ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 9 pdf

... 0.00025 0.072 0.00 69 0.00 19 0.0021 0.044 0.066 33. 25. 3.7 9. 6 23. 14. 5.4 3.4 Table 2 Precision of trace elemental analysis of 3N5 199 .95 %) and 6N 199 .99 99% ) pure In metals ... (ppmw) deviation (%) 3N5 (99 .95 %) 6N (99 .99 99% ) Fe Ni cu Cd Sn TI Pb Bi 0.038 0.366 0.683 0.453 0. 698 0.202 20.5 61.3 4.7 1.5 4.1 1.7 0.6 1 .9...

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... quantitative analysis of major, minor, and trace constituents of materials Instrument cost $300,000-$800,000 Size 3 mx 1.5 mx 2 m high 15 ENCYCLOPEDIA OF MATERIALS CHARACTERIZATION ... analyzed, materials consisting of light elements are always probed more deeply than materials consisting of heavy ele- ments. 2 INTRODUCTION AND SUMMARIES Chapter 1 Co...

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... Measure- ment of the intensiey and the shape of the profile gives a quantitative analysis of phase boundaries and the influence of finite sizes on the tran~ition.~ Dynamics of phase transitions, ... extracted. Thermal properties of overlayer atoms. Measurement of the intensity of any dif- fracted beam with temperature and its angular profile can be interpreted in terms...

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... time) of a silicon sample containing a boron ion implant. elements as a function of time, a profile of the in-depth distribution of the elements is obtained. The depth scale of the profile ... Polymer Mater. Sci. Eng. 59, 734, 198 8. Static SIMS analysis of plasma treated polymer surfaces. s D. Briggs. Ox. Mass Spectrom. 22 ,91 , 198 7. Static SIMS analysis...

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... Conferences, in NucL Imtx Metb. B45, 199 0; B35, 198 8; B15, 198 6; 218, 198 3; 191 , 198 1; 168, 198 0. 9 Proceedings from International Conferences on the Application of Accel- erators in Research and ... Mi&. B40/41, 198 9; B24/25, 198 7; B10/11, 198 5. io W. A. Lanford, K. Davis, I? LaMarche, T. Laursen, R Groleau, and R. H. Doremus. J, Non-Cryst. Sofkh...

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... composite materials. Profilometry of softer materials, such as polymers, is also possible with SFM, and with STM if the sample is conducting. Low forces on the SFM tip allow imaging of materials ... main body of artifacts in STM and SFM arises from a phenomenon known as tip imaging9 Every data point in a scan represents a convolution of the shape of the tip and the s...

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... Matter 1, 692 9, 198 9; 198 7, p. 187. 95 ,240, 198 9. L. H. Robins, L. I? Cook, E. N. Farabaugh, and A. Feldman. Pbys. Rea B 39, 13367, 198 9. 12 D. B. Holt. In: Am& of Organic ... distribution of generation of Cu KOr X rays for an incident beam energy of 20 keV, and the effect of absorption. tion volume of a beam incident perpendicularly o...

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... 177,1 69, 192 3; ibid 180,65, 192 5. 2 J.J. Lander. Pbys. Rev. 91 , 1382, 195 3. 3 L. A. Harris. J &pi. Pbys. 39, 3; ibid 14 19, 196 8. 4 E. N. Sidiafus. Pbys. Rw. B. 16,1436, 197 7; ... RekztedPben. 10,305, 197 7. N. Sickahs and C. Kukla. Pbys. Rev. B 19, 4056, 197 9. University Press, 198 9. 198 1. 5.3 AES 323 Basic Principles The hndamen...

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... 1186,110, 198 9. Mater. 18,3 79, 198 9. 7.2 Modulation Spectroscopy 399 A .a73 - B .15- a : .m- C .018 - rn I I I I I I I I I 16w 1466 193 5 1 199 1066 99 2 799 e45 532 99 9 ... Solid Film. 89, 2 49, 198 2. A detailed review of effec- tive medium theory and its use in studies of optical properties of solids. 3 R E. Collins. Rev. Sci. Ima....

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... 62,645, 199 0. Analysis of io J. J. Pireaux, C. Grdgoire, M. Vermeersch, I? A. Thiry, and R. Caudano. alloys. polymer surfaces using HREELS. Su$ace Sci. 1 89/ 190 ,90 3, 198 7. Surface ... consisting of 240 nm of Si on 170 nm of Si02 on a Si sub-ate. The spectrum in (a) was acquired using a scattering angle of leOo while the spectrum in (b) used a dete...

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