The Materials Science of Thin Films 2011 Part 5 docx
The Materials Science of Thin Films 2011 Part 5 docx
... Depletion 5. 5 Experimental Studies of Nucleation and Growth 5. 6 Grain Structure of Films and Coatings 5. 7 Amorphous Thin Films References 1 -5 are recommended sources for much of the subject ... 21 35 700 GaN TMGa + NH, 800 A1N TMAl + NH, 1 250 GaAs TMGa + ASH, 8 .50 1824 650 - 750 GaP TMGa + PH, 750 GaSb TEGa + TMSb 9.17 253 2 50 0 -55 0 1.13 1709 lnAs TEIn + ASH, 650 -700 ... findings. 5. Plot lnP&, /Psicl,P& vs. 1/ T K for the temperature range 800 to 150 0 K, using the results of Fig. 4 -5. a. What is the physical significance of the slope of this...
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The Materials Science of Thin Films 2011 Part 1 ppt
... Fig. 1-8b. The generalized behavior shown is common for all classes of solid materials, regardless of the type of bonding or crystal structure. Although the mathematical forms of the attractive ... discipline of materials science and engineer- ing. A dramatic increase in our understanding of the fundamental nature of materials throughout much of the twentieth century has led to the development ... change of T or P will destroy the three-phase equilib- Thin Films - A Historical Perspective Thin- film technology is simultaneously one of the oldest arts and one of the newest sciences....
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The Materials Science of Thin Films 2011 Part 2 ppsx
... in the presence of an applied field. logarithm of the rate is plotted on the ordinate and the reciprocal of the absolute temperature is plotted along the abscissa. The slope of the resulting ... continuous state of random motion, which is intimately dependent on the temperature of the gas. During their motion the gas particles collide with each other as well as with the walls of the confining ... characteristic of both the diffusing species and the matrix in which transport occurs. The extent of 50 Vacuum Science and Technology is that the large number of atoms or molecules of the gas...
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The Materials Science of Thin Films 2011 Part 4 ppt
... a rate of 1 pmlmin in vacuum at 25 'C, and What was it was estimated that the oxygen content of the film was the partial pressure of oxygen in the system? 7. Alloy films of Ti-W, ... (4-34b) Note the use of the perfect gas law and the neglect of the temperature dependence of D. Maintenance of stoichiometry requires that JCd = JTez 9 (4- 35) the factor of 2 arising ... view of the MOS field effect transistor structure in Fig. 4-1 indicates the extent to which the technology is employed. Above the plane of the base P-Si wafer, all of the films with the...
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The Materials Science of Thin Films 2011 Part 6 doc
... series of post-specimen lenses. The objective lens produces the first image of the object and is, therefore, required to be the most perfect of the lenses. Depending on how the beams reaching the ... discussion of the analysis of diffraction effects is well beyond the scope of this book. Some notion of the correlation between structure and diffraction patterns can be gained from the model of thin ... time one of the diffracted beams is chosen by means of an aperture that blocks the central beam and the other diffracted beams. The micrograph of alternating 40 A-wide films in the GaAs-Al,,,Ga,~,As...
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The Materials Science of Thin Films 2011 Part 8 pps
... Blakely, Thin Solid Films 25, 363, 19 75) . 364 Interdiffusion and Reactions in Thin Films the mathematical theories of GB diffusion including discussions of transport in these different ... IO4 sec 0 2 75. 0°C, 3 456 x IO5 sec v) t z 3 2- U a: a: t > a t m a t I= 0 LL a 0, U Y 2 Y v) ul 0 5 IO 15 20 25 30 35 40 45 50 55 60 65 70 PENETRATION ... array of Fig. 7-26a reflects the sixfold symmetry of the (111) plane, and the six fainter spots in between are the result of the (7 x 7) surface reconstruction. In RHEED, on the other...
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The Materials Science of Thin Films 2011 Part 9 pot
... If the normal tensile stress ax = F/A, then the force resolved on these shear planes is F cos 45 = fi /2 F. The area of the shear planes is A /cos 45 = 2/ A. Therefore, the ... 250 50 0 250 150 1 I 0 .5 15 50 0 B = beam supported on both ends; C = cantilever beam; P = circular plate From Refs. 3 and IO. 41 4 Mechanical Propertles of Thin Films ... Testing of Films Bulge testing is widely used to determine the mechanical properties of thin films and membranes. In this test the film-substrate assembly is sealed to the end of a hollow...
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The Materials Science of Thin Films 2011 Part 10 pps
... by the rupture of the ultrathin tunnel barrier due to the mismatch in thermal expansion between Pb alloys and the Si substrate on which the device is built. During temperature cycling the thermal ... overall capacitance is the product of the two individual (oxide and semiconductor) capacitances divided by their sum.) Note that now the bands bend the other way -the slope of the oxide conduction-band ... low. As an application of Matthiessen’s rule, consider the problem of assessing the purity and defect content of “pure” metal films. A measure of these properties is the residual resistivity...
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The Materials Science of Thin Films 2011 Part 11 pot
... 3. 65 0.70 0.0 75 4.62 0.17 3.97 0.12 4.17 0. 75 0.080 5. 05 0.16 4.42 0.12 4.62 0.80 0.090 5. 45 0.16 4.84 0.12 5. 07 0. 85 0.100 5. 85 0.17 5. 30 0.12 5. 47 0.90 0.1 05 6.22 0.18 5. 72 0.13 5. 86 ... 1. 45 0. 85 0. 45 0. 055 2.42 1.40 1.88 0.87 2.20 0 .50 0. 050 2.87 0.84 1.84 0.88 2.42 0 .55 0. 055 3.32 0.34 2.37 0.72 2.42 0.60 0.060 3. 75 0.23 2.97 0.17 3.07 0. 65 0.070 4.20 0.19 3 .50 0.13 ... 0.49 4.32 0.62 4.80 0.76 5. 32 0.97 6.00 1.24 6.60 1 .55 7.00 1.80 7.12 1.99 7. 05 2.08 7. 15 1.96 7.70 1. 75 8 .50 2.30 16 .5 5. 97 30.3 11.0 42.4 17.0 55 .0 25. 4 67.3 From Ref. 7 Flgure...
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The Materials Science of Thin Films 2011 Part 12 pptx
... substrates. The value of K, depends on a number of factors. Most important is the nature of the materials in contact, but the extent and type of lubrication, surface temperature, and nature of the ... > 95 Calculate R for the following dielectric stacks. System No. of Layers n Substrate H.L. X(m) SH 1 1 CeO, .Na,AIF6 0 .55 SHLH 3 1 .52 CeO, ,Na3AIF6 0 .55 SHLHLH 5 1 .52 ... only depends on the type of metal but also on the wavelength of light used to view it. The critical thickness for A1 films at 55 00 is 82 A, whereas for Au films it is 1 85 A. It is common...
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