Bsi bs en 60384 16 1 2005 (2010)

BRITISH STANDARD BS EN 60384-16-1: 2005 Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 Incorporating corrigendum March 2010 Fixed capacitors for use in electronic equipment — Part 16-1: Blank detail specification: Fixed metallized polypropylene film dielectric d.c capacitors — Assessment levels E and EZ ICS 31.060.30 12&23 μF: at kHz C R ≤ μF: at 10 kHz 4.3 Robustness of terminations Visual examination No visible damage 4.4 Resistance to soldering heat Method: 4.14 Component solvent resistance (if applicable) Solvent: Solvent temperature: Method Recovery time: See detail specification 4.4.2 Final measurements Visual examination No visible damage Legible marking Capacitance Δ C/C for Grade 1.1: ≤1 % Grade 1.2: ≤2 % Grade 2: ≤3 % of value measured in 4.3.1 Increase of tan δ : for C ≤ μF: for Grade 1.1: ≤0,001 Grade 1.2: ≤0,002 Grade 2: ≤0,004 for C > μF: see detail specification, compared to values measured in 4.3.1 Tangent of loss angle Subgroup C1B Other part of sample of Subgroup C1 4.6.1 Initial measurements D 18 Capacitance Tangent of loss angle: for C R > μF: at kHz C R ≤ μF: at 10 kHz 4.6 Rapid change of temperature T A = Lower category temperature T B = Upper category temperature Five cycles Duration t = 30 Visual examination 4.7 Vibration Frequency range: Hz to Hz Amplitude 0,75 mm or acceleration 100 m/s (whichever is the less severe) Total duration: h No visible damage BS EN 60384-16-1:2005 EN 60384-16-1:2005 –8– Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 Table (continued) Subclause number and test a D or ND Conditions of test a Sample size and criterion of acceptability Performance requirements a c c E p 4.7.2 Final inspection Visual examination 4.8 Bump (or shock, see 4.9) Method of mounting: see 1.1 of this specification n EZ c p n c No visible damage Number of bumps: Acceleration: m/s Duration of pulse: ms 4.9 Shock (or bump, see 4.8) Method of mounting: see 1.1 of this specification Acceleration: m/s Duration of pulse: ms 4.8.3 or 4.9.3 Final measurements Visual examination No visible damage Capacitance Δ C/C for Grade 1.1: ≤1 % Grade 1.2: ≤2 % Grade 2: ≤3 % of value measured in 4.6.1 Subgroup C1 Combined sample of specimens of Subgroups C1A and C1B Tangent of loss angle Increase of tan δ : for C ≤ μF: for Grade 1.1: ≤0,001 Grade 1.2: ≤0,002 Grade 2: ≤0,004 for C > μF: see detail specification, compared to values measured in 4.6.1 Insulation resistance ≥50 % of the values in 4.2.4.2 D 4.10 Climatic sequence 4.10.2 Dry heat 4.10.3 Damp heat, cyclic, Test Db, first cycle 4.10.4 Cold Temperature: lower category temperature Duration: h 4.10.5 Low air pressure (if required by the detail specification) Air pressure: kPa 4.10.5.3 Final measurement Visual examination 4.10.6 Damp heat, cyclic, Test Db, remaining cycles 27 10 Temperature: upper category temperature Duration: 16 h No permanent breakdown, flashover or harmful deformation of the case BS EN 60384-16-1:2005 EN 60384-16-1:2005 –9– Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 Table (continued) Subclause number and test a D or ND Conditions of test a Sample size and criterion of acceptability Performance requirements a c c E p 4.10.6.2 Final measurement n EZ c p n c Visual examination No visible damage Legible marking Capacitance Δ C/C for Grade 1.1: ≤1 % Grade 1.2: ≤3 % Grade 2: ≤5 % of value measured in 4.4.2, 4.8.3 or 4.9.3 as applicable Subgroup C2 Tangent of loss angle Increase of tan δ : for C ≤ μF: for Grade 1.1: ≤0,0015 Grade 1.2: ≤0,003 Grade 2: ≤0,005 for C > μF: see detail specification, compared to values measured in 4.3.1 or 4.6.1 as applicable Insulation resistance ≥50 % of values in 4.2.4.2 D 15 10 4.11 Damp heat, steady state 4.11.1 Initial measurements Capacitance Tangent of loss angle at kHz 4.11.3 Final measurement Visual examination No visible damage Legible marking Capacitance Δ C/C for Grade 1.1: ≤1 % Tangent of loss angle Increase of tan δ : for C ≤ μF: for Grade 1.1: ≤0,001 Grade 1.2: ≤0,002 for C > μF: