ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 10 pdf

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 10 pdf

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 10 pdf

... grating equation. The intensity of the light in the different orders is a very sensitive function of the shape of the lines of the pattern. If the shape of the lines of the pattern is influenced ... polarization depends on the relative orientation of the plane of incidence, the incident angle of the light, and the orientation of M. While the amount of rota...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 1 pdf

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 1 pdf

... scattering Spectroscopy, Iss 514 MASS AND OPTICAL SPECTROSCOPIES 10. 0 10. 1 10. 2 10. 3 10. 4 10. 5 10. 6 10. 7 10. 8 10. 9 Introduction 527 Dynamic Secondary Ion Mass Spectrometry, Dynamic ... Types of solid sample (typical) ArrideTechnique probed probed capability No. 10. 4 SNMS . 1.5 nm un 50 PPm Flat conductors Y2 2Y 10. 5 LIMS *. 10. 6 SSMS 0 10....
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 4 pdf

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 4 pdf

... Measure- ment of the intensiey and the shape of the profile gives a quantitative analysis of phase boundaries and the influence of finite sizes on the tran~ition.~ Dynamics of phase transitions, ... extracted. Thermal properties of overlayer atoms. Measurement of the intensity of any dif- fracted beam with temperature and its angular profile can be interpreted in terms...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 8 pdf

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 8 pdf

... time) of a silicon sample containing a boron ion implant. elements as a function of time, a profile of the in-depth distribution of the elements is obtained. The depth scale of the profile ... of the sputtering time. By monitoring the secondary ion count rates of selected 10. 1 Dynamic SIMS 537 lime - of - Right OF) Mass Analyser Figure 1 Schematic rep...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 9 pdf

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 9 pdf

... discussion of GDMS quantitation, including the measurement of relative GDMS sensitivity factors and a modeling of glow-discharge source processes to enable semiempirical estimates of 10. 7 GDMS ... detection limits are typi- cally in the range of tens of pg to ng, with a precision of 10% to 15%. 638 MASS AND OPTICAL SPECTROSCOPIES Chapter 10 Laser-ablation ICP-OE...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 2 pot

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 2 pot

... composite materials. Profilometry of softer materials, such as polymers, is also possible with SFM, and with STM if the sample is conducting. Low forces on the SFM tip allow imaging of materials ... profiles of all features with sides steeper than 55" will be dominated by the profile of the tip. Because many kinds of features have steep sides, tip imaging is a com...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 3 potx

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 3 potx

... distribution of generation of Cu KOr X rays for an incident beam energy of 20 keV, and the effect of absorption. tion volume of a beam incident perpendicularly on a flat specimen of copper, ... form of a cone as shown in Figure l), the electron diffraction pattern becomes an array of disks rather than an array of sharp spots as in TEM. The vari- ous manifes...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 5 pptx

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 5 pptx

... valence-band density of states, and thus the shape of the LW “peak” is derived from a self convolution of the valence- band density of states, and the width of the LW peak is twice the width of the valence ... specific parts of the density of states. A fuller description of this type of work' is beyond the scope of this article and is not partic- ularl...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 6 potx

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 6 potx

... surface region of thickness t4). One of the films tl or t3 may consist of microscopic (less than 100 nm size) mixtures of two materials, such as SiO, and Si3N4. The volume ratios of these ... to - 100 pn if the angle of incidence variation is not crit- id. For smaller focusing the beam contains components having a range of angles of incidence that may alter th...
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ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 7 ppt

ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 7 ppt

... about a factor of 100 ) at 10- 100 ppm than vice versa; the depth-resolution depends on ion energy, angle of incidence, and depth below the surhce such that a resolution of 20 is achievable ... wide range of analytical applications. Some typical examples include the quantitation of hydrogen in glassy carbon films, the study of the dynamics of polymeric molecule^,^...
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