® Edition 2.0 2013-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Instruments and software used for measurement in high-voltage and highcurrent tests – Part 2: Requirements for software for tests with impulse voltages and currents IEC 61083-2:2013 Appareils et logiciels utilisés pour les mesures pendant les essais haute tension et haute intensité – Partie 2: Exigences pour le logiciel pour les essais avec des tensions et des courants de choc Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe IEC 61083-2 All rights reserved Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IEC's member National Committee in the country of the requester If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information Droits de reproduction réservés Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence IEC Central Office 3, rue de Varembé CH-1211 Geneva 20 Switzerland Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 info@iec.ch www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies About IEC publications The technical content of IEC publications is kept under constant review by the IEC Please make sure that you have the latest edition, a corrigenda or an amendment might have been published Useful links: IEC publications search - 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Make sure that you obtained this publication from an authorized distributor Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé ® Registered trademark of the International Electrotechnical Commission Marque déposée de la Commission Electrotechnique Internationale Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe IEC 61083-2 61083-2 © IEC:2013 CONTENTS FOREWORD INTRODUCTION Scope and object Normative references Terms and definitions Test data generator (TDG) 4.1 Principle 4.2 Data format Values and acceptance limits for the parameters of the reference impulses Software testing 6.1 General 6.2 Performance test 10 6.3 Uncertainty contribution for IEC 60060-2 and/or IEC 62475 10 Record of performance of the software 11 Annex A (normative) Reference values and acceptance limits for the parameters of TDG impulses 12 Annex B (informative) Alternative method for uncertainty estimation 25 Bibliography 32 Table – References to impulse voltage parameter definitions Table – References to impulse current parameter definitions Table – Standard uncertainty contributions of software to the overall uncertainty according to the simplified procedure 11 Table A.1 – Reference values and their acceptance limits for full lightning impulses (LI) (1 of 6) 12 Table A.2 – Reference values and their acceptance limits for chopped lightning impulses (LIC) (1 of 2) 18 Table A.3 – Reference values and their acceptance limits for switching impulses (SI) 20 Table A.4 – Reference values and their acceptance limits for current impulses (IC) (1 of 2) 21 Table A.5 – Reference values and their acceptance limits for oscillating lightning impulses (OLI) 23 Table A.6 – Reference values and their acceptance limits for oscillating switching impulses (OSI) 24 Table B.1 – Expanded uncertainties (U x ) of the lightning impulse reference values (1 of 2) 27 Table B.2 – Expanded uncertainties (U x ) of the chopped lightning impulse reference values 28 Table B.3 – Expanded uncertainties (U x ) of the switching impulse reference values 29 Table B.4 – Expanded uncertainties (U x ) of the impulse current reference values 29 Table B.5 – Expanded uncertainties (U x ) of the oscillating lightning impulse reference values 29 Table B.6 – Expanded uncertainties (U x ) of the oscillating switching impulse reference values 30 Table B.7 – Example of uncertainty estimation 30 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe –2– –3– INTERNATIONAL ELECTROTECHNICAL COMMISSION INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT IN HIGH-VOLTAGE AND HIGH-CURRENT TESTS – Part 2: Requirements for software for tests with impulse voltages and currents FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees) The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”) Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work International, governmental and nongovernmental organizations liaising with the IEC also participate in this preparation IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter 5) IEC itself does not provide any attestation of conformity Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity IEC is not responsible for any services carried out by independent certification bodies 6) All users should ensure that they have the latest edition of this publication 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications 8) Attention is drawn to the Normative references cited in this publication Use of the referenced publications is indispensable for the correct application of this publication 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights IEC shall not be held responsible for identifying any or all such patent rights International Standard IEC 61083-2 has been prepared by IEC technical committee 42: Highvoltage and high-current testing techniques This second edition cancels and replaces the first edition, published in 1996, and constitutes a technical revision The main changes with respect to the previous edition are listed below: a) the test data generator software has been updated: b) the number of reference impulse waveforms included in the test data generator has been significantly increased; c) all reference values have IEC 60060-1and IEC 62475; been recalculated according to new definitions in Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 61083-2 © IEC:2013 61083-2 © IEC:2013 d) methods for estimating the uncertainty of parameter evaluation has been introduced and are in line with the procedure introduced in IEC 60060-2 The text of this standard is based on the following documents: FDIS Report on voting 42/318/FDIS 42/321/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table This publication has been drafted in accordance with the ISO/IEC Directives, Part A list of all the parts in the IEC 61083 series, published under the general title Instruments and software used for measurement in high-voltage and high-current tests, can be found on the IEC website The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication At this date, the publication will be • • • • reconfirmed, withdrawn, replaced by a revised edition, or amended Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe –4– –5– INTRODUCTION IEC 61083-1 specifies the test requirements for digital recorders Digital recorders, like analogue oscilloscopes, are susceptible to changes in their characteristics However, the more stringent testing (than is practical for analogue oscilloscopes) specified for digital recorders for standard impulse voltage and current measurement has led to the accuracy of digital recorders being more clearly demonstrated This part of IEC 61083 applies to software used to process digital records to provide the values of the relevant impulse parameters The raw data are retained for comparison with the processed data However, since the parameters of the test impulse (including the test value) are to be read from the processed data, it is important to establish tests to ensure that the reading of parameters is adequately performed The problem is how to ensure this, while permitting users to develop a wide range of techniques This problem is further complicated by the different needs of various users, ranging from single-purpose test laboratories, for example those of a cable manufacturer who may only test a few objects which are capacitive, to large high-voltage test/research laboratories, which may perform tests on a very wide range of