…………………….….…….…….……………....66
4.2.1
Surface Morphology and Structural Features……….……...………..67
4.2.2
Optical Properties………..….…….…….……….…….…….……….70
4.2.3
Investigation of ZnO Growth Mechanism……….….………….……73
4.3 Conclusions……….…….…….……….…….…….……….…….…….………...81
4.4 References…….…….…….…….…….…….…….…….…….…….…….……...82
Chapter 5: Chemical Synthesis Using Zinc and Metal Salts with Ammonia…...84
5.1 Introduction………………………………………………………………………84
5.2 Results and Discussion…………………………………………………………..85
5.2.1 Synthesis of ZnO and its Properties………………………...………….87
5.2.1.1 Synthesis of ZnO by Sputtering…………………………..….87
5.2.1.2 Synthesis of ZnO on Different Substrates…………………...88
5.2.1.3 Synthesis of ZnO on Bare Silicon Substrates for 4 to 24
hours……………………………………………………..…...92
5.2.2 Structural Properties and Composition of Ga Incorporated ZnO……...95
5.2.3 Influence of Ga on Morphology…………………………………….....98
5.2.4 Influence of Ga on Optical Properties………………………………..101
5.2.5 Influence of Ga on GZO Growth Mechanism………………………..102
5.3 Conclusions……………………………………………………………………..109
5.4 References……………….……….……….……….……….……….…………..111
iv
Chapter 6: Conclusions and Future Work…….……….……….………...……..114
6.1 Conclusions…….……….……….…………….…………….…………….……114
6.2 Future Work…….…………….…………………………………………..….....118
v
Summary
Zinc oxide (ZnO) is a promising candidate for many applications.
Nanostructured ZnO has been gaining a strong foothold as they vastly improve ZnO
properties. In this project, nanostructured ZnO and its related compounds are
synthesized with sputtering, furnace and hydrothermal methods. Characterization is
done with X-ray diffraction (XRD), scanning electron microscope (SEM),
transmission electron microscopy (TEM), photoluminescence (PL), and vibrating
sample magnetometer (VSM). The film thickness is done with surface profilometer.
This M. Eng work determines if black ZnO (pure ZnO) exists while
investigating properties of the resultant annealed zinc films. The findings disputed
this claim. TEM suggested a Zn/ZnO layered structure. The enhanced ultraviolet (UV)
emission in ZnO films is attributed to a low annealing temperature of 100 oC as its
structure is retained. Zn is able to enhance UV emissions for ZnO film annealed at
200 oC. Zn is also responsible for ferromagnetism in annealed ZnO films.
In addition, the synthesis of ZnO by a new method with aqueous sodium
chloride is succeeded. Films with network of circular pores to a film with nanowirelike network with bigger pores were obtained. The rise and subsequent decline in
green emission could be related to the morphology change over time since ZnO films
are obtained within 3 hours of heating. Further investigation demonstrates the
importance of nanostructured Zn films in oxidation by aqueous NaCl solution. The
model behind pitting corrosion is responsible for nanostructured ZnO films in this
study.
Finally, this work studied the effect of substrates, heating durations and Ga
addition on ZnO by hydrothermal methods. The substrates did not have much
vi
significant role in affecting morphologies or optical properties. The thickness of assynthesized powder grown on substrates can be tuned with heating durations from 4
to 24 hours. It is found that GZO is obtained when 10 and 20 at % of Ga was added in,
while ZnGa2O4 is obtained with 30 to 50 at % of Ga introduced. The amount of Ga
used for GZO is much larger than typical chemical methods as usually GZO can only
tolerate less than 10 at % Ga. Without any Ga introduction, rods with diameter 1-1.5
µm and length 10-12 µm were grown and arranged in a neat floral arrangement. With
10 at % Ga, hexagonal discs littered with vertically protruding spike-like rods were
formed. This is a unique morphology which has not yet been reported. PL spectra
showed that the visible emission centers shifted to shorter wavelengths from 2.11 to
2.57 eV with 0, 10 and 20 at % Ga in GZO, suggesting that the Ga dopants
contributed to the defects in ZnO. With ZnGa2O4, blue emissions emerged as well
though they were blue-shifted drastically to 2.66-2.73 eV.
In summary, these studies have sprouted interesting ideas towards
nanostructured ZnO, and provided room for further investigations. However, this will
be left to the other group members to explore these prospects.
vii
List of Tables
Table 2.1 Flow on the development of hydrothermal synthesis over time………......29
Table 3.1 Ratio of the height of the peak intensities of ZnO (101) and Zn (101) in Zn
film before annealing, ZnO films annealed at 100 oC for 15 h, 200 oC for 214 h, and
400 oC for 6 h………………………………………………………………………...50
Table 4.1 Tabulations for an estimation of moles of Zn present in Zn films………..78
Table 4.2 Tabulations of experimental results……………………………………….80
viii
List of Figures
Fig. 1.1 Stick and ball representation of ZnO crystal structures: (a) cubic rocksalt, (b)
cubic zinc blende, and (c) hexagonal wurtzite. The shaded gray and black spheres
denote Zn and O atoms, respectively……………………………………………..…...2
Fig. 1.2 (a) A schematic of a DSC based on the ZnO branched nanorod array, (b)
Photocurrent–voltage curves of the DSSCs based on the ZnO branched nanorod array,
its corresponding primary nanorod array, and the nanowire arrays, and (c)
Performance characteristics of the DSCs based on different nanostructures….…..….4
Fig. 1.3 SEM images of ZnO nanorods synthesized in Q. Yu et al with (a) no H3BO3,
and (b) 0.03 mol/L of H3BO3 concentration……………………………………..……6
Fig. 1.4 SEM images of (a) 15% fluorine-doped ZnO, (b) Zn0.9432Mn0.0568O
nanostructured thin films obtained from sol-gel method.. ……………………..……..8
Fig. 1.5 Illustration of comparison between conventional and microwave-assisted
heating. ………………………………………………………………………..……....9
Fig. 1.6 Two nanoimprint lithography schemes developed as (a) thermal imprinting
process, (b) UV imprinting process, and (c) soft imprinting process.. ……………...11
Fig. 1.7 SEM images of the patterned ZnO film, area with (a) array pattern, and (b)
line pattern, obtained by soft lithography….………………………………………...12
Fig. 1.8 SEM images of (a) cross-section of growth of nanowires on Si substrate in A.
K. Srivastava, (b) GZO nanorods with 1 wt% Ga on sapphire substrate, both obtained
by RF magnetron sputtering in Young et al…………………………………...…..…13
Fig. 1.9 SEM images of (a) ZnO nano-needles on ZnO/Zn/ZnO multilayer structure
annealed at 300-400 oC in S. Kumar et al, and (b) annealed dense ZnO film-like
nanobelts obtained under plasma power of 70 W in G. X. Li et al…………………..14
ix
Fig. 2.1 Schematic of physical sputtering process………………………………...…26
Fig. 2.2 Setup of the RF magnetron sputtering system used in the experiments….....27
Fig. 2.3 Experimental setup of furnace used in the experiments. ………………...…28
Fig. 2.4 Experimental setup of Teflon-liner and outer stainless steel casting used in
the experiments…..…………………………………………………………………..30
Fig. 2.5 Diagram showing pressure as a function of temperature for pure water, with
the filling factor (% degree of fill) of the autoclave. The critical temperature (Tcr =
374.1 °C) and pressure (ρ = 221.2 bar) are indicated….…………………………….31
Fig. 2.6 Viscosity of water as a function of density and temperature…………….….32
Fig. 2.7 Dielectric constant of water plotted against as a function of pressure and
temperature….……………………………………………………………………….33
Fig. 2.8 Diagram showing the percent of Zn(II) present in the labelled form at each
pH. Only species that were present at a ratio of greater than 10% in the pH range 2–
13.5 are displayed….………………………………………………………………...34
Fig. 2.9 Illustration of Bragg’s law………..………………………………………....36
Fig. 2.10 Schematic of the XRD measurement.……………………………………..37
Fig. 2.11 Schematic diagram of a working SEM………………………………….....38
Fig. 2.12 Schematic diagram of the central process by which images and diffraction
patterns are formed within the objective lens of the TEM…………………………..41
Fig. 2.13 Illustration of VSM……………………………………………………...…43
Fig. 3.1 XRD spectra of films under different conditions of (a) Zn film before
annealing, (b) ZnO films after annealed at 100 oC for 15 h, (c) 200 oC for 214 h, and
(d) 400 oC for 6 h…………………………………………………………………….50
x
Fig. 3.2 Morphology and visual appearances (insets) of ZnO films under different
conditions with (a) SEM of Zn film before annealing, (b) SEM of ZnO films after
annealed at 100 oC for 15 h, (c) 200 oC for 214 h, (d) 400 oC for 6 h, and (e) HR-TEM
of ZnO film annealed at 200 oC for 214 h……………………………………...……53
Fig. 3.3 Schematic diagram of mechanism to obtain Zn/ZnO layered film………....55
Fig. 3.4 PL spectra of films under different conditions of (a) Zn film before annealing,
ZnO films after annealed at 100 oC for 15 h, 200 oC for 214 h, and 400 oC for 6 h, and
(b) Inset: PL spectrum magnification of Zn film before annealing……………...….58
Fig. 3.5 Illustration of mechanism behind UV and green emissions in Zn/ZnO layered
film………………………………………………………………………….……..…59
Fig. 3.6 M-H curves by VSM at room temperature of films annealed under different
conditions of (a) Zn film before annealing, ZnO films after annealed at (b) 100 oC for
15 h, (c) 200 oC for 214 h, and (d) 400 oC for 6 h.. …………………………………61
Fig. 4.1 SEM of ZnO nanostructured films (a) before heating, after heating at 170 oC
for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h……………………………….……69
Fig. 4.2 XRD of ZnO nanostructured films (a) before heating, after heating at 170 oC
for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h……………………………….……70
Fig. 4.3 PL spectra of ZnO nanostructured films (a) before heating, after heating at
170 oC for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h.…………………………...72
Fig. 4.4 TEM of different parts of ZnO nanostructured films after heating at 170 oC
for 15 h in (a) one section, (b) SAED of the section, (c) a nanowire with HRTEM as
inset, and (d) branched section of a nanowire…………………………………...…..74
Fig. 4.5 An illustration of growth mechanism for nanostructured ZnO films……....77
xi
Fig. 4.6 XRD of powders on a Si wafer with pre-fixed Zn:NaCl ratio of (a) 1:1, (b)
10:1, (c) 1:10………………………………………………………………………..80
Fig. 5.1 (a) XRD pattern, (b) SEM image, (c) PL spectrum for ZnO-seeded glass
substrates heated for 4 hours, and (d) cross-sectional SEM image for ZnO-seeded
glass substrate heated for 24 hours…………………………………………………..88
Fig. 5.2 XRD patterns of ZnO growing on (a) ZnO-seeded glass, (b) glass, (c) silicon
substrates for 4 hours.……………………………………………………...…….…. 89
Fig. 5.3 SEM images of ZnO growing on (a) ZnO-seeded glass, (b) glass, (c) silicon
substrates for 4 hours.…………………………………………………………..…... 90
Fig. 5.4 PL spectra of ZnO grown on (a) ZnO-seed glass, (b) glass, (c) silicon
substrates for 4 hours.……………………………………………………………..... 91
Fig. 5.5 XRD patterns of ZnO grown on silicon substrates for (a) 4, (b) 8, (c) 12, and
(d) 24 hours.……………………………………………………………………..….. 92
Fig. 5.6 SEM of ZnO grown on silicon substrates for (a) 4, (b) 8, (c) 12, (d) 24 hours,
and (e) Plot of ZnO film thickness to heating duration.…………………………..... 94
Fig. 5.7 PL spectra of ZnO grown on silicon substrates for (a) 4, (b) 8, (c) 12, and (d)
24 hours.……………………………………………………………………………...95
Fig. 5.8 XRD patterns of as-synthesized GZO powder with (a) 0, (b) 10, (c) 20, (d) 30,
(e) 40, and (f) 50 at % of Ga:Zn ratio in the starting precursors. ………….……......96
Fig. 5.9 ICP of as-synthesized powder with (a) 10, (b) 20, (c) 30, (d) 40, and (e) 50 at %
of Ga:Zn in the starting precursors.………………………………….………………97
Fig. 5.10 SEM images of as-synthesized powder with (a) 0, (b) 10, (c) 20, (d) 30, (e)
40, and (f) 50 at % Ga at the start…………………………………………………..100
xii
Fig. 5.11 PL spectra of as-synthesized GZO powders with (a) 0, (b) 10, (c) 20, (d) 30,
(e) 40, and (f) 50 at % Ga at the start……………………………………………….102
Fig. 5.12 SEM mapping of (a) electron image, (b) Zn, (c) Ga, and (d) O at one section
of as-synthesized powder with 10 at % Ga at the start……………………………..104
Fig. 5.13 (a) TEM, (b) SAED of TEM, (c) HRTEM, and (d) SAED of HRTEM for
as-synthesized powder with 10 at % of Ga/Zn at the start………………………….106
Fig. 5.14 XRD patterns of as-synthesized powders with (a) 0, (b) 10, (c) 20 at % Ga,
and (d) Williamson-Hall Plot for as-synthesized GZO powder with 10 at % Ga/Zn at
the start.…………………………………………………………………………......107
xiii
List of Publications
1) R. Q. Wee, H. Gong, W. F. Yang, R. Chen, H. D. Sun, C. F. Wang, A.Y. S. Lee,
“Growth of Zinc Oxide Nanorods in Different Directions by a Simple Chemical
Method”, International Conference of Young Researchers on Advanced Materials
(ICYRAM) 2012, Singapore. Abstract is accepted as oral presentation.
2) R. Q. Wee, W. F. Yang, R. Chen, H. D. Sun, C. F. Wang, A. Y. S. Lee, and H.
Gong, “Development of ZnO Nanostructured Films via Sodium Chloride Solution
and Investigation of Its Growth Mechanism and Optical Properties”. Accepted in
Journal of the American Ceramic Society for publication.
3) R. Q. Wee, H. Gong, W. F. Yang, R. Chen, H. D. Sun, “On Black ZnO Films and
Light Emission Properties”. Submitted to Journal of Physics D for publication.
xiv
Chapter 1: Introduction
Wee Rui Qi
Chapter 1: Introduction
1.1 Background Information
1.1.1 Introduction to Nanostructured ZnO Properties and Applications
Zinc oxide (ZnO) has attracted tremendous attention having good electrical
properties. Transparent conducting oxides (TCOs),1 organic light-emitting diodes,2
gas sensors,3 field-emitters,4 photocatalysts,5 antireflection coatings,6 dye-sensitized
solar cells,7 ferromagnetic materials,8 and even pyroelectric generators9 are some
which made use of this property. Pure ZnO is an n-type semiconductor with a wide
band gap of 3.4 eV.10 Round nanorods, hexagonal rods, flower-like and coral-reef
like ZnO are found on substrates such as Si, cotton, nylon, FTO, and ITO.11-16
Most of the group-II-VI binary compound semiconductors crystallize in either
cubic zinc-blende or hexagonal wurtzite structure where each anion is surrounded by
four cations at the corners of a tetrahedron, and vice versa. This tetrahedral
coordination is typical of sp3 covalent bonding, but these materials also have a
substantial ionic character. ZnO is a II-VI compound semiconductor. Its ionicity
resides at the borderline between covalent and ionic semiconductor. Wurtzite, zinc
blende, and rocksalt are the crystal structures in ZnO, as schematically shown in Fig.
1.1. Wurtzite is the most common phase as it is thermodynamically stable phase at
ambient conditions. The zinc-blende ZnO structure can be stabilized only by growth
on cubic substrates, while the rocksalt (NaCl) structure are obtained at relatively high
pressures.17,18
1
Chapter 1: Introduction
Wee Rui Qi
Fig. 1.1 Stick and ball representation of ZnO crystal structures: (a) cubic rocksalt, (b)
cubic zinc blende, and (c) hexagonal wurtzite. The shaded gray and black spheres
denote Zn and O atoms, respectively.17
The optical properties in ZnO constitute one of the basic properties often
examined in ZnO as light emissions in the ultraviolet (UV) and green light regions
are commonly observed. It is reported by Jin et al. that those defect-related
luminescences are caused by radiative transitions between shallow donors (related to
oxygen vacancies) and deep acceptors (Zn vacancies).19 The acceptor level (Zn
vacancy) is located 2.5 eV below the conduction band edge, while the donor level is
known as shallow as 0.05–0.19 eV. For UV light emission, it is due to recombination
of electrons and holes. Red, orange, yellow blue emissions are also reported though
these are less common.20,21 Metal capping of ZnO noble metals or infusion of metal
nanoparticles into ZnO -based structures is one way to control optical properties.
Elements currently under study include Ag, Au, Al and Pt 22-24.
With much development in nanostructured ZnO, there is no doubt that it will
bring forth exciting improvements with the incorporation of ZnO nanostructures in
devices. However, even different morphology can influence its potential in improving
device performance differently. In M. Raula et al, Friedel-Crafts acylation reaction of
anthracene with benzoyl chloride, a typical test for photocatalytic activity, is carried
2
Chapter 1: Introduction
Wee Rui Qi
out. It is found that the yields of flower-like ZnO nanostructures were higher than
their spherical nano-counterparts, showing greater potential as catalysts.5 In Y. X.
Wang et al, ZnO nanoflowers showed an improved ability on the photocatalytic
degradation of 4-cholrophenol (4-CP) in aqueous solution under UV radiation than
that of ZnO nanorods. From Fig. 1.2, the 4-CP in aqueous solutions can be almost
completely eliminated by ZnO nanoflowers while ZnO nanorods show ~80%
degradation of 4-CP after illuminated by UV light for 120 min.25 In Y. Zhang et al,
brush-like hierarchical ZnO nanostructures showed greater response to ethanol
compared with ZnO nanowires. This could be due to the enhanced oxygen vacancy
defects observed from PL.26 In C. X. Wang et al, ZnO nanoflower films have better
dye loading than ZnO nanorod films. This translated in an overall conversion
efficiency of 1.37 % for the dye-sensitized solar cell (DSSC) with ZnO nanoflowers,
making it higher than DSSC with nanorods.7 In X. M. Fang et al, branched ZnO
architecture with nanorods in a 3D array overrode its nanowire and nanorod
counterparts in conversion efficiency in DSSC. The reason behind was the increased
surface area in branched 3D array which increased dye absorption.27
3
Chapter 1: Introduction
Wee Rui Qi
Fig. 1.2 (a) A schematic of a DSSC based on the ZnO branched nanorod array, (b)
Photocurrent–voltage curves of the DSSCs based on the ZnO branched nanorod array,
its corresponding primary nanorod array, and the nanowire arrays, and (c)
Performance characteristics of the DSCs based on different nanostructures.27
1.1.2
Synthesis Methods for Nanostructured Materials and ZnO
As seen from Section 1.1.3, there is no fixed preference on morphology
required for improved device performance. Experiments have to be fine-tuned with
different nanostructures in order to gauge its comparison. There is therefore a need to
have a precise control over the synthesis of ZnO nanostructures before progressing to
research on device performance. Chemical synthesis of nano-materials may be
conducted in solid, liquid, or gaseous state. This section highlights some of the
common synthesis methods for nanostructures and ZnO.