see detail specification, compared to values measured in 4.11.1 Insulation resistance ≥50 % of values in 4.2.4.2 Subgroup C3 D Grade 1.2: ≤3 % Grade 2: ≤5 % of value measured in 4.11.1 4.12 Endurance Duration: Grade 1: 000 h Grade 2: 000 h 4.12.1 Initial measurement Capacitance Tangent of loss angle: 21 10 for C R > μF: at kHz C R ≤ μF: at 10 kHz 4.12.5 Final measurement Visual examination No visible damage Legible marking BS EN 60384-16-1:2005 EN 60384-16-1:2005 – 10 – Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 Table (continued) Subclause number and test a Conditions of test a D or ND Sample size and criterion of acceptability Performance requirements a c c E p Subgroup C4 4.2.6 4.13 Charge and discharge 4.13.1 Initial measurement c p n c Capacitance Δ C/C for Grade 1.1: ≤1 % Tangent of loss angle Increase of tan δ : for C ≤ μF: for Grade 1.1: ≤0,002 Grade 1.2: ≤0,004 for C > μF: see detail specification, compared to values measured in 4.12.1 Insulation resistance ≥50 % of values in 4.2.4.2 D Temperature characteristics (if applicable) n EZ Grade 1.2: ≤3 % Grade 2: ≤5 % of value measured in 4.12.1 10 Capacitance Insulation resistance As in 4.2.6 Capacitance Tangent of loss angle: C R > μF: at kHz C R ≤ μF: at 10 kHz Duration of charge: s Duration of discharge: s for 4.13.3 Final measurement Subgroup C5 4.2.5 Inductance (if applicable) ND Capacitance Δ C/C for Grade 1.1: ≤1 % Tangent of loss angle Increase of tan δ : for C ≤ μF: for Grade 1.1: ≤0,003 Grade 1.2: ≤0,005 for C > μF: see detail specification, compared to values measured in 4.13.1 Insulation resistance ≥50 % of values in 4.2.4.2 Grade 1.2: ≤3 % Grade 2: ≤5 % of value measured in 4.13.1 12 6 10 L ≤ … mH BS EN 60384-16-1:2005 Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 – 11 – EN 60384-16-1:2005 a Subclause numbers of tests and performance requirements refer to the sectional specification, IEC 60384-16 and Clause of this specification b Number to be tested: Sample size as directly allotted to the code letter for IL in Table IIA of IEC 60410 (Single sampling plan for normal inspection) c In this table: p = periodicity (in months); n = sample size; c = acceptance criterion (permitted number of defectives); D = destructive; ND = non-destructive; IL = inspection level; IEC 60410 AQL = acceptable quality level d 100% testing shall be followed by re-inspection by sampling in order to monitor outgoing quality level by nonconforming items per million (10 -6 ) The sampling level shall be established by the manufacturer For the calculation of 10 -6 values any parametric failure shall be counted as a non-conforming item In case one or more non-conforming items occur in a sample, this lot shall be rejected _ BS EN 60384-16-1:2005 Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 EN 60384-16-1:2005 – 12 – Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments) applies NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies Publication IEC 60384-16 Year - 1) Title EN/HD Year Fixed capacitors for use in electronic equipment Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c capacitors EN 60384-16 2005 1) Undated reference 2) Valid edition at date of issue 2) blank Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 Licensed copy: Bradford University, University of Bradford, Version correct as of 19/03/2012 18:02, (c) The British Standards Institution 2012 BS EN 60384-16-1:2005 BSI - British Standards Institution BSI is the independent national body responsible for preparing British Standards It presents the UK view on standards in Europe and at the international level It is incorporated by Royal Charter Revisions British Standards are updated by amendment or revision Users of British Standards should make sure that they possess the latest amendments or editions It is the constant aim of BSI to improve the quality of our products and services We would be grateful if anyone finding an inaccuracy or ambiguity while using 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