objects, which have a correspondingly wide range of impedances The approach taken in this part of IEC 61083 is to provide, from a test data generator software, waveforms (and ranges of their parameters) which a user can employ to verify that a procedure gives values within the specified ranges To reduce the amount of testing required, the waveforms are divided into groups, and the user needs only to check those groups that are appropriate for the high-voltage and/or high-current tests to be performed in his/her laboratory New definitions for lightning impulse parameters and switching impulse time-to-peak evaluation are introduced in IEC 60060-1 The changes in these definitions have lead to significant changes in some of the reference values in this standard The number of impulse records in the test data generator has been increased to cover a wider range of impulse shapes seen in on-site testing Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 61083-2 © IEC:2013 61083-2 © IEC:2013 INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT IN HIGH-VOLTAGE AND HIGH-CURRENT TESTS – Part 2: Requirements for software for tests with impulse voltages and currents Scope and object This part of IEC 61083 is applicable to software used for evaluation of impulse parameters from recorded impulse voltages and currents It provides test waveforms and reference values for the software required to meet the measuring uncertainties and procedures specified in IEC 60060-1, IEC 60060-2, IEC 60060-3 and IEC 62475 Hardware with built-in firmware that cannot accept external numerical input data is not covered by this standard The object of this standard is to • establish the tests which are necessary to show that the performance of the software complies with the requirements of the relevant IEC standards; • define the terms specifically related to digital processing; • specify reference values and the acceptance limits for the reference impulses; • specify the requirements for the record of performance; • define the methods to assess the contribution of software to the measurement uncertainty Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments) applies IEC 60060-1:2010, High-voltage test techniques – Part 1: General definitions and test requirements IEC 60060-2, High-voltage test techniques – Part 2: Measuring systems IEC 60060-3:2006, High-voltage test techniques – Part 3: Definitions and requirements for on–site testing IEC 61083-1:2001, Instruments and software used for measurement in high-voltage impulse tests – Part 1: Requirements for instruments IEC 62475:2010, High-current test techniques – Definitions and requirements for test currents and measuring systems ISO/IEC Guide 98-3, Uncertainty of measurement – Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe –6– –7– Terms and definitions For the purposes of this document, the following terms and definitions apply NOTE References to definitions of relevant impulse parameters, as shown in the relevant clauses of IEC 60060-1:2010, IEC 60060-3:2006 and IEC 62475:2010 are listed in Tables and 3.1 raw data original record of sampled and quantized information obtained when a digital recorder converts an analogue signal into a digital form, possibly corrected for offset or multiplied by a scale factor 3.2 processed data data obtained by any processing (other than correction for offset and/or multiplying by a scale factor) of the raw data [SOURCE: IEC 61083-1:2001, definition 1.3.3.5, modified – "constant scale factor" replaced by "scale factor"; NOTE not retained] 3.3 internal noise level standard deviation of the samples recorded when a constant voltage is applied to the input of the digital recorder 3.4 reference impulse waveform supplied by the test data generator (TDG) 3.5 sampling rate sampling frequency number of samples of a signal taken per unit time [SOURCE: IEC 60050-704:1993, definition 704-23-03] 3.6 resolution (in digital processing) measure of the accuracy with which a digital system can distinguish between the magnitudes of two samples of a signal Note to entry: Resolution is usually expressed as the number of bits necessary to express in binary form the maximum number of possible different signal levels which can be recognized by the system [SOURCE: IEC 60050-807:1998, definition 807-01-02] 3.7 test data generator TDG computer program that generates digital reference data files, representative of synthesized and recorded impulse waveforms Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 61083-2 © IEC:2013 8.1.5 7.1.22, Annex B Time to halfvalue T2 7.1.9 7.1.9 7.1.9 Extreme value Ue 7.1.20 7.1.20 7.1.20 Average rate of rise (8.2.3) 7.2.5 (7.2.5) Front time T1 8.2.5 7.2.7 (8.2.5) (7.2.7) Time to halfvalue T2 8.2.6 8.2.6 Oscillation frequency f 61083-2 © IEC:2013 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe NOTE Some definitions of parameters (shown in parenthesis) in IEC 60060-3:2006 are different from those in IEC 60060-1:2010 For IEC 60060-3, reference values are only provided for oscillating lightning and oscillating switching impulse parameters 8.2.4 (8.2.4) Time to peak Value of the test voltage (7.2.4) Tp IEC 60060-3:2006 Ut 8.2.3 7.1.27, Annex B 7.1.27 Time to chopping Tc Oscillating switching impulse voltage (OSI) 7.1.18, Annex B 7.1.18, Annex B Front time T1 7.2.4 8.1.3 7.1.17, Annex B 7.1.17, Annex B Relative overshoot magnitude β Oscillating lightning impulse voltage (OLI) 8.1.2 7.1.15, Annex B Tail chopped lightning impulse voltage (LIC-M4 to LIC-M5) Switching impulse voltage (SI) 7.1.15, 7.2.6 Front chopped lightning impulse voltage (LIC-A1, LIC-M1 to LIC-M3) Time to peak Value of the test voltage 7.1.15, Annex B Tp Ut Full lightning impulse voltage (LI) Impulse group/ Evaluation algorithm IEC 60060-1:2010 Table – References to impulse voltage parameter definitions –8– 100,42 64,28 100,00 150,01 Courant de choc, 4/10 Courant de choc, 8/20 Courant de choc, 10/350 Courant de choc ComposanteAh IC-M2 IC-M3 IC-M4 IC-M5 Valeur de référence kA –10,001 Description Courant de choc, 8/20 Choc de référence ± 0,2 ± 0,2 ± 0,2 ± 0,2 ± 0,2 Limite d'acceptation % de I p Ip 17,09 23,47 7,75 4,237 8,82 Valeur de référence µs ±2 ±2 ±2 ±2 ±2 Limite d'acceptation % de T ou T d T1, Td 48,34 398,9 20,53 9,13 21,31 Valeur de référence µs ±2 ±2 ±2 ±2 ±2 Limite d'acceptation % de T ou T t T2, Tt 61083-2 © CEI:2013 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe IC-M1 Désignation dans le générateur de données numériques d'essai Tableau A.4 – Valeurs de référence et leurs limites d'acceptation pour les courants de choc (IC) (1 de 2) – 54 – 20,495 0,229 10,156 Courant de choc 1/15 Courant de choc rectangulaire Courant de choc 1/15 IC-M7 IC-M8 IC-M9 Valeur de référence kA 12,464 Description Courant de choc 30/300 Choc de référence ± 0,2 ± 1,0 ± 0,2 ± 0,2 Limite d'acceptation % de I p Ip 0,968 051 1,009 27,91 Valeur de référence µs ±2 ±2 ±2 ±2 Limite d'acceptation % de T ou T d T1, Td 17,68 678 17,65 274,0 Valeur de référence µs ±2 ±2 ±2 ±2 Limite d'acceptation % de T ou T t T2, Tt – 55 – Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe IC-M6 Désignation dans le générateur de données numériques d'essai Tableau A.4 (2 de 2) 61083-2 © CEI:2013 203,1 201,7 -809,9 Choc de foudre oscillant, f = 60 kHz Choc de foudre oscillant, f = 35 kHz Choc de foudre oscillant, f = 70 kHz OLI-M2 OLI-M3 OLI-M4 Valeur de référence kV 203,3 Description Choc de foudre oscillant, f = 110 kHz Choc de référence ± 0,5 ± 0,5 ± 0,5 ± 0,5 Limite d'acceptation % de U p Up 4,935 9,68 5,80 3,280 Valeur de référence µs ±2 ±2 ±2 ±2 Limite d'acceptation % de T T1 69,1 83,0 52,0 32,89 Valeur de référence µs ±2 ±2 ±2 ±2 Limite d'acceptation % de T T2 61083-2 © CEI:2013 