4
Chapter 1: Introduction
Wee Rui Qi
1.1.2.1 Solvothermal/Hydrothermal methods
In solvothermal techniques, the reaction mixture is heated above the boiling
point of the solvent in an autoclave or other closed system and the sample is exposed
to steam at high pressures. The reactions may be carried out in water or in any other
solvent (e.g. methanol, ethanol, polyol). When water is used as a solvent, the process
is described as hydrothermal. Compared with synthesis routes at atmospheric pressure,
the increased reaction temperature in the solvothermal technique may lead to an
accelerated crystal growth accompanied by a narrow particle size distribution and
better crystallinity.28
Typically, an aqueous solution of Zn salts such as zinc nitrate hexahydrate
Zn(NO3)2·6H2O, zinc sulfate heptahydrate ZnSO4·7H2O and zinc acetate dehydrate
(Zn(CHCOO)2·2H2O mixed with ammonia or ammonia precursors is mixed before
introducing into the Teflon-lined container. Heating is usually carried out at low
temperatures below 110 oC, where 30 oC is known to produce ZnO in Zhao et al.29,30
The ammonia provides a steady source of hydroxide ions to form zinc hydroxide,
which later undergoes a condensation reaction to form ZnO.5,31 Therefore, the molar
ratio of Zn salts and hydroxide ions present is usually closely monitored as it is well
known for hydroxide ions in shape alteration of ZnO.5,30,32,33 Hydroxide sources
include ammonia, NaOH and hexamethylenetetramine C6H12N4 (HMT). Parameters
such as cooling rate, heating temperatures and durations are also known to affect
synthesis though they are less studied.30,34
In some cases, surfactants are also introduced. The externally added surfactants or
capping agents were adsorbed preferentially on some crystal planes of the growing
particles that ultimately alter the growth kinetics and the relative stability of the
5
Chapter 1: Introduction
Wee Rui Qi
crystal faces and hence either promote or inhibit crystal growth in some particular
crystal planes, resulting in the formation of anisotropic ZnO nanostructures. In M.
Raula et al, the introduction of sodium ascorbate resulted in flower-like ZnO.5 Further
experiments by changing the concentration of precursors and the shape-directing
agent showed that intermediate morphologies include spherical/quasi-spherical and
spindle shaped nanostructures. Ethylene diaminetetra acetic acid (EDTA) and
cetyltrimethylammonium bromide (CTAB) are other surfactants known to be added
in.7,31,33
Though addition of metal salts can alter shape configurations too, these metal
salts are better known in altering ZnO properties so that the modified properties can
better fulfill the requirements of the applications. Antimony chloride (SbCl3), silver
nitrate Ag(NO3), aluminum chloride hexahydrate (AlCl3·6H2O), cobalt nitrate
(Co(NO3)2·6H2O), boric acid (H3BO3), manganese acetate, and indium chloride
(InCl3) were some of the dopant salts found in hydrothermal synthesis of dopedZnO.35-40 The influence of H3BO3 on ZnO morphology is given in Fig. 1.3.38
Fig. 1.3 SEM images of ZnO nanorods synthesized in Q. Yu et al with (a) no
H3BO3, and (b) 0.03 mol/L of H3BO3 concentration.38
6
Chapter 1: Introduction
Wee Rui Qi
The growth of nanostructured ZnO films requires an additional step; that is, to
grow firmly on the substrate. However, to grow such nanostructured films, the
substrates are usually first coated with a thin layer of ZnO before the nanostructured
ZnO growth can proceed.29,30,32,41 Known as the seeding layer, it is said that this ZnOseeded layer allows the nucleation step to be bypassed. Growth can take place
immediately since the interfacial energy between the crystal nuclei and the substrate
is effectively lowered. It is also reported that types of substrates can affect ZnO
morphology though the number of studies done are very sparse.15
1.1.2.2 Sol-Gel
Sol–gel processes are another wet chemical synthesis commonly used for
nanostructures such as powders, films, fibers, and monoliths.28 Typical sol–gel
process involves hydrolysis and condensation of metal alkoxides and metal salts such
as chlorides, nitrates and acetates.
In metal alkoxides M(OR)x, the synthesis involves the reaction of metal
species (a metal, metal hydroxide, metal oxide, or metal halide) with an alcohol.
Metal alkoxides are good precursors because they readily undergo hydrolysis that
replaces an alkoxide with a hydroxide group from water and a free alcohol is formed.
Hydrolysis occurred when heated over time, allowing the sol to progress further in its
reaction. Condensation (polymerization) occurred, leading to gel formation. The two
hydrolyzed fragments then join together during condensation to release either an
alcohol or water.
In nanostructured ZnO, zinc acetate dehydrate Zn(CH3COO)2.H2O is usually
dissolved in an alcohol along with a stabilizer, monoethanolamine (C2H7NO, MEA)
7
Chapter 1: Introduction
Wee Rui Qi
Alcohols include 2-methoxethanol (C3H8O2) and isopropanol. To get doped ZnO,
dopant salts are also introduced. Examples include antimony chloride (SbCl3),
ammonium fluoride (FNH4), aluminum chloride hexahydrate (AlCl3.6H2O), copper
acetate (Cu(CH3COO)2), manganese acetate dihydrate and (Mn(CH3COO)2.2H2O.
The influence of FNH4 on ZnO morphology is given in Fig. 1.4. The mixture is then
heated to yield a clear and homogeneous solution before cooling to room
temperatures. The solution is usually spin coated multiple times before annealing to
obtain a film. Nanorods, nanofibers, nanoparticulate films have been obtained by solgel.42-48
Fig. 1.4 SEM images of (a) 15% fluorine-doped ZnO, (b) Zn0.9432Mn0.0568O
nanostructured thin films obtained from sol-gel method.43,46
1.1.2.3 Microwave-Assisted Synthesis
Compared with the conventional heating, microwave heating can heat up the
reaction system rapidly due to its unique characteristics, resulting in high reaction rate,
short reaction time, enhanced reaction selectivity, energy saving, and is
environmentally friendly as there are no byproducts of combustion.14 It is usually
used in conjunction with other synthesis methods.28
Fig. 1.5 gives the comparison between conventional and microwave-assisted
heating. It is observed that a uniform heating is achieved with microwave. The
8
Chapter 1: Introduction
Wee Rui Qi
microwave electromagnetic fields can greatly enhance the reaction/diffusion, which
increase the crystal growth rate during processing of various materials. This reduced
synthesis time and cut costs.49 In addition, the very high temperatures and pressures
of collapsing gas bubbles led to thermal dissociation of water vapor into ·OH and ·H
radicals, allowing for quicker reactions.50
Fig. 1.5 Illustration of comparison between conventional and microwave-assisted
heating.49
In nanostructured ZnO, microwave-assisted synthesis is usually used as a
complement for other steps during fabrication.51-54 In K. D. Bhatte et al, formation of
nanocrystalline ZnO was carried out using microwave irradiation and by using 1,3propanediol as a solvent and zinc acetate as a precursor The mixture is transferred
into a Teflon-liner tube and kept in a microwave oven for heating.51 In J. F. Huang et
al, Zn(NO3)2·6H2O and NaOH are placed in Teflon-liner before keeping in
temperature cum pressure-controlled microwave hydrothermal system. Nanorods and
nanowires were obtained.52
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1.1.2.4 Nano-Lithography
Template-assisted fabrications are also used for nanostructured films. A
solution is then deposited on the template and formed the desired nanostructures. In
electron beam (e-beam) lithography, a beam of electrons is emitted in a patterned
fashion across a surface covered with a film (called the resist).55 Pattern transfer to
underlying substrates usually occurred by reactive-ion etching (RIE). The advantage
of e-beam lithography is that the wavelength of a 100 keV electron at 4 pm is much
smaller than the wavelength of photons at 193-436 nm used in conventional
lithography. This allows creation of nanostructures as dimensions of features cannot
be smaller due to diffraction limit of light.
Nanoimprint lithography is an upcoming method of fabricating nanometer
scale patterns.56 It is simpler and faster than electron beam lithography while
achieving nano-sized features. Patterns are created by mechanical deformation of
imprint resist rather than electron beam. Three schemes are illustrated in Fig. 1.6. The
differences lie in the steps before the mold is separate from the substrate after
patterning, and before etching occurs for pattern to be transferred onto underlying
substrate. Thermal imprinting makes use of a high viscosity spin-coated layer is
applied on substrate before the patterned template comes in contact.57 The
temperature of the spin-on material is raised above its Tg while applying a high
pressure to the stack of the mold and substrate to conform them. In UVnanoimprinting, a low-viscosity UV-curable material is used. Discrete drops of lowviscosity UV-curable material are first dispensed between the mask and the substrate
to induce the filling of the mask features. UV curing is then carried out to solidify the
resist. In soft-lithography, the mold is generally made with a very flexible material
10
Chapter 1: Introduction
Wee Rui Qi
such as polydimethylsiloxane or PDMS.58 This enables patterning with the use of
flexible low-cost molds instead of rigid molds such as silicon or fused silica used in
imprint lithography. “Ink” is applied on the raised features of mold where its pattern
was transferred on the resist upon stamping.
Fig. 1.6 Two nanoimprint lithography schemes developed as (a) thermal imprinting
process, (b) UV imprinting process, and (c) soft imprinting process.56
Nanostructured ZnO has been obtained by the as-mentioned types of
lithography.59-64 Fig. 1.7 gives patterned ZnO film obtained by soft lithography. The
patterned resist was obtained before depositing ZnO solution by spin-coatng, sol-gel
or precipitation. In Y. Leprince-Wang et al. and J. K. Hwang et al where both soft and
UV lithography are involved, PDMS stamp is first used before curing and subsequent
deposition of ZnO solution.63,64 Nanowire-arrays, nano-pillar and nano-ribs were
some unique patterns obtained with help of lithography.
11
Chapter 1: Introduction
Wee Rui Qi
Fig. 1.7 SEM images of the patterned ZnO film, area with (a) array pattern, and (b)
line pattern, obtained by soft lithography.62
1.1.2.5 Vapor-Phase Synthesis
Atoms or molecules are deposited onto surfaces to form coatings or thin films
ranging in thickness from one atomic layer (~0.3 nm) to hundreds of micrometers.
Vapor deposition can be categorized into either physical (PVD) or chemical (CVD).
The main differences lie in the method used for deposition. In PVD, the coating
method involves purely physical processes such as high temperature vacuum
evaporation with subsequent condensation, or plasma sputter bombardment. PVD
includes electron beam evaporation, pulsed laser deposition and sputtering.65-68
However in CVD, a chemical reaction at the surface is involved.
Zn, ZnO or zinc sulphide (ZnS) powder was usually introduced as source
material in tube furnace in CVD. ZnO films are obtained at 500-1100 oC usually
either in N2 or argon gas flow. O2 gas is sometimes added too.69-73 ZnO
nanostructures can also be obtained without the use of high temperature. Though
sputtering is more commonly known for thin film deposition, nanostructures have
been obtained.74-78 In A. K. Srivastava, nanorods and nanowires were obtained from
sputtering ZnO target on Si substrates.77 In Young et al, vertically arrayed Ga-doped
ZnO nanorods were grown on sapphire substrate during RF magnetron sputtering by
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Chapter 1: Introduction
Wee Rui Qi
ZnO targets pre-mixed with Ga (Fig. 1.8).78 Ga dopants promoted nanorod growth by
inducing island growth in the initial stage.
Fig. 1.8 SEM images of (a) cross-section of growth of nanowires on Si substrate in A.
K. Srivastava, (b) GZO nanorods with 1 wt% Ga on sapphire substrate, both obtained
by RF magnetron sputtering in Young et al.77,78
1.1.2.6 Direct Oxidation by Air
It is possible ZnO nanostructures to form through annealing in air.79-81 In S.
Kumar et al, annealing of ZnO/Zn/ZnO multilayer structure at 300-400 oC after
sputtering led to the formation of ZnO nano-needles on the surface.79 The ultra-thin
Zn layer was found to be the self-catalytic agent to nucleate the growth of the ZnO
nano-needles. This is reasonable as nanowires and nanobelts were observed after
oxidation of sputtered zinc films at 350 oC obtained with target RF powers of 50–100
W in G. X. Li et al (Fig. 1.9).80 In Parkansky et al, ZnO nanorods are obtained after
annealing of ZnO films at 300 oC.81
13
Chapter 1: Introduction
Wee Rui Qi
Fig. 1.9 SEM images of (a) ZnO nano-needles on ZnO/Zn/ZnO multilayer structure
annealed at 300-400 oC in S. Kumar et al, and (b) annealed dense ZnO film-like
nanobelts obtained under plasma power of 70 W in G. X. Li et al.79,80
1.1.3
Challenges Identified
With the importance of ZnO and nanostructures, there is a continued interest
to study ZnO and address existing disputes regarding it. Some challenges pertaining
ZnO which further understanding is sought after, and work has been carried out in
Chapters 3, 4, and 5. In Tian et al, ZnO films with pyramids with extremely sharp tips
on its surface, are being suspected to be the cause behind black appearance.82 The
fabrication however, was done purely on a zinc block. It is difficult to distinguish
whether the remnant zinc after hydrothermal treatment or the ZnO pyramids
morphology, is accountable to the appearance of black color. As black coatings are
said to be most effective in suppressing reflections from the transparent conducting
oxide (TCO), it is important to analyse its origin.83-85 This controversy surrounding
the origins of black ZnO triggered an interest to study in detail here. Chapter 3 seeks
to have a clearer understanding behind origins of black ZnO by depositing Zn films
on clear glass substrate instead, before oxidized gradually into ZnO.
Using molten salts with Zn has been one of the methods to obtain ZnO. It is
peculiar that there is no known report on having aqueous sodium chloride (NaCl) to
14
Chapter 1: Introduction
Wee Rui Qi
obtain ZnO even though aqueous solutions are widely known in synthesis of ZnO.86-90
For instance, A.N. Baranov et.al. reported the synthesis of ZnO nanorods by adjusting
the ratio of zinc precursor to sodium chloride powder of 1:10 prepared by freezedrying followed by ball milling before heating up to 800 oC.86
It is well known that zinc undergoes corrosion in the presence of humidity or
seawater. Thus, it may be possible that sodium chloride can play a role in the
formation of ZnO. It is hypothesized that controlled etching by solution method can
be achieved to obtain ZnO nanostructures. Chapter 4 reports the successful synthesis
of ZnO with aqueous sodium chloride as well as the manipulation of nanostructures
with heating durations.
In hydrothermal synthesis, an aqueous solution of Zn salts is usually mixed
with ammonia or ammonia precursors, is used as discussed earlier. The ammonia
provides a steady source of hydroxide ions to form zinc hydroxide, which later
undergoes a condensation reaction to form ZnO. However, to grow specifically
nanostructured films, the substrates are usually first coated with a thin layer of ZnO
before the nanostructured ZnO growth is carried out. It is reported that the types of
substrates can affect ZnO morphology though the number of studies done are very
sparse.15 Moreover, there is no systematic study whereby different substrates
underwent the same set of synthesis conditions.
In addition, gallium is of interest due to its ease of Ga3+ ions as a substitution
for Zn2+ ions without much lattice distortion. It is often used to improve electrical
properties. Few reports existed in obtaining GZO via hydrothermal methods.91,92 As
ammonia is commonly used to form a complex with Zn precursors for ZnO synthesis,
it is proposed that GZO can be obtained by this method even with large amount of Ga.
15
Chapter 1: Introduction
Wee Rui Qi
It is hoped that interesting morphologies and properties will be obtained as well. The
first section in Chapter 5 examines the effect of substrates and heating durations on
ZnO synthesis while the second section investigates the influence of Ga on ZnO
morphology and properties.
1.2 Outline of Thesis
The thesis comprises of six chapters whereby Chapters 3 to 5 constituted of
studies done. In these chapters, detailed background information is given to allow
readers a comprehensive insight on the existing works done.
Chapter 1 provides the background information on ZnO, and the importance
of nanostructures and nanostructured ZnO which has been discussed in this chapter.
Chapter 2 contains mainly details of synthesis methods for our studies as well as the
characterization techniques. Chapter 3 seeks to have a clearer understanding behind
origins of black ZnO by depositing Zn films on clear glass substrate instead, before
oxidized gradually into ZnO. Chapter 4 reports the successful synthesis of ZnO with
aqueous sodium chloride as well as the manipulation of nanostructures with heating
durations. The first section in Chapter 5 examines the effect of substrates and heating
durations on ZnO synthesis while the second section investigates the influence of Ga
on ZnO morphology and properties. To sum up the works done, Chapter 6 gave a
summary of the works done and also suggested some future works related to ZnO.
16
Chapter 1: Introduction
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Chapter 2: Synthesis and Characterization
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Chapter 2: Synthesis and Characterization
2.1 Fabrication of Samples
2.1.1 Sputtering of Zn and ZnO Thin Films
A brief introduction to sputtering will be given here as sputtering was used to
produce a thin layer of zinc (Zn) used in Chapters Three and Four, and zinc oxide
(ZnO) used in Chapter Five. Physical vapor deposition (PVD) is a general term used
to describe any of a variety of methods to deposit thin solid films by the condensation
of a vaporized form of the solid material onto various surfaces. PVD involved
physical ejection of atoms or molecules, followed by condensation onto a substrate.
Nucleation of these atoms occurred on substrate which resulted in sample growth.
This process is known as reactive deposition as the vapor-phase material consists of
ions or plasma and is often chemically reacted with gases introduced into the vapor
during growth.1-4
Sputtering is a well-known technique to deposit thin films on substrates. It
falls under PVD category along with electron beam evaporation, thermal evaporation
and pulsed laser deposition (PLD). The technique is based on physical ion
bombardment of a source material, also known as the target. The incident energetic
particles resulted from plasma, which was produced when a huge voltage passes
through gas molecules. During ion bombardment, collisions between the incident
energetic particles, and/or resultant recoil atoms, with surface atoms caused the atoms
to be ejected from the solid target. This is illustrated in Fig. 2.1. It condensed on the
substrate where film growth then occurred. Sputter yield γ is defined as the ratio
between the number of sputter-ejected atoms and the number of incident projectiles,
25
Chapter 2: Synthesis and Characterization
Wee Rui Qi
and is determined by the energy and mass of the ions at the target. However, the
sputtering rate of the target depended on the total power.
