ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 1 ppsx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 1 ppsx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 1 ppsx

... Atomic Absorption Spectroscopy Atomic Absorption Vapor Phase Decomposition-Atomic Absorption Spectroscopy Graphite Furnace Atomic Absorption Flame Atomic Absorption Auger Electron Spectroscopy ... Loss Spectroscopy High-Resolution Electron Energy-Loss Spectroscopy Reflected Electron Energy-Loss Spectroscopy Reflection Electron Energy-Loss Microscopy Low-Energy Electron-Loss Spectr...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 5 ppsx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 5 ppsx

... it is becoming widely used to monitor homogeneous surface impurities at concentrations down to 10 &apos ;o- lO1' atoms/cm2 for heavy metals and 10 '2 -10 '3 atoms/cm2 for elements ... thin-film formation; evaluation of thin-film coatings or lubricants (thicknessquantity, chemical composition); failure analysis for adhesion between components, air oxi- dation, corros...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 8 ppsx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 8 ppsx

... Sci. Technol, A 511 81 (19 87). This article discusses why one would choose nonresonant multiphoton ionization for mass spectrometry of solid surfaces. Examples are given for depth profiling ... high-technology materials where the identification of contaminants 10 .2 Static SIMS 557 IO MASS AND OPTICAL SPECTROSCOPIES 10 .1 10 .2 10 .3 10 .4 10 .5 10 .6 10 .7 10 .8...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 2 pps

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 2 pps

... is colored, the stage is rotated. Colored, anisotropic materi- als may show pleochroism-a change in color or hue when the orientation with respect to the vibration direction of the polarizer ... microscope. The optical microscope offered the scientist a first look at most samples and could be used to routinely doc- ument the progress of an investigation. As the sophistication of ....

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 3 potx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 3 potx

... phonon-assisted photon emission or, more likely, the emission of phonons only. Process 2 produces intrinsic lumi- nescence due to direct recombination between an electron in the conduction ... from contamination sources that would change the mea- sured through-section composition. Ion-beam milling for short times usually removes such films deposited by electropolishing; however, ion-be...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 6 pptx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 6 pptx

... biochemistry, and medicine, where it is known under the general name of fluorometry. In PL of semiconductors, one mon- itors emission from the bottom of the conduction band to the top of ... 10 '7 -10 '9 cm-3 by observing the ratio of the peak intensity of the nitrogen-bound exciton transition to that of its LO phonon side- band, or to peaks involving nitrogen...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 7 pot

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 7 pot

... Piream.' HEELS is abso- lutely nondestructive and can be used to obtain information on the chemical com- position, morphology, structure, and phonon modes of the solid surfice. Many polymer ... insulators, including AlZO3, MgO, SiO2, LiF, and NaC1. Comparison to Other Techniques Information on vibrations at surfaces is complementary to that provided on the compositional a...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 9 ppt

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 9 ppt

... 19 81. Describes method for correction of overlapping spectral lines when using a polychromator for 9 J. W Olesik. hlyt. Gem. 63 ,12 A, 19 9 1. Evaluation of remaining limi- ICP-OES. ... National Laboratory, USA Reactor ORR Oak Ridge National Laboratory, USA Reactor Table 1 Some neutron sources. Within nuclear reactors, neutrons are a primary product of nuclear fis...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 10 pps

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC phần 10 pps

... 1, 19 90. Description of the pro- 11 .4 NRA 693 12 .3 MOKE Magneto-optic Kerr Rotation DAVID E. FOWLER Contents Introduction History and Basic Principles Instrumentation Comparison ... Conference 14 64: Symposium on I.C. Metrology, Inspection, and Process Control, San Jose, CA, 19 91, Proc. SPIE. 14 64, pp. 245-257, 19 9 1. Another application is presented...

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ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC potx

ENCYCLOPEDIA O FMATERIALS CHARACTERIZATIONC potx

... Ion scattering Spectroscopy, Iss 514 MASS AND OPTICAL SPECTROSCOPIES 10 .0 10 .1 10 .2 10 .3 10 .4 10 .5 10 .6 10 .7 10 .8 10 .9 Introduction 527 Dynamic Secondary Ion Mass Spectrometry, ... Transmission Electron Microscopy Transmission Electron Microscope Conventional Transmission Electron Microscopy Scanning Transmission Electron Microscopy High Resolution Transmi...

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