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe OLI-M1 Désignation dans le générateur de données numériques d'essai Tableau A.5 – Valeurs de référence et leurs limites d’acceptation pour les chocs de foudre oscillants (OLI) – 56 – 202,9 784,6 -1 521,1 Choc de manœuvre oscillant, f = 2,0 kHz Choc de manœuvre oscillant, f = 3,6 kHz Choc de manœuvre oscillant, f = 8,3 kHz OSI-M2 OSI-M3 OSI-M4 kV Valeur de référence 204,2 Description Choc de manœuvre oscillant, f = 4,7 kHz Choc de référence ± 0,5 ± 0,5 ± 0,5 ± 0,5 Limite d'acceptation % de U p Up 63,2 144,7 248,9 110,7 Valeur de référence µs ±2 ±2 ±2 ±2 Limite d'acceptation % de T p Tp 121 136 177 134 Valeur de référence µs ±2 ±2 ±2 ±2 Limite d'acceptation % de T T2 – 57 – Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe OSI-M1 Désignation dans le générateur de données numériques d'essai Tableau A.6 – Valeurs de référence et leurs limites d'acceptation pour les chocs de manœuvre oscillants (OSI) 61083-2 © CEI:2013 61083-2 © CEI:2013 Annexe B (informative) Autre méthode d'estimation de l'incertitude B.1 Incertitude des valeurs de référence Les valeurs de référence sont fondées sur la moyenne des résultats obtenus sur plusieurs logiciels fournis par les membres de l'équipe de maintenance Chaque logiciel a fait l'objet d’un développement indépendant afin de mettre en application les définitions de la CEI 60060-1, de la CEI 60060-3 et de la CEI 62475 Le résultat de ce processus d'évaluation est présenté dans les Tableaux B.1 B.6 La valeur de référence d'un paramètre est égale la valeur moyenne x de n évaluations indépendantes de ce paramètre: x= n n ∑ xk k =1 L'écart-type expérimental de ces n observations indépendantes est égal s (xk ) = n −1 n ∑ (xk − x ) k =1 L'incertitude élargie est la suivante: Ux = t × s (x k ) n , où t est un facteur de la distribution t conduisant un niveau de confiance d'environ 95% (k = 2) NOTE Les échantillons qui ont dévié de plus de fois de l'écart-type d'une population d'échantillons n'ont pas été inclus dans le calcul de la valeur moyenne x et de son incertitude élargie U x Il convient que les limites d'acceptation figurant dans les Tableaux A.1 A.6 soient supérieures aux incertitudes normalisées évaluées; en revanche, il convient qu'elles soient inférieures l'ensemble des limites d'incertitude fixées pour les systèmes de mesure dans la CEI 60060-2 et la CEI 62475 Les valeurs des Tableaux A.1 A.6 s'inscrivent l'intérieur de ces limites B.2 Contribution du logiciel l'estimation de l'incertitude selon la CEI 60060-2 Plutôt que d'appliquer les limites d'acceptation de 6.3, il est possible d'utiliser les différences entre les valeurs de référence x REF et les valeurs évaluées par le logiciel en essai comme base pour l'évaluation de l'incertitude Après l'identification des n formes d'onde relatives l'algorithme du logiciel en essai, il est possible d'utiliser la différence maximale observée par rapport la valeur de référence pour obtenir la première composante de l'incertitude normalisée: Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe – 58 – – 59 – uB71 = n x i − xREF,i i =1 xREF,i max ou dans le cas β’, quand l'incertitude est donnée en termes absolus: uB71 = n ′ i max β i′ − βREF, i =1 Il convient, en outre, de prendre en compte l'incertitude des valeurs de référence Pour ce faire, la moyenne ( x ), l'incertitude normalisée (U x) et le nombre d'observations (n) de la détermination de chaque valeur de référence sont répertoriés dans les Tableaux B.1 B.6 Dans les tableaux, l'incertitude élargie est donnée sur un niveau de confiance d'environ 95% (k = 2) Cette composante de l'incertitude normalisée est donnée par uB72 = n max U x,i i =1 où U x,i sont les incertitudes élargies pour x REF,i L'incertitude normalisée du logiciel est donnée par la formule suivante uB7 = uB712 + uB72 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 