Magnetron source is one common approach for growing thin films by sputter
deposition where positive ions present in the plasma of a magnetically enhanced glow
discharge will bombard the target. The target can be powered in different ways,
ranging from direct current (DC) for conductive targets to radio frequency (RF) for
non-conductive targets. Since sputtering is a purely physical process, a reactive gas is
added to the plasma in order to change the chemistry of the sample growth.
Fig. 2.1 Schematic of physical sputtering process.2
Theoretically, a cathode and an anode are positioned opposed to each other in
a vacuum chamber. The vacuum chamber is typically pumped by a combination of
turbomolecular and rotary pumps, although a diffusion pump is still often used. After
pumping to a base pressure of the order of 1×10−4 Pa (~7.5 ×10−7 Torr) or lower, a
noble gas (usually argon) is introduced into the vacuum chamber. A working pressure
between 1 and 10 Pa (~7.5 ×10−3 – 7.5 ×10−2 Torr) is reached. When a high voltage
difference in the range of 2000 V is applied between cathode and anode, a glow
discharge is ignited. Material deposition then began.4
In the magnetron sputtering system used in these experiments, radio frequency
(RF) is used as source of power as non-conductive target is implored. Fig. 2.2 shows
26
Chapter 2: Synthesis and Characterization
Wee Rui Qi
the experimental setup of RF sputtering system used for the experiments. Prior to
sputtering, the substrates are first washed with deionized (DI) water, ethanol, acetone,
and with DI water as the last step. The system is however, pumped to ~ 4 x 10-5 Torr
or above before sputtering started. This was slightly lower than the theoretical
pressure mentioned earlier. The power and time for sputtering are varied to control
the morphology and properties of the sputtered films. Typically, 60 W was usually
used in experiments. The temperature during sputtering was kept at room temperature.
Air is introduced into vacuum chamber before replacing or removing substrates.
Fig. 2.2 Setup of the RF magnetron sputtering system used in the experiments.
2.1.2 Heating in Furnace
The annealing of Zn films in Chapter Three and the hydrothermal processes
discussed in Chapters Four and Five, both occurred in a furnace. The model DZF6030A from Yiheng Technical Co. Ltd is implored. The samples are removed with
the help of gloves, and cooled to room temperature in fume-hood. The furnace is
temperature-controlled in ambient air. Fig. 2.3 gives an experimental setup of the
furnace used.
27
Chapter 2: Synthesis and Characterization
Wee Rui Qi
Fig. 2.3 Experimental setup of furnace used in the experiments.
2.1.3 Hydrothermal Synthesis
2.1.3.1 Background of Hydrothermal Synthesis
Hydrothermal synthesis is a usual technique used for nanostructured ZnO.
This technique is used extensively in Chapter Four and Five where the bulk of
experiments are carried out with this. Model 4744 General Purpose Acid Digestion
Vessel with Teflon-lined insert from Parr Instrument Company with capacity of 45
mL is used.
Sir Roderick Murchison, a British Geologist, was the first to use the term
hydrothermal in the mid-19th century.5 The main objective was to create or simulate
the natural conditions existing in the earth’s crust in the laboratory. This early interest
in hydrothermal research stemmed from the quest in obtaining the synthesis of a
particular mineral or in concocting compounds similar to natural minerals. In 1839,
the German chemist Robert Wilhelm Bunsen contained aqueous solutions in thickwalled glass tubes at temperatures above 200 ◦C and at pressures above 100 bars. The
crystals of barium carbonate and strontium carbonate that he formed under these
conditions marked the first use of hydrothermal aqueous or other solvents as a
28
Chapter 2: Synthesis and Characterization
Wee Rui Qi
reaction media.6 However, the first publication on hydrothermal synthesis only
appeared in 1845. This was a report outlining the successful synthesis of tiny quartz
crystals upon transformation of freshly precipitated silicic acid in Papin’s digestor by
Schafthaul. Since then, there had been tremendous development on hydrothermal
technology. The materials of interest have also progressed beyond minerals. Table 2.1
gives a flow on development of hydrothermal synthesis over time.5
Table 2.1 Flow on the development of hydrothermal synthesis over time.5
29
Chapter 2: Synthesis and Characterization
Wee Rui Qi
2.1.3.2 Experimental Setup
Since hydrothermal synthesis required high temperature and pressure under
prolonged duration, the use of autoclaves is usually required. In modern laboratories,
autoclaves with Teflon inserts are used for temperatures below 200 °C and 200 bar as
seen in Fig. 2.4. The autoclave material must be inert with respect to the solvent. To
prevent corrosion of the internal cavity of the autoclave, protective inserts are
generally used. Teflon makes an ideal container under these conditions since, in
contrast to glass and quartz, it is inert to both hydrofluoric acid and alkaline media.
However, above 200 °C the creep behavior becomes a problem. For synthesizing
under more extreme conditions of up to 1100 °C and 3 kbar, commercial equipment is
available with the name TZM-Apparatus.5
Fig. 2.4 Experimental setup of Teflon-liner and outer stainless steel casting used in
the experiments.
2.1.3.3 Chemistry Behind Hydrothermal Synthesis
Water is an environmentally safe material and cheaper than other solvents,
and it can act as a catalyst for transformation of desired materials by tuning
temperature and pressure. Since water is the solvent for most reactions, it is
30
Chapter 2: Synthesis and Characterization
Wee Rui Qi
imperative to understand its phase-temperature diagram to provide a conducive but
yet safe environment. Safety is of paramount importance as the pressure will rise very
steeply above 100 °C when fill volumes are in the 80-90 % range. Fig. 2.5 gives the
phase-temperature (PT) diagram of water.7
Fig. 2.5 Diagram showing pressure as a function of temperature for pure water, with
the filling factor (% degree of fill) of the autoclave. The critical temperature (Tcr =
374.1 °C) and pressure (ρ = 221.2 bar) are indicated.5
To understand why hydrothermal synthesis is well favoured, the chemistry
behind reactions in hydrothermal synthesis is looked into. Diffusion is important in
chemical reactions.8 Arrhenius equation in Equation 2.1 gives the dependence of the
rate constant k of chemical reactions with temperature.
𝑘 = 𝐴𝑒
−𝐸𝑎�
𝑅𝑇
(2.1)
31
Chapter 2: Synthesis and Characterization
Wee Rui Qi
This means that the large the reaction barrier height, the larger the temperature
effect on the reaction. A reaction pathway which was previously not available in
ambient water due to a high barrier can now be made accessible thermally in
supercritical water. At very high PT conditions (1000 oC and 100 kbar), water is
completely dissociated into H3O+ and OH-, behaving like molten salt. The viscosity of
solvent is inversely proportionate to diffusion and hence, the rate constant k. When
density ρ is larger than 0.8 g/cm3 in Fig. 2.6, a drastic decrease is observed whereby
viscosity is correlated with rising temperatures.
Fig. 2.6 Viscosity of water as a function of density and temperature.8
Meanwhile, the solubility of solute in solvent is also affected under
hydrothermal conditions.8 The relative dielectric of solvent and solute can be
32
Chapter 2: Synthesis and Characterization
Wee Rui Qi
interpreted as a measure of its polarity. The dielectric constant of water at ambient
conditions in room temperature is ~80.1. With a temperature increase, there is a
reduction in dielectric constant of water under hydrothermal conditions seen in Fig.
2.7. Therefore, the solubility of non-polar species increases whereas solubility of
ionic and polar species decreases.
Fig. 2.7 Dielectric constant of water plotted against as a function of pressure and
temperature.8
Particularly for ZnO, the presence of NH4+ ions in the solution produced a
marked increase in the rate of growth in the prismatic faces.9 Much investigation has
been done on chemistry behind effect by NH4+ concentration. In M. N. R. Ashfold et
al.,
the chemistry behind
hydrothermal
synthesis
was
examined.10 With
hexamethylenetetramine (HMT) zinc nitrate Zn(NO)3, the continual decomposition of
HMT ensured a continuous supply of ammonium ions NH4+ and formaldehyde CH2O
in the reaction solution over time as seen in Equation 2.2. As pKa was interpreted as
4.01, a high concentration of Zn ions (Zn2+) existed as seen in Fig. 2.8. Precipitation
33
Chapter 2: Synthesis and Characterization
Wee Rui Qi
of ZnO ensued from the aqueous solution with hydroxide (OH-) ions from either
Equations 2.3 or 2.4. With thermodynamic calculations, zinc hydroxide (Zn(OH)2)
will precipitate out first as it is less stable. However, the rise in OH- ions produced by
Equation 2.2 leads to an increase in pH of solution. Combined with a decrease of Zn2+
ion concentration by Equation (4), Zn(OH)2 becomes thermodynamically unstable
and will dissolve to form ZnO subsequently.10
C6H12N4 + 10H2O ⇌ 6CH2O + 4NH4+ + 4OH−
(2.2)
Zn2+ + 2OH− ⇌ Zn(OH)2 ⇌ ZnO + H2O
(2.4)
Zn2+ + 2OH− ⇌ ZnO + H2O
(2.3)
Fig. 2.8 Diagram showing the percent of Zn(II) present in the labelled form at each
pH. Only species that were present at a ratio of greater than 10% in the pH range 2–
13.5 are displayed.10
2.2 Characterization Techniques
2.2.1 Surface Profiler
The surface profilometer is from Tencor with model Alpha-Step 500. The
Alpha-Step 500 is equipped with a standard stylus of 12.5 micron radius. Only
34
Chapter 2: Synthesis and Characterization
Wee Rui Qi
sputtered films are measured here. The profilometer is a non-destructive step
instrument. It is typically used to measure the film thickness whereby a diamond
tipped stylus is utilized to measure the depth of the thin films, ranging from
micrometer to nanometer scale. During measurement, the tipped stylus is in direct
contact and scanned across the surface for a specified distance and contact force. The
profilometer can measure small surface variations in the vertical stylus displacement
as a function of position. The height position or information from the sample surface
is picked up by the diamond stylus to generate an analog signal. This signal is then
converted into a digital signal for analysis and display. The resolution of the
measurement is dependent on the radius of the stylus and the geometries of the
features.
2.2.2 X-ray Diffraction (XRD)
X-ray diffraction (XRD) spectra are obtained with BRUKER AXS (model D8
ADVANCE, CuKα1 where λ=0.154056 nm). For powdered samples, a layer of
powders are deposited onto clean substrates. For non-powder samples, measurement
is carried out directly. The samples are scanned from diffraction angle 2θ of 30 ° to
90 ° in Chapter 3 while a range of 25 ° to 90 ° is used for Chapters 4 and 5. The scan
step used is 0.02 ° for all experiments. For the detailed study of XRD done in Chapter
5, the scan step used is 0.0025 o. The scan data is acquired from BRUKER AXS
software XRD commander and analyzed by Eva. The qualitative identification is
achieved by comparing the X-ray diffraction patterns obtained from the thin film
samples with an internationally recognized database JCPDS (International Centre for
Diffraction Data).11,12
35
Chapter 2: Synthesis and Characterization
Wee Rui Qi
X-ray crystallography is a method of determining the arrangement of atoms
within a crystal. During an X-ray diffraction measurement, a crystal is mounted on a
goniometer and gradually rotated while being bombarded with X-rays continuously.
When a beam of X-rays strikes a crystal in the sample, it causes the beam of light to
spread into many specific directions. A diffraction pattern of regularly spaced spots
known as reflections are produced. These diffraction peaks are given as a function of
diffraction angle 2θ.
The diffraction peaks are a result of constructive interference of waves
scattered from the atoms or ions composing a crystal. As x rays diffract from the
periodic arrangement of atoms in a crystal, Bragg’s law in Equation 2.5 and Fig. 2.9
can be used to describe the diffraction, where n is an integer, λ is the wavelength of
incident wave, d is the spacing between the planes in the atomic lattice, and θ is the
angle between the incident ray and the scattering planes.
λ = 2dhkl sin θ
(2.5)
Fig. 2.9 Illustration of Bragg’s law.12
During measurement, the x-ray source (i.e., the x-ray tube target), the
specimen, and the receiving slit are kept on a common circle, called the focusing
circle. The sample is usually rotated to ensure a systematic measurement. The sample
36
Chapter 2: Synthesis and Characterization
Wee Rui Qi
is moved through an angle of θ while the detector is scanned through an angle of 2θ.
This θ-2θ motion implies that the radius of the focusing circle is continually changing
throughout a diffraction pattern scan. This is a common configuration for powder
diffraction. Fig. 2.10 gives a schematic of the measurement.
Fig. 2.10 Schematic of the XRD measurement.11
2.2.3 Scanning Electron Microscopy (SEM)
A scanning electron microscope (SEM) is a type of electron microscope that
images a sample by scanning it with a beam of electrons in a raster scan pattern. A
ZEISS system is implored here while energy-dispersive X-ray spectroscopy (EDX)
analysis is used to determine the sample composition. For powdered samples, a layer
of powders are deposited onto clean substrates. For non-powder samples,
measurement is carried out directly. During measurement, the sample is put outside
the focusing field and then tilted towards the detector. The electron gun is either a
tungsten hairpin or a lanthanum hexaboride single crystal. Typically the beam
diameter is of the order of 10 nm with a beam energy Eo of 10-30 keV is focused by
condensing lenses into a very fine focal spot of ~5.0 nm on a conducting sample
surface. The electrons will interact with the atoms that make up the sample producing
signals that contain information about the sample's surface topography and
composition. Fig. 2.11 gives a schematic view.
37
Chapter 2: Synthesis and Characterization
Wee Rui Qi
Two main modes of signals are used for the samples. Secondary electrons (SE)
consist of ejection of electrons from the sample after interaction with primary beam
electrons. With energies of typically 1-10 eV, secondary electrons can be excited
within the specimen by a single primary electron at any time. However, only those
which are excited within ~10 nm of the surface can escape into the vacuum and be
detected. Backscattered electrons (BSE) are high-energy electrons that come from
primary electron beam. The primary electrons interacted with nuclei atoms in the
sample and are reflected from it.
Fig. 2.11 Schematic diagram of a working SEM.13
2.2.4 Transmission Electron Microscopy (TEM)
Transmission electron microscopy (TEM) is a microscopy technique whereby
a beam of electrons is transmitted through an ultra-thin specimen. As it passes
through, it interacts with the sample and forms an image. The image is magnified and
38
Chapter 2: Synthesis and Characterization
Wee Rui Qi
focused onto an imaging device, such as a fluorescent screen, or to be detected by a
sensor such as a CCD camera. In the experiments, TEM model JEOL 2010F and
JEOL 3010F operated at 200 keV. The samples are prepared by depositing minimal
powder into a vial of ethanol before quick sonication. A drop of solution is then
dripped on copper grid. High resolution transmission electron spectroscopy (HRTEM) is carried out to determine the lattice structure on the sample. Selected-area
electron diffraction (SAED) is done to investigate the diffraction pattern as well.
Typically, high-energy (~ 100-400 keV) electrons are used. Amorphous
materials, such as polymers and glasses, are rarely studied because of the difficulties
of interpreting the images and diffraction patterns and the susceptibility of such
materials to damage by the electron beam. One advantage TEM has over a light
microscope is its resolution. The resolution of a microscope (d, the smallest
observable distance between two points in an image) is controlled by the wavelength
(λ) of the radiation used. The value of λ for 100 keV electrons is 0.0037 nm, where λ
for visible light is ~0.5 µm for visible light. Therefore, the resolution limit of the
TEM is, theoretically, several orders of magnitude smaller than that of the light
microscope.
The whole instrument is first evacuated to ≤ 10 −6 Pa to prevent electron scatter
by ambient conditions. During measurements, electrons are produced either from a
lanthanum hexaboride single crystal heated to ~2000 K or by a field-emission gun
(FEG), which consists of a sharp tungsten needle (radius ~ 100 nm). An intense
electric field (>107 Vcm−1) is applied. Electrons emitted from the source and are
accelerated through ~ 100-400 kV and enter the illumination system. The illumination
system produces a demagnified image of the source at the plane of the specimen by
using two or more electromagnetic condenser lenses to restrict the electron paths. In
39
Chapter 2: Synthesis and Characterization
Wee Rui Qi
combination with limiting diaphragms (apertures) within the lens, an approximately
parallel, coherent electron beam of ~ 2-60 µm diameter is produced at the specimen
or, if analysis is to be performed, fine electron probes down to ~0.1 nm are obtainable
from a FEG.
In TEM, useful specimens can range in thickness from ~ 20nm to 0.5µm.
Electrons travelling straight through the specimen constitute the direct beam, while
scattered beams of electrons travel off the optic axis. Electrons scattered in specific
directions are focused at specific points in the back-focal plane to form the diffraction
pattern. The specimen is in the object plane, the diffraction pattern is formed in the
back-focal plane (distance f from the lens) and the various images are formed in the
image plane of the lens at a magnification given by the ratio of the image and object
distances, v/u. To form images, electrons emerging from any point in the specimen
are recombined to a point in the image plane, thus forming images. Fig. 2.12 gives an
illustration.
The restricting apertures can be used to select the area of the sample where
measurement is taken. The image may be recorded on electron-sensitive film in the
camera chamber or viewed on a TV/computer screen via a digital CCD camera,
usually situated in the camera or viewing chamber. Similarly, if the backfocal plane is
imaged, the electron diffraction pattern appears on the screen.
40
Chapter 2: Synthesis and Characterization
Wee Rui Qi
Fig. 2.12 Schematic diagram of the central process by which images and diffraction
patterns are formed within the objective lens of the TEM.14
2.2.5 Photoluminescence (PL)
Photoluminescence signals (PL) result from radiative recombination processes
in optically excited semiconductors. This is one of many forms of luminescence (light
emission) and is distinguished by photoexcitation (excitation by photons). The period
between absorption and emission is typically extremely short, in the order of 10
nanoseconds. For experiments here, an in-house photoluminescence (PL) system with
laser excitation of 325 nm with power of 10 mW and laser spot 1 mm is used to
examine light emitting properties at room temperature. For powdered samples, a layer
of powders are deposited onto clean substrates. For non-powder samples,
measurement is carried out directly.
Optical excitation, with photons of energy larger than the bandgap, generates
excess carriers in semiconductor materials. These carriers recombine both radiatively
41
Chapter 2: Synthesis and Characterization
Wee Rui Qi
and nonradiatively. The emitted light (photoluminescence) is caused by band-to-band
optical transitions which involved radiative centers in the gap. Disregarding quantum
effects, band-to-band transitions involve nearband- edge states in conduction and
valence bands occurred during photoluminescence.15
2.2.6 Vibrating Sample Magnetometer (VSM)
Vibrating sample magnetometer (VSM) is used to determine magnetic
properties of the samples at room temperature. The sample is wrapped with carbon
tape around the plastic holder prior to measurement. For experiments, VSM used is a
product from Lake Shore at a sensitivity of 1 x 10-6 emu.
