... for Nondestructive Testing, 1986 2. H.E. Bussey, Standards and Measurements of Microwave Surface Impedance, Skin Depth, Conductivity, and Q, IRE Trans. Instrum., Vol 1-9 , Sept 1960, p 171 -1 75 ... testpiece. A C-scan format also records time-of-flight data, which can be converted and displayed by image-processing equipment to provide an indication of flaw depth A-scan and B-scan data are ... Press, 1963 4. R.P. Dooley, X-Band Holography, Proc. IEEE, Vol 53 (No. 11) , Nov 1965, p 173 3 -1 73 5 5. W.E. Kock, A Photographic Method for Displaying Sound Wave and Microwave Space Patterns,...