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Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 17:53, (c) The British Standards Institution 2012 BRITISH STANDARD Fixed capacitors for use in electronic equipment — Part 20-1: Blank detail specification — Fixed metallized polyphenylene sulfide film dielectric surface mount d.c capacitors — Assessment level EZ ICS 31.060.10 12&23 μF ≤ 0,0015 for Grade ≤ 0,0025 for Grade ≤ 0,003 for Grade compared to values measured in Sub-group C3 Insulation resistance ≥ 50 % of values in 4.3.4.3 however, ≥ 25 % for Grade Visual examination No visible damage Lower category temperature Upper category TB = temperature Five cycles Duration t = 30 No visible damage BS EN 60384-20-1:2008 – 10 – Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 17:53, (c) The British Standards Institution 2012 Table (continued) Subclause number and test a Sub-group C3.2 4.10 Damp heat, steady state 4.10.1 Initial measurements 4.10.2 D or ND c D p n c 15 0g Performance requirements a Not required, see Group Recovery: Final measurements Sub-group C3.3 Conditions of test Sample size and acceptance criterion c a Visual examination No visible damage Capacitance ΔC/C for Grade and Grade 2: ≤ %, Grade 3: ≤ % of value measured in Sub-group C3 Tangent of loss angle at kHz Increase of tan δ: ≤ 0,0025 compared to values measured in Sub-group Insulation resistance ≥ 50 % of values in 4.3.4.3, however, ≥ 25 % for Grade D 15 0g 4.11 Endurance 4.11.1 Initial measurements Not required, see Subgroup C3 4.11.2 Test conditions See 4.11.2, 4.11.3 and 4.11.4 4.11.5 Final measurements Visual examination No visible damage Legible marking Capacitance ΔC/C ≤ % for Grade ΔC/C ≤ % for Grade and Grade compared to measurements in Sub-group Tangent of loss angle: at 10 kHz for C R ≤ μF Increase of tan δ: ≤ 0,003 for Grade ≤ 0,005 for Grade and Grade at kHz for C R > μF ≤ 0,002 for Grade ≤ 0,003 for Grade and Grade compared to values measured in Subgroup C3 Insulation resistance ≥ 50 % of values in 4.3.4.3 however, ≥ 30 % for Grade Sub-group C3.4 4.12 D Charge and discharge 4.12.1 Initial measurement Not required, see Sub-group 4.12.2 Test conditions 10 000 cycles 0g BS EN 60384-20-1:2008 – 11 – Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 17:53, (c) The British Standards Institution 2012 Table (continued) Subclause number and test a D or ND c Conditions of test a Sample size and acceptance criterion c p 4.12.3 Final measurements n Performance requirements a c Capacitance ΔC/C ≤ % for Grade ΔC/C ≤ % for Grade however, ≤ % for Grade compared to values measured in Sub-group C3 Tangent of loss angle: at 10 kHz for C R ≤ μF Increase of tan δ: ≤ 0,003 for Grade ≤ 0,005 for Grade and Grade at kHz for C R > μF ≤ 0,002 for Grade ≤ 0,003 for Grade and Grade compared to values measured in Sub-group C3 Insulation resistance ≥ 50 % of values in 4.3.4.3, however, ≥ 30 % for Grade a Subclause numbers of tests and performance requirements refer to the sectional specification IEC 60384-20 and clause of this specification b Inspection levels are selected from IEC 60410 (Sampling plans and procedures for inspection by attributes) c In this table: IL is the inspection level p is the periodicity in months n is the sample size c is the acceptance criterion (permitted number of non-conforming items) D signifies destructive ND signifies non-destructive d 100 % testing shall be followed by re-inspection by sampling in order to monitor outgoing quality level by nonconforming items per million (ppm) The sampling level shall be established by the manufacturer For the calculation of ppm values any parametric failure shall be counted as a non-conforming item In case one or more non-conforming items occur in a sample, this lot shall be rejected e This test may be replaced by in-production testing if the manufacturer installs Statistical Process Control (SPC) on dimensional measurements or other mechanisms to avoid parts exceeding the limits f This may be carried out on surface mount capacitors mounted on a substrate g If one non-conforming item is obtained, all the tests of the sub-group shall be repeated on a new sample and then no further non-conforming items are permitted Release of product may continue during repeat testing NOTE Any specimen found defective after mounting shall not be taken into account when calculating the permissible non-conforming items for the following tests They shall be replaced by spare parts BS EN 60384-20-1:2008 – 12 – Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 17:53, (c) The British Standards Institution 2012 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments) applies NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies Title EN/HD Year IEC 60384-1 (mod) - 1) Fixed capacitors for use in electronic equipment Part 1: Generic specification EN 60384-1 + corr October 2001 2001 2) IEC 60384-20 1) Fixed capacitors for use in electronic EN 60384-20 equipment Part 20: Sectional specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c capacitors 2008 2) Publication Year - 1) Undated reference 2) Valid edition at date of issue blank Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 17:53, (c) The British Standards Institution 2012 Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 17:53, (c) The British Standards Institution 2012 BS EN 60384-20-1:2008 British Standards Institution (BSI) BSI 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