VSM involves a large-scale applied field, using an electromagnet to immerse
an entire small sample in a nearly uniform field. The field is swept slowly (usually
less than mTs−1) and the sample is moved (vibrated) in the applied field. The
magnetic sources associated with a sample's geometry and magnetization are able to
internal magnetostatic fields and therefore, care is required to ensure symmetry in
sample sizes. The inductive pick-up coils are placed in close proximity to the sample
and are marked as X inside the applied field in Fig. 2.13. The motion of sample
results in induced voltage. This means that induced voltage is proportional to the
sample’s magnetic moment. Assumption is such that the external fields are wholly
proportional to the net internal magnetization, which is affected by the sample
geometry, though other factors may influence too. When the measurement is
completed, the hysteresis curve of the sample is obtained.16
42
Chapter 2: Synthesis and Characterization
Wee Rui Qi
Fig. 2.13 Illustration of VSM.16
2.3 References
1
W. Kern, K. K. Schuegraf, in Handbook of Thin Film Deposition Processes
and Techniques (2)- Principles, Methods, Equipment and Applications; Ch. 1,
edited by K. Seshan (William Andrew Inc., 2001), p. 11.
2
S. Rossnagel, in Handbook of Thin Film Deposition Processes and
Techniques (2)- Principles, Methods, Equipment and Applications; Ch. 8,
edited by K. Seshan (William Andrew Inc., 2001), p. 319.
3
P. M. Martin, in Handbook of Deposition Technologies for Films and
Coatings (Third Edition)- Science, Applications and Technology; Ch. 1, 3 ed.,
edited by P. M. Martin (Elsevier, 2010), p. 1.
4
D. Depla, S. Mahieu, J.E. Greene, in Handbook of Deposition Technologies
for Films and Coatings (Third Edition)- Science, Applications and
Technology; Ch. 5, 3 ed., edited by P. M. Martin (Elsevier, 2010), p. 253.
43
Chapter 2: Synthesis and Characterization
5
Wee Rui Qi
K. Byrappa and M. Yoshimura, in Handbook of Hydrothermal Technology- A
Technology for Crystal Growth and Materials Processing; Ch. 2, edited by K.
Byrappa and M. Yoshimura (William Andrew Inc., 2001), p. 53.
6
R. A. Laudise, in 50 years Progress in Crystal Growth- A Reprint Collection;
edited by R. A. Laudise (Elsevier Science, 2004), p. 185.
7
D. O’Hare, in Encyclopedia of Materials: Science and Technology; edited by
K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J. Kramer, S.
Mahajan, and P. Veyssière (Elsevier 2001), p. 3989.
8
K. Byrappa and M. Yoshimura, in Handbook of Hydrothermal Technology- A
Technology for Crystal Growth and Materials Processing; Ch. 4, edited by K.
Byrappa, M. Yoshimura (William Andrew Inc., 2001), p. 161.
9
E. D. Kolb and R. A. Laudise, J. Am. Ceram. Soc. 49, 302 (1966).
10
M. N. R. Ashfold, R. P. Doherty, N. G. Ndifor-Angwafor, D. J. Riley, Y. Sun,
Thin Solid Films, 515, 8679 (2007).
11
S.T. Misture,
R.L. Snyder, in Encyclopedia of Materials: Science and
Technology; edited by by K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B.
Ilschner, E. J. Kramer, S. Mahajan, and P. Veyssière (Elsevier 2001), p. 9799.
12
A.K. Chatterjee, in Handbook of Analytical Techniques in Concrete Science
and Technology - Principles, Techniques, and Applications; Ch. 8, edited by
V.S. Ramachandran and James J. Beaudoin (William Andrew Inc., 2001), p.
275.
13
O. C. Wells, in Encyclopedia of Materials: Science and Technology; edited by
by K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J. Kramer,
S. Mahajan, and P. Veyssière (Elsevier 2001), p. 8265.
44
Chapter 2: Synthesis and Characterization
14
Wee Rui Qi
D. B. Williams, in Encyclopedia of Materials: Science and Technology; edited
by by K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J.
Kramer, S. Mahajan, and P. Veyssière (Elsevier 2001), p. 2577.
15
S. K. Krawczyk, in Encyclopedia of Materials: Science and Technology;
edited by by K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J.
Kramer, S. Mahajan, and P. Veyssière (Elsevier 2001), p. 8397.
16
M. W. Muller, in Encyclopedia of Materials: Science and Technology; edited
by by K. H. J. Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J.
Kramer, S. Mahajan, and P. Veyssière (Elsevier 2001), p. 1.
45
Chapter 3: Investigation on Origins of Black Zinc Oxide
Wee Rui Qi
Chapter 3: Investigation on Origins of Black Zinc Oxide
3.1 Introduction
As transparent conducting oxide, it is essential to have a good antireflective
property on the TCO to increase light coupling into devices. Vertical rods, nanowires
and porous structures are some surface morphologies found to be effective as ZnO
antireflection coatings.1-4 However, black coatings are said to be most effective in
suppressing reflections from the TCOs. This is observed in black silicon where
structuring its surface morphology leads to low reflectivity and therefore, a black
appearance.5-7 Recently, black indium tin oxide (ITO) and ZnO have been reported.
For black ITO, it is obtained by increasing plasma power as described in Ma et al
while black ITO nanopowers are obtained by solution method investigated in Wang et
al.8,9 In Tian et al, ZnO films with pyramids with extremely sharp tips on its surface,
are being suspected to be the cause behind black appearance.10 The fabrication
however, was done purely on a Zn block. It is difficult to distinguish whether the
remnant Zn after hydrothermal treatment or the ZnO pyramids morphology, is
accountable to the appearance of black color. Black zinc coatings exist by the
inclusion of fine metallic particles dispersed in a dielectric material11 through a
chromating process to Zn plates, these black Zn coatings are found in surgical
instruments and machinery compartments to improve its visibility. It is therefore
intriguing to investigate the reason behind black ZnO.
As the potential of ZnO is vast, there has been much research to enhance its
properties. Zn is often used to enhance ZnO properties. Zn-ZnO core shell structures
produced violet and blue emissions.12,13 Zn coated ZnO nanowires resulted in the
46
Chapter 3: Investigation on Origins of Black Zinc Oxide
Wee Rui Qi
large enhancement of UV and green emissions.14 In Yi et al, Zn nanoclusters
embedded in ZnO nanowires turned out to be responsible for ferromagnetism.15
Nonetheless, there is still a lack of studies on the successful introduction of Zn
into ZnO and effect of properties. The introduction of zinc by incomplete oxidation of
Zn to ZnO could solve this. Zn is embedded in ZnO during the fabrication
process.16,17 Zn/ZnO nanowires and core-shell structures have been fabricated by
laser
ablation,
thermal
evaporation,
electrodepositon
and
chemical
vapor
deposition.12,13,15,18-21 Partially oxidized Zn films are yet to be studied, though
obtaining ZnO films from Zn films followed by subsequent annealing treatments are
well-publicized.17,22-28
In this work, ZnO films with varying amount of Zn are fabricated from Zn
films. The aim of this study is to determine whether black ZnO with purely ZnO
exists, while understanding properties of the resultant annealed films. Different
amount of Zn in ZnO films is controlled by varying the annealing conditions. The
physical appearance, structural, optical and magnetic properties are examined with
XRD, SEM, TEM, PL and VSM.
3.2 Results and Discussion
Zn films were first sputtered onto cleaned glass substrate, at 60 W for 3 h at
~4 x 10-5 Torr with argon gas. A film thickness of 3.63 μm was obtained as checked
using a surface profiler. To oxidize Zn into ZnO, post-sputtering heat treatment is
performed on the films by placing the sample on a hot plate with temperature control
in ambient conditions. The conditions were 100 oC for 15 h, 200 oC for 214 h, 400 oC
for 6 h. X-ray diffraction (XRD) was done on the samples with CuKα1 radiation to
determine the phases while scanning electron microscopy (SEM) was carried out to
47
Chapter 3: Investigation on Origins of Black Zinc Oxide
Wee Rui Qi
examine morphology of the films. For XRD, the following JCPDS cards were used:
01-1244 (Zn), 36-1451 (ZnO), 44-1349 (SiO2), and 27-1402 (Si). High resolution
transmission electron spectroscopy (HR-TEM) is carried out to determine the particle
structure on the film. A photoluminescence (PL) system with laser excitation of 325
nm with power of 10 mW and laser spot 1 mm was used to examine light emitting
properties at room temperature. Lastly, vibrating sample magnetometer (VSM) was
used to determine hysteresis loops (M-H curves) (of the samples at room temperature.
Zn and ZnO films are referred to as before and after annealing of the films
respectively.
3.2.1 Structural Features and Surface Morphology
XRD spectra of the films are given in Fig. 3.1. Both Zn and ZnO peaks were
present in film before annealing. The presence of ZnO before any annealing treatment
is attributed to the chamber base ambience that contained humid air due to machine
fault. Thus, oxygen was already introduced during sputtering of Zn film. The amount
of Zn present decreased gradually with increasing annealing temperature as seen from
Table 3.1. There was no oxidation of Zn into ZnO after the Zn film was annealed at
100 oC as similar XRD spectra are observed in Figs. 3.1(a)-(b). To obtain varying Zn
in ZnO, partial to complete oxidation are carried out from 200 oC to 400 oC as the
intensity of Zn (101) peak at 43.4 o decreased gradually with an increased annealing
temperature. The reason why annealing at 200 oC is carried out for 214 h instead of 615 h for 100 oC and 400 oC because it was hoped that a complete oxidation of Zn will
occur at a low temperature of 200 oC over a long period of time. However, no
apparent change in visible appearance over a long heating suggested otherwise. This
is confirmed by XRD shown in Fig. 3.1(c).
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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To give a rough idea of how the elemental composition of the film changed
with different annealing conditions, the ratio of Zn/ZnO peak intensities is calculated
from XRD patterns in Fig. 3.1. The ratio comparison of selected peaks is used since
the absolute amount of Zn present cannot be calculated from an XRD spectrum alone.
Chosen for their strong peak intensities in ZnO and Zn respectively, the peak
intensities of ZnO (101) and Zn (101) are compared in Table 3.1. The ratio of ZnO
(101)/Zn (101) peak intensities remained at 2:6 before annealing, and after annealed
at 100 oC. However, the ratio of ZnO (101)/Zn (101) peak intensities increased to 7:4
when annealed at 200 oC, and then 5:0 at 400 oC. This confirms that Zn content in
ZnO films can be controlled by annealing. However, more study is required to
determine the exact composition of Zn versus ZnO in ZnO films.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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Fig. 3.1 XRD spectra of films under different conditions of (a) Zn film before
annealing, (b) ZnO films after annealed at 100 oC for 15 h, (c) 200 oC for 214 h, and
(d) 400 oC for 6 h.
Table 3.1 Ratio of the height of the peak intensities of ZnO (101) and Zn (101) in Zn
film before annealing, ZnO films annealed at 100 oC for 15 h, 200 oC for 214 h, and
400 oC for 6 h.
To further support the claim that black ZnO contains Zn, the physical
appearance of the films before and after annealing is compared in Fig. 3.2. Before
annealing, Zn film is black. After annealing temperatures of 100 oC and 200 oC, the
50
Chapter 3: Investigation on Origins of Black Zinc Oxide
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resultant annealed films remained black or grey. When the zinc films are annealed at
400 oC, the ZnO film became opaque-white. In Figs. 3.1(a)-(b), Zn peaks existed in
annealed films. In Fig. 3.1(d), a complete oxidation to ZnO has taken place. This
suggests that the intensity of black appearance is directly related to the amount of Zn
in the annealed films, whereby the darkest ZnO films contained the most Zn content.
The control of black intensity in ZnO films suggests a simple method of
fabrication other than chromating zinc plates. Two factors can contribute to black
films. Firstly, black appearance could be due to metallic Zn particles embedded in
ZnO films. It is well known that when the particle size of a metal, for example Au,
becomes in nanometer range, the color becomes black. Another factor is the porous
network within the ZnO films. Light is absorbed due to the nanostructure where the
irregular surface of the films is brought by oxidation of particles. However, as porous
structure is observed in all films, this is unlikely to be a contributing factor. Therefore,
the black appearance is likely to be due to Zn, and that black ZnO films which
consisted purely of ZnO does not exist.
The morphology of the films before and after annealing at various
temperatures and time is examined with SEM in Fig. 3.2. Before annealing, a mix of
distinct elongated and irregular-shaped particles of size 100-200 nm was observed.
The sputtered Zn film was quite porous compare to normal ones which were dense,
which is again explainable by humidity presence during sputtering. This morphology
remained when ZnO films are annealed at 100 oC and 200 oC though some sections of
the particles coalesced due to sintering. At an annealing temperature of 400 oC, the
particles became more spherical with a diameter of 100-200 nm. There was also a
porous centre in each ring-like particle.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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It is hypothesized that the resultant annealed films consisted of core-shell
particles with Zn as core and ZnO as shell since the exterior of each Zn particle can
oxidized first before its interior due to its exposure to both heat and oxygen. The
porous nature of ZnO films made it easy for oxygen to be in contact with each Zn
particle. To examine the composition makeup of individual particle, particles from
ZnO film annealed at 200 oC are scraped off onto TEM copper grid with holey carbon.
Fig. 3.2(e) shows the image obtained from HR-TEM, which showed the ZnO
nanograins. For section A in the image, the lattice spacing between each plane
indicated the presence of (100) planes in ZnO. In addition, intersecting parallel planes
at 120 o corresponding to two of the three dimensions of unit cell of ZnO are seen in
section B.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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Fig. 3.2 Morphology and visual appearances (insets) of ZnO films under different
conditions with (a) SEM of Zn film before annealing, (b) SEM of ZnO films after
annealed at 100 oC for 15 h, (c) 200 oC for 214 h, (d) 400 oC for 6 h, and (e) HR-TEM
of ZnO film annealed at 200 oC for 214 h.
This suggests the existence of a Zn/ZnO layered film. Zn peaks present in Fig.
3.1(a) by XRD suggests the possibility of Zn residing in the bottom layer, which was
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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nearer to glass substrate. The formation of ZnO films can be interpreted as follow.
Through heating, the surface which was in contact with oxygen in air first oxidized.
As heating progressed, this conversion to ZnO proceeded to deeper layers of the film.
The inner-most layer remained least affected by oxidation though nano-scale interface
roughness was created by heating which contributed to the dark appearance of film.
When heated at 400 oC for 6 hours, this inner-most layer finally oxidized to ZnO,
giving rise to a complete oxidation of ZnO film. This explains why ZnO films
retained a dark appearance for annealing temperatures below 400 oC. Since the
change in interface between the two layers was likely to be gradual, it is difficult to
distinguish the exact occurrence of interface in the sample. It is thus unclear if this
bottom layer constituted of solely Zn or a mixture of Zn and ZnO.
Fig. 3.3 illustrates the mechanism. From this mechanism, it is demonstrated
that simple heating can induce a layer of oxide at its metal-air interface. This is a
useful alternative method to physical methods such as sputtering and pulsed laser
deposition for growth of ZnO with good adhesion on surfaces. This method also
supersedes most typical chemical methods since good adhesion is obtained. In this
method, ZnO molecules have to first attach on the surface chemically before growth
takes place. With extensive surface irregularities, any chemical attachment can be
difficult to take place, resulting in poor oxide coverage.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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Fig. 3.3 Schematic diagram of mechanism to obtain Zn/ZnO layered film.
3.2.2 Photoluminescence Properties
The PL spectroscopy is employed to study the optical properties of ZnO
nanostructures. Direct comparison for emission intensity is made as the surface area
of all films is the same. Before annealing, there were two weak and broad emission
peaks at 2.2 eV and 3.26 eV. Strong emissions at 2.2 eV and 3.26 eV are seen in Figs.
3.4(a)-(b) when ZnO films are annealed at 100 oC, 200 oC and 400 oC. The origins of
these green and UV emissions are explained earlier. UV and green emissions for ZnO
films increased with annealing temperatures, with the lowest for annealing
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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temperature of 100 oC. However, UV emission is significantly enhanced when ZnO
film is annealed at 200 oC.
Firstly, neither UV nor green emission was seen in Zn films before annealing.
This is so even though both Zn and ZnO were present before annealing. This clearly
indicates a modification of optical properties in ZnO purely by annealing as UV and
green emissions became stronger after zinc film is annealed at 100 oC. This is not
unusual as annealing at 900
o
C enhanced strong blue-green and orange-red
luminescence for Zn-incorporated ZnO films obtained by electrodeposition in Lee et
al.20 However, this is the first time a low annealing temperature of 100 oC has a
profound effect on luminescence enhancement in Zn-ZnO structures. This is useful
for applications that cannot withstand high temperatures.
Transitions taken place before annealing of Zn films were mostly nonradiative rather than radiative. During annealing, the oxygen present in the
environment came into contact with Zn film through its porous structure and
boundaries. Oxygen vacancies (Vo+ and Vo++) formed during sputtering are filled and
reduced, which increased emission for annealed ZnO films. This is why all annealed
ZnO films exhibited strong UV emissions. Defects were also formed during annealing.
Green emission surfaced in all annealed ZnO films. This is attributed to the formation
of defects since green emissions are known to be caused by surface defects. At
annealing temperature of 100 oC, Zn had more time to move around for its optimum
stoichiometric Zn-O positions at that temperature. However, the heating time was
insufficient for its optimum position, leading to defect formation and green light
emission. At a higher annealing temperature of 400 oC, Zn is rapidly converted to
ZnO.16,27 Due to the hasty ZnO formation, a high concentration of defects occurred.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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Defects such as Zn interstitials and antisite defects (OZn) may form, which contributed
to green light emissions seen in Fig. 3.4(a).29
It is of particular interest that UV emission intensified significantly in ZnO
film annealed at 200 oC. The peak intensification is caused by resonant coupling
between surface plasmons in Zn and emission of ZnO. This is not unfound as this
phenomenon has been reported elsewhere.18 In Tang et al, UV emission
intensification seen in Zn/ZnO nanowires is due to Zn nanoparticles infused in ZnO.18
This model as illustrated in Fig. 3.5, applies here since both Zn and ZnO are involved.
