INTERNATIONAL ELECTROTECHNICAL COMMISSION BRITISH STANDARD BS EN 60384 23 1 2005 Fixed capacitors for use in electronic equipment — Part 23 1 Blank detail specification — Fixed surface mount metallize[.]
BRITISH STANDARD Fixed capacitors for use in electronic equipment — Part 23-1: Blank detail specification — Fixed surface mount metallized polyethylene naphthalate film dielectric DC capacitors — Assessment level EZ The European Standard EN 60384-23-1:2005 has the status of a British Standard ICS 31.060.10 12&23 μF Insulation resistance Increase of tan δ: ≤ 0,0025 for Grade ≤ 0,004 for Grade ≤ 0,007 for Grade compared to values measured in Subgroup C3 ≤ 0,003 for Grade ≤ 0,005 for Grade ≤ 0,007 for Grade compared to values measured in Subgroup C3 ≥ 50 % of values in 4.3.4.3 for Grade and Grade ≥ 25 % of values in 4.3.4.3 for Grade EN 60384-23-1:2005 – 11 – Table (continued) Subclause number and test D or ND (see NOTE 1) Conditions of test Sample size and acceptance criterion (see NOTE 3) Performance requirements (see NOTE 1) (see NOTE 1) p n c Subgroup C3.2 4.10 Damp heat, steady state 4.10.1 Initial measurement Not required, see Subgroup C3 4.10.2 Final measurement Visual examination No visible damage Capacitance ⏐ΔC/C⏐ ≤ % for Grade and Grade ≤ 10 % for Grade of the value measured in Subgroup C3 Tangent of loss angle at kHz Increase of tan δ: ≤ 0,005 compared to values measured in Subgroup C3 Insulation resistance ≥ 50 % of values in 4.3.4.3 for Grade and Grade ≥ 25 % of values in 4.3.4.3 for Grade Subgroup C3.3 4.11 Endurance 4.11.1 Initial measurements 4.11.2 Test conditions 4.11.5 Final measurements D 15 NOT E Not required, see Subgroup C3 See 4.11.2, 4.11.3 and 4.11.4 Visual examination No visible damage Legible marking Capacitance ⏐ΔC/C⏐ ≤ % for Grade ≤ % for Grade and Grade of values measured in Subgroup C3 Tangent of loss angle: at 10 kHz for C R ≤ 1μF at kHz for C R > μF Insulation resistance Increase of tan δ: ≤ 0,003 for Grade ≤ 0,005 for Grade ≤ 0,007 for Grade compared to values measured in Subgroup C3 ≤ 0,002 for Grade ≤ 0,003 for Grade ≤ 0,005 for Grade compared to values measured in Subgroup C3 ≥ 50 % of values in 4.3.4.3 for Grade and Grade ≥ 25 % of values in 4.3.4.3 for Grade EN 60384-23-1:2005 – 12 – Table (continued) Subclause number and test D or ND (see NOTE 1) Conditions of test (see NOTE 1) Sample size and acceptance criterion (see NOTE 3) p Subgroup C3.4 D 4.12 Charge and discharge 4.12.1 Initial measurements Not required, see Subgroup C3 4.12.2 Test conditions 10 000 cycles 4.12.3 Final measurements Capacitance n Performance requirements (see NOTE 1) c NOT E ⏐ΔC/C⏐ ≤ % for Grade ≤ % for Grade ≤ 10 % for Grade of the value measured in Subgroup C3 Tangent of loss angle: at 10 kHz for C R ≤ μF Increase of tan δ: ≤ 0,003 for Grade ≤ 0,005 for Grade ≤ 0,007 for Grade compared to values measured in Subgroup C3 at kHz for C R > μF ≤ 0,002 for Grade ≤ 0,003 for Grade ≤ 0,005 for Grade compared to values measured in Subgroup C3 Insulation resistance ≥ 50 % of values in 4.3.4.3 for Grade and Grade ≥ 25 % of values in 4.3.4.3 for Grade NOTE Subclause numbers of tests and performance requirements refer to the sectional specification IEC 60384-21 and section of this specification NOTE Number to be tested: Sample size as directly allotted to the code letter for IL in Table IIA of IEC 60410 (Single sampling plan for normal inspection) NOTE In this table: IL = p = n = c = D = ND = inspection level; periodicity in months; sample size; acceptance criterion (permitted number of non-conforming items); destructive; non-destructive NOTE 100 % testing shall be followed by re-inspection by sampling in order to monitor outgoing quality level by non-conforming items per million (ppm) The sampling level shall be established by the manufacturer For the calculation of ppm values any parametric failure shall be counted as a non-conforming item In case one or more nonconforming items occur in a sample, this lot shall be rejected NOTE This test may be replaced by in-production testing if the manufacturer installs Statistical Process Control (SPC) on dimensional measurements or other mechanisms to avoid parts exceeding the limits NOTE This may be carried out on chip capacitors mounted on a substrate NOTE If one non-conforming item is obtained, all the tests of the subgroup shall be repeated on a new sample and then no further non-conforming items are permitted Release of product may continue during repeat testing NOTE Any specimen found defective after mounting shall not be taken into account when calculating the permissible non-conforming items for the following tests They shall be replaced by spare parts – 13 -– EN 60384-23-1:2005 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments) applies NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies Publication Year Title EN/HD Year IEC 60384-1 (mod) 1999 Fixed capacitors for use in electronic equipment Part 1: Generic specification EN 60384-1 + Corr October 2001 2001 IEC 60384-23 - 1) Part 23: Sectional specification: Fixed surface mount metallized polyethylene naphthalate film dielectric d.c capacitors EN 60384-23 2005 2) 1) Undated reference 2) Valid edition at date of issue BS EN 60384-23-1:2005 BSI — British Standards Institution BSI is the independent national body responsible for preparing British Standards It presents the UK view on standards in Europe and at the international level It is incorporated by Royal Charter Revisions British Standards are updated by amendment or revision Users of British Standards should make sure that they possess the latest amendments or editions It is the constant aim of BSI to improve the quality of our products and services We would be grateful if anyone finding an inaccuracy or ambiguity while using this British 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