ENCYCLOPEDIA OF MATERIALS CHARACTERIZATIONC phần 2 pot

... composite materials. Profilometry of softer materials, such as polymers, is also possible with SFM, and with STM if the sample is conducting. Low forces on the SFM tip allow imaging of materials ... prescribed degree. This large depth of focus contributes to the ease of observation of topographical 2. 2 SEM 77 Incident Electron Beam Pre-Field of the Ojbective Le...

Ngày tải lên: 08/08/2014, 17:20

... distribution of generation of Cu KOr X rays for an incident beam energy of 20 keV, and the effect of absorption. tion volume of a beam incident perpendicularly on a flat specimen of copper, ... of Cu produces a weak peak at about 1 .27 eV, in addition to the CdS band-edge emission at 2. 42 eV. Pulsed laser annealing with an energy density of 0.1 J/cm2 increase...

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... 415 Many materials have been studied; examples include: Dielectrics and optical coatings: Si3N4, Si 02, SiOJV,,, Al2O3, a-C:H, ZnO, Ti 02, ZnO/Ag/ZnOY TiOz/Ag/TiO2, Ago, In(Sn )20 3, and organic ... surface region of thickness t4). One of the films tl or t3 may consist of microscopic (less than 100 nm size) mixtures of two materials, such as SiO, and Si3N4. The volu...

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... ll.' ;E20ll 5 11 .2 ;l;g;v 11.3 NAA 11.4 NRA 2 0 0 C Optical 0 : 12. 2 scatternmetry z v) 12. 3 MOU P 12. 4 Adsorption U . . *. 100nm 2pm 1-100ppm All Y3 2Y 3P cm ... of edge profiles information None, the specimen is already thin capabilities Without standards +fl0 -20 % at.; with standards - 1 -2% at. -lo -21 g Thickness of s...

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... in some cases. Systematic errors often make the accu- 4.3 SEXAFS/NEXAFS 22 7 24 10 12 6 n A Vo x -8 34 - 12 -18 -24 5 6 7 8 9 10 11 12 13 14 15 16 17 18 k in Inverse ... versa. 22 8 ELECTRON/X-RAY DIFFRACTION Chapter 4 b b aP a b C d Figure2 Examples of overlayer structures with appropriate notation. (a) fcc (100) ~(2x2); (b) fcc...

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... the XPS recorded Si 2p signal of Figure 4 has a width of about 1 eV, the individual 2~ 3,~ and 2p% components of the synchrotron recorded signal are only about 0 .25 eV wide. Whether this ... AM -24 1 (Np L X rays) are used in place of an X-ray tube in some applications. Analyzing Crystals Crystals commonly used in XRF are: LiF (20 0) and (22 0), which have 2Csp...

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... consisting of 24 0 nm of Si on 170 nm of Si 02 on a Si sub-ate. The spectrum in (a) was acquired using a scattering angle of leOo while the spectrum in (b) used a detector angle of llOo. ... + 2. 196 ( 1.6454) El-'- 0.0 42 EL2 where El is expressed in MeV and the cross section in units of cm2/sr. Such an expression is of practical value for compu...

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... 0.6 0 .27 Cr 26 19.5 Mn 0.6 0.73 Fe 9 8 .2 co 2 1.6 Ni 37 55 cu 0.07 0.19 Mo 25 11 .2 w 0.9 1.46 Table 1 Semiquantitative bulk analysis by SNMSd of the NIST SRM 24 02 Hasteloy ... of ICP-OES systems in use worldwide and the cost of a new ICP-OES is halfthat of an ICPMS.) 531 3 0 z 0 104 103 10’ IO’ 106 105 10‘ I03 IO‘ IO‘ 140 160...

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... 0.698 0 .20 2 20 .5 61.3 4.7 1.5 4.1 1.7 0.6 1.9 1.3 1.7 Al Fe Ni cu Sn Sb TI Pb 0.00056 0.00 025 0.0 72 0.0069 0.0019 0.0 021 0.044 0.066 33. 25 . 3.7 9.6 23 . 14. 5.4 ... ~0.00006 <0.0001 0.0 02 (c20.) (c200.) (40.) (<0 .2) 0.005 <0.00009 0.0 02 0.005 <0.0001 c0.00 02 (4 co.001 c0.0 02 <0.00001 0.001 <0.000 02 &l...

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... 1000 2 750- w + 500- 25 0- 0- : z 0 n - i A CARBON AA 0 LITHIUM -=- _- ___ A A A '? + L-4- I 12. 6 12. 4 12. 2 12. 0 11.8 DISTANCE (mml 7 Lateral profiles of carbon ... limit of approximately 2 and a long wavelength limit of 720 PHYSICAL AND MAGNETIC PROPERTIES Chapter 12 12 PHYSICAL AND MAGNETIC PROPERTIES 12. 1 Surface Rough...

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