The work function of Zn is 4.33 eV while it is 5.2 eV in ZnO, forming an Ohmic
contact between Zn and ZnO. When both Fermi levels aligned, the bending of energy
bands allowed electrons to move from Zn to ZnO. The absorption energy by electrons
in Zn occurred at 380 nm.30 This can be matched with UV emissions in ZnO, which is
also the reason behind UV enhancement by silver in ZnO.31 Thus, coupling between
surface plasmons in Zn and emission of ZnO can occur. The electrons are transferred
to conduction band of ZnO, giving rise to a higher electron density. This increase in
electron-hole recombination rate enhances UV light emission in ZnO. The energy for
surface plasmons is also provided by the defect-related emissions in ZnO in visible
light region, leading to its suppression. However, not all defect-related emissions
contributed to surface plasmons. Moreover, electrons at conduction band in ZnO can
first transferred from conduction band to defect level before proceeding to valence
band, giving rise to the green emissions.14
As Zn contributes to surface plasmons, it is imperative for annealed films to
contain sufficient Zn in order for a peak enhancement. However, sufficient ZnO is
still required as Zn can only enhance UV and green emissions. This probably explains
why no UV peak enhancement is observed in both ZnO films annealed at 100 oC and
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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400 oC. When annealed at 100 oC, the film contained insufficient ZnO; whereby the
film no longer contained any Zn after annealed at 400 oC.
Fig. 3.4 PL spectra of films under different conditions of (a) Zn film before annealing,
ZnO films after annealed at 100 oC for 15 h, 200 oC for 214 h, and 400 oC for 6 h, and
(b) Inset: PL spectrum magnification of Zn film before annealing.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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Fig. 3.5 Illustration of mechanism behind UV and green emissions in Zn/ZnO layered
film.
3.2.3 Magnetic Properties
VSM is a usual technique to investigate the magnetic properties in materials.
In these measurements, glass substrates which the films laid on and the tape were
already taken into account of. In addition, the magnetic response of the machine in
the background is also subtracted from the presented results. Fig. 3.6 show the M-H
curves obtained for ZnO films before and after annealing at 100 oC, 200 oC and 400
o
C. There existed a hysteresis loop for ZnO films before and after annealing at 100 oC
and 200 oC, and ferromagnetism ceased when annealing occurs at 400 oC.
This trend suggests that Zn was responsible for the hysteresis loops since there
was no more hysteresis loop for ZnO film annealed at 400 oC. It is unlikely that any
impurities or contamination during sample fabrication contributed to ferromagnetic
behavior as otherwise, ferromagnetic behavior would be observed in all samples. It is
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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also implausible that ferromagnetism arose from the interaction of different phases of
ZnO since only wurtzite phase is observed in Fig. 3.1(d). Defect-mediated magnetism
is unlikely since no ferromagnetic behavior was exhibited in ZnO film annealed at
400 oC though defects still resided as seen in Fig. 3.3(a). Zn is therefore a
contributing factor in ferromagnetic ZnO films. This is not unusual as the
phenomenon has been reported in Yi et al.15 In Yi et al, Zn nanowires are oxidized to
ZnO over different durations. At 10 h, ferromagnetism peaked, which ceased when
annealed at 40 h. Experiments showed that ferromagnetism was due Zn clusters
formed in ZnO nanowires. The structure is verified with XANES spectra which
showed a deviation from curve fitting for both Zn foil and ZnO. This is likely to
occur in this study as ferromagnetism subsided when no Zn was observed in ZnO
films annealed at 400 oC. Interfacial effects between Zn and ZnO might play a role
since both Zn and ZnO e are not ferromagnetic individually.
It is interesting to note that there might be a relation between luminescence
and ferromagnetic properties. When ZnO film is annealed at 100 oC and 200 oC, both
UV enhancement and ferromagnetic behavior are observed. However, further detailed
study is required to fully understand the relationship behind these properties.
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Chapter 3: Investigation on Origins of Black Zinc Oxide
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Fig. 3.6 M-H curves by VSM at room temperature of films annealed under different
conditions of (a) Zn film before annealing, ZnO films after annealed at (b) 100 oC for
15 h, (c) 200 oC for 214 h, and (d) 400 oC for 6 h.
3.3 Conclusions
In summary, we have investigated if black ZnO with purely ZnO existed. Ratios
of ZnO (101)/Zn (101) peak intensities of 2:6, 2:6, 7:4 and 5:0 are attained for ZnO
films at annealing conditions of 100 oC for 15 h, 200 oC for 214 h and 400 oC for 6 h
respectively. From visible appearance and XRD spectra, Zn was found to be present
in black ZnO films. The black appearance disappeared when the film no longer
contained metallic Zn particles. The investigation therefore disputed the claims of
black ZnO made purely from ZnO. We also examined the structural, optical and
magnetic properties of these ZnO films. The influence of annealing and Zn are also
studied. From the SEM images, elongated and irregular-shaped particles obtained are
transformed into spherical particles after ZnO films are annealed at 400 oC for 6 h.
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TEM revealed ZnO nanostructures. It is demonstrated that simple heating can induce
a layer of oxide at its metal-air interface. This is a useful alternative to physical
methods to obtain growth of ZnO with good adhesion on surfaces. It is hypothesized
that annealing of Zn films resulted in Zn/ZnO layered films. A low annealing
temperature of 100 oC has a profound effect by enhancing UV emission in ZnO films.
Reverting back to the effect of Zn on ZnO, UV enhancement observed at ZnO film
annealed at 200 oC strongly suggested the effect of Zn in ZnO. Zn also causes
ferromagnetic behavior in all films except for the film annealed at 400 oC.
3.4 References
1
J. Y. Chen and K. W. Sun, Sol. Energy Mater. Sol. Cells 94, 930 (2010).
2
Y.–J. Lee, D. S. Ruby, D. W. Peters, B. B. McKenzie, and J. W. P. Hsu, Nano
Lett. 8, 1501 (2008).
3
E. Osorio, R. Urteaga, L. N. Acquaroli, G. García-Salgado, H. Juaréz, and R.
R. Koropecki, Sol. Energy Mater. Sol. Cells 95, 3069 (2011).
4
X. M. Liu and J. H. He, J. Phys. Chem. C, 113, 148 (2009).
5
D. Murias, C. Reyes-Betanzo, M. Moreno, A. Torres, A. Itzmoyotl, R.
Ambrosio, M. Soriano, J. Lucas, and P. R. i. Cabarrocas, Mater. Sci. Eng, B
(2012).
6
A. Y. Vorobyev and C. Guo, Appl. Surf. Sci. 257, 7291 (2011).
7
Y. Xia, B. Liu, J. Liu, Z. Shen, and C. Li, Solar Energy 85, 1574 (2011).
8
H. B. Ma, J. -S. Cho, and C. -H. Park, Surf. Coat. Technol. 153, 131 (2002).
9
H. W. Wang, X. J. Xu, J. R. Zhang, and C. Z. Li, J. Mater. Sci. Technol. 26,
1037 (2010).
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10
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Y. S. Tian, C. G. Hu, Y. F. Xiong, B. Y. Wan, C. H. Xia, X. S. He, and H. Liu,
J. Phys. Chem. C 114, 10265 (2010).
11
M. Nikolova, O. Harizanov, P. Steftchev, I. Kristev, and S.Rashkov, Surf.
Coat. Technol. 34, 501 (1988).
12
H. Zeng, W. Cai, J. Hu, G. Duan, P. Liu, and Y. Li, Appl. Phys. Lett. 88,
171910 (2006).
13
W. S. Khan, C. Cao, Z. Chen, and G. Nabi, Mater. Chem. Phys. 124, 493
(2010).
14
Y. J. Fang, J. Sha, Z. L. Wang, Y. T. Wan, W. W. Xia, and Y. W. Wang, Appl.
Phys. Lett. 98, 033103 (2011).
15
J. B. Yi, H. Pan, J. Y. Lin, J. Ding, Y. P. Feng, S. Thongmee, T. Liu, H. Gong,
and L. Wang, Adv. Mater. 20, 1170 (2008).
16
W. Gao, Z.W. Li, R. Harikisun, and S.-S. Chang, Mater. Lett. 57, 1435 (2003).
17
Z. W. Li, W. Gao, and R. J. Reeves, Surf. Coat. Technol. 198, 319 (2005).
18
W. Tang, D. Huang, L. Wu, C. Zhao, L. Xu, H. Gao, X. Zhang, and W. Wang,
CrystEngComm 13, 2336 (2011).
19
X. Zhang, J. Dai, C. Lam, H. Wang, P. Webley, Q. Li, and H. Ong, Acta
Mater 55, 5039 (2007).
20
M.-K. Lee and H.-F. Tu, Jpn. J. Appl. Phys. 47, 980 (2008).
21
H. B. Zeng, Z. G. Li, W. P. Cai, B. Q. Cao, P. S. Liu, and S. K. Yang, J. Phys.
Chem. B 111, 14311 (2007).
22
M. Bouderbala, S. Hamzaoui, M. Adnane, T. Sahraoui, and M. Zerdali, Thin
Solid Films 517, 1572 (2009).
23
M. Cui, X. Wu, L. Zhuge, and Y. Meng, Vacuum 81, 899 (2007).
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24
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T. Hiramatsu, M. Furuta, T. Matsuda, C. Li, and T. Hirao, Appl. Surf. Sci. 257,
5480 (2011).
25
L. Wu, Y. Wu, X. Pan, and F. Kong, Opt. Mater. 28, 418 (2006).
26
O. Martínez, V. Hortelano, J. Jiménez, J. L. Plaza, S. de Dios, J. Olvera, E.
Diéguez, R. Fath, J. G. Lozano, T. Ben, D. González, and J. Mass, J. Alloys
Compd. 509, 5400 (2011).
27
S. Ren, Y. F. Bai, J. Chen, S. Z. Deng, N. S. Xu, Q. B. Wu, and S. Yang,
Mater. Lett. 61, 666 (2007).
28
J. Zhao, L. Hu, Z. Wang, Y. Zhao, X. Liang, and M. Wang, Appl. Surf. Sci.
229, 311 (2004).
29
Z. Li and W. Gao, Thin Solid Films 515, 3323 (2007).
30
K. Aslan, M.J. R. Previte, Y. X. Zhang, and C. D. Geddes, J. Phys. Chem. C
112, 18368 (2008).
31
X. H. Xiao, F. Ren, X. D. Zhou, T. C. Peng, W. Wu, X. N. Peng, X. F. Yu,
and C. Z. Jiang, Appl. Phys. Lett. 97, 071909 (2010).
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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Chapter 4: Growth of ZnO Nanostructured Films by Zn films in NaCl Solution
4.1 Introduction
It is well known that Zn undergoes corrosion in the presence of humidity or
seawater. Selective corrosion on Zn takes place, inducing interesting features on ZnO
while simultaneously oxidizing Zn. We therefore proposed that sodium chloride
(NaCl) solution might be helpful in forming ZnO nanostructures. Current studies
showed that Zn with NaCl powder has successfully produced ZnO. One synthesis
method is to obtain ZnO from a Zn-NaCl mixture. It involved the use of Zn
precursors with NaCl powder to synthesize ZnO.1-5 In A.N. Baranov et al., the ratio of
Zn precursor to NaCl powder of 1:10 is prepared by freeze-drying followed by ball
milling before heating up to 800 oC to synthesize ZnO nanorods. High temperatures
were required as synthesis of ZnO was not observed below 500 oC.1 NaCl assisted by
preventing agglomeration of the Zn precursor during mechanical action of ball
milling. Water molecules were not involved in chemical reactions as they had been
removed.3,4 Large amount of NaCl was needed for synthesizing small amount of ZnO
via decomposition of Zn precursor when Zn powder was used. Moreover, only ZnO
nanowires are reported.6
Despite numerous studies on ZnO via NaCl, using NaCl solution to obtain
ZnO appears relatively new. The idea of corroding Zn to obtain ZnO nanostructures
is reasonable as this has been exemplified by Mouanga et al. where Zn foils were
immersed in NaCl solution for days.7 Apart from the prolonged duration required,
atmospheric carbon dioxide was also introduced into ZnO nanostructures which may
degrade the quality of ZnO. Tian et al and Yan et al also attained ZnO pyramids and
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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nanorods by subjecting Zn foils at 170 oC and 120 oC respectively.8,9 However, there
is a lack of understanding of using corrosion mechanism on Zn in these studies. Thus,
more can be done to explore the use of NaCl solution for ZnO nanostructures.
In this paper, a new strategy to obtain ZnO by using NaCl solution on glass is
presented. The glass which has been pre-coated with a layer of Zn, acted as Zn source.
It is hoped that ZnO will grow directly on Zn film as this will eliminate the need to
apply as-synthesized powder onto substrate. Moreover, as NaCl exists in solution
form, the fabrication temperature will be much lower since NaCl crystals did not have
to be in molten state. This greatly reduces the amount of NaCl required relative to Zn
precursor since water is the main medium. Moreover, since only NaCl and water are
used, this fabrication process is environmental friendly and is replicable in large-scale
production. The morphology, structure and optical properties of the obtained product
are investigated after synthesis.
4.2 Results and Discussion
Zn films were first sputtered onto cleaned glass substrate, at 60 W for 3 h at
~4x 10-5 Torr with argon gas. A film thickness of 3.63 μm was obtained as checked
using a surface profiler. The Zn on glass was placed in a Teflon container with a wellmixed solution of 0.116 g of NaCl and 20 mL water. It was then heated at 170 oC
from 3 to 15 hours. The samples were replaced after cooled to room temperature. The
samples were characterized with SEM, XRD, TEM and PL. X-ray diffraction (XRD)
was done on the samples with CuKα1 radiation to determine the phases while
scanning electron microscopy (SEM) was carried out to examine morphology of the
films. In XRD, the following JCPDS cards were used: 01-1244 (Zn), 36-1451 (ZnO),
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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20-1435 (Zn(OH)2), 16-0850 (ZnCl2), 44-1349 (SiO2), and 27-1402 (Si). High
resolution transmission electron spectroscopy (HR-TEM) was carried out to
determine the particle structure on the film. A photoluminescence (PL) system with
laser excitation of 325 nm with power of 10 mW and laser spot 1 mm was used to
examine light emitting properties at room temperature.
4.2.1
Surface Morphology and Structural Features
Fig. 4.1(a) shows SEM image of the Zn film sputtered on glass at a low base
vacuum of ~4 x 10-5 Torr. A mix of distinct elongated and irregular-shaped particles
of size 100-200 nm is observed. The porous sputtered Zn film was due to the
presence of humid air in the low base vacuum chamber, in which oxygen and water
vapour were present during the process of sputtering Zn film. Figs. 4.1(b)-(f) show
the surface morphology of nanostructured ZnO after heating from 3 to 15 hours. After
3 hours of heating, a network with circular pores of diameter 0.5-1 µm emerged. The
network remained after 6 hours of heating though the circular pores appeared to have
a more uniform diameter compared to after heating for 3 hours. With 9 hours of
heating, the circular pores enlarged, causing a network of nanowires with diameters
of 100 nm to 200 nm. There was little change of the nanowires after 9 hours as the
morphology remained similar for the Zn films heated for 12 and 15 hours. It should
be noted that spheres with diameter 100 nm to 200 nm were seen in some areas of the
network of nanowires with 15 hours. The network of nanowires also appeared more
spacious than the nanostructured ZnO after heating for 9 and 12 hours.
Fig. 4.2(a) shows the XRD spectrum of the Zn film before heating. Peaks of both
Zn and ZnO were present, indicating that the resultant sputtered film contained both
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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Zn and ZnO before any heat treatment. This again, was due to the presence of oxygen
during sputtering. Figs. 4.2(b)-(f) show the XRD spectra of nanostructured ZnO after
heating from 3 to 15 hours. All peaks could be indexed to ZnO. From Fig. 4.2(b), 3
hours of heating were sufficient to fully oxidize Zn to ZnO. No peaks of NaCl and
zinc chloride (ZnCl2) were observed in any of the samples, though two peaks due to
zinc hydroxide were identified after the sputtered Zn film was heated for 6 hours. A
pH value of 6 for the solution kept unchanged after heating reactions. It is proven that
water acted as oxidizer while NaCl remained in solution form instead of reacting with
Zn. It is evident that NaCl played the role of a catalyst as different morphologies of
ZnO films are observed with different heating time.
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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Fig. 4.1 SEM of ZnO nanostructured films (a) before heating, after heating at 170 oC
for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h.
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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Fig. 4.2 XRD of ZnO nanostructured films (a) before heating, after heating at 170 oC
for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h.
4.2.2 Optical Properties
The PL spectroscopy has been employed to study the optical properties of
ZnO nanostructures. Before heating, there are two weak and broad emission peaks at
2.2 eV and 3.26 eV. This is attributed to the UV light emission due to recombination
of electrons and holes. An additional peak appears at ~2.2 eV, which is defect-related
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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luminescence caused by radiative transitions between shallow donors (related to
oxygen vacancies) and deep acceptors (Zn vacancies) in ZnO. A peak of ~3.15 eV
appeared for all samples seen in Figs. 4.3(a)-(f). Ultraviolet emission is observed for
all samples. When the Zn film underwent heating for 3 hours, there was no peak at
green light wavelength. However, a hump is observed after heating for 6 hours, which
increased after 9 and 12 hours of heating. This hump subsequently disappeared after
15 hours of heating.
As heating duration was the only experimental variable, it was responsible for
the rise and subsequent decline of green emissions of the films. Surprisingly, there
was no fixed elimination or enhancement of the emissions as heating duration
increased. It was widely reported that annealing gave rise to a consistent rise or
decline in green emissions.10 The observations in Fig. 4.3(a)-(e) clearly showed the
effect of morphology changes derived from the different heating durations. It is
suggested that morphology changes led to defect formation and elimination which
manifested as a rise and decline in green emissions. From Figs. 4.3(b)-(c), there was
little change in PL luminescence when heating time was between 3 and 6 hours. This
reinforces that a longer heating time did not lead to more defects forming since there
was no change in morphology. From Figs. 4.1(c)-(d), the transition of circular pore
structure to a network of nanowires occurred between 6 and 9 hours of heating. The
abrupt change in morphology over this period of time led to defect formation, which
caused green emission. Subsequently with more heating, green emission disappeared
after heating for 15 hours. The minimal change in morphology from 9 to 15 hours of
heating suggested that elimination of defects was due to a longer heating time. These
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preliminary findings therefore proposed that morphology changes affected
photoluminescence properties in addition to heating durations.
Fig. 4.3 PL spectra of ZnO nanostructured films (a) before heating, after heating at
170 oC for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h.
