... normal pul se polarography. Differential pulse polarography Single-sweep voltammogram obtained at a carbon-wax electrode for 10 -3 mol/L Ag + ion in 0.1 mol/L KNO 3 as supporting electrolyte. ... time, pulse duration, and current signal in differential pulse polarography. Polarograms of 10 -5 mol/L Cd 2+ , Zn 2+ and Mn 2+ . A, normal pulse mode; B, differential pulse m...
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... v. 10. Materials characterization 1. Handbooks, manuals, etc. I. Title: American Society for Metals. Handbook Committee. TA459.M43 1978 669 7 8-1 4934 ISBN 0-8 717 0-0 0 7-7 (v. 1) SAN 20 4-7 586 ... to Materials Characterization R.E. Whan, Materials Characterization Department, Sandia National Laboratories Reference 1. Characterization of Materials, prepar...
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Volume 10 - Materials Characterization Part 2 pdf
... 100 (212) 10 125 (255) 15 800 (147 0) 15 900 (1650) 10 2100 (3 810) 0 2100 (3 810) 10 357.9 1 320 Tin 75 (165) 10 100 (212) 15 450 (840) 10 800 (147 0) 10 ... 100 (212) 10 125 (255) 15 800 (147 0) 15 900 (1650) 10 2100 (3 810) 0 2100 (3 810) 10 357.9 1 320 Tin 75 (165) 100 (212) 450 (840) 800 (...
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Volume 10 - Materials Characterization Part 3 ppt
... Nucl. Part. Sci., Vol 30, 1980, p 211 Particle-Induced X-Ray Emission Thomas A. Cahill, Crocker Nuclear Laboratory, University of California Davis Data Reduction Particle-induced x-ray emission ... smaller particles tend to represent man-made materials; the larger ones are of natural origin. The smaller particles exhibit fewer particle-size effects, and x-ray spectrometric determina...
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Volume 10 - Materials Characterization Part 6 pot
... spectroscopy: • Isotope dilution mass spectrometry: • Spark source mass spectrometry: • Particle-induced x-ray emission spectroscopy: Neutron Activation Analysis M.E. Bunker, M.M. Minor, and S.R. ... Material 1633) determined using 1 4- MeV FNAA Element sought Radioisotope(s) detected (a) , T 1/2 Measured element concentration (a) , μg/g unless % indicated μ 3100 ± 200 (1.6 ± 0....
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Volume 10 - Materials Characterization Part 7 ppsx
... Relaxation parameter for ferromagnetic materials M Table 2 Effective magnetization in stressed nickel films Table 3 Spin wave resonance values for ferromagnetic materials
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Volume 10 - Materials Characterization Part 8 doc
... z Z c I I hkl I International Tables for X-Ray Crystallography, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, Advances in X-Ray Analysis, ASM Handbook Metals Handbook o o , A ... Limitations • • Estimated Analysis Time • Capabilities of Related Techniques • Electron probe x-ray microanalysis: Metallography: Principles and Practice, J. Microsc., The Microscope...
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Volume 10 - Materials Characterization Part 9 ppsx
... small circles ar e the partially filled fluorine atom positions. The platinum-platinum spacing is the shortest known for any − 1- D metal complex. The corresponding platinum-chain conductivity ... Ω -1 cm -1 at 298 K) for any known complex of this type. Source: Ref 16 Origin of fringes caused by a fault plane between crystals I and II. Source: Ref 9, 10 Diffraction in...
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Volume 10 - Materials Characterization Part 10 ppt
... X-ray Analyses, si s si s si s I r ij l ij K, A, I Table 1 Initial and final short-distance parameters for the silica glass refinement Material Cycle r ij , l ij 0.03 0.06 0 .10 0 .10 0 .10 ... 8) a (Eq 9) a I h r R, r. (Eq 10) (Eq 11) h, (Eq 12) h b J. Non-Cryst. Solids, Carbon, Ann. Phys., Z. Phys., X-ray Diffraction, X-ray Diffraction, Phys. Rev., J. Non-Cryst. Solids, Acta Cry...
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