... Series on characterization of particular materials classes include volumes on silicon processing, metals and alloys, catalytic materials, integrated circuit packaging, etc. Characterization ... crystal Single crystal Single crysml All All All, inorganic usually N1 Y2 N2 N2 Y3 Y2 Y2 Y1 Y3 Y3 N2 YIN - Y- Y- Y3 Y- Y- Y3 Y- Y3 1Y 1Y 3Y 2Y 2Y 2Y...
Ngày tải lên: 27/06/2014, 23:20
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Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 2 pps
... up for the characterization of opaque samples. Figure 3 illustrates a research-grade microscope made specifically for materials sci- ence, i.e., for optically characterizing all transparent ... Figure 3 Nikon Microphot-FXA research microscope for materials science. As an example of a more specific application, Figure 2 illustrates a metallo- graph-a light microscope...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 3 pps
... micro- structure of materials. It is used to study all varieties of solid materials: metals, ceramics, semiconductors, polymers, and composites. With the common availabil- ity of high-voltage ... Operational Considerations in Electron Microscopes Quantification Conclusions Introduction With modern detectors and electronics most Energy-Dispersive X-Ray Spectros- copy (EDS)...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 5 ppt
... and small mole- cules on surfaces; electrode-dectrolyte interfaces; electrochemically produced solu- tion species; metals, semiconductors, and insulators; high-temperature superconductors; ... studies of mate- rials, particulary catalysts59 and electrochemical systems. l3 Other techniques that have been successfully employed for in situ electrochemical studies include ellip-...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 6 ppsx
... strengths of XPS are its good quantification, its excellent chemical state determination capabilities, its applicability to a wide variety of materials from bio- logical materials to metals, ... processing of these materials, such as studying the effects of cleaning procedures on residual surface contami- nants, and studying reactive ion-etching mechanisms.’ The major d...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 7 ppt
... defects. Such materials include alkali- halides, semiconductors, crystalline ceramics, and glasses. In opaque materials PL is particularly surface sensitive, being restricted by the optical ... long wavelengths, soft X-ray analysis employs a long-wave- length X-ray source such as Al( 8 .34 A for Al Ka) or Cu ( 13. 36 for Cu La). Spe- cial analyzing crystals or gratin...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 8 pptx
... surfaces. Magneto-optic and magnetic disc materials: DyCo, TbFeCo, garnets, sputtered magnetic media (CoNiCr alloys and their carbon overcoats). Electrochemical and biological and medical ... Microfocus Raman Spectroscopic Analysis By successllly marrying a Raman spectrometer to an optical microscope it is possi- ble to obtain spectra having the resolution of optical microscopy-...
Ngày tải lên: 11/08/2014, 02:21
Encycopedia of Materials Characterization (surfaces_ interfaces_ thin films) - C. Brundle_ et al._ (BH_ 1992) WW Part 9 pps
... Figure 3b corresponds to the case of cylin- drical symmetry, where S, = f &, and hence only two distinct line shape com- chemical shift is the same in all three directions. Accordingly, ... units of the number of atomic scatterers per surface unit cell. In practice, due to uncertainties in the exact angular acceptance and efficiency of the detector, as we...
Ngày tải lên: 11/08/2014, 02:21