... 31, 2005, pg 10 .Optional Homework Problems (for Study!)Skoog, Holler and Nieman, Chapter 21. Problems: 21- 1, 21- 2, 21- 4, and 21- 8. 1 Lecture Date: March 17 th, 2008 Microscopy and Surface Analysis ... necessaryDetection limits(atomic fraction) 10 -2to 10 -3 10 -2to 10 -3 10 -3to 10 -8 10 -3to 10 -8Lateral resolution (um)0.05 ~10 00 0.05 1 Depth resolution (nm)0.3-2.5 1- 3 10 00-50000 0.3-2Organic samples ... 427-4 71 (19 96). Force Microscopy: 9. R. J. Hamers, “Scanned probe microscopies in chemistry,” J. Phys. Chem., 10 0, 13 103 -13 120 (19 96).Further Reading Surface Spectrometric Methods (XPS and AES) 10 ....