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4.2.3 Investigation of ZnO Growth Mechanism
From Fig. 4.2(f), it appears that the nanowires are interconnected. TEM is used to
further examine this sample. Particles from ZnO film after heating for 15 hours are
scraped off onto TEM copper grid with holey carbon. Figs. 4.4(a)-(d) show the TEM
images obtained at different sections of the sample. Fig. 4.4(a) shows the HR-TEM
while Fig. 4.4(b) gives its selected area diffraction pattern (SAED). A lattice spacing
of 0.247 nm belonging to ZnO (101) is obtained in Fig. 4.4(a). This is further
supported by its SAED which can be indexed to ZnO, as shown in Fig. 4.4(b). The
TEM results supported Fig. 4.2(f) where only ZnO formed. From Fig. 4.4(c), it is
observed that a single nanowire can have a diameter of ~50 nm. This suggests that the
diameter of a single nanowire could actually be much smaller than the 50-200 nm as
predicted from SEM in Fig. 4.1(f). It is also observed that the end of the single
nanowire was rough as clearly seen in its HR-TEM inset. The rough surface of
nanowire probably explains why these individual nanowires are linked to each other
by an interconnected network in Fig. 4.4(d). This accounted for the interconnected
network even as the network morphed from a mix of distinct elongated and irregularshaped particles to having circular porosity and lastly, to nanowires.
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Fig. 4.4 TEM of different parts of ZnO nanostructured films after heating at 170 oC
for 15 h in (a) one section, (b) SAED, (c) a nanowire with HRTEM as inset, and (d)
branched section of a nanowire.
The strategy for growth mechanism present in this paper is interesting as it
demonstrated the use of salt solution in controlling ZnO nanostructures. The total
amount of Zn present was kept constant, and thus could not be responsible for
varying ZnO nanostructures. As heating duration was the only variable in this set of
experiments, it was the determinant behind the emergence of different ZnO
nanostructures. The proposed mechanisms parallel to those present in corrosion as Zn
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is often used a sacrificial anode as cathodic protection.11,12 Corrosion is usually seen
as something undesirable and thus, most studies involved investigating corrosion to
minimize corrosion preserving Zn or Zn alloy.13,14 The corrosion on Zn alloys was
due to pitting corrosion, where the gaps between pits were no more than few
micrometers wide. Pitting has the ability to oxidize Zn and offered non-uniform
corrosion rates on Zn films. This mechanism is illustrated in Fig. 4.5. The Zn
substrate immersed in NaCl solution can be seen as local cathode and anode which
are both contained in the same environment. Known as anode dissolution, the areas of
Zn in the pores is oxidized in water to form Zn2+ in Equation 4.1. Meanwhile, the
dissolved oxygen in water reacts with water to form OH- on the protruding surface as
seen in Equation 4.2.15
Anodic reaction: Zn (s) Zn2+ (aq) + 2e-
(4.1)
Cathodic reaction: O2 (dis) + 4e- + 2H2O 4OH- (aq)
(4.2)
Zn2+ ions then react with water to form zinc hydroxide in acidic conditions.
Zinc hydroxide will then dehydrate to ZnO. A thin layer of ZnO formed on the glass
surface, giving rise to a ZnO seed layer. This paved way for rapid growth of as more
ZnO deposited on the glass substrate, thus forming the nanostructured film.
2Zn2+ + 2H2O Zn(OH)2 + 2H+
(4.3)
The presence of Cl- ions in the solution accelerated this corrosion mechanism.
As Zn2+ ions remained entrenched in the deep trench provided by pores within the Zn
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film surface, this led to the trapping of Cl- ions from NaCl solution in the same area
in order to maintain charge neutrality in the localized region. This encouraged the
Zn2+ ions to react with the water, thus forming zinc hydroxide in Equation 4.3.16 The
production of H+ ions will release Cl- ions. This acidic condition thus led to an
autocatalytic effect as Cl- ions encouraged the further oxidation of Zn to Zn2+ within
the pores. As OH- ions produced by Equation 4.2 remained unused, Zn(OH)2 would
eventually decompose to ZnO when being heated up sufficiently.
Meanwhile, the protective layer of ZnO on Zn film is slowly dissolved,
making even bulk Zn in Zn film susceptible to corrosion. The reaction is as follow.
ZnO + 2OH- + H2O Zn (OH)42-
(4.4)
Upon dehydration, Zn (OH)42- would contribute to the re-forming of an oxide
film thicker than observed on Zn surface previously. Without NaCl as catalyst, it is
likely that only reactions in Equations 4.1 and 4.2 occurred. If NaCl took part in the
chemical reactions, ZnCl2 would form too. However, reactions in Equations 4.1-4.3
occurred instead. From Fig. 4.2(b) by XRD, it is seen that 3 hours were sufficient to
fully oxidize Zn to ZnO. However, the change in morphology of ZnO films continued
with a longer heating time though there is no change in its structural composition.
This suggests that the nutrient for ZnO growth on glass substrate indeed came from
Zn2+ ions in solution. No NaCl or ZnCl2 peaks were identified in Figs. 4.2(b)-(f) by
XRD, and the pH value of the solution before and after reaction remained unchanged.
These suggested that pitting corrosion that has an autocatalytic nature can be the
growth mechanism of ZnO nanostructures and NaCl as catalyst in this part of study.
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Fig. 4.5 An illustration of growth mechanism for nanostructured ZnO films.
To further validate this proposed mechanism, a series of experiments where
Zn powder is first mixed with NaCl solution and then subjected to at 170 oC for 15
hours is carried out. There were no permanent pits as Zn powder was loose. The
resultant precipitates are then characterized with XRD. Figs. 4.6(a)-(d) showed the
XRD spectra of the samples on a Si wafer support, and Tables 4.1 and 4.2 showed the
number of moles of Zn and NaCl used for each reaction. To observe the effect of Zn
amount, different amount of Zn with same amount of NaCl was first carried out in
experiment 1 and 2. To mimic the condition with little Zn since only 3.567 x 10-6 mol
of Zn was present in experiments with Zn films, experiment 3 was carried out
whereby the amount of NaCl added is multiplied by 10.
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It is interesting to notice that ZnO, Zn(OH)2 and ZnCl2 peaks exist in the XRD
patterns in Fig. 4.6, obviously different from the case of the porous Zn film for which
almost only pure ZnO was obtained (Fig. 4.2). It should be pointed out that ZnO,
Zn(OH)2 and ZnCl2 were formed for polished Zn pieces immersed in NaCl solution at
room temperature for a few days, while only ZnO was formed for unpolished Zn foils
immersed in NaCl solution at 170 oC and 120 oC. 8,9
In experiment 1, a resultant pH of 9 was observed along with a mixture of
ZnCl2, Zn(OH)2 and ZnO. When more Zn powder was added in experiment 2, pH
increases to 11. When large amount of NaCl was used in experiment 3, a mixture of
ZnCl2, Zn(OH)2 and ZnO were produced while the pH decreased to 6 (Fig. 4.6). NaCl
reacted with Zn2+ ions and did not merely acted as a catalyst in these three
experiments. It was likely that dehydration of Zn(OH)2 did not occur as the assynthesized powders comprised mostly of ZnCl2.
Table 4.1 Tabulations for an estimation of moles of Zn present in Zn films.
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It is concluded that reactions by Equations 4.1 and 4.2 have occurred. Due to
good circulation of solution between loose Zn powder, ZnCl2 produced will neither
be trapped in the pit nor forced to react with H2O because of the entrapment. Thus,
ZnO formation was reduced greatly. Instead, Zn2+ ions reacted directly with OH- ions
produced, to form Zn(OH)2. The OH- ions produced from the reduction of water with
dissolved oxygen in Equation 4.2 were not neutralized. This was in line with our
observations as an increasing pH is observed with more Zn powder introduced at the
start. The oxidation of Zn had to be counter-balanced with reduction of water in
dissolved oxygen to form hydroxide ions. In addition, Cl- ions from NaCl solution did
not act as catalyst here but instead, as a reactant with Zn2+ ions to produce ZnCl2.
This is why when more NaCl was added in experiment 3, the pH drops to 6 since
more ZnCl2 were formed.
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
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Fig. 4.6 XRD of powders on a Si wafer with pre-fixed Zn:NaCl ratio of (a) 1:1, (b)
10:1, and (c) 1:10.
Table 4.2 Tabulations of experimental results.
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4.3 Conclusions
We successfully obtained ZnO nanostructures by immersing Zn films in NaCl
solution at 170 oC from 3 to 15 hours in hydrothermal conditions. The morphology of
ZnO structure can be tuned by changing the duration of time during heating. Scanning
electron microscopy (SEM) and X-ray diffraction (XRD) indicated that ZnO films
with different morphologies are obtained: from a film with network of circular pores
to a film with nanowire-like network with bigger pores. This is particularly useful in
mesoporous films’ applications. This paper proved that NaCl solution can
simultaneously aid in the oxidation of Zn films while modifying surface
morphologies of resultant ZnO films. Further studies by transmission electron
microscopy (TEM) revealed the existence of an interconnected network through
linking of individual nanowires. Photoluminescence (PL) properties depend on
morphologies resulting from heating durations for the samples. Ultraviolet emission is
observed for all ZnO films. Green emission surfaced after heating for 6 hours, which
subsequently disappeared after 15 hours of heating. It is suggested that the
morphology change over different heating durations led to the rise and subsequent
decline of green emissions. The growth mechanism behind Zn oxidation and
morphology changes here is investigated with the aid of experimental method. To
determine the effect of Zn, Zn powder with varying amount of NaCl is carried out
under hydrothermal conditions. A mixture of ZnCl2, Zn(OH)2 and ZnO obtained
therefore illustrated the importance of nanostructured Zn films in oxidation by
aqueous NaCl solution. It is also found that the model behind pitting corrosion can be
used to describe the morphology change in ZnO films in this chapter.
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4.4 References
1
A. N. Baranov, C. H. Chang, O. A. Shlyakhtin, G. N. Panin, T. W. Kang, and
Y.-J. Oh, Nanotechnol. 15, 1613 (2004).
2
C. P. Fah, J. M. Xue, and J. Wang, J. Am. Ceram. Soc. 85, 273 (2002).
3
A. N. Baranov, G. N. Panin, T. W. Kang, and Y.-J. Oh, Nanotechnol. 16,
1918 (2005).
4
L. Shen, L. Guo, N. Bao, and K. Yanagisawa, Chem. Lett. 32, 826 (2003).
5
C. K. Xu, G. D. Xu, Y. K. Liu, and G. H. Wang, Solid State Commun. 122,
175 (2002).
6
J. Yang, W. Wang, Y. Ma, D. Z. Wang, D. Steeves, B. Kimball, and Z. F. Ren,
Journal of Nanosci. and Nanotechnol. 6, 2196 (2006).
7
M. Mouanga, P. Berçot, and J. Y. Rauch, Corros. Sci. 52, 3984 (2010).
8
Y. S.Tian, C. G. Hu, Y. F. Xiong, B. Y. Wan, C. H. Xia, X. S. He, and H. Liu.
J. Phys. Chem. C 114, 10265–10269 (2010).
9
C. Yan and D. Xue, J. Cryst. Growth 310, 1836 (2008).
10
J. Lim, K. Shin, H. W. Kim, and C. Lee, Mater. Sci. Eng., B 107, 301 (2004).
11
C. Rousseau, F. Baraud, L. Leleyter, and O. Gil, J. Hazard. Mater. 167, 953
(2009).
12
A. K. Neufeld, I. S. Cole, A. M. Bond, and S. A. Furman, Corros. Sci. 44, 555
(2002).
13
C. A. Huang, C. K. Lin, and Y. H. Yeh, Corros. Sci. 52, 1326 (2010).
14
J.-C. Lin, K.-C. Peng, I.-G. Peng, and S.-L. Lee, Thin Solid Films 517, 4777
(2009).
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Chapter 4: Growth of ZnO Nanostructured Films by Zn Films in NaCl Solution
15
Wee Rui Qi
D. A. Jones, Principles and Prevention of Corrosion, Prentice Hall, Second
Edition, Chapter 7, pp 209-215 (2005).
16
M. G. Fontana Corrosion Engineering, McGraw-Hill, New York, Chapter 3,
pp. 66-67 (1987).
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Chapter 5: Chemical Synthesis Using Zinc and Metal Salts with Ammonia
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Chapter 5: Chemical Synthesis Using Zinc and Metal Salts with Ammonia
5.1 Introduction
The introduction of metals such as Group-III elements (B, Al, Ga, In) affects
ZnO morphologies and properties.1-3 Gallium is of interest due to its ease of Ga3+ ions
as a substitution for Zn2+ ions without much lattice distortion. The ionic radius of
Ga3+ (0.62 Å) is smaller than that of Zn2+ (0.74 Å), while the covalent band length of
Ga–O (1.92 Å) is slightly shorter than that of Zn–O (1.97 Å).4,5 Thus, this minimized
the disruption in structure when Zn2+ ions are replaced with Ga3+. Moreover, gallium
is less reactive and more resistive to oxidation, which is an advantage over another
common dopant: aluminum.6,7 Typical methods of gallium doped zinc oxide (GZO)
include sputtering,8 pulsed laser deposition,9 spray pyrolysis,10 thermal evaporation11
using Ga or Ga2O3 as gallium source, while methods involving sol-gel6,12 and
hydrothermal13,14 usually include metal precursors where gallium is provided through
gallium nitrate nonahydrate and gallium chloride.
Chemical methods provided an easy and cheap synthesis method to obtain
GZO. They can easily be scaled up for large-area production. There are several
studies involving sol-gel or spin coating methods but they involved repetitive steps
and small amount of Ga in their synthesis process.12,15,16 Till date, there are few
reports in obtaining GZO via hydrothermal methods. In Ramalingam et al, seeded
layer of GZO thin films was first prepared by spin coating in presence of a polymer.
The films were then allowed to grow in Teflon container with Zn(CH3CO2)2 and
Ga(NO3)3·xH2O at 90 oC for 15 hours.17 In Cimitan et al, solution with Zn(CH3CO2)2
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and Ga(NO3)3·xH2O were heated to 150 oC where pressure is maintained at 2 bar for
15 min before lowering to room temperature.1 However, ZnGa2O4 is usually
synthesized when large amount of Ga is used instead.18-20 As ammonia is commonly
used to form a complex with Zn precursors for ZnO synthesis, it is proposed that
GZO can be obtained by this method even with large amount of Ga.21,22 It is hoped
that interesting morphologies and properties will be obtained as well.
As the effect of each parameter is specific to each experimental condition, it
will be prudent to study conditions in detail before examining the effect of adding
metal elements which is the focus in later part of the study. In the first part of this
study, ZnO is synthesized with three different substrates and heating durations.
Silicon, glass and ZnO-seeded glass substrates are chosen as they are conventional
substrates used for study. The aim is to allow a better understanding of ZnO synthesis.
This detailed study will pave the way for second part of the study where effect of Ga
is expected to influence the synthesis of ZnO significantly. In the second part of study,
we seek to obtain Ga incorporated ZnO. GZO with Ga introduced. In both studies, the
structural, morphological and optical properties are characterized for the assynthesized powders.
5.2 Results and Discussion
In the first part of study, zinc acetate Zn(CH3CO2)2 was first mixed in 0.03
dm3 of deionized (DI) water. The mass of zinc acetate was fixed at 0.165 g. The
solution was stirred quickly till fully dissolved after adding 1 mL of ammonia (24
wt %). It was then transferred carefully into a Teflon container with capacity of 45
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mL before heating at 60 oC for 4-24 hours, after which it was left to cool at room
temperature for 1 hour before removing the substrates. The substrates were then
gently rinsed with DI water and dried with N2. Substrates introduced during synthesis
are cleaned silicon, glass and ZnO-seed glass obtained by sputtering at 60 W for 3
hours.
In the second part of the study, the heating duration was fixed at 4 hours.
Gallium nitrate Ga(NO3)3.xH2O was added in the precursor solution. The mass of
Zn(CH3CO2)2 was fixed at 0.165 g while mass for Ga(NO3)3.xH2O was determined
by the different molar ratio to be examined in this study. The synthesis method was
repeated as previous. In addition, the powder was dried before annealing in air at 150
o
C for 1 hour. The molar ratio under study was 0, 10, 20, 30, 40 and 50 at % of Ga in
comparison to amount of Zn in zinc acetate added, which was fixed.
X-ray diffraction (XRD) was performed on the samples with CuKα1 radiation
to determine the phases while scanning electron microscopy (SEM) was carried out to
examine morphology of the films. In XRD, the following JCPDS cards were used:
36-1451 (ZnO), 20-1435 (Zn(OH)2), 50-0448 (ZnGa2O), 44-1349 (SiO2), and 271402 (Si). High resolution transmission electron spectroscopy (HR-TEM) was carried
out to determine the particle structure on the film. A photoluminescence (PL) system
with laser excitation of 325 nm with power of 10 mW and laser spot 1 mm was used
to examine light emitting properties at room temperature.
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5.2.1 Synthesis of ZnO and its Properties
5.2.1.1 Synthesis of ZnO by Sputtering
The properties of ZnO-seeded glass are examined with XRD, SEM and PL.
Fig. 5.1(a)-(c) give data obtained for ZnO-seeded glass heated for 4 hours. In addition,
the cross-sectional SEM for ZnO-seeded glass heated for 24 hours is given in Fig.
5.1(d) as the image taken for 4 hours was not clear. From Fig. 5.1(d), vertically
upright nanorods with diameter 100-200 nm and height of 3.5-4 mm were observed.
The peaks positions in the XRD pattern were identified to be ZnO. The SEM image
showed that the film consisted of fine particles with ~100 nm as diameter. In its PL
spectrum, there is a strong ultraviolet (UV) emission peak at 2.99 eV which is
attributed to excitonic recombination of the near-band-edge emission.23 The strong
intensity suggested that the ZnO obtained by sputtering is of good crystal quality.
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Fig. 5.1 (a) XRD pattern, (b) SEM image, (c) PL spectrum for ZnO-seeded glass
substrates heated for 4 hours, and (d) cross-sectional SEM image for ZnO-seeded
glass substrate heated for 24 hours.
5.2.1.2 Synthesis of ZnO on Different Substrates
The as-synthesized powders after hydrothermal method were characterized
with XRD, SEM and PL. Other than looking into the effect of substrates, samples
with 4 and 24 hours of heating were chosen to examine the effect of heating duration.
To examine the structure, XRD was done on the samples after hydrothermal
conditions. XRD spectra of the three substrates at 4 hours were given in Fig. 5.2. The
evolving of multiple peaks to (002) peak clearly indicated that ZnO with preferred
[002] orientation were formed when ZnO-seeded glasses were used, regardless of the
synthesis time. When other substrates were used, the structure remained
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polycrystalline with different crystal orientations. This confirmed that a seeded layer
of ZnO was required to induce growth of highly oriented ZnO.
Fig. 5.2 XRD patterns of ZnO growing on (a) ZnO-seeded glass, (b) glass, (c) silicon
substrates for 4 hours.
SEM was carried out on the samples for the morphological features. Fig. 5.3(a)
revealed the formation of vertically upright ZnO nanorods on ZnO-seeded glass
substrates where they were about ~100-200 nm in diameter. The nanorods obtained in
4 hours were ~2.5-3 mm and tapered. An obvious change in morphology occurred
when glass and silicon substrate were used. In Figs. 5.3(b)-(c), rods with diameter ~11.5 mm were formed with 4 hours of heating for both Si and glass substrates. The
rods were arranged in a floral pattern whereby the height of each rod was ~10-12 mm.