61083-2 © CEI:2013 0,009 0,007 000,2 856,01 71,972 100,170 104,349 96,012 LI-A3 LI-A4 LI-A5 LI-A6 LI-A7 LI-A8 0,004 0,006 86,597 85,584 952,09 -1041,7 -1026,5 -267,14 -55,003 -166,865 -1 272,3 -99,732 -100,035 100,258 299,324 LI-A11 LI-A12 LI-M1 LI-M2 LI-M3 LI-M4 LI-M5 LI-M6 LI-M7 LI-M8 LI-M9 LI-M10 LI-M11 8 8 8 8 8 8 8 8 8 8 8 n 1,661 1,666 0,828 1,514 1,482 1,355 2,746 0,987 2,150 3,356 1,123 0,587 0,578 0,924 1,215 1,503 2,122 1,762 1,711 0,841 1,117 1,693 0,839 84 x µs 0,07 0,09 0,08 0,08 0,3 0,02 0,4 0,4 0,13 0,09 0,4 0,2 0,3 0,4 0,12 0,3 0,5 0,4 0,3 0,3 0,3 0,12 0,011 % de x Ux T1 8 8 8 8 8 8 8 8 8 8 8 n 60,946 60,853 46,654 49,358 50,03 54,739 42,11 56,22 41,749 61,249 85,603 57,358 56,367 42,659 55,737 44,924 38,36 41,576 47,705 47,802 48,15 47,479 60,156 x µs 0,005 0,003 0,02 0,004 0,05 0,007 0,05 0,06 0,015 0,006 0,02 0,009 0,009 0,02 0,015 0,02 0,04 0,02 0,02 0,012 0,04 0,011 0,003 % de x Ux T2 8 8 8 8 8 8 8 8 8 8 8 n -0,457 –0,007 1,382 –0,55 11,20 3,837 18,71 4,82 9,17 9,18 2,082 2,267 4,066 12,01 4,02 14,75 20,15 17,73 7,74 7,88 4,575 5,14 0,001 x % 0,002 0,011 0,007 0,02 0,04 0,014 0,08 0,02 0,02 0,02 0,003 0,007 0,010 0,05 0,02 0,03 0,07 0,02 0,05 0,02 0,007 0,02 0,003 Ux %, abs β' 7 7 7 7 7 7 7 7 7 7 n 300,482 100,867 –100,761 –99,709 –1 296,6 –169,921 –56,401 –276,986 –1 070,07 –1 070,04 960,13 86,194 87,902 84,338 56,271 97,812 105,878 101,930 72,536 874,260 023,67 049,906 049,588 x kV Ux 0,002 0,003 0,004 0,002 0,013 0,001 0,015 0,003 0,006 0,008 0,005 0,0000 0,0002 0,000 0,000 0,000 0,000 0,000 0,000 0,000 0,002 0,000 0,000 % de x Ue 6 6 6 6 6 6 6 6 6 6 6 n 161,9 48,7 –119,4 –65,0 –907 –119,9 –20,66 -266,3 –399,4 –267,2 845 147,4 149 89,5 47,0 66,3 51,7 59,66 43,30 020 914 547 193 x kV/µs 0,3 0,6 0,3 1,0 0,5 0,3 0,15 0,3 0,5 0,6 0,8 1,4 0,4 0,4 0,6 0,3 0,2 0,14 1,0 0,2 0,7 0,5 % de x Ux Vitesse moyenne d'augmentation kV/µs 3 3 3 3 3 3 3 3 3 3 3 n 61083-2 © CEI:2013 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 0,004 0,004 0,02 0,005 0,010 0,03 0,02 0,015 0,007 0,004 0,004 0,009 55,928 81,929 LI-A9 LI-A10 0,011 0,005 0,006 0,005 0,02 0,008 037,63 LI-A2 0,002 % de x Ux 049,60 x kV Ut LI-A1 LI Tableau B.1 – Incertitudes élargies (U x ) des valeurs de référence pour un choc de foudre (1 de 2) – 60 – 48,549 497,97 369,21 –99,346 LI-M14 LI-M15 LI-M16 LI-M17 0,02 0,02 0,289 03 –0,303 60 0,147 81 –389,9 LIC-M2 LIC-M3 LIC-M4 LIC-M5 1,774 0,919 1,016 0,933 1,537 1,292 x µs Ux 0,04 0,10 0,11 0,2 0,2 0,2 % de x 8 8 n 53,312 47,531 59,187 37,479 46,937 52,266 x µs 0,002 0,010 0,007 0,04 0,013 0,011 % de x Ux T2 8 8 8 n 1,327 0,833 –0,08 4,27 1,763 –1,76 x % 0,003 0,006 0,02 0,04 0,014 0,05 Ux %, abs β' 7 7 7 n –101,21 371,709 499,945 49,213 39,605 –4,326 09 x kV 0,05 0,003 0,002 0,015 0,002 0,003 Ux % de x Ue 6 6 6 n 6 5 n 0,857 1,305 x µs 0,9 0,6 % de x Ux T1 0 0 n 9,24 6,00 0,567 0,514 0,569 0,543 01 x µs 0,2 0,3 0,2 0,4 0,12 0,005 % de x Ux Tc 6 5 5 n 6,85 -0,16 x % 0,04 0,05 Ux %, abs β' 5 0 0 n –397,8 0,1480 x kV 0,04 0,2 % de x Ux Ue 4 0 0 n Ux 1,1 0,6 0,5 0,2 % de x –452 0,114 x kV/µs 3 % de x Ux Vitesse moyenne d'augmentation V/µs –45,8 390 477 54,4 26,12 -3,35 x kV/µs 3 0 0 n 3 3 3 n Vitesse moyenne d'augmentation kV/µs – 61 – Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 0,05 0,03 0,07 850,0 LIC-M1 0,005 872,21 % de x Ux Up, Ut 8 8 8 n T1 Tableau B.2 – Incertitudes élargies (U x ) des valeurs de référence pour un choc de foudre coupé 0,003 0,005 0,005 0,012 0,004 0,008 % de x Ux Ut LIC-A1 x kV 39,460 LIC –4,319 LI-M13 x kV LI-M12 LI Tableau B.1 (2 de 2) 61083-2 © CEI:2013 61083-2 © CEI:2013 Tableau B.3 – Incertitudes élargies (U x ) des valeurs de référence pour un choc de manœuvre SI Tp Up x kV % de x SI-A1 950,28 SI-A2 T2 n x µs % de x n x µs % de x 0,004 251 0,8 512,5 0,02 0,987 67 0,004 19,9 320,79 0,009 SI-A3 99,218 0,001 43,1 987,3 0,011 SI-M1 –0,590 0,11 187 655 1,4 SI-M2 3,680 0,13 218 410 Ux Ux Ux n Tableau B.4 – Incertitudes élargies (U x ) des valeurs de référence pour un courant de choc IC T1 Ip x kA % de x IC-M1 –10,001 IC-M2 T2 n x µs % de x n x µs % de x 0,08 8,822 0,03 21,313 0,02 100,418 0,009 4,237 12 0,003 9,1273 0,004 IC-M3 64,281 0,011 7,747 0,010 20,533 0,013 IC-M4 100,001 0,003 23,470 0,007 399 0,6 IC-M5 150,01 0,05 17,09 0,5 48,34 0,3 IC-M6 12,464 0,02 27,914 0,008 274,014 0,004 IC-M7 20,495 0,02 1,009 0,3 17,648 0,06 IC-M8 0,229 37 0,04 050,54 0,007 678,3 0,009 IC-M9 10,155 0,009 0,967 0,06 17,68 0,3 Ux Ux Ux n Tableau B.5 – Incertitudes élargies (U x ) des valeurs de référence pour un choc de foudre oscillant OLI T1 Up x kV % de x OLI-M1 203,3 OLI-M2 n x µs % de x 0,3 32,9 5,802 0,13 6 9,68 0,2 4,935 0,2 n x µs % de x 0,14 3,280 203,1 0,10 OLI-M3 201,7 0,10 OLI-M4 –809,9 0,11 Ux T2 Ux f n x Hz % de x 0,8 111,3 0,8 52,0 0,7 60,9 0,3 6 83,0 0,5 36,4 0,5 6 69,1 0,3 71,9 0,3 Ux Ux n Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe – 62 – – 63 – Tableau B.6 – Incertitudes élargies (U x ) des valeurs de référence pour un choc de manœuvre oscillant OSI Tp Up x kV % de x OSI-M1 204,2 OSI-M2 T2 n x µs % de x 0,2 110,7 202,9 0,10 OSI-M3 784,6 0,09 OSI-M4 –1 521 0,13 B.3 Ux n x µs % de x 0,3 346 248,9 0,2 144,72 0,10 63,2 0,3 Ux f n x Hz % de x 0,7 4,721 0,15 780 1,3 2,048 0,4 370 1,3 3,55 1,1 215 1,0 8,33 0,9 Ux Ux n Exemple B.3.1 Généralités L'incertitude normalisée liée au logiciel u B7 doit être déterminée pour la valeur de crête des chocs de foudre coupés Les formes d'onde liées, dans l'Annexe A, sont LIC-A1 et LIC-M1 M5 Le Tableau B.7 indique – les valeurs de référence et les limites d’acceptation d'après l'Annexe A; – les valeurs d'incertitude élargie d'après l'Annexe B; et – les valeurs évaluées par le logiciel en essai et leur écart par rapport aux valeurs de référence Tableau B.7 – Exemple d'estimation de l'incertitude Forme d'onde Valeur de référence (d'après le Tableau A.2) Limite d'acceptation (d'après le Tableau A.2) Incertitude élargie de la valeur de référence (d'après le Tableau B.2) Valeur évaluée x REFi kV % Ui % xi kV Écart par rapport la valeur de référence x i − xREFi xREFi LIC-A1 872,2 1,0 0,005 873,4 0,14 LIC-M1 850,0 1,0 0,07 851,4 0,16 LIC-M2 0,289 1,0 0,02 0,288 0,36 LIC-M3 –0,303 1,0 0,02 –0,303 0,10 LIC-M4 0,147 1,0 0,03 0,148 0,33 LIC-M5 –389,9 1,0 0,05 –391 0,28 Valeur max B.3.2 0,07 % 0,36 Estimation selon 6.3 Tous les écarts par rapport aux valeurs de référence respectent les limites d'acceptation La contribution l'incertitude qui en résulte est égale uB7 = × % = 0,58 % Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 61083-2 © CEI:2013 B.3.3 61083-2 © CEI:2013 Estimation selon l'Annexe B On peut obtenir une plus faible contribution l'incertitude en tenant compte des incertitudes des valeurs de référence et des écarts par rapport ces valeurs Selon cette annexe, on obtient: u B71 = u B72 = × 0,36 % = 0,21 % , × 0,07 % = 0,04 % et u B7 = u B71 + u B72 = 0,21 % + 0,04 % = 0,21% Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe – 64 – – 65 – Bibliographie CEI 60050-704:1993, Vocabulaire Electrotechnique International – Partie 704: Transmission CEI 60050-807:1998, Vocabulaire Electrotechnique International – Partie 807: Enregistrement numérique des signaux audio et vidéo _ Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe 61083-2 © CEI:2013 Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe ELECTROTECHNICAL COMMISSION 3, rue de Varembé PO Box 131 CH-1211 Geneva 20 Switzerland Tel: + 41 22 919 02 11 Fax: + 41 22 919 03 00 info@iec.ch www.iec.ch Copyrighted material licensed to BR Demo by Thomson Reuters (Scientific), Inc., subscriptions.techstreet.com, downloaded on Nov-27-2014 by James Madison No further reproduction or distribution is permitted Uncontrolled when printe INTERNATIONAL