ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 9 ppt

... show tungsten isotope patterns for WO+, WO,', and WO3+. Another type of interference in ICPMS is suppression of the formation of ions from trace constituents when a large amount of ... 198 1. Describes method for correction of overlapping spectral lines when using a polychromator for 9 J. W Olesik. hlyt. Gem. 63,12A, 199 1. Evaluation of remaining limi- ICP-OES....

Ngày tải lên: 12/08/2014, 14:21

... biochemistry, and medicine, where it is known under the general name of fluorometry. In PL of semiconductors, one mon- itors emission from the bottom of the conduction band to the top of ... 10'7-10&apos ;9 cm-3 by observing the ratio of the peak intensity of the nitrogen-bound exciton transition to that of its LO phonon side- band, or to peaks involving nitrogen ....

Ngày tải lên: 12/08/2014, 14:21

... Atomic Absorption Spectroscopy Atomic Absorption Vapor Phase Decomposition-Atomic Absorption Spectroscopy Graphite Furnace Atomic Absorption Flame Atomic Absorption Auger Electron Spectroscopy ... Loss Spectroscopy High-Resolution Electron Energy-Loss Spectroscopy Reflected Electron Energy-Loss Spectroscopy Reflection Electron Energy-Loss Microscopy Low-Energy Electron-Loss Spectr...

Ngày tải lên: 12/08/2014, 14:21

... is colored, the stage is rotated. Colored, anisotropic materi- als may show pleochroism-a change in color or hue when the orientation with respect to the vibration direction of the polarizer ... microscope. The optical microscope offered the scientist a first look at most samples and could be used to routinely doc- ument the progress of an investigation. As the sophistication of ....

Ngày tải lên: 12/08/2014, 14:21

... phonon-assisted photon emission or, more likely, the emission of phonons only. Process 2 produces intrinsic lumi- nescence due to direct recombination between an electron in the conduction ... from contamination sources that would change the mea- sured through-section composition. Ion-beam milling for short times usually removes such films deposited by electropolishing; however, ion-be...

Ngày tải lên: 12/08/2014, 14:21

... it is becoming widely used to monitor homogeneous surface impurities at concentrations down to 10&apos ;o- lO1' atoms/cm2 for heavy metals and 10'2-10'3 atoms/cm2 for elements ... resolution also should be noted. The spectral resolution of the gratings used to monochromatize synchrotron radiation gets worse as the photon energy gets higher, so the resolution advant...

Ngày tải lên: 12/08/2014, 14:21

... Piream.' HEELS is abso- lutely nondestructive and can be used to obtain information on the chemical com- position, morphology, structure, and phonon modes of the solid surfice. Many polymer ... shown in Figure 2. Elec- trons from an electron microscope hairpin tungsten filament are focused with an Einzel lens onto the monochromator entrance slit, pass through the monochroma-...

Ngày tải lên: 12/08/2014, 14:21

... The posrioiization methods are: electron impact ionization, ionization by multiple photon interactions, and ionization by collision with metastable atoms in a plasma. The SNMS methods incorporating ... implantation allows the introduction of a known amount of an element into a solid sample. A sample with a major component composition similar to that of the unknown sample may be implante...

Ngày tải lên: 12/08/2014, 14:21

... information on additional applications is directed to the proceedings of the Ion Beam Analysis Conferences' and those from the International Conferences on the Application of Accelerators ... does not provide information on chemical bonding or microscopic structure. Hence, it is often used in conjunction with other techniques that do provide such information, such as ESCA, optic...

Ngày tải lên: 12/08/2014, 14:21

... Reflection Electron Microscopy Surfice Analysis by her Ionization Post-Ionization Secondary Ion Mass Spectrometry Multi-Photon Nonresonant Post Ionization Multiphoton Resonant Post Ionization ... Resonant Post Ionization Multi-Photon Ionization Single-Photon Ionization Sputter-Initiated Resonance Ionization Spectroscopy Surface Analysii by Resonant Ionization Spectroscopy Time-of-F...

Ngày tải lên: 14/03/2014, 14:20