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As there were growth on both silicon and glass substrates, there was doubt whether
precipitation actually occurred and deposited on top of the substrates. However, rods
in floral arrangement were observed at side of the substrate when cross sectional
SEM was done. This proved that the existence of strong adhesion of the rods to the
substrates. It also clearly demonstrated the direct growth of ZnO on bare silicon and
glass substrates by aqueous method, whereby it was usually obtained by methods
such as pulsed laser deposition and thermal evaporation.24-26 In addition, cross
sectional SEM was made on the samples to give indication on controlling thickness
with time. Other than ZnO-seeded glass substrates, it appeared that the substrates did
not have much significant role in affecting morphologies.
Fig. 5.3 SEM images of ZnO growing on (a) ZnO-seeded glass, (b) glass, (c) silicon
substrates for 4 hours.
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PL spectroscopy was carried out on the samples in Fig. 5.4. All samples displayed
diminished UV emissions at ~3.1 eV but strong green emissions at ~2.10 eV
comparatively. It appeared that there was a substrate effect on the optical properties
as there was a slight hump at ~3.1 eV when glass substrate is used instead of ZnOseed glass substrate. However, it was later found out that the emission from glass
substrate itself though it was unclear what caused its emissions at that wavelength.
The strong green emissions proved that plenty of defects were introduced during
hydrothermal synthesis. Similarly, the substrates did not affect optical properties for
ZnO.
Fig. 5.4 PL spectra of ZnO grown on (a) ZnO-seed glass, (b) glass, (c) silicon
substrates for 4 hours.
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5.2.1.3 Synthesis of ZnO on Bare Silicon Substrates for 4 to 24 hours
Fig. 5.5 gave the XRD spectra of as-synthesized powders on silicon substrates
heated from 4 to 24 hours. There was no distinct change in structure as the peak
positions and intensities remained the same.
Fig. 5.5 XRD patterns of ZnO grown on silicon substrates for (a) 4, (b) 8, (c) 12, and
(d) 24 hours.
Morphologies of the as-synthesized powders grown on silicon substrates were
examined in Figs. 5.6(a)-(d). The rods with diameter ~1-1.5 mm and in floral
arrangement were seen for all heating durations, further verifying the lack of
structural change with heating durations. Cross sectional SEM was done on the
samples to give indication on controlling thickness with time. It was assumed that
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ZnO growth on silicon and glass substrates was similar since the substrates did not
appear to play a significant role in morphology. Fig. 5.6(e) showed that though the
thickness increased with heating duration, its growth rate decreased substantially after
8 hours of heating. This further verified that increasing heating time served to
increase thickness, and would not alter the morphology and structure much. Similarly,
the PL spectra (Fig. 5.7) showed similarities amongst all samples. It appeared if that
defects introduced were uniformed regardless of heating durations as all spectra
spotted high green emissions. It therefore suggests that the film thickness of assynthesized powder can be tuned with heating durations from 4 to 24 hours.
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Fig. 5.6 SEM of ZnO grown on silicon substrates for (a) 4, (b) 8, (c) 12, (d) 24 hours,
and (e) Plot of ZnO film thickness to heating duration.
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Fig. 5.7 PL spectra of ZnO grown on silicon substrates for (a) 4, (b) 8, (c) 12, and (d)
24 hours.
5.2.2 Structural Properties and Composition of Ga Incorporated ZnO
XRD was performed on the as-synthesized Ga incorporated ZnO (GZO)
powders for structural characterization. The initial and finals molar ratios of Ga:Zn
refer to those in the initial precursor solution and the synthesized GZO powder,
respectively. In Fig. 5.8, ZnO peaks were observed in XRD patterns for samples with
starting Ga:Zn molar ratios of 0, 10 and 20 at %, while ZnGa2O4 and ZnO peaks were
observed in initial Ga:Zn molar ratios of 30, 40 and 50 at %. The peak positions
marked in blue belong to the silicon substrate where GZO was deposited on. To give
an understanding on elemental composition after being synthesized, the starting and
final Ga:Zn molar ratio was plotted in Fig. 5.9. The final Ga:Zn molar ratio remained
similar even though its starting Ga:Zn molar ratio increased from 10 to 20 at %.
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However, more Ga is found in synthesized GZO powder than that in the original
precursor, for samples with Ga:Zn initial ratio equal and greater than 30 at %.
Fig. 5.8 XRD patterns of as-synthesized GZO powder with (a) 0, (b) 10, (c) 20, (d) 30,
(e) 40, and (f) 50 at % of Ga:Zn ratio in the starting precursors.
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Fig. 5.9 ICP of as-synthesized powder with (a) 10, (b) 20, (c) 30, (d) 40, and (e) 50 at %
of Ga:Zn in the starting precursors.
It was obvious that the major transition in structural change occurred between
20 and 30 at % of Ga/Zn. The transition in structure was further proven in Fig. 5.9 by
ICP where an abrupt decrease in Ga:Zn molar ratio of as-synthesized powder was
observed between 20 and 30 at % of Ga/Zn in its starting powder. It is evident that
certain degree of ionic substitution has taken place. Before this structural transition,
Ga doping was present in ZnO due to the minute change in the final Ga:Zn molar
ratio. However, doping ceased after this structural transition as there were substantial
amount of Zn and Ga present.
It was remarkable that ZnO structure was maintained with the introduction of
relatively large amount of Ga as less than 5 at % of Ga/Zn was known to be able to
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cause the formation of ZnGa2O4.27 In this study, doping of Ga in ZnO was sustained
at 20 at % Ga. During synthesis, Ga and Zn precursors were well-mixed in asprepared solution. It was likely for Ga to be embedded as it was well known for ZnNH3 complex to form with Zn precursors and ammonia.23,28 As heating progressed,
ZnO formed together with Ga trapped within its structure. This could explain the
relatively high amount of Ga doped in ZnO before structural transition to ZnGa2O4.
From Figs. 5.8(d)-(f), it appeared that either ZnGa2O4 or Ga2O3 could form
with 30 to 50 at % Ga due to their peak positions being uncannily close to each other.
However, it is more likely for ZnGa2O4 to form in this study due to the large amount
of Zn present when characterized by ICP. This was also observed in Hirano’s work
where ZnGa2O4 was synthesized when Ga:Zn molar ratio was 0.47 to 0.61 after
converting from the given ZnO/Ga2O3 ratio.19 From this study, it was found that the
annealing temperature of 150 oC was able to eliminate hydroxide peaks due to
Zn(OH)2. Therefore, it was also reasonable to rule out Ga(OH)3 even though it shares
a peak position at ~76.4 o.
5.2.3 Influence of Ga on Morphology
The morphology of the as-synthesized powder was examined with SEM in Fig.
5.10. Without any Ga introduction, rods with diameter 1-1.5 µm and length 10-12 µm
were grown and arranged in a neat floral arrangement. The atomic % Ga stated is
defined as the amount of Ga in the initial precursor solution. With 10 at % Ga,
hexagonal discs littered with vertically protruding spike-like rods are formed. Fig.
5.10(b) indicates that the diameter and thickness of hexagonal discs were ~7 µm and
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~0.4 µm respectively, while the length of its rods was ~0.7 µm. When amount of Ga
was increased to 20 at %, there was an obvious lack of rod formation though some
sites featured very short snubs which could be due to the initial growth of the rods.
The diameter of hexagonal discs diminished to ~4.5 µm though the morphology
retained. Its thickness also decreased to ~0.2 µm. Upon further increase of Ga to 30
at %, a continuous network of hexagonal discs appeared whereby the outline was less
distinctive. Moreover, the vertically protruding rods disappeared entirely. This
morphology was repeated for 40 at % and 50 at % Ga.
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Fig. 5.10 SEM images of as-synthesized powder with (a) 0, (b) 10, (c) 20, (d) 30, (e)
40, and (f) 50 at % Ga at the start.
The formation of hexagonal discs with vertically protruding rods is a unique
morphology. The study showed that 10 at % Ga was the only combination that
promoted this distinctive morphology. Upon further increase in Ga addition, the
change in dimensions and morphologies were obtained. This was previously not
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reported as only bare hexagonal features in ZnO have been disclosed.29-32 This
marked the first time that vertical rods grown on hexagonal discs were observed.
Since the vertical rods on hexagonal discs can promote a larger surface area, it is
likely that it would boost its potential as photocatalyst or gas-sensors.
5.2.4 Influence of Ga in ZnO on Optical Properties
The PL spectra were used to examine the optical properties of the assynthesized powder in Fig. 5.11. From Fig. 5.11(a), distinct peaks at UV and green
emissions are observed. These are attributed to be band-edge and defect-related
respectively.23 However, the PL spectra in Figs. 5.11(b)-(f) exhibited an emission
over a broad range of wavelengths. The distinct change in PL spectra once 10 at %
Ga was added in, was testimony to effect of Ga in ZnO properties. In GZO, the
visible emission centers shifted to shorter wavelengths from 2.11 to 2.57 eV with 0,
10 and 20 at % Ga, suggesting that the Ga dopants contributed to the defects in ZnO.5
With ZnGa2O4, blue emissions emerged as well though they were blue-shifted
drastically to 2.66-2.73 eV. It is obvious that emissions were not due to the band gap
as band gap of ZnGa2O4 is ~5 eV.33 The addition of Ga contributed to defects in
ZnGa2O4, which gave rise to visible emissions. This was verified by Kim et al
whereby blue emissions were due to the regular Ga-O octahedron which allowed
charge transfer between Ga3+ and Zn2+ to take place.34,35 It was reasonable for
distortion to incur due to shift in Ga:Zn molar ratio, causing minor shift in visible
emission.
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Fig. 5.11 PL spectra of as-synthesized GZO powders with (a) 0, (b) 10, (c) 20, (d) 30,
(e) 40, and (f) 50 at % Ga at the start.
5.2.5 Influence of Ga on GZO Growth Mechanism
It was of interest on the powder with 10 at % Ga at the start as it was the lone
sample with hexagonal discs littered with vertically protruding spike-like rods. It was
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suspected that a delicate balance between Zn and Ga resulted in the growth of this
morphology. To shed light on its formation at this elemental composition, elemental
mapping by SEM on resultant powder by 10 at % Ga was done. Specific
compositions at various sections were calculated in Fig. 5.12(a). It was clear that
different sites showed different elemental composition. The molar ratio of Ga:Zn was
0.52 at position 1 where the surface of hexagonal discs was bare. This decreased
sharply on the hexagonal discs with vertically outright rods, whereby the ratio was
0.19 on the disc while it was 0.09 on its rods. Elemental mapping by SEM in Figs.
5.12(b)-(d) displayed the elemental distribution in a section of the as-synthesized
powder. The rods grown on hexagonal discs contained more Zn than the discs
themselves. Ga was concentrated in bare hexagonal discs. This accounted for Ga in
final Ga:Zn molar ratio of 0.114 in the as-synthesized powder.
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Fig. 5.12 SEM mapping of (a) electron image, (b) Zn, (c) Ga, and (d) O at one section
of as-synthesized powder with 10 at % Ga at the start.
It was initially expected that these sites would have less elemental distribution
of Zn in the rods compared to its surrounding due to presence of space between the
rods. Since the opposite occurred, this hereby confirmed that zinc was concentrated in
the rods grown on hexagonal discs. In addition, the high concentration of Ga in
hexagonal discs suggested that Ga could act as a catalyst for secondary growth of
ZnO nanorods from its surface. This has been observed in growth of Ga2O3
nanowires where Ga behaved as catalyst.36 This proved that it was possible for Ga to
encourage growth of vertical rods.
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TEM characterization is carried out in Fig. 5.13 on as-synthesized powder
with 10 % Ga at the start. At low magnification, it is found that the hexagonal disc
was made of single crystal with a lattice spacing of d = 0.279 nm which corresponded
to ZnO (100). The diameter of this disc was smaller than measured in Fig. 5.10(b),
which was reasonable as there would be small deviations in particle size. Upon higher
magnification in Figs. 5.13(c)-(d) whereby the focus was on the edge of the
hexagonal disc, areas with dislocations were observed. This suggested that the assynthesized powder contained plenty of strain. Its lattice spacing of d = 0.278 nm
further confirmed the presence of ZnO. However, it was discovered from SAED in
Fig. 5.13(d) that the hexagonal discs actually consisted of polycrystalline ZnO as well.
It is postulated that these signals were due to the vertical upright rods grown from the
disc surface, where they positioned in such a way that TEM could not detect their
presence. Another possibility is that the polycrystalline characteristics were due to
detached rods since their presence were observed from SEM in Fig. 5.10(b). The rods
were free to stick on the disc surface without any orientation, thus contributing to the
polycrystalline nature in SAED. Since strain was present in the hexagonal disc, it is
postulated that strain caused a secondary growth where the rods grew from the
hexagonal discs after primary growth of the discs was completed.
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Fig. 5.13 (a) TEM, (b) SAED of TEM, (c) HRTEM, and (d) SAED of HRTEM for
as-synthesized powder with 10 at % of Ga/Zn at the start.
The presence of dislocations is not sufficient to prove that its responsibility
for the morphology in the samples since strain presence is common in many materials.
Moreover, substrate clearly did not contribute to strain here since the as-synthesized
powder were deposited onto the silicon substrates rather than grown directly on
them.37 To further verify the effect by strain, an additional study with XRD with step
size of 0.0025 o was carried out on as-synthesized powder with 0, 10 and 20 at % Ga
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at the start in Figs. 5.14 (a)-(c). The samples were chosen since it was thought that
structural transition occurred between 20 and 30 at % Ga. The peak positions at ~31.8
o
, ~34.5 o and ~36.3 o verified that ZnO was indeed present in all these samples. By
comparing the original signals with respect to the substrate signal of 33.08 o in 0 at %
Ga, the shifted signals in 10 % and 20 % Ga powders were marked in red. Using ZnO
(100) as an example, its peak position increased gradually from 31.88 o, 31.89 o and
then to 31.91 o with Ga increase. Therefore, strain such as dislocations, was the origin
behind lattice shrinkage. As dislocations were detected from XRD study, it was
possible for them to contribute to luminescent properties of the as-synthesized
powders.38
Fig. 5.14 XRD patterns of as-synthesized powders with (a) 0, (b) 10, (c) 20 at % Ga,
and (d) Williamson-Hall Plot for as-synthesized GZO powder with 10 at % Ga/Zn at
the start.
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As explained previously, the ionic radius of Ga3+ is similar than Zn2+ ions
4,5
.
This facilitated the easy substitution of Zn with Ga and vice versa. As amount of Ga
introduced at the start increased, there will be more Ga to replace Zn in the structure.
Since ionic radius of Ga3+ is slightly smaller than Zn2+ ions, this explained the
subsequent lattice shrinkage.
A further illustration on presence of strain was done by tabulating the
Williamson-Hall (WH) plot for powder with 10% Ga at the start in Fig. 5.14(d). The
WH plot featured a relationship between Bragg angles θB with strain ε and crystallite
size via a quadratic equation. The average size and strain can be calculated from the
fitted linear line when the WH plot is based on Equation 5.1 where β, θB, t, and ε
represent full width at half maximum (FWHM) of the XRD peak, Bragg’s angle,
wavelength of X-ray (0.154056 nm), average particle size (diameter), and strain,
respectively. In the equation, slope gives 4ε while its intercept is related to average
particle size t.39,40
𝛽 cos θ𝐵 =
0.9 𝜆
𝑡
+ 4𝜀 sinθ𝐵
(5.1)
Clearly, there is no linear relationship in the WH plot in Fig. 5.14(d). The
obtained slope was therefore not related to strain ε. It was expected as the WH plot
was based on an assumption of isotropic strain.41 Hexagonal discs with vertically
protruded rods were present, indicating that this assumption probably did not hold.
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Wee Rui Qi
However, it can be concluded that there was indeed strain ε as there was an upward
trend from the plot.
5.3 Conclusions
For the first part of study in this chapter, a growth of ZnO was demonstrated
directly on substrates comprising of silicon, glass and ZnO-seeded glass substrates.
Rods in floral arrangement were obtained on silicon and glass substrates while
vertically upright nanorods were obtained for the ZnO-seeded substrates. It was also
demonstrated that direct growth of ZnO occurred on bare silicon and glass substrates
by aqueous method, whereby it was usually obtained by methods such as pulsed laser
deposition and thermal evaporation. Other than ZnO-seeded glass substrates, it
appeared that the substrates did not have much significant role in affecting
morphologies. All as-synthesized powder displayed diminished UV emissions at ~3.1
eV but strong green emissions at ~2.10 eV comparatively. Similarly, the substrates
did not affect optical properties for ZnO. It was verified that the thickness of assynthesized powder film can be tuned with heating durations from 4 to 24 hours.
In the second part of study, GZO and ZnGa2O4 were prepared by
hydrothermal
method
with
zinc
acetate
Zn(CH3CO2)2,
gallium
nitrate
Ga(NO3)3.xH2O and ammonia. Characterization was made with XRD, SEM, TEM
and PL. The atomic % of Ga/Zn stated is defined as the amount of Ga in the initial
precursor solution. It is found that GZO is obtained when 10 and 20 at % of Ga was
added in, while ZnGa2O4 is obtained with 30 to 50 at % of Ga introduced. The
amount of Ga used for GZO is much larger than typical chemical methods in which
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Chapter 5: Chemical Synthesis Using Zinc and Metal Salts with Ammonia
Wee Rui Qi
GZO can only tolerate less than 10 at % Ga. The influence of Ga on ZnO morphology
is found. Without any Ga introduction, rods with diameter 1-1.5 µm and length 10-12
µm were grown and arranged in a neat floral arrangement. With 10 at % Ga,
hexagonal discs littered with vertically protruding spike-like rods were formed. This
is a unique morphology which has not yet been reported, and only bare hexagonal
features in ZnO have been reported. Thus, this provides potential as photocatalyst or
gas-sensors since the vertical rods on hexagonal disc promoted a larger surface area.
It is probable for Ga to encourage secondary growth of vertical rods where elemental
mapping by SEM showed large amount of Ga in the hexagonal discs. When amount
of Ga is increased to 20 at %, there is an obvious lack of rod formation though some
sites feature very short snubs which can be due to the initial growth of the rods. It is
proven with detailed XRD and Williamson-Hall Plot that lattice shrinkage due to
ionic substitution occurred during doping.
