... Frontiers in Electronic Testing 43 ,DOI 10.1007/97 8-9 0 -4 8 1-3 28 2-9 2,c Springer Science+Business Media B.V. 201033Simpo PDF Merge and Split Unregistered Version - http://www.simpopdf.comContents1 ... (ed.), Models in Hardware Testing: Lecture Notes of the Forumin Honor of Christian Landrault, Frontiers in Electronic Testing 43 ,DOI 10.1007/97 8-9 0 -4 8 1-3 28 2-9 1,c Springer Science+Business ... circuits with full open defects. Electron Lett 43 (21): 144 0– 144 1Rodr´ıguez-Monta˜n´es R, Arum´ı D, Figueras J, Eichenberger S, Hora C, Kruseman B (2008) Time-dependent behaviour of full open defects...