With further increase of Ga to 30 at %, a continuous network of hexagonal
discs appeared whereby the outline was less distinctive. Moreover, the vertically
protruding rods disappeared entirely. This morphology was repeated for 40 at % and
50 at % Ga. The influence of Ga in optical properties in ZnO is also apparent. PL
spectra showed that the visible emission centers shifted to shorter wavelengths from
2.11 to 2.57 eV with 0, 10 and 20 at % Ga in GZO, suggesting that the Ga dopants
contributed to the defects in ZnO. With ZnGa2O4, blue emissions emerged as well
though they were blue-shifted drastically to 2.66-2.73 eV.
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5.4 References
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J. Kobayashi, N. Ohashi, H. Sekiwa, I. Sakaguchi, M. Miyamoto, Y. Wada, Y.
Adachi, K. Matsumoto, and H. Haneda, J. Cryst. Growth 311, 4408 (2009).
3
M. Izakia, and J. Katayama, J. Electrochem. Soc. 147, 1, 210 (2000).
4
V. Assunção, E. Fortunato, A. Marques, A. Gonçalves, I. Ferreira, H. Águas, and R.
Martins, Thin Solid Films 442, 102 (2003).
5
C.-Y. Tsay, C.-W. Wu, C.-M. Lei, F.-S. Chen, and C.-K. Lin, Thin Solid Films 519,
1516 (2010).
6
A. Kalaivanan, S. Perumal, N. Neelakanda Pillai, and K. R. Murali, Mater. Sci.
Semicond. Process. 14, 94 (2011).
7
F. Wu, L. Fang, Y. J. Pan, K. Zhou, Q. L. Huang, and C. Y. Kong, Physica E 43, 228
(2010).
8
P. K. Song, M. Watanabe, M. Kon, A. Mitsui, Y.Shigesato, Thin Solid Films 411, 82
(2002).
9
M. Yan, H. T. Zhang, E. J. Widjaja, and R. P. H. Chang, J. Appl. Phys. 94, 5240
(2003).
10
K. T. R. Reddy, H. Gopalaswamy, P. J. Reddy, R.W. Miles, J. Cryst. Growth 210
516 (2000).
11
S. Y. Bae, C. W. Na, J. H. Kang, J. Park, J. Phys. Chem. B 109, 2526 (2005).
12
V. Fathollahi and M. Mohammadpour Amini, Mater. Lett. 50, 235 (2001).
13
H. Q. Le, S. K. Lim, G. K. L. Goh, S. J. Chua, and J. Ong, J. Electrochem. Soc. 157,
H796 (2010).
14
H. Wang, S. Baek, J. Song, J. Lee, and S. Lim, Nanotechnol. 19, 075607 (2008).
15
G. K. Paul and S. K. Sen, Mater. Lett. 57, 742 (2002).
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16
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P. K. Nayak, J. Kim, S. Chung, J. Jeong, C. Lee, and Y. Hong, J. Phys. D: Appl. Phys.
42, 139801 (2009).
17
R. Jothi Ramalingam and G. S. Chung, Mater. Lett. 68, 247 (2012).
18
D. P. Dutta, R. Ghildiyal, and A. K. Tyagi, J. Phys. Chem. C 113, 16954 (2009).
19
M. Hirano, J. Mater. Chem. 10, 469 (2000).
20
Y.-H. Zheng, C.-Q. Chen, Y.-Y, Zhan, X.-Y, Lin, Q. Zheng, K.-M. Wei, J.-F. Zhu,
and Y.-J. Zhu, Inorg. Chem. 46, 16 (2007)
21
Q. Ahsanulhaq, A. Umar, and Y. B. Hahn, Nanotechnol. 18, 115603 (2007).
22
K. Yu, Z. Jin, X. Liu, J. Zhao, and J. Feng, Appl. Surf. Sci. 253, 4072 (2007).
23
L. Wu, Y. Wu, X. Pan, and F. Kong, Opt. Mater. 28, 418 (2006).
24
L. Feng, A. Liu, M. Liu, Y. Ma, J. Wei, and B. Man, J. Alloys Compd. 492, 427
(2010).
25
Y. Sun, G. M. Fuge, and M. N. R. Ashfold, Chem. Phys. Lett. 396, 21 (2004).
26
H. I. Abdulgafour, F. K.Yam, Z. Hassan, K. Al-Heuseen, and M. J. Jawad, J. Alloys
Compd. 509, 5627 (2011).
27
A. de Souza Gonçalves, S. Antonio Marques de Lima, M. Rosaly Davolos, S.
Gutierrez Antônio, and C. de Oliveira Paiva-Santos, J. Solid State Chem. 179, 1330
(2006).
28
A. Wei, X. W. Sun, C. X. Xu, Z. L. Dong, M. B. Yu, and W. Huang, Appl. Phys. Lett.
88, 213102 (2006).
29
X L. Cao, H. B. Zeng, M. Wang, X. J. Xu, M. Fang, S. l. Ji, L. D. Zhang, J. Phys.
Chem. C, 112, 14 (2008).
30
R. C. Pawar, J. S. Shaikh, A. A. Babar, P. M. Dhere, and P. S. Patil, Sol. Energy 85,
1119 (2011).
31
D. J. Gargas, M. C. Moore, A. Ni, S.-W. Chang, Z. Y. Zhang, S.-L. Chuang, P. D.
Yang, ACS Nano 4, 6.
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M. Wang, S. H. Hahn, J. S. Kim, J. S. Chung, E. J. Kim, and K.-K. Koo, J. Cryst.
Growth 310, 1213 (2008).
33
T. Omata, N. Ueda, K. Ueda, and H. Kawazoe, Appl. Phys. Lett. 64, 1077 (1994).
34
J. S. Kim, H. I. Kang, W. N. Kim, J. I. Kim, J. C. Choi, H. L. Park, G. C. Kim, T. W.
Kim, Y. H. Hwang, S. I. Mho, M. C. Jung, and M. Han, Appl. Phys. Lett. 82, 2029
(2003).
35
J. S. Kim, H. L. Park, C. M. Chon, H. S. Moon, and T. W. Kim, Solid State Commun.
129, 163 (2004).
36
L. Xu, Y. Su, Q. T. Zhou, S. Li, Y. Q. Chen, Y. Feng, Cryst. Growth Des. 7, 4 (2007).
37
R. Ghosh, D. Basak, and S. Fujihara, J. Appl. Phys. 96, 2689 (2004).
38
A. Stroud and J. H. You, J. Cryst. Growth 340, 92 (2012).
39
P. K. Giri, S. Bhattacharyya, D. K. Singh, R. Kesavamoorthy, B. K. Panigrahi, and K.
G. M. Nair, J. Appl. Phys. 102, 093515 (2007).
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G. K. Williamson and W. H. Hall, Acta Metall. 1, (1953).
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Chapter 6: Conclusions and Future Work
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Chapter 6: Conclusions and Future Work
6.1 Conclusions
Zinc oxide (ZnO) is a promising candidate for many applications.
Nanostructured ZnO has been gaining a strong foothold as they vastly improve ZnO
properties. In this project, nanostructured ZnO and its related compounds are
synthesized
with
sputtering,
furnace
and
hydrothermal
methods.
Sample
characterization is performed with X-ray diffraction (XRD), scanning electron
microscopy (SEM), transmission electron microscopy (TEM), Photoluminescence
(PL), and Vibrating sample magnetometry (VSM). The film thickness is estimated
with a surface profilometer. The results are presented in Chapters 3-5.
Chapter 3 determines if black ZnO (pure ZnO) exists while investigating
properties of the resultant annealed zinc films. Zinc (Zn) films underwent annealing
at various conditions. The ratios of ZnO (101)/Zn (101) peak intensities of 2:6, 2:6,
7:4 and 5:0 are attained for ZnO films at annealing conditions of 100 oC for 15 h, 200
o
C for 214 h and 400 oC for 6 h respectively. Visual inspection and XRD spectra
showed presence of Zn in black ZnO films. The black appearance disappeared when
the film no longer contained metallic Zn particles. This demonstrates that black ZnO
made purely from ZnO does not exist, clarifying our doubt on the literature claimed
black ZnO film.
The influence of annealing and Zn are also studied. Elongated and irregularshaped particles are obtained and can be transformed into spherical particles after
ZnO films are annealed at 400 oC for 6 h. A layer of oxide is found at its film’s metalair interface, and the presence of a Zn/ZnO layered structure is found. The effect of
114
Chapter 6: Conclusions and Future Work
Wee Rui Qi
annealing is found not only confined to the morphology and structure but also ZnO
properties. The enhanced ultraviolet (UV) emission in ZnO films is found and
attributed to a low annealing, which is useful for applications that cannot withstand
high temperatures. Reverting back to the effect of Zn on ZnO, Zn is capable of
enhancing UV emissions and is also suggested that Zn is responsible for
ferromagnetism in annealed Zn films.
Chapter 4 reports the successful synthesis of ZnO by a new method with
aqueous sodium chloride. ZnO nanostructures are successfully obtained by
immersing zinc films in sodium chloride (NaCl) solution at 170 oC from 3 to 15 hours
in hydrothermal conditions. This is a novel method in obtaining ZnO nanostructures
as a reduced amount of sodium chloride is sufficed for oxidation of Zn. The
morphology of ZnO structure is tuned by changing the duration of time during
heating. SEM and XRD indicated that ZnO films with different morphologies are
obtained: from a film with network of circular pores to a film with nanowire-like
network with bigger pores. This has potential as mesoporous films. At the same time,
NaCl solution can simultaneously oxidized Zn films. Further studies by TEM
revealed the existence of an interconnected network through linking of individual
nanowires. From PL, UV emission is observed for all ZnO films. Green emission
surfaced after heating for 6 hours, which subsequently disappeared after 15 hours of
heating. It is suggested that the morphology change over different heating durations
led to the rise and subsequent decline of green emissions as ZnO films are already
obtained within 3 hours of heating.
To determine the effect of Zn, Zn powder with varying amount of NaCl is
carried out under hydrothermal conditions. A mixture of ZnCl2, Zn(OH)2 and ZnO
115
Chapter 6: Conclusions and Future Work
Wee Rui Qi
obtained therefore illustrated the importance of nanostructured Zn films in oxidation
by aqueous NaCl solution. The model behind pitting corrosion is found to be
responsible for nanostructured ZnO films in this study.
Chapter 5 examines the effect of substrates, heating durations and Ga addition
on ZnO by hydrothermal methods. For the first part of study, growth of ZnO was
demonstrated directly on substrates comprising of silicon, glass and ZnO-seeded glass
substrates. Rods in floral arrangement were obtained on silicon and glass substrates
while vertically upright nanorods were obtained for the ZnO-seeded substrates. It
was also demonstrated that direct growth of ZnO occurred on bare silicon and glass
substrates by aqueous method whereby a seeded layer of ZnO is usually required.
However, it appeared that the substrates did not have much significant role in
affecting morphologies or optical properties. All as-synthesized powder displayed
diminished UV emissions at ~3.1 eV but strong green emissions at ~2.10 eV
comparatively. It was confirmed that thickness of as-synthesized powder can be tuned
with heating durations from 4 to 24 hours.
In the second part of study, GZO and ZnGa2O4 were prepared by
hydrothermal
method
with
zinc
acetate
Zn(CH3CO2)2,
gallium
nitrate
Ga(NO3)3.xH2O and ammonia. The atomic % Ga stated is defined as the amount of
Ga in the initial precursor solution. It is found that GZO is obtained when 10 and 20
at % of Ga was added in, while ZnGa2O4 is obtained with 30 to 50 at % of Ga
introduced. The amount of Ga used for GZO is much larger than typical chemical
methods as usually GZO can only tolerate less than 10 at % Ga. The influence of Ga
on ZnO morphology is apparent. Without any Ga introduction, rods with diameter 11.5 µm and length 10-12 µm were grown and arranged in a neat floral arrangement.
116
Chapter 6: Conclusions and Future Work
Wee Rui Qi
With 10 at % Ga, hexagonal discs littered with vertically protruding spike-like rods
were formed. This is a unique morphology which has not yet been reported. This
provides tremendous potential as photocatalyst or gas-sensors since the vertical rods
on hexagonal disc promoted a larger surface area. It is probable for Ga to encourage
secondary growth of vertical rods where elemental mapping by SEM showed large
amount of Ga in the hexagonal discs. When amount of Ga is increased to 20 at %,
there is an obvious lack of rod formation though some sites feature very short snubs
which can be due to the initial growth of the rods. It is proven with detailed XRD and
Williamson-Hall Plot that lattice shrinkage due to ionic substitution occurred during
doping of Ga.
With further increase of Ga to 30 at %, a continuous network of hexagonal
discs appeared whereby the outline was less distinctive. Moreover, the vertically
protruding rods disappeared entirely. This morphology was repeated for 40 at % and
50 at % Ga. The influence of Ga in optical properties in ZnO is also apparent. PL
spectra showed that the visible emission centers shifted to shorter wavelengths from
2.11 to 2.57 eV with 0, 10 and 20 at % Ga in GZO, suggesting that the Ga dopants
contributed to the defects in ZnO. With ZnGa2O4, blue emissions emerged as well
though they were blue-shifted drastically to 2.66-2.73 eV.
In summary, nanostructured ZnO particles and films are found achievable by
using different ways in this research work. Structural, optical and magnetic properties
of these nanostructures and films are studied, and interesting results are obtained,
analyzed and discussed. A better understanding of the formation and properties of
nanostructured ZnO is achieved.
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Chapter 6: Conclusions and Future Work
Wee Rui Qi
6.2 Future Work
The challenges regarding nanostructured ZnO were identified and addressed.
It has facilitated important information on the origins of black ZnO, executed the
relevance of aqueous NaCl solution, as well as explored synthesis parameters to
influence ZnO nanostructures. These studies have sprouted interesting ideas towards
nanostructured ZnO, and provided room for further investigations. For instance, it is
worthwhile to study the effect of a mixture of aqueous NaCl and Ga salts on synthesis
and properties of nanostructured ZnO as it has been achieved separately in Chapters 4
and 5. However, this will be left to the other group members to explore this prospect.
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[...]... Illustration of VSM…………………………………………………… …43 Fig 3.1 XRD spectra of films under different conditions of (a) Zn film before annealing, (b) ZnO films after annealed at 100 oC for 15 h, (c) 200 oC for 214 h, and (d) 400 oC for 6 h…………………………………………………………………….50 x Fig 3.2 Morphology and visual appearances (insets) of ZnO films under different conditions with (a) SEM of Zn film before annealing, (b) SEM of ZnO films. .. types of substrates can affect ZnO morphology though the number of studies done are very sparse.15 1.1.2.2 Sol-Gel Sol–gel processes are another wet chemical synthesis commonly used for nanostructures such as powders, films, fibers, and monoliths.28 Typical sol–gel process involves hydrolysis and condensation of metal alkoxides and metal salts such as chlorides, nitrates and acetates In metal alkoxides... al.29,30 The ammonia provides a steady source of hydroxide ions to form zinc hydroxide, which later undergoes a condensation reaction to form ZnO.5,31 Therefore, the molar ratio of Zn salts and hydroxide ions present is usually closely monitored as it is well known for hydroxide ions in shape alteration of ZnO.5,30,32,33 Hydroxide sources include ammonia, NaOH and hexamethylenetetramine C6H12N4 (HMT) Parameters... h, and (f) 15 h……………………………….……69 Fig 4.2 XRD of ZnO nanostructured films (a) before heating, after heating at 170 oC for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h……………………………….……70 Fig 4.3 PL spectra of ZnO nanostructured films (a) before heating, after heating at 170 oC for (b) 3 h, (c) 6 h, (d) 9 h, (e) 12 h, and (f) 15 h.………………………… 72 Fig 4.4 TEM of different parts of ZnO nanostructured films. .. Chen, H D Sun, C F Wang, A Y S Lee, and H Gong, “Development of ZnO Nanostructured Films via Sodium Chloride Solution and Investigation of Its Growth Mechanism and Optical Properties” Accepted in Journal of the American Ceramic Society for publication 3) R Q Wee, H Gong, W F Yang, R Chen, H D Sun, “On Black ZnO Films and Light Emission Properties” Submitted to Journal of Physics D for publication xiv... fine-tuned with different nanostructures in order to gauge its comparison There is therefore a need to have a precise control over the synthesis of ZnO nanostructures before progressing to research on device performance Chemical synthesis of nano-materials may be conducted in solid, liquid, or gaseous state This section highlights some of the common synthesis methods for nanostructures and ZnO 4 Chapter 1:... factor (% degree of fill) of the autoclave The critical temperature (Tcr = 374.1 °C) and pressure (ρ = 221.2 bar) are indicated….…………………………….31 Fig 2.6 Viscosity of water as a function of density and temperature…………….….32 Fig 2.7 Dielectric constant of water plotted against as a function of pressure and temperature….……………………………………………………………………….33 Fig 2.8 Diagram showing the percent of Zn(II) present... (d) 400 oC for 6 h, and (e) HR-TEM of ZnO film annealed at 200 oC for 214 h…………………………………… ……53 Fig 3.3 Schematic diagram of mechanism to obtain Zn/ZnO layered film……… 55 Fig 3.4 PL spectra of films under different conditions of (a) Zn film before annealing, ZnO films after annealed at 100 oC for 15 h, 200 oC for 214 h, and 400 oC for 6 h, and (b) Inset: PL spectrum magnification of Zn film before annealing……………... Jagadish, in Zinc Oxide Bulk, Thin Films and Nanostructures – Processing, Properties and Applications; Ch 1, edited by C Jagadish and S Pearton (Elsevier, 2006), p 1 19 B J Jin, S H Bae, S Y Lee, S Im, Mater Sci Eng., B 71, 301 (2000) 20 F Manjón, Solid State Commun 128, 35 (2003) 21 S Ghosh, G G Khan, B Das, and K Mandal, J Appl Phys 109, 123927 (2011) 22 J B You, X W Zhang, Y M Fan, Z G Yin, P F Cai, and. .. and indium chloride (InCl3) were some of the dopant salts found in hydrothermal synthesis of dopedZnO.35-40 The influence of H3BO3 on ZnO morphology is given in Fig 1.3.38 Fig 1.3 SEM images of ZnO nanorods synthesized in Q Yu et al with (a) no H3BO3, and (b) 0.03 mol/L of H3BO3 concentration.38 6 Chapter 1: Introduction Wee Rui Qi The growth of nanostructured ZnO films requires an additional step; that ... chemical synthesis commonly used for nanostructures such as powders, films, fibers, and monoliths.28 Typical sol–gel process involves hydrolysis and condensation of metal alkoxides and metal... 73 (2009) 24 Chapter 2: Synthesis and Characterization Wee Rui Qi Chapter 2: Synthesis and Characterization 2.1 Fabrication of Samples 2.1.1 Sputtering of Zn and ZnO Thin Films A brief introduction... thin layer of zinc (Zn) used in Chapters Three and Four, and zinc oxide (ZnO) used in Chapter Five Physical vapor deposition (PVD) is a general term used to describe any of a variety of methods